DE2343206C2 - - Google Patents

Info

Publication number
DE2343206C2
DE2343206C2 DE2343206A DE2343206A DE2343206C2 DE 2343206 C2 DE2343206 C2 DE 2343206C2 DE 2343206 A DE2343206 A DE 2343206A DE 2343206 A DE2343206 A DE 2343206A DE 2343206 C2 DE2343206 C2 DE 2343206C2
Authority
DE
Germany
Prior art keywords
source region
gate electrode
region
transistor arrangement
drain
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2343206A
Other languages
German (de)
English (en)
Other versions
DE2343206A1 (de
Inventor
Takaaki Atsugi Kanagawa Jp Yamada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of DE2343206A1 publication Critical patent/DE2343206A1/de
Application granted granted Critical
Publication of DE2343206C2 publication Critical patent/DE2343206C2/de
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D64/00Electrodes of devices having potential barriers
    • H10D64/60Electrodes characterised by their materials
    • H10D64/605Source, drain, or gate electrodes for FETs comprising highly resistive materials
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass

Landscapes

  • Insulated Gate Type Field-Effect Transistor (AREA)
  • Junction Field-Effect Transistors (AREA)
DE19732343206 1972-08-28 1973-08-27 Feldeffekt-transistoranordnung Granted DE2343206A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP47085950A JPS4941081A (enrdf_load_stackoverflow) 1972-08-28 1972-08-28

Publications (2)

Publication Number Publication Date
DE2343206A1 DE2343206A1 (de) 1974-03-14
DE2343206C2 true DE2343206C2 (enrdf_load_stackoverflow) 1987-05-21

Family

ID=13873026

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19732343206 Granted DE2343206A1 (de) 1972-08-28 1973-08-27 Feldeffekt-transistoranordnung

Country Status (5)

Country Link
JP (1) JPS4941081A (enrdf_load_stackoverflow)
AT (1) AT349530B (enrdf_load_stackoverflow)
DE (1) DE2343206A1 (enrdf_load_stackoverflow)
GB (1) GB1432989A (enrdf_load_stackoverflow)
NL (1) NL7311854A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10350702A1 (de) * 2003-10-30 2005-06-09 Infineon Technologies Ag Bauelement mit einer kapazitiven, gegenüber Fehlern einer Dielektrikumschicht robusten Struktur

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL50821A (en) * 1975-12-03 1978-10-31 Hughes Aircraft Co Resistive gate mos switch

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10350702A1 (de) * 2003-10-30 2005-06-09 Infineon Technologies Ag Bauelement mit einer kapazitiven, gegenüber Fehlern einer Dielektrikumschicht robusten Struktur
DE10350702B4 (de) * 2003-10-30 2007-08-09 Infineon Technologies Ag Halbleiterbauelement mit einer kapazitiven, gegenüber Fehlern einer Dielektrikusschicht robusten Struktur

Also Published As

Publication number Publication date
AT349530B (de) 1979-04-10
DE2343206A1 (de) 1974-03-14
ATA746773A (de) 1978-09-15
GB1432989A (en) 1976-04-22
JPS4941081A (enrdf_load_stackoverflow) 1974-04-17
NL7311854A (enrdf_load_stackoverflow) 1974-03-04

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