DE19580361T1 - Balun-Apparat und Verfahren zu seinem Entwurf - Google Patents

Balun-Apparat und Verfahren zu seinem Entwurf

Info

Publication number
DE19580361T1
DE19580361T1 DE19580361T DE19580361T DE19580361T1 DE 19580361 T1 DE19580361 T1 DE 19580361T1 DE 19580361 T DE19580361 T DE 19580361T DE 19580361 T DE19580361 T DE 19580361T DE 19580361 T1 DE19580361 T1 DE 19580361T1
Authority
DE
Germany
Prior art keywords
design
balun apparatus
balun
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE19580361T
Other languages
German (de)
English (en)
Inventor
James P Phillips
Louis J Vannatta
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of DE19580361T1 publication Critical patent/DE19580361T1/de
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced lines or devices with unbalanced lines or devices
DE19580361T 1994-03-11 1995-01-30 Balun-Apparat und Verfahren zu seinem Entwurf Ceased DE19580361T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/209,811 US5565881A (en) 1994-03-11 1994-03-11 Balun apparatus including impedance transformer having transformation length
PCT/US1995/000689 WO1995024744A1 (en) 1994-03-11 1995-01-30 A balun apparatus and method of designing same

Publications (1)

Publication Number Publication Date
DE19580361T1 true DE19580361T1 (de) 1996-05-09

Family

ID=22780396

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19580361T Ceased DE19580361T1 (de) 1994-03-11 1995-01-30 Balun-Apparat und Verfahren zu seinem Entwurf

Country Status (19)

Country Link
US (1) US5565881A (enExample)
JP (1) JPH08510623A (enExample)
CN (1) CN1039860C (enExample)
AU (1) AU680737B2 (enExample)
BR (1) BR9505784A (enExample)
CA (1) CA2160024A1 (enExample)
DE (1) DE19580361T1 (enExample)
FI (1) FI955362A0 (enExample)
FR (1) FR2717325B1 (enExample)
GB (1) GB2293280B (enExample)
HU (1) HU9503148D0 (enExample)
IT (1) IT1277860B1 (enExample)
MX (1) MXPA95001295A (enExample)
RU (1) RU2143160C1 (enExample)
SE (1) SE9503987L (enExample)
SG (1) SG69951A1 (enExample)
TW (1) TW256965B (enExample)
WO (1) WO1995024744A1 (enExample)
ZA (1) ZA95983B (enExample)

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US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US5861853A (en) * 1997-05-07 1999-01-19 Motorola, Inc. Current balanced balun network with selectable port impedances
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6256882B1 (en) 1998-07-14 2001-07-10 Cascade Microtech, Inc. Membrane probing system
USH1959H1 (en) 1998-09-03 2001-05-01 Anthony Kikel Single balanced to dual unbalanced transformer
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6380821B1 (en) 2000-08-24 2002-04-30 International Business Machines Corporation Substrate shielded multilayer balun transformer
CN1248360C (zh) * 2000-08-31 2006-03-29 松下电器产业株式会社 无线通信终端内置天线
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE20114544U1 (de) 2000-12-04 2002-02-21 Cascade Microtech, Inc., Beaverton, Oreg. Wafersonde
AU2002327490A1 (en) 2001-08-21 2003-06-30 Cascade Microtech, Inc. Membrane probing system
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
EP1509776A4 (en) 2002-05-23 2010-08-18 Cascade Microtech Inc PROBE TO TEST ANY TESTING EQUIPMENT
US6819200B2 (en) * 2002-07-26 2004-11-16 Freescale Semiconductor, Inc. Broadband balun and impedance transformer for push-pull amplifiers
KR100517946B1 (ko) * 2002-08-13 2005-09-30 엘지전자 주식회사 밸룬 구조
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
WO2006017078A2 (en) 2004-07-07 2006-02-16 Cascade Microtech, Inc. Probe head having a membrane suspended probe
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE112004002554T5 (de) 2003-12-24 2006-11-23 Cascade Microtech, Inc., Beaverton Active wafer probe
EP1754072A2 (en) 2004-06-07 2007-02-21 CASCADE MICROTECH, INC. (an Oregon corporation) Thermal optical chuck
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
WO2006137979A2 (en) 2005-06-13 2006-12-28 Cascade Microtech, Inc. Wideband active-passive differential signal probe
DE112007001399T5 (de) 2006-06-09 2009-05-07 Cascade Microtech, Inc., Beaverton Messfühler für differentielle Signale mit integrierter Symmetrieschaltung
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
JP2010503306A (ja) * 2006-09-06 2010-01-28 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 遮蔽デバイス用アンテナ
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe
US8462061B2 (en) * 2008-03-26 2013-06-11 Dockon Ag Printed compound loop antenna
CN102124657A (zh) * 2008-08-18 2011-07-13 松下电器产业株式会社 噪声消除装置和使用了该装置的噪声消除模块及电子设备
US7888957B2 (en) 2008-10-06 2011-02-15 Cascade Microtech, Inc. Probing apparatus with impedance optimized interface
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8319503B2 (en) 2008-11-24 2012-11-27 Cascade Microtech, Inc. Test apparatus for measuring a characteristic of a device under test
US8816281B2 (en) * 2011-03-28 2014-08-26 Tokyo Electron Limited Ion energy analyzer and methods of manufacturing the same
US8654022B2 (en) 2011-09-02 2014-02-18 Dockon Ag Multi-layered multi-band antenna
WO2013064910A2 (en) 2011-11-04 2013-05-10 Dockon Ag Capacitively coupled compound loop antenna
US10630241B2 (en) 2018-08-23 2020-04-21 Nxp Usa, Inc. Amplifier with integrated directional coupler
FR3144710B1 (fr) * 2022-12-29 2025-09-19 Thales Sa Balun Rat-Race et procédé de réduction d'encombrement de Balun Rat-Race associé

