DE2362935A1 - Anordnung zur ueberwachung der luftverunreinigung - Google Patents
Anordnung zur ueberwachung der luftverunreinigungInfo
- Publication number
- DE2362935A1 DE2362935A1 DE2362935A DE2362935A DE2362935A1 DE 2362935 A1 DE2362935 A1 DE 2362935A1 DE 2362935 A DE2362935 A DE 2362935A DE 2362935 A DE2362935 A DE 2362935A DE 2362935 A1 DE2362935 A1 DE 2362935A1
- Authority
- DE
- Germany
- Prior art keywords
- light
- sample
- path
- detector
- absorption
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012544 monitoring process Methods 0.000 title claims description 14
- 238000003915 air pollution Methods 0.000 title claims description 4
- 238000010521 absorption reaction Methods 0.000 claims description 28
- 239000000356 contaminant Substances 0.000 claims description 15
- 238000012545 processing Methods 0.000 claims description 13
- 230000005855 radiation Effects 0.000 claims description 8
- 230000031700 light absorption Effects 0.000 claims description 5
- 239000002245 particle Substances 0.000 claims description 5
- 238000012937 correction Methods 0.000 claims description 3
- 230000002452 interceptive effect Effects 0.000 claims 1
- 238000000034 method Methods 0.000 description 10
- 230000002596 correlated effect Effects 0.000 description 7
- 238000011109 contamination Methods 0.000 description 6
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 5
- 239000012535 impurity Substances 0.000 description 5
- RAHZWNYVWXNFOC-UHFFFAOYSA-N Sulphur dioxide Chemical compound O=S=O RAHZWNYVWXNFOC-UHFFFAOYSA-N 0.000 description 4
- 239000003344 environmental pollutant Substances 0.000 description 4
- 231100000719 pollutant Toxicity 0.000 description 4
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 4
- 238000000149 argon plasma sintering Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000035945 sensitivity Effects 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- ODUCDPQEXGNKDN-UHFFFAOYSA-N Nitrogen oxide(NO) Natural products O=N ODUCDPQEXGNKDN-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 2
- 229910002091 carbon monoxide Inorganic materials 0.000 description 2
- 238000013016 damping Methods 0.000 description 2
- 238000012806 monitoring device Methods 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- AKEJUJNQAAGONA-UHFFFAOYSA-N sulfur trioxide Chemical compound O=S(=O)=O AKEJUJNQAAGONA-UHFFFAOYSA-N 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 229910000661 Mercury cadmium telluride Inorganic materials 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- MCMSPRNYOJJPIZ-UHFFFAOYSA-N cadmium;mercury;tellurium Chemical compound [Cd]=[Te]=[Hg] MCMSPRNYOJJPIZ-UHFFFAOYSA-N 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 229910052745 lead Inorganic materials 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000037361 pathway Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US00320401A US3805074A (en) | 1973-01-02 | 1973-01-02 | Spectral scan air monitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2362935A1 true DE2362935A1 (de) | 1974-07-04 |
Family
ID=23246254
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2362935A Pending DE2362935A1 (de) | 1973-01-02 | 1973-12-18 | Anordnung zur ueberwachung der luftverunreinigung |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US3805074A (enExample) |
| JP (1) | JPS4999082A (enExample) |
| CA (1) | CA1011129A (enExample) |
| DE (1) | DE2362935A1 (enExample) |
| FR (1) | FR2212927A5 (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0094374A1 (de) * | 1982-05-06 | 1983-11-16 | AVL Gesellschaft für Verbrennungskraftmaschinen und Messtechnik mbH.Prof.Dr.Dr.h.c. Hans List | Verfahren zur kontinuierlichen Messung der Masse von Aerosolteilchen in gasförmigen Proben sowie Vorrichtung zur Durchführung des Verfahrens |
| US4849637A (en) * | 1986-10-04 | 1989-07-18 | Kernforschungszentrum Karlsruhe Gmbh | Method and apparatus for continuously measuring the concentration of a gas component |
| DE3806385A1 (de) * | 1988-02-29 | 1989-09-07 | Feldmuehle Ag | Verfahren und vorrichtung zum pruefen von transparenten bahnen |
| DE10202918C1 (de) * | 2002-01-25 | 2003-10-16 | Siemens Ag | Gassensor |
Families Citing this family (49)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3891848A (en) * | 1973-12-27 | 1975-06-24 | Nasa | Fluorescence detector for monitoring atmospheric pollutants |
