DE2453720A1 - Vorrichtung zur selbsttaetigen driftkorrektur eines messgeraetes - Google Patents

Vorrichtung zur selbsttaetigen driftkorrektur eines messgeraetes

Info

Publication number
DE2453720A1
DE2453720A1 DE19742453720 DE2453720A DE2453720A1 DE 2453720 A1 DE2453720 A1 DE 2453720A1 DE 19742453720 DE19742453720 DE 19742453720 DE 2453720 A DE2453720 A DE 2453720A DE 2453720 A1 DE2453720 A1 DE 2453720A1
Authority
DE
Germany
Prior art keywords
signal
output signal
amplifier arrangement
amplifier
starting point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19742453720
Other languages
German (de)
English (en)
Inventor
Heinz-Dieter Dipl Ing Goeldner
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ABB Training Center GmbH and Co KG
Original Assignee
Hartmann and Braun AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hartmann and Braun AG filed Critical Hartmann and Braun AG
Priority to DE19742453720 priority Critical patent/DE2453720A1/de
Priority to FR7525536A priority patent/FR2291480A1/fr
Priority to GB41454/75A priority patent/GB1523735A/en
Priority to NL7512874A priority patent/NL7512874A/xx
Priority to US05/630,335 priority patent/US4032856A/en
Priority to JP50136759A priority patent/JPS5172388A/ja
Publication of DE2453720A1 publication Critical patent/DE2453720A1/de
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03G—CONTROL OF AMPLIFICATION
    • H03G3/00—Gain control in amplifiers or frequency changers
    • H03G3/20—Automatic control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration
    • G01D18/006—Intermittent recalibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0006—Calibrating gas analysers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R17/00—Measuring arrangements involving comparison with a reference value, e.g. bridge
    • G01R17/02—Arrangements in which the value to be measured is automatically compared with a reference value

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Combustion & Propulsion (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE19742453720 1974-11-13 1974-11-13 Vorrichtung zur selbsttaetigen driftkorrektur eines messgeraetes Ceased DE2453720A1 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE19742453720 DE2453720A1 (de) 1974-11-13 1974-11-13 Vorrichtung zur selbsttaetigen driftkorrektur eines messgeraetes
FR7525536A FR2291480A1 (fr) 1974-11-13 1975-08-18 Dispositif pour corriger automatiquement le decalage d'un appareil de mesure
GB41454/75A GB1523735A (en) 1974-11-13 1975-10-09 Arrangement for calibrating gas analyser measuring circuits
NL7512874A NL7512874A (nl) 1974-11-13 1975-11-03 Inrichting voor het automatisch corrigeren van de drift in een meetapparaat.
US05/630,335 US4032856A (en) 1974-11-13 1975-11-10 Drift compensated amplifier, particularly for measuring signals
JP50136759A JPS5172388A (enExample) 1974-11-13 1975-11-13

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19742453720 DE2453720A1 (de) 1974-11-13 1974-11-13 Vorrichtung zur selbsttaetigen driftkorrektur eines messgeraetes

Publications (1)

Publication Number Publication Date
DE2453720A1 true DE2453720A1 (de) 1976-05-20

Family

ID=5930673

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19742453720 Ceased DE2453720A1 (de) 1974-11-13 1974-11-13 Vorrichtung zur selbsttaetigen driftkorrektur eines messgeraetes

Country Status (6)

Country Link
US (1) US4032856A (enExample)
JP (1) JPS5172388A (enExample)
DE (1) DE2453720A1 (enExample)
FR (1) FR2291480A1 (enExample)
GB (1) GB1523735A (enExample)
NL (1) NL7512874A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3150013A1 (de) * 1981-12-17 1983-06-23 Datron-Electronic Pichl & Schulte KG, 6109 Mühltal "verfahren und vorrichtung zur automatisierten justierung (eichung) von messgeraeten und wandlern pysikalischer eingangsgroessen"

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4151738A (en) * 1977-11-03 1979-05-01 General Electric Company Toxic gas monitor having automatic calibration
DE3115404A1 (de) * 1981-04-16 1982-11-11 Robert Bosch Gmbh, 7000 Stuttgart Verfahren und vorrichtung zur ueberwachung und kalibrierung von grenzstromsonden
US4447780A (en) * 1981-10-28 1984-05-08 The Babcock & Wilcox Company Linearizing circuit and method of calibrating same
JPS5885338U (ja) * 1981-12-07 1983-06-09 株式会社日立製作所 自動焦点装置
JPH057568Y2 (enExample) * 1985-11-27 1993-02-25
US4770026A (en) * 1987-01-15 1988-09-13 Alcotek, Inc. Method of and apparatus for testing breath alcohol
JP4277599B2 (ja) * 2003-07-14 2009-06-10 ヤマハ株式会社 オフセット補正方法、オフセット補正回路及び電子ボリューム

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3441863A (en) * 1965-08-02 1969-04-29 Tektronix Inc Drift compensated direct coupled amplifier circuit having adjustable d.c. output voltage level
US3504521A (en) * 1966-10-25 1970-04-07 Centre Nat Rech Metall Method and device for the continuous analysis of the composition of a gas

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3150013A1 (de) * 1981-12-17 1983-06-23 Datron-Electronic Pichl & Schulte KG, 6109 Mühltal "verfahren und vorrichtung zur automatisierten justierung (eichung) von messgeraeten und wandlern pysikalischer eingangsgroessen"

Also Published As

Publication number Publication date
FR2291480A1 (fr) 1976-06-11
US4032856A (en) 1977-06-28
JPS5172388A (enExample) 1976-06-23
FR2291480B1 (enExample) 1980-08-08
GB1523735A (en) 1978-09-06
NL7512874A (nl) 1976-05-17

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