DE2920872C2 - - Google Patents
Info
- Publication number
- DE2920872C2 DE2920872C2 DE19792920872 DE2920872A DE2920872C2 DE 2920872 C2 DE2920872 C2 DE 2920872C2 DE 19792920872 DE19792920872 DE 19792920872 DE 2920872 A DE2920872 A DE 2920872A DE 2920872 C2 DE2920872 C2 DE 2920872C2
- Authority
- DE
- Germany
- Prior art keywords
- sleeves
- contact
- contact device
- connection elements
- coil springs
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000005476 soldering Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
- G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
- G01R1/06722—Spring-loaded
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792920872 DE2920872A1 (de) | 1979-05-23 | 1979-05-23 | Federnde kontakteinrichtung fuer messund pruefzwecke |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19792920872 DE2920872A1 (de) | 1979-05-23 | 1979-05-23 | Federnde kontakteinrichtung fuer messund pruefzwecke |
Publications (2)
Publication Number | Publication Date |
---|---|
DE2920872A1 DE2920872A1 (de) | 1980-12-04 |
DE2920872C2 true DE2920872C2 (enrdf_load_stackoverflow) | 1988-07-21 |
Family
ID=6071503
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE19792920872 Granted DE2920872A1 (de) | 1979-05-23 | 1979-05-23 | Federnde kontakteinrichtung fuer messund pruefzwecke |
Country Status (1)
Country | Link |
---|---|
DE (1) | DE2920872A1 (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
ATE68603T1 (de) * | 1986-02-27 | 1991-11-15 | Feinmetall Gmbh | Federkontaktstift fuer pruefvorrichtungen. |
DE3709962A1 (de) * | 1986-05-22 | 1987-11-26 | I D Von Hagen Fa | Spannverschluss fuer einen behaelter, insbesondere fuer einen motorradkoffer |
-
1979
- 1979-05-23 DE DE19792920872 patent/DE2920872A1/de active Granted
Also Published As
Publication number | Publication date |
---|---|
DE2920872A1 (de) | 1980-12-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AF | Is addition to no. |
Ref country code: DE Ref document number: 2826645 Format of ref document f/p: P |
|
8110 | Request for examination paragraph 44 | ||
8125 | Change of the main classification |
Ipc: H01R 11/18 |
|
AF | Is addition to no. |
Ref country code: DE Ref document number: 2826645 Format of ref document f/p: P |
|
D2 | Grant after examination | ||
8364 | No opposition during term of opposition | ||
8340 | Patent of addition ceased/non-payment of fee of main patent |