DE112016001458T5 - Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation - Google Patents

Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation Download PDF

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Publication number
DE112016001458T5
DE112016001458T5 DE112016001458.9T DE112016001458T DE112016001458T5 DE 112016001458 T5 DE112016001458 T5 DE 112016001458T5 DE 112016001458 T DE112016001458 T DE 112016001458T DE 112016001458 T5 DE112016001458 T5 DE 112016001458T5
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DE
Germany
Prior art keywords
electron
ion source
ions
ionization
trochoidal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112016001458.9T
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German (de)
English (en)
Inventor
Nicholas Wilton
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meridion LLC
Original Assignee
Meridion LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meridion LLC filed Critical Meridion LLC
Publication of DE112016001458T5 publication Critical patent/DE112016001458T5/de
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
    • H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/328—Static spectrometers using double focusing with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
DE112016001458.9T 2015-03-29 2016-03-29 Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation Pending DE112016001458T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562139758P 2015-03-29 2015-03-29
US62/139,758 2015-03-29
PCT/US2016/024757 WO2016160835A1 (en) 2015-03-29 2016-03-29 Apparatus for mass analysis of analytes by simultaneous positive and negative ionization

Publications (1)

Publication Number Publication Date
DE112016001458T5 true DE112016001458T5 (de) 2017-12-14

Family

ID=57006367

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112016001458.9T Pending DE112016001458T5 (de) 2015-03-29 2016-03-29 Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation

Country Status (5)

Country Link
US (2) US10153150B2 (enExample)
JP (1) JP6550468B2 (enExample)
DE (1) DE112016001458T5 (enExample)
GB (1) GB2552615B (enExample)
WO (1) WO2016160835A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016160835A1 (en) * 2015-03-29 2016-10-06 Meridion, Llc Apparatus for mass analysis of analytes by simultaneous positive and negative ionization
US11043370B2 (en) 2018-07-20 2021-06-22 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
US10670561B2 (en) * 2018-07-20 2020-06-02 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
JP6943897B2 (ja) * 2019-01-18 2021-10-06 日本電子株式会社 マススペクトル処理装置及び方法
US20210175063A1 (en) 2019-12-10 2021-06-10 Thermo Finnigan Llc Axial ci source - off-axis electron beam
CN117147673B (zh) * 2023-10-24 2024-01-26 广州源古纪科技有限公司 一种呼气质谱检测方法、系统及设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4933551A (en) * 1989-06-05 1990-06-12 The United State Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Reversal electron attachment ionizer for detection of trace species
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
JP4186889B2 (ja) * 1999-04-15 2008-11-26 株式会社日立製作所 質量分析装置
US6919562B1 (en) * 2002-05-31 2005-07-19 Analytica Of Branford, Inc. Fragmentation methods for mass spectrometry
WO2003103007A1 (en) * 2002-06-03 2003-12-11 The State Of Oregon Acting By And Through The State Board Of Higher Education Onbehalf Of Oregonof Oregon State University Mass spectrometer
CA2525978C (en) * 2003-05-30 2011-07-19 Purdue Research Foundation Process for increasing ionic charge in mass spectrometry
US7576324B2 (en) 2003-09-05 2009-08-18 Griffin Analytical Technologies, L.L.C. Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry
GB201104225D0 (en) * 2011-03-14 2011-04-27 Micromass Ltd Pre scan for mass to charge ratio range
WO2016160835A1 (en) * 2015-03-29 2016-10-06 Meridion, Llc Apparatus for mass analysis of analytes by simultaneous positive and negative ionization

Also Published As

Publication number Publication date
GB2552615A (en) 2018-01-31
US10153150B2 (en) 2018-12-11
WO2016160835A1 (en) 2016-10-06
US10720317B2 (en) 2020-07-21
JP2018514909A (ja) 2018-06-07
HK1250551A1 (zh) 2018-12-21
GB2552615B (en) 2021-07-14
JP6550468B2 (ja) 2019-07-24
GB201715070D0 (en) 2017-11-01
US20180068841A1 (en) 2018-03-08
US20190115201A1 (en) 2019-04-18

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Representative=s name: VENNER SHIPLEY LLP, DE

Representative=s name: BUCHER, RALF, DIPL.-ING. UNIV., DE

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