DE3040304C2 - - Google Patents

Info

Publication number
DE3040304C2
DE3040304C2 DE3040304A DE3040304A DE3040304C2 DE 3040304 C2 DE3040304 C2 DE 3040304C2 DE 3040304 A DE3040304 A DE 3040304A DE 3040304 A DE3040304 A DE 3040304A DE 3040304 C2 DE3040304 C2 DE 3040304C2
Authority
DE
Germany
Prior art keywords
template
circuit board
chips
location
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE3040304A
Other languages
German (de)
English (en)
Other versions
DE3040304A1 (de
Inventor
Ernst 8070 Ingolstadt De Ensslin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Telefunken Electronic GmbH
Original Assignee
Telefunken Electronic GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Telefunken Electronic GmbH filed Critical Telefunken Electronic GmbH
Priority to DE19803040304 priority Critical patent/DE3040304A1/de
Publication of DE3040304A1 publication Critical patent/DE3040304A1/de
Application granted granted Critical
Publication of DE3040304C2 publication Critical patent/DE3040304C2/de
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/309—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of printed or hybrid circuits or circuit substrates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815—Controlling of component placement on the substrate during or after manufacturing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Computer Hardware Design (AREA)
  • Health & Medical Sciences (AREA)
  • Operations Research (AREA)
  • Manufacturing & Machinery (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Tests Of Electronic Circuits (AREA)
DE19803040304 1980-10-25 1980-10-25 Verfahren und vorrichtung zur optischen ueberpruefung von bestueckten leiterplatten Granted DE3040304A1 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19803040304 DE3040304A1 (de) 1980-10-25 1980-10-25 Verfahren und vorrichtung zur optischen ueberpruefung von bestueckten leiterplatten

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19803040304 DE3040304A1 (de) 1980-10-25 1980-10-25 Verfahren und vorrichtung zur optischen ueberpruefung von bestueckten leiterplatten

Publications (2)

Publication Number Publication Date
DE3040304A1 DE3040304A1 (de) 1982-06-03
DE3040304C2 true DE3040304C2 (en, 2012) 1988-06-16

Family

ID=6115179

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19803040304 Granted DE3040304A1 (de) 1980-10-25 1980-10-25 Verfahren und vorrichtung zur optischen ueberpruefung von bestueckten leiterplatten

Country Status (1)

Country Link
DE (1) DE3040304A1 (en, 2012)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2757939B3 (fr) * 1996-12-30 1999-01-08 Gemplus Sca Gabarit pour le controle geometrique de cartes a memoire
FR2785044B1 (fr) * 1998-10-27 2001-01-26 Gemplus Card Int Gabarit universel de controle geometrique d'une carte
CN110940787B (zh) * 2019-12-29 2022-12-13 圣达电气有限公司 一种移动式铜箔针孔检验装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE7717348U1 (en, 2012) * 1900-01-01 Muehlau, Karl-Heinz, 7880 Saeckingen

Also Published As

Publication number Publication date
DE3040304A1 (de) 1982-06-03

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Legal Events

Date Code Title Description
8127 New person/name/address of the applicant

Owner name: TELEFUNKEN ELECTRONIC GMBH, 7100 HEILBRONN, DE

8120 Willingness to grant licences paragraph 23
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee