|
US4155116A
(en)
*
|
1978-01-04 |
1979-05-15 |
The Bendix Corporation |
Digital control system including built in test equipment
|
|
US4195769A
(en)
*
|
1978-06-12 |
1980-04-01 |
Honeywell Inc. |
Method and apparatus for fault-testing of electrical system monitor communication circuits
|
|
US4255790A
(en)
*
|
1978-09-25 |
1981-03-10 |
Hondeghem Luc M |
Programmable pulse generating system
|
|
US4212075A
(en)
*
|
1978-10-10 |
1980-07-08 |
Usm Corporation |
Electrical component testing system for component insertion machine
|
|
US4255792A
(en)
*
|
1978-10-13 |
1981-03-10 |
Das Pawan K |
Automated analog circuit test system
|
|
US4245352A
(en)
*
|
1979-03-07 |
1981-01-13 |
International Jensen Incorporated |
Automated system for testing radio receivers
|
|
US4506212A
(en)
*
|
1979-08-02 |
1985-03-19 |
The Post Office |
Method and apparatus for testing integrated circuits using AC test input and comparison of resulting frequency spectrum outputs
|
|
US4300207A
(en)
*
|
1979-09-25 |
1981-11-10 |
Grumman Aerospace Corporation |
Multiple matrix switching system
|
|
US4459695A
(en)
*
|
1979-11-07 |
1984-07-10 |
Davy Mcgee (Sheffield) Limited |
Fault finding in an industrial installation by means of a computer
|
|
US4307345A
(en)
*
|
1979-11-26 |
1981-12-22 |
E.I.L. Instruments, Inc. |
Circuit recloser test set
|
|
US4285059A
(en)
*
|
1979-12-10 |
1981-08-18 |
The United States Of America As Represented By The Secretary Of The Army |
Circuit for test of ultra high speed digital arithmetic units
|
|
US4348759A
(en)
*
|
1979-12-17 |
1982-09-07 |
International Business Machines Corporation |
Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
|
|
US4354268A
(en)
*
|
1980-04-03 |
1982-10-12 |
Santek, Inc. |
Intelligent test head for automatic test system
|
|
CA1163721A
(en)
*
|
1980-08-18 |
1984-03-13 |
Milan Slamka |
Apparatus for the dynamic in-circuit testing of electronic digital circuit elements
|
|
EP0066603A1
(en)
*
|
1980-12-15 |
1982-12-15 |
Ivac Corporation |
Electrical monitoring system
|
|
US4403297A
(en)
*
|
1981-01-02 |
1983-09-06 |
Loveland Controls Company |
Process control system prover
|
|
US4389710A
(en)
*
|
1981-01-12 |
1983-06-21 |
Goodyear Aerospace Corporation |
Braking system test circuit
|
|
US4437056A
(en)
|
1981-03-31 |
1984-03-13 |
American Standard Inc. |
Cab signal test set for automatically testing the pickup coils and checking an amplifier of cab signal equipment
|
|
DE3116079A1
(de)
*
|
1981-04-23 |
1982-11-11 |
Robert Bosch Gmbh, 7000 Stuttgart |
Pruefsystem
|
|
US4439858A
(en)
*
|
1981-05-28 |
1984-03-27 |
Zehntel, Inc. |
Digital in-circuit tester
|
|
JPS5875073A
(ja)
*
|
1981-10-29 |
1983-05-06 |
Yokogawa Hewlett Packard Ltd |
直流特性測定システム
|
|
JPS5873881A
(ja)
*
|
1981-10-29 |
1983-05-04 |
Advantest Corp |
Ｉｃテスタ
|
|
DE3144040A1
(de)
*
|
1981-11-05 |
1983-05-19 |
Elektronikus Mérökészülékek Gyára, 1631 Budapest |
Schaltungsanordnung zur erzeugung von einer abhaengigen und einer unabhaengigen veraenderlichen sowie parameterwerten entsprechenden digitalen mengen sowie zu deren digitaler verarbeitung
