FR2212927A5 - - Google Patents

Info

Publication number
FR2212927A5
FR2212927A5 FR7346185A FR7346185A FR2212927A5 FR 2212927 A5 FR2212927 A5 FR 2212927A5 FR 7346185 A FR7346185 A FR 7346185A FR 7346185 A FR7346185 A FR 7346185A FR 2212927 A5 FR2212927 A5 FR 2212927A5
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7346185A
Other languages
French (fr)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of FR2212927A5 publication Critical patent/FR2212927A5/fr
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FR7346185A 1973-01-02 1973-12-21 Expired FR2212927A5 (enExample)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US00320401A US3805074A (en) 1973-01-02 1973-01-02 Spectral scan air monitor

Publications (1)

Publication Number Publication Date
FR2212927A5 true FR2212927A5 (enExample) 1974-07-26

Family

ID=23246254

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7346185A Expired FR2212927A5 (enExample) 1973-01-02 1973-12-21

Country Status (5)

Country Link
US (1) US3805074A (enExample)
JP (1) JPS4999082A (enExample)
CA (1) CA1011129A (enExample)
DE (1) DE2362935A1 (enExample)
FR (1) FR2212927A5 (enExample)

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US3935459A (en) * 1974-06-24 1976-01-27 Sun Electric Corporation Apparatus and method of automatically zeroing an exhaust emission analyzer
DE2438294B2 (de) * 1974-08-09 1977-05-18 Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt Infrarotgasanalysator
US3943368A (en) * 1974-10-15 1976-03-09 The United States Of America As Represented By The United States National Aeronautics And Space Administration Office Of General Counsel-Code Gp Method and apparatus for compensating reflection losses in a path length modulated absorption-absorption trace gas detector
US3911276A (en) * 1974-10-18 1975-10-07 Diax Corp Laser spectroscopy
JPS5937767B2 (ja) * 1977-04-20 1984-09-12 オリンパス光学工業株式会社 測光装置
US4176959A (en) * 1978-04-17 1979-12-04 Raytheon Company High gain laser spectrometer
NL213983A (enExample) * 1978-11-29
US4442349A (en) * 1980-09-15 1984-04-10 Baird Corporation Circuitry for the generation and synchronous detection of optical pulsed signals
US4410273A (en) * 1981-03-09 1983-10-18 Laser Analytics, Inc. Scanning laser spectrometer
AT376301B (de) * 1982-05-06 1984-11-12 List Hans Verfahren zur kontinuierlichen messung der masse von aeorosolteilchen in gasfoermigen proben sowie vorrichtung zur durchfuehrung des verfahrens
US4509130A (en) * 1982-06-03 1985-04-02 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Digital control of diode laser for atmospheric spectroscopy
AT379452B (de) * 1983-04-21 1986-01-10 Avl Verbrennungskraft Messtech Verfahren zur bestimmung der massen von absorbierenden anteilen einer probe und vorrichtung zur durchfuehrung des verfahrens
DE3339348A1 (de) * 1983-10-29 1985-05-09 Meditec GmbH, 8501 Heroldsberg Neodym-yag-laser mit passivem mode-locking
JPS61202128A (ja) * 1985-03-06 1986-09-06 Hitachi Ltd 半導体レ−ザヘテロダイン干渉計
US4722090A (en) * 1985-03-18 1988-01-26 Mitsubishi Denki Kabushiki Kaisha Excimer laser equipment
DE3510052A1 (de) * 1985-03-20 1986-09-25 Kernforschungszentrum Karlsruhe Gmbh, 7500 Karlsruhe Verfahren und prozessphotometer zur kontinuierlichen messung von konzentrationen
DE3633931A1 (de) * 1986-10-04 1988-04-07 Kernforschungsz Karlsruhe Verfahren und einrichtung zur kontinuierlichen messung der konzentration eines gasbestandteiles
DE3806385A1 (de) * 1988-02-29 1989-09-07 Feldmuehle Ag Verfahren und vorrichtung zum pruefen von transparenten bahnen
EP0344461B1 (de) * 1988-06-01 1994-10-12 Hartmann & Braun Aktiengesellschaft Kalibriereinrichtung für ein nichtdispersives Infrarot-Fotometer
US5340987A (en) * 1991-03-15 1994-08-23 Li-Cor, Inc. Apparatus and method for analyzing gas
DE4110095C2 (de) * 1991-03-27 1998-02-12 Draegerwerk Ag Verfahren zur gasspektroskopischen Messung der Konzentration eines Gasbestandteiles
DE4122572A1 (de) * 1991-07-08 1993-01-14 Draegerwerk Ag Verfahren zum betrieb einer laserdiode
US5317156A (en) * 1992-01-29 1994-05-31 Sri International Diagnostic tests using near-infrared laser absorption spectroscopy
DE4300853C2 (de) * 1993-01-15 2003-09-04 Daimler Chrysler Ag Verfahren zur spektroskopischen Bestimmung des Stickstoffoxidgehalts