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE846874C (de) * 1944-02-25 1952-08-18 Patelhold Patentverwertung Transformatorsystem mit Leitungscharakter
DE3238806C2 (de) * 1982-10-20 1985-06-20 Richard Hirschmann Radiotechnisches Werk, 7300 Esslingen Symmetriereinrichtung
GB2179801A (en) * 1985-08-31 1987-03-11 Plessey Co Plc Balun circuit

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3614676A (en) * 1969-08-15 1971-10-19 Sylvania Electric Prod Broadband impedance-matching transformer
US3678418A (en) * 1971-07-28 1972-07-18 Rca Corp Printed circuit balun
US3835421A (en) * 1972-12-14 1974-09-10 Rca Corp Microwave transmission line and devices using multiple coplanar conductors
US3846721A (en) * 1973-08-08 1974-11-05 Amp Inc Transmission line balun
US4260963A (en) * 1979-10-18 1981-04-07 Rockwell International Corporation 4:1 Balun
JPS59148405A (ja) * 1983-02-14 1984-08-25 Matsushita Electric Ind Co Ltd 平衡不平衡変換器
US4495505A (en) * 1983-05-10 1985-01-22 The United States Of America As Represented By The Secretary Of The Air Force Printed circuit balun with a dipole antenna
PL141094B1 (en) * 1983-12-09 1987-06-30 Polska Akad Nauk Centrum Microwave balun transformer,especially for mixers and modulators
FR2556508B1 (fr) * 1983-12-13 1987-12-18 Thomson Csf Symetriseur pour coupler une ligne dissymetrique a un element symetrique
US4737797A (en) * 1986-06-26 1988-04-12 Motorola, Inc. Microstrip balun-antenna apparatus
JP2737942B2 (ja) * 1988-08-22 1998-04-08 ソニー株式会社 受信機
US4980654A (en) * 1990-04-06 1990-12-25 Tektronix, Inc. Transmission line transformer
RU2020663C1 (ru) * 1991-05-20 1994-09-30 Гомельское конструкторское бюро "Луч" Симметрирующее устройство
US5304959A (en) * 1992-10-16 1994-04-19 Spectrian, Inc. Planar microstrip balun

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE846874C (de) * 1944-02-25 1952-08-18 Patelhold Patentverwertung Transformatorsystem mit Leitungscharakter
DE3238806C2 (de) * 1982-10-20 1985-06-20 Richard Hirschmann Radiotechnisches Werk, 7300 Esslingen Symmetriereinrichtung
GB2179801A (en) * 1985-08-31 1987-03-11 Plessey Co Plc Balun circuit

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
DE-B: Wolff, Ingo: "Einführung in die Microchip- Leitungstechnik, S. 130-136 *

Also Published As

Publication number Publication date
CN1127571A (zh) 1996-07-24
WO1995024744A1 (en) 1995-09-14
ITRM950140A1 (it) 1996-09-08
CN1039860C (zh) 1998-09-16
SG69951A1 (en) 2000-01-25
RU2143160C1 (ru) 1999-12-20
GB2293280B (en) 1998-10-21
IT1277860B1 (it) 1997-11-12
FI955362L (fi) 1995-11-08
ZA95983B (en) 1995-10-09
AU680737B2 (en) 1997-08-07
MXPA95001295A (es) 2004-10-21
HU9503148D0 (en) 1996-01-29
SE9503987D0 (sv) 1995-11-10
SE9503987L (sv) 1995-12-27
GB2293280A (en) 1996-03-20
FI955362A7 (fi) 1995-11-08
FR2717325B1 (fr) 1996-06-28
BR9505784A (pt) 1996-03-05
CA2160024A1 (en) 1995-09-14
JPH08510623A (ja) 1996-11-05
FR2717325A1 (fr) 1995-09-15
US5565881A (en) 1996-10-15
TW256965B (enExample) 1995-09-11
FI955362A0 (fi) 1995-11-08
AU1832595A (en) 1995-09-25
GB9522907D0 (en) 1996-01-10
ITRM950140A0 (it) 1995-03-08

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Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8131 Rejection