|
|
US4524444A
(en)
*
|
1982-01-12 |
1985-06-18 |
Discovision Associates |
Analyzing the signal transfer characteristics of a signal processing unit
|
|
JPS58158566A
(ja)
*
|
1982-03-17 |
1983-09-20 |
Hitachi Ltd |
検査装置
|
|
FR2523791B1
(fr)
*
|
1982-03-19 |
1985-01-04 |
Thomson Csf |
Dispositif et appareil de test d'equipements electroniques notamment de television
|
|
FR2523789B1
(fr)
*
|
1982-03-19 |
1985-01-04 |
Thomson Csf |
Dispositif de generation de signaux de test d'equipements electroniques
|
|
US4616178A
(en)
*
|
1982-05-27 |
1986-10-07 |
Harris Corporation |
Pulsed linear integrated circuit tester
|
|
US4528504A
(en)
*
|
1982-05-27 |
1985-07-09 |
Harris Corporation |
Pulsed linear integrated circuit tester
|
|
US4525789A
(en)
*
|
1982-07-16 |
1985-06-25 |
At&T Bell Laboratories |
Programmable network tester with data formatter
|
|
US4517154A
(en)
*
|
1982-07-27 |
1985-05-14 |
General Electric Company |
Self-test subsystem for nuclear reactor protection system
|
|
US4574354A
(en)
*
|
1982-11-19 |
1986-03-04 |
Tektronix, Inc. |
Method and apparatus for time-aligning data
|
|
SE8305262L
(sv)
*
|
1982-12-14 |
1984-06-15 |
Gen Electric |
Universellt logikkort
|
|
US4561093A
(en)
*
|
1983-02-22 |
1985-12-24 |
Otis Elevator Company |
Servicing a software-controlled elevator
|
|
US4617663A
(en)
*
|
1983-04-13 |
1986-10-14 |
At&T Information Systems Inc. |
Interface testing of software systems
|
|
US4635259A
(en)
*
|
1983-08-01 |
1987-01-06 |
Fairchild Semiconductor Corporation |
Method and apparatus for monitoring response signals during automated testing of electronic circuits
|
|
US4637020A
(en)
*
|
1983-08-01 |
1987-01-13 |
Fairchild Semiconductor Corporation |
Method and apparatus for monitoring automated testing of electronic circuits
|
|
US4849702A
(en)
*
|
1983-08-01 |
1989-07-18 |
Schlumberger Techologies, Inc. |
Test period generator for automatic test equipment
|
|
US4646299A
(en)
*
|
1983-08-01 |
1987-02-24 |
Fairchild Semiconductor Corporation |
Method and apparatus for applying and monitoring programmed test signals during automated testing of electronic circuits
|
|
DE3332386A1
(de)
*
|
1983-09-08 |
1985-03-21 |
Vdo Adolf Schindling Ag, 6000 Frankfurt |
Elektrische pruefeinrichtung eines fahrzeug-kombinationsinstruments
|
|
US4606025A
(en)
*
|
1983-09-28 |
1986-08-12 |
International Business Machines Corp. |
Automatically testing a plurality of memory arrays on selected memory array testers
|
|
US4656632A
(en)
*
|
1983-11-25 |
1987-04-07 |
Giordano Associates, Inc. |
System for automatic testing of circuits and systems
|
|
US4641085A
(en)
*
|
1984-01-09 |
1987-02-03 |
Hewlett-Packard Company |
Vector network analyzer with integral processor
|
|
JPH0743413B2
(ja)
*
|
1984-05-09 |
1995-05-15 |
三菱電機株式会社 |
半導体試験装置
|
|
US4672555A
(en)
*
|
1984-10-18 |
1987-06-09 |
Massachusetts Institute Of Technology |
Digital ac monitor
|
|
US4686627A
(en)
*
|
1984-12-24 |
1987-08-11 |
Honeywell Inc. |