DE4320036C2 (de) * 1993-06-17 1997-02-13 Fraunhofer Ges Forschung Verfahren und Anordnung zur Driftkorrektur zeitdiskreter Meßsignale bezogen auf ein Referenzsignal, insbesondere in der absorptionsspektroskopischen Spurengasanalytik
US5464983A (en) * 1994-04-05 1995-11-07 Industrial Scientific Corporation Method and apparatus for determining the concentration of a gas
FR2733319B1 (fr) * 1995-04-21 1997-05-23 Air Liquide Procede et dispositif d'analyse de traces d'impuretes dans un echantillon de gaz au moyen d'une diode laser
US6091504A (en) * 1998-05-21 2000-07-18 Square One Technology, Inc. Method and apparatus for measuring gas concentration using a semiconductor laser
EP1070956A1 (en) * 1999-07-23 2001-01-24 Datex-Ohmeda, Inc. Method and apparatus for monitoring maintenance of calibration condition in respiratory gas spectrometer
DE10202918C1 (de) * 2002-01-25 2003-10-16 Siemens Ag Gassensor
EP1706726A4 (en) * 2004-01-16 2008-03-12 Commw Scient Ind Res Org Sulphur dioxide detection method
GB2412430A (en) * 2004-03-24 2005-09-28 Lee Paul Richman Hazardous gas detector
ATE378580T1 (de) * 2004-03-09 2007-11-15 Senscient Ltd Gasnachweis
WO2007060045A1 (en) * 2005-11-25 2007-05-31 Foss Analytical Ab Optical analyzer
US8264689B1 (en) * 2008-12-22 2012-09-11 ISC8 Inc. Micro gas cell array device and method
EP2604999A1 (de) 2011-12-15 2013-06-19 Mettler-Toledo AG Gasmessgerät
EP2947450B1 (de) * 2014-05-19 2016-09-28 Sick Ag Messgerät zur Messung einer bestimmten Gaskomponente
US9501827B2 (en) 2014-06-23 2016-11-22 Exxonmobil Upstream Research Company Methods and systems for detecting a chemical species
WO2015199913A1 (en) 2014-06-23 2015-12-30 Exxonmobil Upstream Research Company Systems for detecting a chemical species and use thereof
US9442011B2 (en) 2014-06-23 2016-09-13 Exxonmobil Upstream Research Company Methods for calibrating a multiple detector system
WO2015199912A1 (en) 2014-06-23 2015-12-30 Exxonmobil Upstream Research Company Image quality enhancement of a differential image for a multiple detector system
AU2015374335B2 (en) 2014-12-23 2018-03-29 Apple Inc. Optical inspection system and method including accounting for variations of optical path length within a sample
EP3054280B1 (de) * 2015-02-04 2026-04-08 Axetris AG Optisches Messgerät und Verfahren zur Gasdetektion
CN108449957B (zh) * 2015-09-01 2021-03-09 苹果公司 用于非接触式感测物质的基准开关架构
US10690591B2 (en) 2015-09-18 2020-06-23 Apple Inc. Measurement time distribution in referencing schemes
CN109073460B (zh) 2016-04-21 2022-08-23 苹果公司 用于参考切换的光学系统
WO2017184423A1 (en) 2016-04-21 2017-10-26 Bribbla Dynamics Llc Multiplexing and encoding for reference switching
EP3688446A2 (en) 2017-09-29 2020-08-05 Apple Inc. Resolve path optical sampling architectures
CN114545550B (zh) 2018-02-13 2024-05-28 苹果公司 具有集成边缘外耦合器的集成光子装置
FI130319B (en) * 2019-10-10 2023-06-19 Teknologian Tutkimuskeskus Vtt Oy Method and apparatus for measuring a spectrum of a gaseous sample
EP4176304A1 (en) 2020-09-09 2023-05-10 Apple Inc. Optical system for noise mitigation
WO2024108206A1 (en) * 2022-11-18 2024-05-23 Government Of The United States Of America, As Represented By The Secretary Of Commerce Single-detector double-path intensity-modulation spectrometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2547212A (en) * 1948-01-17 1951-04-03 Philips Lab Inc Apparatus for determining the composition of a substance
US2938118A (en) * 1955-08-12 1960-05-24 Parsons & Co Sir Howard G Self balancing electrical instruments
DE1065637B (de) * 1955-11-28 1960-02-11 The Perkin-Elmer Corporation, Norwalk, Conn. (V. St. A.) Absorptions - Meßanordnung, insbesondere Gasanalysator zum Vergleich zweier Konzentrationen
US3180984A (en) * 1962-04-11 1965-04-27 Mine Safety Appliances Co Stabilized comparison analyzer and method of analyzing
US3465143A (en) * 1965-12-09 1969-09-02 Bausch & Lomb Switching system for detecting a plurality of physical quantities in a consecutive timing sequence

Also Published As

Publication number Publication date
US3805074A (en) 1974-04-16
CA1011129A (en) 1977-05-31
DE2362935A1 (de) 1974-07-04
JPS4999082A (enExample) 1974-09-19

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Legal Events

Date Code Title Description
ST Notification of lapse