DE19980524T1 - IC test device - Google Patents

IC test device

Info

Publication number
DE19980524T1
DE19980524T1 DE19980524T DE19980524T DE19980524T1 DE 19980524 T1 DE19980524 T1 DE 19980524T1 DE 19980524 T DE19980524 T DE 19980524T DE 19980524 T DE19980524 T DE 19980524T DE 19980524 T1 DE19980524 T1 DE 19980524T1
Authority
DE
Germany
Prior art keywords
test device
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19980524T
Other languages
German (de)
Inventor
Tsuyoshi Yamashita
Akihiko Ito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of DE19980524T1 publication Critical patent/DE19980524T1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
DE19980524T 1998-03-02 1999-03-01 IC test device Ceased DE19980524T1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP10049523A JPH11248787A (en) 1998-03-02 1998-03-02 Ic testing apparatus
PCT/JP1999/000968 WO1999045403A1 (en) 1998-03-02 1999-03-01 Ic test apparatus

Publications (1)

Publication Number Publication Date
DE19980524T1 true DE19980524T1 (en) 2000-05-25

Family

ID=12833509

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19980524T Ceased DE19980524T1 (en) 1998-03-02 1999-03-01 IC test device

Country Status (5)

Country Link
JP (1) JPH11248787A (en)
KR (1) KR20010020333A (en)
DE (1) DE19980524T1 (en)
TW (1) TW428095B (en)
WO (1) WO1999045403A1 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5348731B2 (en) * 2007-12-26 2013-11-20 ホシザキ電機株式会社 Refrigerator unit
KR102179036B1 (en) * 2019-07-02 2020-11-16 세메스 주식회사 Chamber wall structure of test handler

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2915969B2 (en) * 1990-07-06 1999-07-05 株式会社アドバンテスト Constant temperature bath for IC testing
JP2540703Y2 (en) * 1990-10-19 1997-07-09 株式会社アドバンテスト IC test equipment
JP2561115Y2 (en) * 1991-09-13 1998-01-28 安藤電気株式会社 Driving mechanism of fan in low temperature chamber

Also Published As

Publication number Publication date
WO1999045403A1 (en) 1999-09-10
JPH11248787A (en) 1999-09-17
KR20010020333A (en) 2001-03-15
TW428095B (en) 2001-04-01

Similar Documents

Publication Publication Date Title
DE69936470D1 (en) test card
DK1029240T3 (en) Measuring device
DE69830082D1 (en) MEASURING DEVICE
NO994610D0 (en) Testing device for working instruments
DE59913407D1 (en) measuring device
DE19782246T1 (en) IC test device
DE19980453T1 (en) Semiconductor device test device
DE29812621U1 (en) Portable measuring device
DE19880680T1 (en) Semiconductor device test device
DE69829091D1 (en) measuring device
DE69605757T2 (en) IC test device
NO981026D0 (en) Measuring device
DE69918215D1 (en) Component carrying device
ID28840A (en) TESTING
FR2780792B1 (en) ELECTRONIC CHIP TESTING APPARATUS
DE29822507U1 (en) Level measuring device
DE29700808U1 (en) Probe device
DE69809805D1 (en) BELT EXTENSION MEASURING DEVICE
DE19980524T1 (en) IC test device
DE29811381U1 (en) Sterilization test device
DE29823204U1 (en) Strip test device
DE29700584U1 (en) Electronic testing device
ATE317976T1 (en) TEST DEVICE
DE29708368U1 (en) Measuring device
DE29802211U1 (en) Fixing device

Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8607 Notification of search results after publication
8131 Rejection