Electrical test apparatus
|
|
US4845637A
(en)
*
|
1985-02-11 |
1989-07-04 |
American Telephone And Telegraph Company, At&T Bell Laboratories |
Feeder monitor arrangement for stored program controlled rectifier plant
|
|
FR2578704B1
(fr)
*
|
1985-03-05 |
1987-07-10 |
France Etat |
Appareil de controle automatique rapide notamment pour terminaux annuaires electroniques
|
|
US4709366A
(en)
*
|
1985-07-29 |
1987-11-24 |
John Fluke Mfg. Co., Inc. |
Computer assisted fault isolation in circuit board testing
|
|
US4831560A
(en)
*
|
1986-01-15 |
1989-05-16 |
Zaleski James V |
Method for testing auto electronics systems
|
|
US4771428A
(en)
*
|
1986-04-10 |
1988-09-13 |
Cadic Inc. |
Circuit testing system
|
|
GB2189613B
(en)
*
|
1986-04-24 |
1991-01-09 |
Argos Alarms & Security Produc |
Monitoring means for testing electrical /electronic circuitry or components
|
|
US4825392A
(en)
*
|
1986-08-20 |
1989-04-25 |
Freeman Mark S |
Dual function DMM display
|
|
US4841456A
(en)
*
|
1986-09-09 |
1989-06-20 |
The Boeing Company |
Test system and method using artificial intelligence control
|
|
US4772845A
(en)
*
|
1987-01-15 |
1988-09-20 |
Raytheon Company |
Cable continuity testor including a sequential state machine
|
|
WO1988008524A1
(en)
*
|
1987-04-24 |
1988-11-03 |
Grumman Aerospace Corporation |
Automatic test equipment for hydraulic devices
|
|
US5014238A
(en)
*
|
1987-07-15 |
1991-05-07 |
Distributed Matrix Controls Inc. |
Universal input/output device
|
|
US4897794A
(en)
*
|
1987-07-21 |
1990-01-30 |
Egg Co., Ltd. |
Impulse coil tester
|
|
US4845712A
(en)
*
|
1987-11-30 |
1989-07-04 |
Tandem Computers Incorporated |
State machine checker
|
|
US4797604A
(en)
*
|
1987-12-09 |
1989-01-10 |
Etcon Corporation |
Wire length meter suppling current to a wire from which a signal representative of length is derived
|
|
JPH01237180A
(ja)
*
|
1988-03-18 |
1989-09-21 |
Seikosha Co Ltd |
プリンタの検査装置
|
|
EP0339286A3
(en)
*
|
1988-03-31 |
1993-03-17 |
Tektronix, Inc. |
Test system for acquiring, calculating and displaying representations of data sequences
|
|
US5012180A
(en)
*
|
1988-05-17 |
1991-04-30 |
Zilog, Inc. |
System for testing internal nodes
|
|
CN1045655A
(zh)
*
|
1988-11-23 |
1990-09-26 |
约翰弗兰克制造公司 |
系统自动诊断的内核测试接口和方法
|
|
US4989207A
(en)
*
|
1988-11-23 |
1991-01-29 |
John Fluke Mfg. Co., Inc. |
Automatic verification of kernel circuitry based on analysis of memory accesses
|
|
US4958347A
(en)
*
|
1988-11-23 |
1990-09-18 |
John Fluke Mfg. Co., Inc. |
Apparatus, method and data structure for validation of kernel data bus
|
|
US5353243A
(en)
*
|
1989-05-31 |
1994-10-04 |
Synopsys Inc. |
Hardware modeling system and method of use
|
|
US5369593A
(en)
*
|
1989-05-31 |
1994-11-29 |
Synopsys Inc. |
System for and method of connecting a hardware modeling element to a hardware modeling system
|
|
US5029166A
(en)
*
|
1989-05-31 |
1991-07-02 |
At&T Bell Laboratories |
Method and apparatus for testing circuit boards
|
|
US5068852A
(en)
*
|
1989-11-23 |
1991-11-26 |
John Fluke Mfg. Co., Inc. |
Hardware enhancements for improved performance of memory emulation method
|
|
US5079707A
(en)
*
|
1990-01-19 |
1992-01-07 |
The Boeing Company |
Integrated certification-calibration system for a testing system having multiple test instruments
|
|
US5111402A
(en)
*
|
1990-01-19 |
1992-05-05 |
Boeing Company |
Integrated aircraft test system
|
|
US5115407A
(en)
*
|
1990-01-19 |
1992-05-19 |
The Boeing Company |
Integrated certification-calibration system for a testing system having multiple test instruments
|
|
US5023791A
(en)
*
|
1990-02-12 |
1991-06-11 |
The Boeing Company |
Automated test apparatus for aircraft flight controls
|
|
US5023545A
(en)
*
|
1990-06-04 |
1991-06-11 |
The United States Of America |
Circuit probing system
|
|
US5247458A
(en)
*
|
1990-09-11 |
1993-09-21 |
Audio Precision, Inc. |
Method and apparatus for testing a digital system for the occurrence of errors
|
|
US5557209A
(en)
*
|
1990-12-20 |
1996-09-17 |
Hewlett-Packard Company |
Identification of pin-open faults by capacitive coupling through the integrated circuit package
|
|
US5124660A
(en)
*
|
1990-12-20 |
1992-06-23 |
Hewlett-Packard Company |
Identification of pin-open faults by capacitive coupling through the integrated circuit package
|
|
US5625292A
(en)
*
|
1990-12-20 |
1997-04-29 |
Hewlett-Packard Company |
System for measuring the integrity of an electrical contact
|
|
US5557559A
(en)
*
|
1992-07-06 |
1996-09-17 |
Motay Electronics, Inc. |
Universal burn-in driver system and method therefor
|
|
US5550844A
(en)
*
|
1992-11-19 |
1996-08-27 |
Proteus Corporation |
Printed circuit board fault injection circuit
|
|
US5570012A
(en)
*
|
1994-11-08 |
1996-10-29 |
Rohm Co. Ltd. |
Apparatus for testing a semiconductor device by comparison with an identical reference device
|
|
US5673295A
(en)
*
|
1995-04-13 |
1997-09-30 |
Synopsis, Incorporated |
Method and apparatus for generating and synchronizing a plurality of digital signals
|
|
US5671147A
(en)
*
|
1995-08-11 |
1997-09-23 |
Hewlett-Packard Company |
AC mains test system for measuring current harmonics and voltage variations
|
|
US5740352A
(en)
*
|
1995-09-27 |
1998-04-14 |
B-Tree Verification Systems, Inc. |
Liquid-crystal display test system and method
|
|
US6499005B2
(en)
*
|
1997-11-10 |
2002-12-24 |
The Boeing Company |
System and method for simulating air mode and ground mode of an airplane
|
|
JP2001272430A
(ja)
*
|
2000-03-24 |
2001-10-05 |
Oht Inc |
検査装置及び検査方法
|
|
FR2841352B1
(fr)
*
|
2002-06-19 |
2004-08-06 |
Eurocopter France |
Dispositif et systeme de maintenance d'un systeme complexe, en particulier d'un aeronef
|
|
US20040162694A1
(en)
*
|
2003-02-13 |
2004-08-19 |
Ricca Paolo Dalla |
Programmable digital interface for analog test equipment systems
|
|
US20130226500A1
(en)
*
|
2012-02-27 |
2013-08-29 |
Yazaki North America, Inc. |
Determination of validity of bi-level digital signal via digital data acquisition
|
|
CN117074744A
(zh)
*
|
2023-07-07 |
2023-11-17 |
国家能源集团科学技术研究院有限公司 |
测试信号源发生装置及励磁调节器测试系统
|