JP6550468B2 - 正及び負の同時イオン化による分析物の質量分析のための装置 - Google Patents

正及び負の同時イオン化による分析物の質量分析のための装置 Download PDF

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Publication number
JP6550468B2
JP6550468B2 JP2017552078A JP2017552078A JP6550468B2 JP 6550468 B2 JP6550468 B2 JP 6550468B2 JP 2017552078 A JP2017552078 A JP 2017552078A JP 2017552078 A JP2017552078 A JP 2017552078A JP 6550468 B2 JP6550468 B2 JP 6550468B2
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Japan
Prior art keywords
electron
ion source
ion
ions
ionization
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JP2017552078A
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Japanese (ja)
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JP2018514909A5 (enExample
JP2018514909A (ja
Inventor
ウィルソン ニコラス
ウィルソン ニコラス
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Meridion LLC
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Meridion LLC
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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
    • H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/328—Static spectrometers using double focusing with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2017552078A 2015-03-29 2016-03-29 正及び負の同時イオン化による分析物の質量分析のための装置 Active JP6550468B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201562139758P 2015-03-29 2015-03-29
US62/139,758 2015-03-29
PCT/US2016/024757 WO2016160835A1 (en) 2015-03-29 2016-03-29 Apparatus for mass analysis of analytes by simultaneous positive and negative ionization

Publications (3)

Publication Number Publication Date
JP2018514909A JP2018514909A (ja) 2018-06-07
JP2018514909A5 JP2018514909A5 (enExample) 2019-05-09
JP6550468B2 true JP6550468B2 (ja) 2019-07-24

Family

ID=57006367

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017552078A Active JP6550468B2 (ja) 2015-03-29 2016-03-29 正及び負の同時イオン化による分析物の質量分析のための装置

Country Status (5)

Country Link
US (2) US10153150B2 (enExample)
JP (1) JP6550468B2 (enExample)
DE (1) DE112016001458T5 (enExample)
GB (1) GB2552615B (enExample)
WO (1) WO2016160835A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112016001458T5 (de) * 2015-03-29 2017-12-14 Meridion, Llc Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation
US10670561B2 (en) * 2018-07-20 2020-06-02 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
US11043370B2 (en) 2018-07-20 2021-06-22 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
JP6943897B2 (ja) * 2019-01-18 2021-10-06 日本電子株式会社 マススペクトル処理装置及び方法
US20210175063A1 (en) 2019-12-10 2021-06-10 Thermo Finnigan Llc Axial ci source - off-axis electron beam
CN117147673B (zh) * 2023-10-24 2024-01-26 广州源古纪科技有限公司 一种呼气质谱检测方法、系统及设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4933551A (en) * 1989-06-05 1990-06-12 The United State Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Reversal electron attachment ionizer for detection of trace species
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
JP4186889B2 (ja) * 1999-04-15 2008-11-26 株式会社日立製作所 質量分析装置
US6919562B1 (en) * 2002-05-31 2005-07-19 Analytica Of Branford, Inc. Fragmentation methods for mass spectrometry
WO2003103007A1 (en) * 2002-06-03 2003-12-11 The State Of Oregon Acting By And Through The State Board Of Higher Education Onbehalf Of Oregonof Oregon State University Mass spectrometer
AU2003232448A1 (en) * 2003-05-30 2005-01-04 Purdue Research Foundation Process for increasing ionic charge in mass spectrometry
WO2005024882A2 (en) 2003-09-05 2005-03-17 Griffin Analytical Technologies Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry
GB201104225D0 (en) * 2011-03-14 2011-04-27 Micromass Ltd Pre scan for mass to charge ratio range
DE112016001458T5 (de) * 2015-03-29 2017-12-14 Meridion, Llc Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation

Also Published As

Publication number Publication date
HK1250551A1 (zh) 2018-12-21
GB2552615A (en) 2018-01-31
US20190115201A1 (en) 2019-04-18
US10720317B2 (en) 2020-07-21
JP2018514909A (ja) 2018-06-07
DE112016001458T5 (de) 2017-12-14
US10153150B2 (en) 2018-12-11
GB201715070D0 (en) 2017-11-01
GB2552615B (en) 2021-07-14
US20180068841A1 (en) 2018-03-08
WO2016160835A1 (en) 2016-10-06

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