DE2459184A1 - Verfahren zur ermittlung schaedlicher gasbestandteile in gasentladungsbildschirmbauelementen - Google Patents
Verfahren zur ermittlung schaedlicher gasbestandteile in gasentladungsbildschirmbauelementenInfo
- Publication number
- DE2459184A1 DE2459184A1 DE19742459184 DE2459184A DE2459184A1 DE 2459184 A1 DE2459184 A1 DE 2459184A1 DE 19742459184 DE19742459184 DE 19742459184 DE 2459184 A DE2459184 A DE 2459184A DE 2459184 A1 DE2459184 A1 DE 2459184A1
- Authority
- DE
- Germany
- Prior art keywords
- gas
- components
- mixture
- gas discharge
- argon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims description 17
- 239000007789 gas Substances 0.000 claims description 95
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 52
- 239000000203 mixture Substances 0.000 claims description 36
- 229910052786 argon Inorganic materials 0.000 claims description 24
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 claims description 16
- 229910052754 neon Inorganic materials 0.000 claims description 14
- 230000005855 radiation Effects 0.000 claims description 11
- 238000012360 testing method Methods 0.000 claims description 9
- 238000011088 calibration curve Methods 0.000 claims description 3
- 238000001228 spectrum Methods 0.000 claims description 3
- 230000001360 synchronised effect Effects 0.000 claims description 2
- 238000005070 sampling Methods 0.000 claims 1
- 239000007921 spray Substances 0.000 claims 1
- 231100000572 poisoning Toxicity 0.000 description 9
- 230000000607 poisoning effect Effects 0.000 description 9
- 239000002245 particle Substances 0.000 description 7
- 230000005284 excitation Effects 0.000 description 6
- 238000005429 filling process Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000011109 contamination Methods 0.000 description 3
- 229910052743 krypton Inorganic materials 0.000 description 3
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 229910052724 xenon Inorganic materials 0.000 description 3
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 3
- 239000000356 contaminant Substances 0.000 description 2
- 239000003344 environmental pollutant Substances 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 231100000719 pollutant Toxicity 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 239000002699 waste material Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- JXBFBSYDINUVRE-UHFFFAOYSA-N [Ne].[Ar] Chemical compound [Ne].[Ar] JXBFBSYDINUVRE-UHFFFAOYSA-N 0.000 description 1
- 238000003915 air pollution Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000007717 exclusion Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 231100000566 intoxication Toxicity 0.000 description 1
- 230000035987 intoxication Effects 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 230000001473 noxious effect Effects 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/66—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
- G01N21/69—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence specially adapted for fluids, e.g. molten metal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J17/00—Gas-filled discharge tubes with solid cathode
- H01J17/38—Cold-cathode tubes
- H01J17/48—Cold-cathode tubes with more than one cathode or anode, e.g. sequence-discharge tube, counting tube, dekatron
- H01J17/49—Display panels, e.g. with crossed electrodes, e.g. making use of direct current
Landscapes
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Immunology (AREA)
- Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US431812A US3865489A (en) | 1974-01-08 | 1974-01-08 | On-line detection and measurement of contaminating gases during filling of gas display panels |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2459184A1 true DE2459184A1 (de) | 1975-07-10 |
Family
ID=23713528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19742459184 Pending DE2459184A1 (de) | 1974-01-08 | 1974-12-14 | Verfahren zur ermittlung schaedlicher gasbestandteile in gasentladungsbildschirmbauelementen |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3865489A (en, 2012) |
| JP (1) | JPS50107989A (en, 2012) |
| DE (1) | DE2459184A1 (en, 2012) |
| FR (1) | FR2257087B1 (en, 2012) |
| GB (1) | GB1446100A (en, 2012) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0944109B2 (en) † | 1998-03-16 | 2008-02-13 | Matsushita Electric Industrial Co., Ltd. | Discharge lamp and method of producing the same |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5528109A (en) * | 1995-04-19 | 1996-06-18 | Tektronix, Inc. | Addressing structure using ionizable gaseous mixture having decreased decay time |
| TW494433B (en) * | 1995-12-21 | 2002-07-11 | Tektronix Inc | Addressing structure using ionizable gaseous mixtures having multiple ionizable components |
| JP4679389B2 (ja) * | 2006-02-20 | 2011-04-27 | 株式会社日立ハイテクノロジーズ | イオン化エネルギーの低い試料を検出する検出器及び分析装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA568974A (en) * | 1959-01-13 | The British Oxygen Canada Limited | Photoelectric gas impurity detector |
-
1974
- 1974-01-08 US US431812A patent/US3865489A/en not_active Expired - Lifetime
- 1974-11-22 FR FR7441914A patent/FR2257087B1/fr not_active Expired
- 1974-12-14 DE DE19742459184 patent/DE2459184A1/de active Pending
- 1974-12-16 GB GB5419874A patent/GB1446100A/en not_active Expired
-
1975
- 1975-01-08 JP JP50004503A patent/JPS50107989A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0944109B2 (en) † | 1998-03-16 | 2008-02-13 | Matsushita Electric Industrial Co., Ltd. | Discharge lamp and method of producing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| US3865489A (en) | 1975-02-11 |
| FR2257087A1 (en, 2012) | 1975-08-01 |
| JPS50107989A (en, 2012) | 1975-08-25 |
| FR2257087B1 (en, 2012) | 1976-10-22 |
| GB1446100A (en) | 1976-08-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OHJ | Non-payment of the annual fee |