FR2336738A1 - Dispositif de formation de reception et d'essais de mots numeriques a fonction variable - Google Patents
Dispositif de formation de reception et d'essais de mots numeriques a fonction variableInfo
- Publication number
- FR2336738A1 FR2336738A1 FR7638964A FR7638964A FR2336738A1 FR 2336738 A1 FR2336738 A1 FR 2336738A1 FR 7638964 A FR7638964 A FR 7638964A FR 7638964 A FR7638964 A FR 7638964A FR 2336738 A1 FR2336738 A1 FR 2336738A1
- Authority
- FR
- France
- Prior art keywords
- under test
- unit under
- digital words
- pins
- receive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US05/643,746 US4102491A (en) | 1975-12-23 | 1975-12-23 | Variable function digital word generating, receiving and monitoring device |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2336738A1 true FR2336738A1 (fr) | 1977-07-22 |
FR2336738B3 FR2336738B3 (fr) | 1979-08-31 |
Family
ID=24582102
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7638964A Granted FR2336738A1 (fr) | 1975-12-23 | 1976-12-23 | Dispositif de formation de reception et d'essais de mots numeriques a fonction variable |
Country Status (3)
Country | Link |
---|---|
US (1) | US4102491A (fr) |
DE (1) | DE2658611A1 (fr) |
FR (1) | FR2336738A1 (fr) |
Families Citing this family (33)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USRE31828E (en) * | 1978-05-05 | 1985-02-05 | Zehntel, Inc. | In-circuit digital tester |
US4216539A (en) * | 1978-05-05 | 1980-08-05 | Zehntel, Inc. | In-circuit digital tester |
US4236246A (en) * | 1978-11-03 | 1980-11-25 | Genrad, Inc. | Method of and apparatus for testing electronic circuit assemblies and the like |
US4404627A (en) * | 1979-05-11 | 1983-09-13 | Rca Corporation | Interrupt signal generating means for data processor |
US4335457A (en) * | 1980-08-08 | 1982-06-15 | Fairchild Camera & Instrument Corp. | Method for semiconductor memory testing |
FR2506045A1 (fr) * | 1981-05-15 | 1982-11-19 | Thomson Csf | Procede et dispositif de selection de circuits integres a haute fiabilite |
JPS58158566A (ja) * | 1982-03-17 | 1983-09-20 | Hitachi Ltd | 検査装置 |
US4570262A (en) * | 1983-06-22 | 1986-02-11 | The Boeing Company | Programmable universal logic driver |
US4656632A (en) * | 1983-11-25 | 1987-04-07 | Giordano Associates, Inc. | System for automatic testing of circuits and systems |
US4727312A (en) * | 1985-12-23 | 1988-02-23 | Genrad, Inc. | Circuit tester |
US4814638A (en) * | 1987-06-08 | 1989-03-21 | Grumman Aerospace Corporation | High speed digital driver with selectable level shifter |
US4855681A (en) * | 1987-06-08 | 1989-08-08 | International Business Machines Corporation | Timing generator for generating a multiplicty of timing signals having selectable pulse positions |
US4791312A (en) * | 1987-06-08 | 1988-12-13 | Grumman Aerospace Corporation | Programmable level shifting interface device |
DE3832378C1 (fr) * | 1988-09-23 | 1989-12-07 | Eurosil Electronic Gmbh, 8057 Eching, De | |
US5369593A (en) * | 1989-05-31 | 1994-11-29 | Synopsys Inc. | System for and method of connecting a hardware modeling element to a hardware modeling system |
US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
US5103169A (en) * | 1989-11-15 | 1992-04-07 | Texas Instruments Incorporated | Relayless interconnections in high performance signal paths |
JP2608167B2 (ja) * | 1990-08-21 | 1997-05-07 | 三菱電機株式会社 | Icテスタ |
JP2608168B2 (ja) * | 1990-08-31 | 1997-05-07 | 三菱電機株式会社 | 半導体試験装置 |
US5225772A (en) * | 1990-09-05 | 1993-07-06 | Schlumberger Technologies, Inc. | Automatic test equipment system using pin slice architecture |
US5212443A (en) * | 1990-09-05 | 1993-05-18 | Schlumberger Technologies, Inc. | Event sequencer for automatic test equipment |
US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
US5673295A (en) * | 1995-04-13 | 1997-09-30 | Synopsis, Incorporated | Method and apparatus for generating and synchronizing a plurality of digital signals |
AUPN687095A0 (en) * | 1995-11-30 | 1995-12-21 | South East Queensland Electricity Corporation | A switching selection device |
US8295182B2 (en) * | 2007-07-03 | 2012-10-23 | Credence Systems Corporation | Routed event test system and method |
US8356200B2 (en) * | 2008-09-26 | 2013-01-15 | Apple Inc. | Negotiation between multiple processing units for switch mitigation |
US8300056B2 (en) | 2008-10-13 | 2012-10-30 | Apple Inc. | Seamless display migration |
CN101727801B (zh) * | 2008-10-31 | 2012-04-11 | 扬智科技股份有限公司 | 用共享接脚控制显示模块及第一电路模块运作的集成电路 |
US20100164966A1 (en) * | 2008-12-31 | 2010-07-01 | Apple Inc. | Timing controller for graphics system |
US9542914B2 (en) * | 2008-12-31 | 2017-01-10 | Apple Inc. | Display system with improved graphics abilities while switching graphics processing units |
US8508538B2 (en) * | 2008-12-31 | 2013-08-13 | Apple Inc. | Timing controller capable of switching between graphics processing units |
US8648868B2 (en) * | 2010-01-06 | 2014-02-11 | Apple Inc. | Color correction to facilitate switching between graphics-processing units |
US8797334B2 (en) * | 2010-01-06 | 2014-08-05 | Apple Inc. | Facilitating efficient switching between graphics-processing units |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3764995A (en) * | 1971-12-21 | 1973-10-09 | Prd Electronics Inc | Programmable test systems |
US3832535A (en) * | 1972-10-25 | 1974-08-27 | Instrumentation Engineering | Digital word generating and receiving apparatus |
US3920973A (en) * | 1973-01-09 | 1975-11-18 | Westinghouse Electric Corp | Method and system for testing signal transmission paths |
US3916306A (en) * | 1973-09-06 | 1975-10-28 | Ibm | Method and apparatus for testing high circuit density devices |
US3922537A (en) * | 1974-09-26 | 1975-11-25 | Instrumentation Engineering | Multiplex device for automatic test equipment |
US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
-
1975
- 1975-12-23 US US05/643,746 patent/US4102491A/en not_active Expired - Lifetime
-
1976
- 1976-12-23 DE DE19762658611 patent/DE2658611A1/de active Pending
- 1976-12-23 FR FR7638964A patent/FR2336738A1/fr active Granted
Also Published As
Publication number | Publication date |
---|---|
FR2336738B3 (fr) | 1979-08-31 |
US4102491A (en) | 1978-07-25 |
DE2658611A1 (de) | 1977-07-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
FR2336738A1 (fr) | Dispositif de formation de reception et d'essais de mots numeriques a fonction variable | |
ES485464A1 (es) | Perfeccionamientos en dispositivos de comprobacion para in- dicar una tension electrica y- su polaridad. | |
DK549776A (da) | Fremgangmsade og apparat til udtagning af prover til analyse | |
FR2523791B1 (fr) | Dispositif et appareil de test d'equipements electroniques notamment de television | |
BE838997A (fr) | Procede et dispositif d'analyse | |
ES2042014T3 (es) | Metodo de ensayar componentes de un aparato de deposicion de gotitas por impulso. | |
DK570785A (da) | Fremgangsmaade til styring af et elektrokirurgisk apparat og apparat til udoevelse af fremgangsmaaden | |
DK171877A (da) | Fremgangsmade til analyse af flydende emner og apparat dertil | |
FR2456402A1 (fr) | Dispositif de connexion pour circuits imprimes radio-frequence sur tableaux de chant | |
DK363178A (da) | Fremgangsmaade til at behandle et som billede eksponeret straden alingsfoelsomt organ og apparat til udoevelse af fremgangsmaa | |
GB2129571B (en) | Method and apparatus for synthesizing a drive signal for active ic testing | |
FR2312802A1 (fr) | Copieur photographique muni d'un dispositif d'analyse qui fournit des signaux electriques representatifs d'un original et d'un poste d'exposition exploitant ces signaux | |
SE7706322L (sv) | Syntetisk provkopplingsanordning | |
JPS52122446A (en) | Circuit tester | |
ATE228251T1 (de) | Phasenprüfgerät | |
NL7801799A (nl) | Tandheelkundig leer- en oefentoestel. | |
JPS5710467A (en) | Terminal device for testing appliance | |
DK5478A (da) | Tastatur til indfoering af data i et elektrisk apparat | |
JPS5315779A (en) | Method of operating charge coupled device and input circuit | |
FR2330231A1 (fr) | Dispositif d'analyse electrique d'une image | |
KARNOPP | Multiple energy domain systems | |
SU612277A1 (ru) | Устройство дл обучени и контрол знаний учащихс | |
Sabah et al. | A function generator for neurophysiological applications | |
DK490176A (da) | Fremgangsmade og apparat til maling og regulering af ohm-verdien af en impedans | |
FR2318469A1 (fr) | Appareil a dessiner des circuits hydrauliques |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |