DE2322649C2 - Wiedergabesystem für ein Feldemissions- Abtastmikroskop - Google Patents
Wiedergabesystem für ein Feldemissions- AbtastmikroskopInfo
- Publication number
- DE2322649C2 DE2322649C2 DE2322649A DE2322649A DE2322649C2 DE 2322649 C2 DE2322649 C2 DE 2322649C2 DE 2322649 A DE2322649 A DE 2322649A DE 2322649 A DE2322649 A DE 2322649A DE 2322649 C2 DE2322649 C2 DE 2322649C2
- Authority
- DE
- Germany
- Prior art keywords
- field
- field emission
- sample
- anode
- playback system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 claims description 12
- 238000010894 electron beam technology Methods 0.000 claims description 6
- 238000003384 imaging method Methods 0.000 claims description 4
- 230000001960 triggered effect Effects 0.000 claims 1
- 230000000694 effects Effects 0.000 description 6
- 230000001133 acceleration Effects 0.000 description 3
- 238000005070 sampling Methods 0.000 description 2
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000011163 secondary particle Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US25112572A | 1972-05-08 | 1972-05-08 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE2322649A1 DE2322649A1 (de) | 1973-11-22 |
| DE2322649C2 true DE2322649C2 (de) | 1986-01-30 |
Family
ID=22950578
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE2322649A Expired DE2322649C2 (de) | 1972-05-08 | 1973-05-03 | Wiedergabesystem für ein Feldemissions- Abtastmikroskop |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US3767926A (enExample) |
| JP (1) | JPS4956581A (enExample) |
| CA (1) | CA977873A (enExample) |
| DD (1) | DD107173A5 (enExample) |
| DE (1) | DE2322649C2 (enExample) |
| FR (1) | FR2184045B1 (enExample) |
| GB (1) | GB1385170A (enExample) |
| NL (1) | NL179693C (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3916191A (en) * | 1974-03-01 | 1975-10-28 | Minnesota Mining & Mfg | Imaging apparatus and method for use with ion scattering spectrometer |
| DE2548831C2 (de) * | 1974-12-20 | 1985-11-14 | Nanometrics Inc., Sunnyvale, Calif. | Impulsgenerator für Rasteranzeigegeräte |
| JPS5826454Y2 (ja) * | 1975-09-27 | 1983-06-08 | 株式会社島津製作所 | デンシセンソウサガタシリヨウカンサツソウチ |
| US6194718B1 (en) * | 1998-09-23 | 2001-02-27 | Applied Materials, Inc. | Method for reducing aliasing effects in scanning beam microscopy |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1023372A (fr) * | 1950-07-19 | 1953-03-18 | S E D A C Soc | Perfectionnements aux procédés de télévision et dispositifs pour la mise en oeuvre de ces procédés |
| US3309461A (en) * | 1962-08-01 | 1967-03-14 | Battelle Development Corp | Pseudo-random electron beam scanning system for narrow bandwidth image transmission |
-
1972
- 1972-05-08 US US00251125A patent/US3767926A/en not_active Expired - Lifetime
-
1973
- 1973-05-03 DE DE2322649A patent/DE2322649C2/de not_active Expired
- 1973-05-04 NL NLAANVRAGE7306298,A patent/NL179693C/xx not_active IP Right Cessation
- 1973-05-04 JP JP48049191A patent/JPS4956581A/ja active Pending
- 1973-05-04 FR FR7316829A patent/FR2184045B1/fr not_active Expired
- 1973-05-07 CA CA170,608A patent/CA977873A/en not_active Expired
- 1973-05-08 GB GB2198473A patent/GB1385170A/en not_active Expired
- 1973-05-08 DD DD170686A patent/DD107173A5/xx unknown
Also Published As
| Publication number | Publication date |
|---|---|
| DE2322649A1 (de) | 1973-11-22 |
| FR2184045A1 (enExample) | 1973-12-21 |
| US3767926A (en) | 1973-10-23 |
| DD107173A5 (enExample) | 1974-07-12 |
| CA977873A (en) | 1975-11-11 |
| FR2184045B1 (enExample) | 1978-02-10 |
| GB1385170A (en) | 1975-02-26 |
| NL179693C (nl) | 1986-10-16 |
| NL7306298A (enExample) | 1973-11-12 |
| JPS4956581A (enExample) | 1974-06-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OD | Request for examination | ||
| 8128 | New person/name/address of the agent |
Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 800 |
|
| 8127 | New person/name/address of the applicant |
Owner name: WARNER LAMBERT TECHNOLOGIES, INC., 75221 DALLAS, T |
|
| 8128 | New person/name/address of the agent |
Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT. KRESSIN, H., DI |
|
| 8127 | New person/name/address of the applicant |
Owner name: NANOMETRICS INC., SUNNYVALE, CALIF., US |
|
| 8128 | New person/name/address of the agent |
Representative=s name: DIEHL, H., DIPL.-PHYS. DR.RER.NAT., PAT.-ANW., 800 |
|
| D2 | Grant after examination | ||
| 8364 | No opposition during term of opposition |