DE19714952C2 - Verwaltung von Speichermodulen - Google Patents

Verwaltung von Speichermodulen

Info

Publication number
DE19714952C2
DE19714952C2 DE19714952A DE19714952A DE19714952C2 DE 19714952 C2 DE19714952 C2 DE 19714952C2 DE 19714952 A DE19714952 A DE 19714952A DE 19714952 A DE19714952 A DE 19714952A DE 19714952 C2 DE19714952 C2 DE 19714952C2
Authority
DE
Germany
Prior art keywords
memory
management
memory module
list
management memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE19714952A
Other languages
German (de)
English (en)
Other versions
DE19714952A1 (de
Inventor
Michael B Raynham
Myron R Tuttle
Yu Andy Kim-Sang
Brian E Dionne
James K Gendreau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Development Co LP
Original Assignee
Hewlett Packard Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of DE19714952A1 publication Critical patent/DE19714952A1/de
Application granted granted Critical
Publication of DE19714952C2 publication Critical patent/DE19714952C2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/20—Initialising; Data preset; Chip identification
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/006—Identification
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/0721—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU]
    • G06F11/0724—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment within a central processing unit [CPU] in a multiprocessor or a multi-core unit
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0766—Error or fault reporting or storing
    • G06F11/0772—Means for error signaling, e.g. using interrupts, exception flags, dedicated error registers
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • G06F11/1024—Identification of the type of error
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/835—Timestamp
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Debugging And Monitoring (AREA)
  • Detection And Correction Of Errors (AREA)
DE19714952A 1996-05-15 1997-04-10 Verwaltung von Speichermodulen Expired - Fee Related DE19714952C2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US08/649,752 US5774647A (en) 1996-05-15 1996-05-15 Management of memory modules

Publications (2)

Publication Number Publication Date
DE19714952A1 DE19714952A1 (de) 1997-11-20
DE19714952C2 true DE19714952C2 (de) 2001-04-19

Family

ID=24606085

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19714952A Expired - Fee Related DE19714952C2 (de) 1996-05-15 1997-04-10 Verwaltung von Speichermodulen

Country Status (4)

Country Link
US (1) US5774647A (https=)
JP (1) JPH1040173A (https=)
DE (1) DE19714952C2 (https=)
GB (1) GB2313217B (https=)