| US3935459A (en) * | 1974-06-24 | 1976-01-27 | Sun Electric Corporation | Apparatus and method of automatically zeroing an exhaust emission analyzer |
| DE2438294B2 (de) * | 1974-08-09 | 1977-05-18 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Infrarotgasanalysator |
| US3943368A (en) * | 1974-10-15 | 1976-03-09 | The United States Of America As Represented By The United States National Aeronautics And Space Administration Office Of General Counsel-Code Gp | Method and apparatus for compensating reflection losses in a path length modulated absorption-absorption trace gas detector |
| US3911276A (en) * | 1974-10-18 | 1975-10-07 | Diax Corp | Laser spectroscopy |
| JPS5937767B2 (ja) * | 1977-04-20 | 1984-09-12 | オリンパス光学工業株式会社 | 測光装置 |
| US4176959A (en) * | 1978-04-17 | 1979-12-04 | Raytheon Company | High gain laser spectrometer |
| NL213983A (enExample) * | 1978-11-29 | |||
| US4442349A (en) * | 1980-09-15 | 1984-04-10 | Baird Corporation | Circuitry for the generation and synchronous detection of optical pulsed signals |
| US4410273A (en) * | 1981-03-09 | 1983-10-18 | Laser Analytics, Inc. | Scanning laser spectrometer |
| US4509130A (en) * | 1982-06-03 | 1985-04-02 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Digital control of diode laser for atmospheric spectroscopy |
| AT379452B (de) * | 1983-04-21 | 1986-01-10 | Avl Verbrennungskraft Messtech | Verfahren zur bestimmung der massen von absorbierenden anteilen einer probe und vorrichtung zur durchfuehrung des verfahrens |
| DE3339348A1 (de) * | 1983-10-29 | 1985-05-09 | Meditec GmbH, 8501 Heroldsberg | Neodym-yag-laser mit passivem mode-locking |
| JPS61202128A (ja) * | 1985-03-06 | 1986-09-06 | Hitachi Ltd | 半導体レ−ザヘテロダイン干渉計 |
| US4722090A (en) * | 1985-03-18 | 1988-01-26 | Mitsubishi Denki Kabushiki Kaisha | Excimer laser equipment |
| DE3510052A1 (de) * | 1985-03-20 | 1986-09-25 | Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe | Verfahren und prozessphotometer zur kontinuierlichen messung von konzentrationen |
| EP0344461B1 (de) * | 1988-06-01 | 1994-10-12 | Hartmann & Braun Aktiengesellschaft | Kalibriereinrichtung für ein nichtdispersives Infrarot-Fotometer |
| US5340987A (en) * | 1991-03-15 | 1994-08-23 | Li-Cor, Inc. | Apparatus and method for analyzing gas |
| DE4110095C2 (de) * | 1991-03-27 | 1998-02-12 | Draegerwerk Ag | Verfahren zur gasspektroskopischen Messung der Konzentration eines Gasbestandteiles |
| DE4122572A1 (de) * | 1991-07-08 | 1993-01-14 | Draegerwerk Ag | Verfahren zum betrieb einer laserdiode |
| US5317156A (en) * | 1992-01-29 | 1994-05-31 | Sri International | Diagnostic tests using near-infrared laser absorption spectroscopy |
| DE4300853C2 (de) * | 1993-01-15 | 2003-09-04 | Daimler Chrysler Ag | Verfahren zur spektroskopischen Bestimmung des Stickstoffoxidgehalts |
| DE4320036C2 (de) * | 1993-06-17 | 1997-02-13 | Fraunhofer Ges Forschung | Verfahren und Anordnung zur Driftkorrektur zeitdiskreter Meßsignale bezogen auf ein Referenzsignal, insbesondere in der absorptionsspektroskopischen Spurengasanalytik |
| US5464983A (en) * | 1994-04-05 | 1995-11-07 | Industrial Scientific Corporation | Method and apparatus for determining the concentration of a gas |
| FR2733319B1 (fr) * | 1995-04-21 | 1997-05-23 | Air Liquide | Procede et dispositif d'analyse de traces d'impuretes dans un echantillon de gaz au moyen d'une diode laser |
| US6091504A (en) * | 1998-05-21 | 2000-07-18 | Square One Technology, Inc. | Method and apparatus for measuring gas concentration using a semiconductor laser |
| EP1070956A1 (en) * | 1999-07-23 | 2001-01-24 | Datex-Ohmeda, Inc. | Method and apparatus for monitoring maintenance of calibration condition in respiratory gas spectrometer |
| EP1706726A4 (en) * | 2004-01-16 | 2008-03-12 | Commw Scient Ind Res Org | Sulphur dioxide detection method |
| GB2412430A (en) * | 2004-03-24 | 2005-09-28 | Lee Paul Richman | Hazardous gas detector |
| ATE378580T1 (de) * | 2004-03-09 | 2007-11-15 | Senscient Ltd | Gasnachweis |
| WO2007060045A1 (en) * | 2005-11-25 | 2007-05-31 | Foss Analytical Ab | Optical analyzer |
| US8264689B1 (en) * | 2008-12-22 | 2012-09-11 | ISC8 Inc. | Micro gas cell array device and method |
| EP2604999A1 (de) | 2011-12-15 | 2013-06-19 | Mettler-Toledo AG | Gasmessgerät |
