DE2658611A1 - Vorrichtung zur erzeugung und zum empfang von digitalwoertern - Google Patents
Vorrichtung zur erzeugung und zum empfang von digitalwoerternInfo
- Publication number
- DE2658611A1 DE2658611A1 DE19762658611 DE2658611A DE2658611A1 DE 2658611 A1 DE2658611 A1 DE 2658611A1 DE 19762658611 DE19762658611 DE 19762658611 DE 2658611 A DE2658611 A DE 2658611A DE 2658611 A1 DE2658611 A1 DE 2658611A1
- Authority
- DE
- Germany
- Prior art keywords
- control
- test unit
- digital
- clock
- digital words
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 claims abstract description 87
- 230000005669 field effect Effects 0.000 claims abstract description 7
- 230000001360 synchronised effect Effects 0.000 claims description 6
- 238000000926 separation method Methods 0.000 claims description 4
- 230000004044 response Effects 0.000 abstract description 27
- 230000006870 function Effects 0.000 description 10
- 230000005284 excitation Effects 0.000 description 8
- 238000012544 monitoring process Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 230000008901 benefit Effects 0.000 description 2
- 230000001934 delay Effects 0.000 description 2
- 230000003111 delayed effect Effects 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 230000002457 bidirectional effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 235000015250 liver sausages Nutrition 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005330 resolution (separation) Methods 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- XYSQXZCMOLNHOI-UHFFFAOYSA-N s-[2-[[4-(acetylsulfamoyl)phenyl]carbamoyl]phenyl] 5-pyridin-1-ium-1-ylpentanethioate;bromide Chemical compound [Br-].C1=CC(S(=O)(=O)NC(=O)C)=CC=C1NC(=O)C1=CC=CC=C1SC(=O)CCCC[N+]1=CC=CC=C1 XYSQXZCMOLNHOI-UHFFFAOYSA-N 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/643,746 US4102491A (en) | 1975-12-23 | 1975-12-23 | Variable function digital word generating, receiving and monitoring device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2658611A1 true DE2658611A1 (de) | 1977-07-14 |
Family
ID=24582102
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19762658611 Pending DE2658611A1 (de) | 1975-12-23 | 1976-12-23 | Vorrichtung zur erzeugung und zum empfang von digitalwoertern |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4102491A (https=) |
| DE (1) | DE2658611A1 (https=) |
| FR (1) | FR2336738A1 (https=) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
| USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
| US4236246A (en) * | 1978-11-03 | 1980-11-25 | Genrad, Inc. | Method of and apparatus for testing electronic circuit assemblies and the like |
| US4404627A (en) * | 1979-05-11 | 1983-09-13 | Rca Corporation | Interrupt signal generating means for data processor |
| US4335457A (en) * | 1980-08-08 | 1982-06-15 | Fairchild Camera & Instrument Corp. | Method for semiconductor memory testing |
| FR2506045A1 (fr) * | 1981-05-15 | 1982-11-19 | Thomson Csf | Procede et dispositif de selection de circuits integres a haute fiabilite |
| JPS58158566A (ja) * | 1982-03-17 | 1983-09-20 | Hitachi Ltd | 検査装置 |
| US4570262A (en) * | 1983-06-22 | 1986-02-11 | The Boeing Company | Programmable universal logic driver |
| US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
| US4727312A (en) * | 1985-12-23 | 1988-02-23 | Genrad, Inc. | Circuit tester |
| US4791312A (en) * | 1987-06-08 | 1988-12-13 | Grumman Aerospace Corporation | Programmable level shifting interface device |
| US4855681A (en) * | 1987-06-08 | 1989-08-08 | International Business Machines Corporation | Timing generator for generating a multiplicty of timing signals having selectable pulse positions |
| US4814638A (en) * | 1987-06-08 | 1989-03-21 | Grumman Aerospace Corporation | High speed digital driver with selectable level shifter |
| DE3832378C1 (https=) * | 1988-09-23 | 1989-12-07 | Eurosil Electronic Gmbh, 8057 Eching, De | |
| US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
| US5369593A (en) * | 1989-05-31 | 1994-11-29 | Synopsys Inc. | System for and method of connecting a hardware modeling element to a hardware modeling system |
| US5103169A (en) * | 1989-11-15 | 1992-04-07 | Texas Instruments Incorporated | Relayless interconnections in high performance signal paths |
| JP2608167B2 (ja) * | 1990-08-21 | 1997-05-07 | 三菱電機株式会社 | Ｉｃテスタ |
| JP2608168B2 (ja) * | 1990-08-31 | 1997-05-07 | 三菱電機株式会社 | 半導体試験装置 |
| US5225772A (en) * | 1990-09-05 | 1993-07-06 | Schlumberger Technologies, Inc. | Automatic test equipment system using pin slice architecture |
| US5212443A (en) * | 1990-09-05 | 1993-05-18 | Schlumberger Technologies, Inc. | Event sequencer for automatic test equipment |
| US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
| US5673295A (en) * | 1995-04-13 | 1997-09-30 | Synopsis, Incorporated | Method and apparatus for generating and synchronizing a plurality of digital signals |
| AUPN687095A0 (en) * | 1995-11-30 | 1995-12-21 | South East Queensland Electricity Corporation | A switching selection device |