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US5661677A (en) 1996-05-15 1997-08-26 Micron Electronics, Inc. Circuit and method for on-board programming of PRD Serial EEPROMS
DE69827949T2 (de) * 1997-07-28 2005-10-27 Intergraph Hardware Technologies Co., Las Vegas Gerät und verfahren um speicherfehler zu erkennen und zu berichten
US6185718B1 (en) * 1998-02-27 2001-02-06 International Business Machines Corporation Memory card design with parity and ECC for non-parity and non-ECC systems
US6516429B1 (en) * 1999-11-04 2003-02-04 International Business Machines Corporation Method and apparatus for run-time deconfiguration of a processor in a symmetrical multi-processing system
US6647517B1 (en) * 2000-04-27 2003-11-11 Hewlett-Packard Development Company, L.P. Apparatus and method for providing error ordering information and error logging information
US6701451B1 (en) * 2000-08-11 2004-03-02 Emc Corporation Selective correction of data errors
US20030051193A1 (en) * 2001-09-10 2003-03-13 Dell Products L.P. Computer system with improved error detection
US7028213B2 (en) * 2001-09-28 2006-04-11 Hewlett-Packard Development Company, L.P. Error indication in a raid memory system
US6976197B2 (en) 2001-10-25 2005-12-13 International Business Machines Corporation Apparatus and method for error logging on a memory module
KR100512982B1 (ko) * 2002-09-05 2005-09-07 삼성전자주식회사 무선 화상형성장치 및 방법
US20040148455A1 (en) * 2002-10-15 2004-07-29 Normand John W. Method and apparatus for passively recording product quality, employment and reliability
US7266786B2 (en) 2002-11-05 2007-09-04 Sonics, Inc. Method and apparatus for configurable address mapping and protection architecture and hardware for on-chip systems
US7143236B2 (en) * 2003-07-30 2006-11-28 Hewlett-Packard Development Company, Lp. Persistent volatile memory fault tracking using entries in the non-volatile memory of a fault storage unit
US7251748B2 (en) * 2003-09-12 2007-07-31 Sun Microsystems, Inc. System and method for determining a global ordering of events using timestamps
DE10345978A1 (de) * 2003-10-02 2005-04-28 Infineon Technologies Ag Speichervorrichtung mit Redundanz und Verfahren zur Datenspeicherung
US7162594B2 (en) * 2003-11-19 2007-01-09 Buffalo Inc. Memory module indicator device
US7802145B1 (en) * 2004-05-18 2010-09-21 Cisco Technology, Inc. Approach for facilitating analysis of computer software errors
US20060077750A1 (en) * 2004-10-07 2006-04-13 Dell Products L.P. System and method for error detection in a redundant memory system
US7308527B2 (en) * 2005-01-24 2007-12-11 International Business Machines Corporation System for indicating a plug position for a memory module in a memory system
US7620855B2 (en) * 2006-06-30 2009-11-17 Seagate Technology Llc Self-defining counters
US7793043B2 (en) * 2006-08-24 2010-09-07 Hewlett-Packard Development Company, L.P. Buffered memory architecture
KR20090087077A (ko) * 2006-11-21 2009-08-14 프리스케일 세미컨덕터, 인크. Ｅｃｃ-유닛 및 부가 프로세싱 장치를 갖는 메모리 시스템
US20080148109A1 (en) * 2006-12-18 2008-06-19 Bashor Paul D Implicating multiple possible problematic components within a computer system using indicator light diagnostics
JP5076488B2 (ja) * 2006-12-22 2012-11-21 富士通株式会社 情報処理装置、履歴管理方法、履歴管理プログラム
US9373362B2 (en) * 2007-08-14 2016-06-21 Dell Products L.P. System and method for implementing a memory defect map
US7949913B2 (en) * 2007-08-14 2011-05-24 Dell Products L.P. Method for creating a memory defect map and optimizing performance using the memory defect map
US7694195B2 (en) 2007-08-14 2010-04-06 Dell Products L.P. System and method for using a memory mapping function to map memory defects
US7945815B2 (en) 2007-08-14 2011-05-17 Dell Products L.P. System and method for managing memory errors in an information handling system
US8560907B1 (en) * 2007-09-06 2013-10-15 Altera Corporation Debugging external interface
TWI381389B (zh) * 2008-09-18 2013-01-01 Inventec Corp 效能計算裝置及效能計算方法
CN102203742B (zh) * 2008-10-29 2014-09-17 惠普开发有限公司 组件安装引导
US8261136B2 (en) * 2009-06-29 2012-09-04 Sandisk Technologies Inc. Method and device for selectively refreshing a region of a memory of a data storage device
US8724408B2 (en) 2011-11-29 2014-05-13 Kingtiger Technology (Canada) Inc. Systems and methods for testing and assembling memory modules
US9117552B2 (en) 2012-08-28 2015-08-25 Kingtiger Technology(Canada), Inc. Systems and methods for testing memory
US9575834B2 (en) 2014-05-16 2017-02-21 International Business Machines Corporation Detecting single event upsets and stuck-at faults in RAM-based data path controllers
TWI570555B (zh) * 2015-12-30 2017-02-11 宇帷國際股份有限公司 動態隨機存取記憶體發光控制系統
TWI570714B (zh) * 2015-12-30 2017-02-11 宇帷國際股份有限公司 固態硬碟發光控制系統
US20240070007A1 (en) * 2022-08-31 2024-02-29 Micron Technology, Inc. Memory with fail indicators, including memory with led fail indicators, and associated systems, devices, and methods
US20250077334A1 (en) * 2023-08-31 2025-03-06 Dell Products L.P. Common handler for multitude of crash failures
CN120997028B (zh) * 2025-10-24 2026-01-27 苏州元脑智能科技有限公司 一种图形处理器可纠正错误的处理方法、电子设备

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US5410545A (en) * 1992-07-28 1995-04-25 Digital Equipment Corporation Long-term storage of controller performance

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US5410545A (en) * 1992-07-28 1995-04-25 Digital Equipment Corporation Long-term storage of controller performance

Also Published As

Publication number Publication date
GB2313217B (en) 2000-09-13
GB9709280D0 (en) 1997-06-25
GB2313217A (en) 1997-11-19
JPH1040173A (ja) 1998-02-13
US5774647A (en) 1998-06-30
DE19714952A1 (de) 1997-11-20

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
D2 Grant after examination
8327 Change in the person/name/address of the patent owner

Owner name: HEWLETT-PACKARD CO. (N.D.GES.D.STAATES DELAWARE),

8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: HEWLETT-PACKARD DEVELOPMENT CO., L.P., HOUSTON, TE

8339 Ceased/non-payment of the annual fee