| EP2947450B1 (de) * | 2014-05-19 | 2016-09-28 | Sick Ag | Messgerät zur Messung einer bestimmten Gaskomponente |
| US9501827B2 (en) | 2014-06-23 | 2016-11-22 | Exxonmobil Upstream Research Company | Methods and systems for detecting a chemical species |
| WO2015199913A1 (en) | 2014-06-23 | 2015-12-30 | Exxonmobil Upstream Research Company | Systems for detecting a chemical species and use thereof |
| US9442011B2 (en) | 2014-06-23 | 2016-09-13 | Exxonmobil Upstream Research Company | Methods for calibrating a multiple detector system |
| WO2015199912A1 (en) | 2014-06-23 | 2015-12-30 | Exxonmobil Upstream Research Company | Image quality enhancement of a differential image for a multiple detector system |
| AU2015374335B2 (en) | 2014-12-23 | 2018-03-29 | Apple Inc. | Optical inspection system and method including accounting for variations of optical path length within a sample |
| EP3054280B1 (de) * | 2015-02-04 | 2026-04-08 | Axetris AG | Optisches Messgerät und Verfahren zur Gasdetektion |
| CN108449957B (zh) * | 2015-09-01 | 2021-03-09 | 苹果公司 | 用于非接触式感测物质的基准开关架构 |
| US10690591B2 (en) | 2015-09-18 | 2020-06-23 | Apple Inc. | Measurement time distribution in referencing schemes |
| CN109073460B (zh) | 2016-04-21 | 2022-08-23 | 苹果公司 | 用于参考切换的光学系统 |
| WO2017184423A1 (en) | 2016-04-21 | 2017-10-26 | Bribbla Dynamics Llc | Multiplexing and encoding for reference switching |
| EP3688446A2 (en) | 2017-09-29 | 2020-08-05 | Apple Inc. | Resolve path optical sampling architectures |
| CN114545550B (zh) | 2018-02-13 | 2024-05-28 | 苹果公司 | 具有集成边缘外耦合器的集成光子装置 |
| FI130319B (en) * | 2019-10-10 | 2023-06-19 | Teknologian Tutkimuskeskus Vtt Oy | Method and apparatus for measuring a spectrum of a gaseous sample |
| EP4176304A1 (en) | 2020-09-09 | 2023-05-10 | Apple Inc. | Optical system for noise mitigation |
| WO2024108206A1 (en) * | 2022-11-18 | 2024-05-23 | Government Of The United States Of America, As Represented By The Secretary Of Commerce | Single-detector double-path intensity-modulation spectrometer |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2547212A (en) * | 1948-01-17 | 1951-04-03 | Philips Lab Inc | Apparatus for determining the composition of a substance |
| US2938118A (en) * | 1955-08-12 | 1960-05-24 | Parsons & Co Sir Howard G | Self balancing electrical instruments |
| DE1065637B (de) * | 1955-11-28 | 1960-02-11 | The Perkin-Elmer Corporation, Norwalk, Conn. (V. St. A.) | Absorptions - Meßanordnung, insbesondere Gasanalysator zum Vergleich zweier Konzentrationen |
| US3180984A (en) * | 1962-04-11 | 1965-04-27 | Mine Safety Appliances Co | Stabilized comparison analyzer and method of analyzing |
| US3465143A (en) * | 1965-12-09 | 1969-09-02 | Bausch & Lomb | Switching system for detecting a plurality of physical quantities in a consecutive timing sequence |
-
1973
- 1973-01-02 US US00320401A patent/US3805074A/en not_active Expired - Lifetime
- 1973-10-26 CA CA184,332A patent/CA1011129A/en not_active Expired
- 1973-12-11 JP JP48138535A patent/JPS4999082A/ja active Pending
- 1973-12-18 DE DE2362935A patent/DE2362935A1/de active Pending
- 1973-12-21 FR FR7346185A patent/FR2212927A5/fr not_active Expired
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0094374A1 (de) * | 1982-05-06 | 1983-11-16 | AVL Gesellschaft für Verbrennungskraftmaschinen und Messtechnik mbH.Prof.Dr.Dr.h.c. Hans List | Verfahren zur kontinuierlichen Messung der Masse von Aerosolteilchen in gasförmigen Proben sowie Vorrichtung zur Durchführung des Verfahrens |
| US4849637A (en) * | 1986-10-04 | 1989-07-18 | Kernforschungszentrum Karlsruhe Gmbh | Method and apparatus for continuously measuring the concentration of a gas component |
| DE3806385A1 (de) * | 1988-02-29 | 1989-09-07 | Feldmuehle Ag | Verfahren und vorrichtung zum pruefen von transparenten bahnen |
| US5157266A (en) * | 1988-02-29 | 1992-10-20 | Stora Feldmuehle Aktiengesellschaft | Method and device for testing transparent sheets |
| DE10202918C1 (de) * | 2002-01-25 | 2003-10-16 | Siemens Ag | Gassensor |
Also Published As
| Publication number | Publication date |
|---|---|
| US3805074A (en) | 1974-04-16 |
| FR2212927A5 (enExample) | 1974-07-26 |
| CA1011129A (en) | 1977-05-31 |
| JPS4999082A (enExample) | 1974-09-19 |
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