DE112022007061T5 - Halbleitervorrichtung - Google Patents

Halbleitervorrichtung Download PDF

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Publication number
DE112022007061T5
DE112022007061T5 DE112022007061.7T DE112022007061T DE112022007061T5 DE 112022007061 T5 DE112022007061 T5 DE 112022007061T5 DE 112022007061 T DE112022007061 T DE 112022007061T DE 112022007061 T5 DE112022007061 T5 DE 112022007061T5
Authority
DE
Germany
Prior art keywords
switching element
measuring
gate terminal
voltage
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112022007061.7T
Other languages
German (de)
English (en)
Inventor
Kana Iseri
Yasuo ATA
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Publication of DE112022007061T5 publication Critical patent/DE112022007061T5/de
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/18Modifications for indicating state of switch
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02HEMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H3/00Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection
    • H02H3/08Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition with or without subsequent reconnection ; integrated protection responsive to excess current
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/082Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit
    • H03K17/0822Modifications for protecting switching circuit against overcurrent or overvoltage by feedback from the output to the control circuit in field-effect transistor switches
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/12Modifications for increasing the maximum permissible switched current
    • H03K17/122Modifications for increasing the maximum permissible switched current in field-effect transistor switches
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/16Modifications for eliminating interference voltages or currents
    • H03K17/161Modifications for eliminating interference voltages or currents in field-effect transistor switches
    • H03K17/165Modifications for eliminating interference voltages or currents in field-effect transistor switches by feedback from the output circuit to the control circuit
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K2217/00Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
    • H03K2217/0027Measuring means of, e.g. currents through or voltages across the switch
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/811Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements

Landscapes

  • Power Conversion In General (AREA)
  • Semiconductor Integrated Circuits (AREA)
DE112022007061.7T 2022-04-14 2022-04-14 Halbleitervorrichtung Pending DE112022007061T5 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2022/017811 WO2023199472A1 (ja) 2022-04-14 2022-04-14 半導体装置

Publications (1)

Publication Number Publication Date
DE112022007061T5 true DE112022007061T5 (de) 2025-01-23

Family

ID=88329393

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112022007061.7T Pending DE112022007061T5 (de) 2022-04-14 2022-04-14 Halbleitervorrichtung

Country Status (5)

Country Link
US (1) US20250158383A1 (https=)
JP (1) JP7720993B2 (https=)
CN (1) CN118974940A (https=)
DE (1) DE112022007061T5 (https=)
WO (1) WO2023199472A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240072639A1 (en) * 2022-08-25 2024-02-29 Lear Corporation Junction Box Having Parallel Switch Failure Detection

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5289580B2 (ja) * 2009-10-20 2013-09-11 三菱電機株式会社 半導体装置
JP5361788B2 (ja) * 2010-04-20 2013-12-04 三菱電機株式会社 パワーモジュール
DE112011102926B4 (de) * 2010-09-03 2018-10-11 Mitsubishi Electric Corp. Halbleiterbauteil
JPWO2014097739A1 (ja) * 2012-12-17 2017-01-12 富士電機株式会社 半導体装置
JP2015122442A (ja) * 2013-12-24 2015-07-02 本田技研工業株式会社 半導体装置
JP6439460B2 (ja) * 2015-01-23 2018-12-19 株式会社デンソー 駆動装置
WO2017199949A1 (ja) * 2016-05-20 2017-11-23 株式会社デンソー スイッチング素子の駆動制御装置
JP6673186B2 (ja) * 2016-12-26 2020-03-25 株式会社デンソー 電力変換器制御装置
JP6451890B1 (ja) * 2018-07-25 2019-01-16 富士電機株式会社 駆動装置およびスイッチング装置
EP3736864B1 (en) * 2019-05-06 2023-04-19 Infineon Technologies Austria AG Semiconductor device
US20230139229A1 (en) * 2020-05-29 2023-05-04 Mitsubishi Electric Corporation Semiconductor device and power converter
US20240421689A1 (en) * 2023-06-14 2024-12-19 Amber Semiconductor, Inc. Ac-to-dc power conversion with ground reference to common node of solid-state ac switch

Also Published As

Publication number Publication date
WO2023199472A1 (ja) 2023-10-19
CN118974940A (zh) 2024-11-15
JP7720993B2 (ja) 2025-08-08
US20250158383A1 (en) 2025-05-15
JPWO2023199472A1 (https=) 2023-10-19

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