DE2604471C2 - Interferometrische Einrichtung - Google Patents
Interferometrische EinrichtungInfo
- Publication number
- DE2604471C2 DE2604471C2 DE2604471A DE2604471A DE2604471C2 DE 2604471 C2 DE2604471 C2 DE 2604471C2 DE 2604471 A DE2604471 A DE 2604471A DE 2604471 A DE2604471 A DE 2604471A DE 2604471 C2 DE2604471 C2 DE 2604471C2
- Authority
- DE
- Germany
- Prior art keywords
- optical path
- path difference
- spectrum
- birefringent
- difference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000003287 optical effect Effects 0.000 claims description 26
- 239000007789 gas Substances 0.000 claims description 13
- 230000000737 periodic effect Effects 0.000 claims description 8
- 238000000862 absorption spectrum Methods 0.000 claims description 7
- 238000010521 absorption reaction Methods 0.000 claims description 4
- 239000000126 substance Substances 0.000 claims description 4
- 230000005855 radiation Effects 0.000 claims description 2
- 238000001228 spectrum Methods 0.000 claims 7
- 238000011835 investigation Methods 0.000 claims 2
- 241000196324 Embryophyta Species 0.000 claims 1
- 238000001514 detection method Methods 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 claims 1
- 230000002452 interceptive effect Effects 0.000 claims 1
- 230000037361 pathway Effects 0.000 claims 1
- 230000035515 penetration Effects 0.000 claims 1
- 230000004907 flux Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
- G01J3/453—Interferometric spectrometry by correlation of the amplitudes
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Optical Elements Other Than Lenses (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7702902A FR2340540A2 (fr) | 1976-02-05 | 1977-02-02 | Dispositif pour la spectrometrie interferentielle a modulation selective |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR7504264A FR2300998A2 (fr) | 1975-02-11 | 1975-02-11 | Dispositif pour la spectrometrie interferentielle a modulation selective |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2604471A1 DE2604471A1 (de) | 1976-08-26 |
| DE2604471C2 true DE2604471C2 (de) | 1986-07-24 |
Family
ID=9151077
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2604471A Expired DE2604471C2 (de) | 1975-02-11 | 1976-02-05 | Interferometrische Einrichtung |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4320973A (enExample) |
| DE (1) | DE2604471C2 (enExample) |
| FR (1) | FR2300998A2 (enExample) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2506961A1 (fr) * | 1981-05-27 | 1982-12-03 | Centre Nat Etd Spatiales | Dispositif de spectroscopie et son application a l'observation de la terre depuis un satellite a defilement |
| FR2566532B1 (fr) * | 1984-06-22 | 1986-09-12 | Elf France | Detecteur de gaz par interferometrie |
| FR2581190B1 (fr) * | 1985-04-25 | 1987-06-19 | Elf France | Detecteur interferometrique de gaz |
| FR2595820B1 (fr) * | 1986-03-13 | 1990-01-05 | Bertin & Cie | Dispositif a fibres optiques pour la detection a distance d'une grandeur physique, en particulier de la temperature |
| JPS62251627A (ja) * | 1986-04-25 | 1987-11-02 | Hitachi Ltd | 偏光干渉計 |
| DE3812334A1 (de) * | 1988-04-14 | 1989-10-26 | Hartmann & Braun Ag | Interferometrische einrichtung |
| DE3825683C1 (enExample) * | 1988-07-28 | 1989-12-28 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch, De | |
| FR2641074B1 (enExample) * | 1988-12-23 | 1991-02-22 | Elf Aquitaine | |
| WO1990010191A1 (de) * | 1989-03-03 | 1990-09-07 | Bühler AG | Polarisationsinterferometer |
| US5225926A (en) * | 1991-09-04 | 1993-07-06 | International Business Machines Corporation | Durable optical elements fabricated from free standing polycrystalline diamond and non-hydrogenated amorphous diamond like carbon (dlc) thin films |
