DD107173A5 - - Google Patents

Info

Publication number
DD107173A5
DD107173A5 DD170686A DD17068673A DD107173A5 DD 107173 A5 DD107173 A5 DD 107173A5 DD 170686 A DD170686 A DD 170686A DD 17068673 A DD17068673 A DD 17068673A DD 107173 A5 DD107173 A5 DD 107173A5
Authority
DD
German Democratic Republic
Application number
DD170686A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of DD107173A5 publication Critical patent/DD107173A5/xx

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/28Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DD170686A 1972-05-08 1973-05-08 DD107173A5 (xx)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US25112572A 1972-05-08 1972-05-08

Publications (1)

Publication Number Publication Date
DD107173A5 true DD107173A5 (xx) 1974-07-12

Family

ID=22950578

Family Applications (1)

Application Number Title Priority Date Filing Date
DD170686A DD107173A5 (xx) 1972-05-08 1973-05-08

Country Status (8)

Country Link
US (1) US3767926A (xx)
JP (1) JPS4956581A (xx)
CA (1) CA977873A (xx)
DD (1) DD107173A5 (xx)
DE (1) DE2322649C2 (xx)
FR (1) FR2184045B1 (xx)
GB (1) GB1385170A (xx)
NL (1) NL179693C (xx)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3916191A (en) * 1974-03-01 1975-10-28 Minnesota Mining & Mfg Imaging apparatus and method for use with ion scattering spectrometer
DE2548831C2 (de) * 1974-12-20 1985-11-14 Nanometrics Inc., Sunnyvale, Calif. Impulsgenerator für Rasteranzeigegeräte
JPS5826454Y2 (ja) * 1975-09-27 1983-06-08 株式会社島津製作所 デンシセンソウサガタシリヨウカンサツソウチ
US6194718B1 (en) * 1998-09-23 2001-02-27 Applied Materials, Inc. Method for reducing aliasing effects in scanning beam microscopy

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1023372A (fr) * 1950-07-19 1953-03-18 S E D A C Soc Perfectionnements aux procédés de télévision et dispositifs pour la mise en oeuvre de ces procédés
US3309461A (en) * 1962-08-01 1967-03-14 Battelle Development Corp Pseudo-random electron beam scanning system for narrow bandwidth image transmission

Also Published As

Publication number Publication date
GB1385170A (en) 1975-02-26
FR2184045A1 (xx) 1973-12-21
DE2322649A1 (de) 1973-11-22
NL179693C (nl) 1986-10-16
US3767926A (en) 1973-10-23
FR2184045B1 (xx) 1978-02-10
JPS4956581A (xx) 1974-06-01
NL7306298A (xx) 1973-11-12
DE2322649C2 (de) 1986-01-30
CA977873A (en) 1975-11-11

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