DE2321735A1 - Verfahren zum ausgleichen der abweichung, die die von einem elektronischen messinstrument vorgenommenen digitalen messungen bestimmt - Google Patents

Verfahren zum ausgleichen der abweichung, die die von einem elektronischen messinstrument vorgenommenen digitalen messungen bestimmt

Info

Publication number
DE2321735A1
DE2321735A1 DE2321735A DE2321735A DE2321735A1 DE 2321735 A1 DE2321735 A1 DE 2321735A1 DE 2321735 A DE2321735 A DE 2321735A DE 2321735 A DE2321735 A DE 2321735A DE 2321735 A1 DE2321735 A1 DE 2321735A1
Authority
DE
Germany
Prior art keywords
input
counter
output
comparator
pulse
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE2321735A
Other languages
German (de)
English (en)
Inventor
Manuel C Dr Ing Sanz
Tito R Suva
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micromedic Systems Inc
Original Assignee
Micromedic Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micromedic Systems Inc filed Critical Micromedic Systems Inc
Publication of DE2321735A1 publication Critical patent/DE2321735A1/de
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06J—HYBRID COMPUTING ARRANGEMENTS
    • G06J1/00—Hybrid computing arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Automation & Control Theory (AREA)
  • Evolutionary Computation (AREA)
  • Fuzzy Systems (AREA)
  • Software Systems (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
DE2321735A 1972-04-28 1973-04-26 Verfahren zum ausgleichen der abweichung, die die von einem elektronischen messinstrument vorgenommenen digitalen messungen bestimmt Pending DE2321735A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CH641872A CH566543A5 (enExample) 1972-04-28 1972-04-28

Publications (1)

Publication Number Publication Date
DE2321735A1 true DE2321735A1 (de) 1973-11-08

Family

ID=4309285

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2321735A Pending DE2321735A1 (de) 1972-04-28 1973-04-26 Verfahren zum ausgleichen der abweichung, die die von einem elektronischen messinstrument vorgenommenen digitalen messungen bestimmt

Country Status (10)

Country Link
US (1) US3922091A (enExample)
JP (1) JPS4942385A (enExample)
CH (1) CH566543A5 (enExample)
DE (1) DE2321735A1 (enExample)
ES (1) ES414131A1 (enExample)
FR (1) FR2182561A5 (enExample)
GB (1) GB1435382A (enExample)
IT (1) IT991564B (enExample)
NL (1) NL7305905A (enExample)
SE (1) SE387439B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0075222A1 (en) * 1981-09-17 1983-03-30 Horiba, Ltd. Method and compensation circuit for analyzers

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS54164321A (en) * 1978-06-16 1979-12-27 Yoshizou Iyama False iron plate for foundation work of steel skeleton construction
US4238830A (en) * 1979-08-01 1980-12-09 The Perkin-Elmer Corporation Curvature correction
US4692883A (en) * 1985-02-21 1987-09-08 The Perkin-Elmer Corporation Automatic digital wavelength calibration system for a spectrophotometer
US4916645A (en) * 1988-06-02 1990-04-10 The Perkin-Elmer Corporation Continuous monochrometer drift compensation of a spectral monochromator
DE4009334C2 (de) * 1990-03-23 2000-11-23 Perkin Elmer Bodenseewerk Zwei Beleuchtungsanordnung zur Beaufschlagung eines Photomultipliers bei einem Zweistrahlphotometer
US6526801B2 (en) * 2000-12-29 2003-03-04 Edwards Systems Technology, Inc. Method of compensating for drift in gas sensing equipment
US7573572B1 (en) * 2005-09-07 2009-08-11 The United States Of America As Represented By The Secretary Of The Navy Drift tube amplifier and method to amplify current
FI129721B (en) 2019-04-12 2022-07-29 Beamex Oy Ab Method and arrangement for long term drift analysis

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3522739A (en) * 1968-10-28 1970-08-04 Princeton Applied Res Corp Spectrophotometer apparatus utilizing a ratio measuring circuit
US3646331A (en) * 1970-09-03 1972-02-29 Kollmorgen Corp Automatic 100{11 line adjustment of spectrophotometers
US3724954A (en) * 1972-01-14 1973-04-03 Photo Electronics Corp Logarithmic circuit with automatic compensation for variations in conditions of operations

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0075222A1 (en) * 1981-09-17 1983-03-30 Horiba, Ltd. Method and compensation circuit for analyzers

Also Published As

Publication number Publication date
GB1435382A (en) 1976-05-12
US3922091A (en) 1975-11-25
CH566543A5 (enExample) 1975-09-15
JPS4942385A (enExample) 1974-04-20
SE387439B (sv) 1976-09-06
FR2182561A5 (enExample) 1973-12-07
IT991564B (it) 1975-08-30
NL7305905A (enExample) 1973-10-30
ES414131A1 (es) 1976-05-16

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