DE3166512D1 - Heterojunction semiconductor device - Google Patents

Heterojunction semiconductor device

Info

Publication number
DE3166512D1
DE3166512D1 DE8181109124T DE3166512T DE3166512D1 DE 3166512 D1 DE3166512 D1 DE 3166512D1 DE 8181109124 T DE8181109124 T DE 8181109124T DE 3166512 T DE3166512 T DE 3166512T DE 3166512 D1 DE3166512 D1 DE 3166512D1
Authority
DE
Germany
Prior art keywords
semiconductor device
heterojunction semiconductor
heterojunction
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8181109124T
Other languages
English (en)
Inventor
Tadashi Fukuzawa
Ken Yamaguchi
Susumu Takahashi
Hisao Nakajima
Michiharu Nakamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Application granted granted Critical
Publication of DE3166512D1 publication Critical patent/DE3166512D1/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/778—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface
    • H01L29/7782—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with confinement of carriers by at least two heterojunctions, e.g. DHHEMT, quantum well HEMT, DHMODFET
    • H01L29/7783—Field effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT ; with two-dimensional charge-carrier layer formed at a heterojunction interface with confinement of carriers by at least two heterojunctions, e.g. DHHEMT, quantum well HEMT, DHMODFET using III-V semiconductor material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/107—Substrate region of field-effect devices
    • H01L29/1075—Substrate region of field-effect devices of field-effect transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Junction Field-Effect Transistors (AREA)
  • Bipolar Transistors (AREA)
DE8181109124T 1980-10-31 1981-10-28 Heterojunction semiconductor device Expired DE3166512D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55152088A JPS5776879A (en) 1980-10-31 1980-10-31 Semiconductor device

Publications (1)

Publication Number Publication Date
DE3166512D1 true DE3166512D1 (en) 1984-11-08

Family

ID=15532779

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181109124T Expired DE3166512D1 (en) 1980-10-31 1981-10-28 Heterojunction semiconductor device

Country Status (4)

Country Link
US (1) US4772925A (de)
EP (1) EP0051271B1 (de)
JP (1) JPS5776879A (de)
DE (1) DE3166512D1 (de)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4633282A (en) * 1982-10-04 1986-12-30 Rockwell International Corporation Metal-semiconductor field-effect transistor with a partial p-type drain
JPS59103389A (ja) * 1982-12-04 1984-06-14 Nippon Telegr & Teleph Corp <Ntt> 超伝導素子及びその製法
JPS59228768A (ja) * 1983-06-11 1984-12-22 Agency Of Ind Science & Technol 半導体集積回路
JPH0810751B2 (ja) * 1983-12-23 1996-01-31 株式会社日立製作所 半導体装置
JPH07120790B2 (ja) * 1984-06-18 1995-12-20 株式会社日立製作所 半導体装置
US4590507A (en) * 1984-07-31 1986-05-20 At&T Bell Laboratories Variable gap devices
GB2166286B (en) * 1984-10-26 1988-07-20 Stc Plc Photo-detectors
JPS61131565A (ja) * 1984-11-30 1986-06-19 Fujitsu Ltd 電界効果型半導体装置
US4652896A (en) * 1985-06-27 1987-03-24 The United States Of America As Represented By The Secretary Of The Air Force Modulation doped GaAs/AlGaAs field effect transistor
EP0264932A1 (de) * 1986-10-24 1988-04-27 Sumitomo Electric Industries Limited Feldeffekttransistor
US4855797A (en) * 1987-07-06 1989-08-08 Siemens Corporate Research And Support, Inc. Modulation doped high electron mobility transistor with n-i-p-i structure
US4839310A (en) * 1988-01-27 1989-06-13 Massachusetts Institute Of Technology High mobility transistor with opposed-gates
US5177026A (en) * 1989-05-29 1993-01-05 Mitsubishi Denki Kabushiki Kaisha Method for producing a compound semiconductor MIS FET
US4987463A (en) * 1989-08-28 1991-01-22 Motorola, Inc. FET having a high trap concentration interface layer
JP2822547B2 (ja) * 1990-03-06 1998-11-11 富士通株式会社 高電子移動度トランジスタ
TW354411B (en) * 1996-09-27 1999-03-11 Sanyo Electric Co Semiconductor device and its manufacturing process
JP4700226B2 (ja) * 2001-05-07 2011-06-15 株式会社コーワ 電気掃除機用吸込口の回転ロータ
JP3705431B2 (ja) * 2002-03-28 2005-10-12 ユーディナデバイス株式会社 半導体装置及びその製造方法
JP4389935B2 (ja) * 2004-09-30 2009-12-24 サンケン電気株式会社 半導体装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4157556A (en) * 1977-01-06 1979-06-05 Varian Associates, Inc. Heterojunction confinement field effect transistor
FR2386903A1 (fr) * 1977-04-08 1978-11-03 Thomson Csf Transistor a effet de champ sur support a grande bande interdite
DE2725180A1 (de) * 1977-06-03 1978-12-07 Sollich Spezialmasch Vorrichtung zum behandeln von kakaobutter enthaltenden massen
GB2012480A (en) * 1978-01-12 1979-07-25 Plessey Co Ltd Heterostructure field effect transistors
US4194935A (en) * 1978-04-24 1980-03-25 Bell Telephone Laboratories, Incorporated Method of making high mobility multilayered heterojunction devices employing modulated doping
DE3072175D1 (de) * 1979-12-28 1990-04-26 Fujitsu Ltd Halbleitervorrichtungen mit heterouebergang.

Also Published As

Publication number Publication date
EP0051271A1 (de) 1982-05-12
EP0051271B1 (de) 1984-10-03
JPS5776879A (en) 1982-05-14
US4772925A (en) 1988-09-20
JPH024140B2 (de) 1990-01-26

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee