HK1250551A1 - 通過同時正負電離對分析物進行質量分析的裝置 - Google Patents
通過同時正負電離對分析物進行質量分析的裝置Info
- Publication number
- HK1250551A1 HK1250551A1 HK18109864.4A HK18109864A HK1250551A1 HK 1250551 A1 HK1250551 A1 HK 1250551A1 HK 18109864 A HK18109864 A HK 18109864A HK 1250551 A1 HK1250551 A1 HK 1250551A1
- Authority
- HK
- Hong Kong
- Prior art keywords
- analytes
- mass analysis
- negative ionization
- simultaneous positive
- simultaneous
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
- H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0027—Methods for using particle spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/22—Electrostatic deflection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/28—Static spectrometers
- H01J49/32—Static spectrometers using double focusing
- H01J49/328—Static spectrometers using double focusing with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201562139758P | 2015-03-29 | 2015-03-29 | |
PCT/US2016/024757 WO2016160835A1 (en) | 2015-03-29 | 2016-03-29 | Apparatus for mass analysis of analytes by simultaneous positive and negative ionization |
Publications (1)
Publication Number | Publication Date |
---|---|
HK1250551A1 true HK1250551A1 (zh) | 2018-12-21 |
Family
ID=57006367
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HK18109864.4A HK1250551A1 (zh) | 2015-03-29 | 2018-07-31 | 通過同時正負電離對分析物進行質量分析的裝置 |
Country Status (6)
Country | Link |
---|---|
US (2) | US10153150B2 (zh) |
JP (1) | JP6550468B2 (zh) |
DE (1) | DE112016001458T5 (zh) |
GB (1) | GB2552615B (zh) |
HK (1) | HK1250551A1 (zh) |
WO (1) | WO2016160835A1 (zh) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2552615B (en) * | 2015-03-29 | 2021-07-14 | Meridion Llc | Apparatus for mass analysis of analytes by simultaneous positive and negative ionization |
US10670561B2 (en) * | 2018-07-20 | 2020-06-02 | Battelle Memorial Institute | Device and system for selective ionization and analyte detection and method of using the same |
US11043370B2 (en) | 2018-07-20 | 2021-06-22 | Battelle Memorial Institute | Device and system for selective ionization and analyte detection and method of using the same |
JP6943897B2 (ja) * | 2019-01-18 | 2021-10-06 | 日本電子株式会社 | マススペクトル処理装置及び方法 |
US20210175063A1 (en) | 2019-12-10 | 2021-06-10 | Thermo Finnigan Llc | Axial ci source - off-axis electron beam |
CN117147673B (zh) * | 2023-10-24 | 2024-01-26 | 广州源古纪科技有限公司 | 一种呼气质谱检测方法、系统及设备 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4933551A (en) * | 1989-06-05 | 1990-06-12 | The United State Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Reversal electron attachment ionizer for detection of trace species |
US5340983A (en) | 1992-05-18 | 1994-08-23 | The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University | Method and apparatus for mass analysis using slow monochromatic electrons |
JP4186889B2 (ja) * | 1999-04-15 | 2008-11-26 | 株式会社日立製作所 | 質量分析装置 |
US6919562B1 (en) * | 2002-05-31 | 2005-07-19 | Analytica Of Branford, Inc. | Fragmentation methods for mass spectrometry |
WO2003103007A1 (en) * | 2002-06-03 | 2003-12-11 | The State Of Oregon Acting By And Through The State Board Of Higher Education Onbehalf Of Oregonof Oregon State University | Mass spectrometer |
WO2004109274A1 (en) * | 2003-05-30 | 2004-12-16 | Purdue Research Foundation | Process for increasing ionic charge in mass spectrometry |
WO2005024882A2 (en) * | 2003-09-05 | 2005-03-17 | Griffin Analytical Technologies | Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry |
GB201104225D0 (en) | 2011-03-14 | 2011-04-27 | Micromass Ltd | Pre scan for mass to charge ratio range |
GB2552615B (en) * | 2015-03-29 | 2021-07-14 | Meridion Llc | Apparatus for mass analysis of analytes by simultaneous positive and negative ionization |
-
2016
- 2016-03-29 GB GB1715070.7A patent/GB2552615B/en active Active
- 2016-03-29 DE DE112016001458.9T patent/DE112016001458T5/de active Pending
- 2016-03-29 JP JP2017552078A patent/JP6550468B2/ja active Active
- 2016-03-29 WO PCT/US2016/024757 patent/WO2016160835A1/en active Application Filing
- 2016-03-29 US US15/560,386 patent/US10153150B2/en active Active
-
2018
- 2018-07-31 HK HK18109864.4A patent/HK1250551A1/zh unknown
- 2018-12-10 US US16/214,566 patent/US10720317B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
DE112016001458T5 (de) | 2017-12-14 |
JP6550468B2 (ja) | 2019-07-24 |
US20190115201A1 (en) | 2019-04-18 |
GB2552615B (en) | 2021-07-14 |
GB2552615A (en) | 2018-01-31 |
WO2016160835A1 (en) | 2016-10-06 |
US20180068841A1 (en) | 2018-03-08 |
US10153150B2 (en) | 2018-12-11 |
GB201715070D0 (en) | 2017-11-01 |
JP2018514909A (ja) | 2018-06-07 |
US10720317B2 (en) | 2020-07-21 |
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