| US8295182B2 (en) * | 2007-07-03 | 2012-10-23 | Credence Systems Corporation | Routed event test system and method |
| US8356200B2 (en) | 2008-09-26 | 2013-01-15 | Apple Inc. | Negotiation between multiple processing units for switch mitigation |
| US8300056B2 (en) | 2008-10-13 | 2012-10-30 | Apple Inc. | Seamless display migration |
| CN101727801B (zh) * | 2008-10-31 | 2012-04-11 | 扬智科技股份有限公司 | 用共享接脚控制显示模块及第一电路模块运作的集成电路 |
| US20100164966A1 (en) * | 2008-12-31 | 2010-07-01 | Apple Inc. | Timing controller for graphics system |
| US9542914B2 (en) * | 2008-12-31 | 2017-01-10 | Apple Inc. | Display system with improved graphics abilities while switching graphics processing units |
| US8508538B2 (en) * | 2008-12-31 | 2013-08-13 | Apple Inc. | Timing controller capable of switching between graphics processing units |
| US8648868B2 (en) * | 2010-01-06 | 2014-02-11 | Apple Inc. | Color correction to facilitate switching between graphics-processing units |
| US8797334B2 (en) * | 2010-01-06 | 2014-08-05 | Apple Inc. | Facilitating efficient switching between graphics-processing units |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3764995A (en) * | 1971-12-21 | 1973-10-09 | Prd Electronics Inc | Programmable test systems |
| US3832535A (en) * | 1972-10-25 | 1974-08-27 | Instrumentation Engineering | Digital word generating and receiving apparatus |
| US3920973A (en) * | 1973-01-09 | 1975-11-18 | Westinghouse Electric Corp | Method and system for testing signal transmission paths |
| US3916306A (en) * | 1973-09-06 | 1975-10-28 | Ibm | Method and apparatus for testing high circuit density devices |
| US3922537A (en) * | 1974-09-26 | 1975-11-25 | Instrumentation Engineering | Multiplex device for automatic test equipment |
| US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
-
1975
- 1975-12-23 US US05/643,746 patent/US4102491A/en not_active Expired - Lifetime
-
1976
- 1976-12-23 DE DE19762658611 patent/DE2658611A1/de active Pending
- 1976-12-23 FR FR7638964A patent/FR2336738A1/fr active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| FR2336738B3 (https=) | 1979-08-31 |
| FR2336738A1 (fr) | 1977-07-22 |
| US4102491A (en) | 1978-07-25 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| DE2658611A1 (de) | Vorrichtung zur erzeugung und zum empfang von digitalwoertern | |
| DE69030015T2 (de) | Verfahren und Vorrichtung zur Prüfung von integrierten Schaltungen mit zahlreichen Anschlüssen | |
| DE68924744T2 (de) | Kontaktstiftelektronik-Einrichtung mit Phasenjustierung für einen IC-Tester und Verfahren zur Phasenjustierung. | |
| DE2439577C2 (de) | Verfahren zum Prüfen von hochintegrierten logischen Schaltungen und Einrichtung zur Durchführung des Verfahrens | |
| DE69100204T2 (de) | Einrichtung zur Erzeugung von Testsignalen. | |
| DE2340547B2 (de) | Schaltungsanordnung zum testen logischer schaltungen | |
| DE3702408C2 (https=) | ||
| EP0009572A2 (de) | Verfahren und Anordnung zur Prüfung von durch monolithisch integrierte Halbleiterschaltungen dargestellten sequentiellen Schaltungen | |
| DE2639323A1 (de) | System zur fehleranalysierung bei gedruckten schaltungsplatinen | |
| DE2555828A1 (de) | Anordnung zur ueberwachung und anzeige einer mehrzahl von mit prioritaeten versehenen parametern | |
| DE102007044131A1 (de) | Speichersteuerung, Speicherschaltung und Speichersystem mit einer Speichersteuerung und einer Speicherschaltung | |
| DE3725821C2 (https=) | ||
| DE69028498T2 (de) | Datenübertragungssystem und -verfahren | |
| DE3689414T2 (de) | Automatisches Prüfsystem mit "wahrem Prüfer-per-Anschluss" -Architektur. | |
| DE3587620T2 (de) | Logikanalysator. | |
| DE2433885C3 (de) | Vorrichtung zum Synchronisieren der Eingansschaltung eines elektronischen Testinstruments auf zu prüfende Signalfolgen | |
| DE2746743C2 (de) | Verfahren und Anordnung zur computergesteuerten Erzeugung von Impulsintervallen | |
| DE112004000601T5 (de) | Ereignisbasiertes Prüfverfahren zur Beseitigung taktbezogener Fehler in integrierten Schaltkreisen | |
| DE69606988T2 (de) | Verfahren und vorrichtung zur parallelen automatischen prüfung von elektronischen schaltungen | |
| WO2011006757A1 (de) | Vorrichtung und verfahren zum messen und/oder erzeugen von elektrischen grössen | |
| DE69122001T2 (de) | Integrierte Schaltung mit einer Standardzelle, einer Anwendungszelle und einer Prüfzelle | |
| DE19514814A1 (de) | Übertragungsvorrichtung und Übertragungsverfahren für Kalibrierungsdaten eines Halbleiter-Testgeräts | |
| DE102004010783A1 (de) | Verfahren und Schaltungsanordnung zum Testen elektrischer Bausteine | |
| DE2242279C3 (de) | Schaltungsanordnung zur Ermittlung von Fehlern in einer Speichereinheit eines programmgesteuerten Datenvermittlungssystems | |
| EP1020733B1 (de) | Integrierte Halbleiterschaltung zur Funktionsüberprüfung von Pad-Zellen |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OHJ | Non-payment of the annual fee |