DE2855584C2 - - Google Patents

Info

Publication number
DE2855584C2
DE2855584C2 DE2855584A DE2855584A DE2855584C2 DE 2855584 C2 DE2855584 C2 DE 2855584C2 DE 2855584 A DE2855584 A DE 2855584A DE 2855584 A DE2855584 A DE 2855584A DE 2855584 C2 DE2855584 C2 DE 2855584C2
Authority
DE
Germany
Prior art keywords
input
switches
clock
switch
pair
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2855584A
Other languages
German (de)
English (en)
Other versions
DE2855584A1 (de
Inventor
Thomas Phillips Redfern
Joseph John Conolly Jun.
Thomas Marius San Jose Calif. Us Frederiksen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Semiconductor Corp
Original Assignee
National Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by National Semiconductor Corp filed Critical National Semiconductor Corp
Publication of DE2855584A1 publication Critical patent/DE2855584A1/de
Application granted granted Critical
Publication of DE2855584C2 publication Critical patent/DE2855584C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/249—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors using clock signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0038—Circuits for comparing several input signals and for indicating the result of this comparison, e.g. equal, different, greater, smaller (comparing pulses or pulse trains according to amplitude)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
    • H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
    • H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
    • H03K17/693—Switching arrangements with several input- or output-terminals, e.g. multiplexers, distributors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Analogue/Digital Conversion (AREA)
  • Manipulation Of Pulses (AREA)
  • Logic Circuits (AREA)
DE19782855584 1978-01-27 1978-12-22 Taktgesteuerter praezisionsvergleicher Granted DE2855584A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/872,966 US4191900A (en) 1978-01-27 1978-01-27 Precision plural input voltage amplifier and comparator

Publications (2)

Publication Number Publication Date
DE2855584A1 DE2855584A1 (de) 1979-08-02
DE2855584C2 true DE2855584C2 (OSRAM) 1989-04-06

Family

ID=25360705

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782855584 Granted DE2855584A1 (de) 1978-01-27 1978-12-22 Taktgesteuerter praezisionsvergleicher

Country Status (4)

Country Link
US (1) US4191900A (OSRAM)
JP (1) JPS54111247A (OSRAM)
DE (1) DE2855584A1 (OSRAM)
FR (1) FR2415813A1 (OSRAM)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2905116A1 (de) * 1978-02-21 1979-08-30 Nat Semiconductor Corp Zweifach-digital/analog-wandleranordnung
DE2939270A1 (de) * 1978-12-11 1980-06-26 Nat Semiconductor Corp Analog/digital-wandlerschaltungsanordnung
US4335371A (en) * 1979-04-09 1982-06-15 National Semiconductor Corporation Digital error correcting trimming in an analog to digital converter
US4317054A (en) * 1980-02-07 1982-02-23 Mostek Corporation Bandgap voltage reference employing sub-surface current using a standard CMOS process
CH639521B (fr) 1980-05-28 Ebauches Electroniques Sa Circuit detecteur de niveau de tension.
US4461965A (en) * 1980-08-18 1984-07-24 National Semiconductor Corporation High speed CMOS sense amplifier
US4323887A (en) * 1980-10-23 1982-04-06 National Semiconductor Corporation CMOS Analog to digital converter with selectable voltage follower buffering
US4375595A (en) * 1981-02-03 1983-03-01 Motorola, Inc. Switched capacitor temperature independent bandgap reference
FR2517433B1 (fr) * 1981-12-01 1984-02-10 Ebauches Electroniques Sa Circuit detecteur de niveau de tension
JPS58121809A (ja) * 1982-01-14 1983-07-20 Toshiba Corp 増幅回路
JPS58170213A (ja) * 1982-03-31 1983-10-06 Toshiba Corp 電圧比較回路
EP0101571B1 (en) * 1982-07-30 1987-01-28 Kabushiki Kaisha Toshiba Differential voltage amplifier
JPS59126319A (ja) * 1982-08-31 1984-07-20 Toshiba Corp チヨツパ形コンパレ−タ
US4547683A (en) * 1982-10-18 1985-10-15 Intersil, Inc. High speed charge balancing comparator
JPS59135927A (ja) * 1983-01-26 1984-08-04 Yokogawa Hokushin Electric Corp Ａ／ｄ変換器
JPS59135926A (ja) * 1983-01-26 1984-08-04 Yokogawa Hokushin Electric Corp Ａ／ｄ変換器
JPS59138119A (ja) * 1983-01-27 1984-08-08 Yokogawa Hokushin Electric Corp Ａ／ｄ変換器
US5237533A (en) * 1991-12-20 1993-08-17 National Semiconductor Corporation High speed switched sense amplifier
FR2690748A1 (fr) * 1992-04-30 1993-11-05 Sgs Thomson Microelectronics Circuit de détection de seuil de tension à très faible consommation.
EP0757861B1 (en) * 1994-04-29 1998-12-30 Analog Devices, Inc. Charge redistribution analog-to-digital converter with system calibration
US5600322A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS analog-to-digital converter
US5600275A (en) * 1994-04-29 1997-02-04 Analog Devices, Inc. Low-voltage CMOS comparator with offset cancellation
US5668551A (en) * 1995-01-18 1997-09-16 Analog Devices, Inc. Power-up calibration of charge redistribution analog-to-digital converter
US5621409A (en) * 1995-02-15 1997-04-15 Analog Devices, Inc. Analog-to-digital conversion with multiple charge balance conversions
SE524561C2 (sv) * 2000-04-25 2004-08-24 Intra Internat Ab Strömmätningskrets med två mätområden
US20040113494A1 (en) * 2000-09-01 2004-06-17 Karuppana Samy V. Daytime running light control using an intelligent power management system
GB2378066B (en) 2001-07-23 2005-10-26 Seiko Epson Corp Comparator circuit and method
US6900686B1 (en) * 2003-06-05 2005-05-31 Marvell International Ltd. Analog switching circuit
US7889752B2 (en) * 2003-06-05 2011-02-15 Marvell International Ltd. Dual ported network physical layer
US7271641B1 (en) * 2003-06-05 2007-09-18 Marvell International Ltd. Self-repairable semiconductor with analog switching circuit
US9246503B1 (en) 2013-09-09 2016-01-26 Ateeda Ltd. Built in self-test
US11018681B1 (en) 2020-03-18 2021-05-25 Analog Devices International Unlimited Company Digital-to-analog converter waveform generator

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3676702A (en) * 1971-01-04 1972-07-11 Rca Corp Comparator circuit
US3914689A (en) * 1974-05-06 1975-10-21 Charles S Wright Self powering temperature compensated rectifier for measuring current
US4097753A (en) * 1976-04-02 1978-06-27 International Business Machines Corporation Comparator circuit for a C-2C A/D and D/A converter
US4028558A (en) * 1976-06-21 1977-06-07 International Business Machines Corporation High accuracy MOS comparator
US4075509A (en) * 1976-10-12 1978-02-21 National Semiconductor Corporation Cmos comparator circuit and method of manufacture

Also Published As

Publication number Publication date
FR2415813A1 (fr) 1979-08-24
DE2855584A1 (de) 1979-08-02
FR2415813B1 (OSRAM) 1983-07-01
JPH0322103B2 (OSRAM) 1991-03-26
JPS54111247A (en) 1979-08-31
US4191900A (en) 1980-03-04

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Free format text: RICHTER, J., DIPL.-ING., 1000 BERLIN GERBAULET, H., DIPL.-ING., PAT.-ANWAELTE, 2000 HAMBURG