| GB2294778B (en) * | 1993-07-10 | 1997-10-22 | Siemens Plc | Fourier transform spectrometer with birefringent component between polarisers |
| GB9314302D0 (en) * | 1993-07-10 | 1993-08-25 | Univ Court Of The University O | Improved spectrometer |
| US5469259A (en) * | 1994-01-03 | 1995-11-21 | International Business Machines Corporation | Inspection interferometer with scanning autofocus, and phase angle control features |
| EP0815432A1 (en) * | 1995-03-21 | 1998-01-07 | Sci-Tec Instruments Inc. | Optical correlation gas analyzer |
| GB2305257B (en) * | 1995-09-12 | 1999-08-18 | Siemens Plc | Improvements in or relating to spectrometers |
| GB9614363D0 (en) * | 1996-07-09 | 1996-09-04 | Council Cent Lab Res Councils | Optical pulse autocorrelator |
| DK78096A (da) | 1996-07-12 | 1998-01-13 | Foss Electric As | Interferometer |
| US5703684A (en) * | 1996-09-23 | 1997-12-30 | International Business Machines Corporation | Apparatus for optical differential measurement of glide height above a magnetic disk |
| US5926266A (en) * | 1996-09-23 | 1999-07-20 | International Business Machines Corporation | Optical apparatus for rapid defect analysis |
| US5784163A (en) * | 1996-09-23 | 1998-07-21 | International Business Machines Corporation | Optical differential profile measurement apparatus and process |
| AUPO790997A0 (en) * | 1997-07-16 | 1997-08-07 | Australian National University, The | Modulated solid state spectrometer |
| US7253896B1 (en) | 1999-12-02 | 2007-08-07 | Bah Holdings Llc | Filter |
| GB0005069D0 (en) * | 2000-03-02 | 2000-04-26 | Ecolotrol | A controlled interference spectrometer |
| US6618142B1 (en) | 2001-06-26 | 2003-09-09 | The United States Of America As Represented By The Secretary Of The Navy | Compact birefringent spectrometer |
| GB0215248D0 (en) * | 2002-07-02 | 2002-08-14 | Qinetiq Ltd | Imaging apparatus |
| US10048192B2 (en) * | 2014-12-18 | 2018-08-14 | Palo Alto Research Center Incorporated | Obtaining spectral information from moving objects |
| US10302494B2 (en) | 2014-12-18 | 2019-05-28 | Palo Alto Research Center Incorporated | Obtaining spectral information from a moving object |
| JP2017125834A (ja) * | 2015-11-11 | 2017-07-20 | 富士電機株式会社 | 分光装置及び分光方法 |
| WO2017172324A1 (en) * | 2016-03-29 | 2017-10-05 | Applied Materials, Inc. | Metrology systems for substrate stress and deformation measurement |
| CN106289527B (zh) * | 2016-08-03 | 2017-12-12 | 南京理工大学 | 一种基于偏振干涉的高光谱成像装置及其成像方法 |
| CN107941329B (zh) * | 2017-10-13 | 2019-12-27 | 华东师范大学 | 一种高阶干涉仪 |
| CN109781260B (zh) * | 2019-02-19 | 2020-04-28 | 西安交通大学 | 超紧凑型快照式偏振光谱成像探测装置及探测方法 |
| CN112596144A (zh) * | 2020-12-15 | 2021-04-02 | 山东大学 | 基于溴化亚汞晶体的偏振棱镜/偏振分光棱镜 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3146294A (en) * | 1959-02-13 | 1964-08-25 | American Optical Corp | Interference microscope optical systems |
| US3653765A (en) * | 1970-06-17 | 1972-04-04 | Hewlett Packard Co | Acousto-optic light spectrum analysis |
| JPS54656B1 (enExample) * | 1971-06-18 | 1979-01-13 | ||
| US3868168A (en) * | 1973-01-16 | 1975-02-25 | American Optical Corp | Combination of birefringent elements for polarizing interferential systems |
| FR2216565B1 (enExample) * | 1973-02-06 | 1977-10-28 | Anvar |
-
1975
- 1975-02-11 FR FR7504264A patent/FR2300998A2/fr active Granted
-
1976
- 1976-02-05 DE DE2604471A patent/DE2604471C2/de not_active Expired
-
1979
- 1979-12-11 US US06/102,335 patent/US4320973A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4320973A (en) | 1982-03-23 |
| FR2300998A2 (fr) | 1976-09-10 |
| FR2300998B2 (enExample) | 1977-12-02 |
| DE2604471A1 (de) | 1976-08-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition |