GB2552615B - Apparatus for mass analysis of analytes by simultaneous positive and negative ionization - Google Patents

Apparatus for mass analysis of analytes by simultaneous positive and negative ionization Download PDF

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Publication number
GB2552615B
GB2552615B GB1715070.7A GB201715070A GB2552615B GB 2552615 B GB2552615 B GB 2552615B GB 201715070 A GB201715070 A GB 201715070A GB 2552615 B GB2552615 B GB 2552615B
Authority
GB
United Kingdom
Prior art keywords
analytes
mass analysis
negative ionization
simultaneous positive
simultaneous
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
GB1715070.7A
Other languages
English (en)
Other versions
GB2552615A (en
GB201715070D0 (en
Inventor
Wilton Nicholas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Meridion LLC
Original Assignee
Meridion LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Meridion LLC filed Critical Meridion LLC
Publication of GB201715070D0 publication Critical patent/GB201715070D0/en
Publication of GB2552615A publication Critical patent/GB2552615A/en
Application granted granted Critical
Publication of GB2552615B publication Critical patent/GB2552615B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/284—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer
    • H01J49/286—Static spectrometers using electrostatic and magnetic sectors with simple focusing, e.g. with parallel fields such as Aston spectrometer with energy analysis, e.g. Castaing filter
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0095—Particular arrangements for generating, introducing or analyzing both positive and negative analyte ions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/328—Static spectrometers using double focusing with a cycloidal trajectory by using crossed electric and magnetic fields, e.g. trochoidal type

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
GB1715070.7A 2015-03-29 2016-03-29 Apparatus for mass analysis of analytes by simultaneous positive and negative ionization Active GB2552615B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201562139758P 2015-03-29 2015-03-29
PCT/US2016/024757 WO2016160835A1 (en) 2015-03-29 2016-03-29 Apparatus for mass analysis of analytes by simultaneous positive and negative ionization

Publications (3)

Publication Number Publication Date
GB201715070D0 GB201715070D0 (en) 2017-11-01
GB2552615A GB2552615A (en) 2018-01-31
GB2552615B true GB2552615B (en) 2021-07-14

Family

ID=57006367

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1715070.7A Active GB2552615B (en) 2015-03-29 2016-03-29 Apparatus for mass analysis of analytes by simultaneous positive and negative ionization

Country Status (5)

Country Link
US (2) US10153150B2 (enExample)
JP (1) JP6550468B2 (enExample)
DE (1) DE112016001458T5 (enExample)
GB (1) GB2552615B (enExample)
WO (1) WO2016160835A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE112016001458T5 (de) * 2015-03-29 2017-12-14 Meridion, Llc Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation
US10670561B2 (en) * 2018-07-20 2020-06-02 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
US11043370B2 (en) 2018-07-20 2021-06-22 Battelle Memorial Institute Device and system for selective ionization and analyte detection and method of using the same
JP6943897B2 (ja) * 2019-01-18 2021-10-06 日本電子株式会社 マススペクトル処理装置及び方法
US20210175063A1 (en) 2019-12-10 2021-06-10 Thermo Finnigan Llc Axial ci source - off-axis electron beam
CN117147673B (zh) * 2023-10-24 2024-01-26 广州源古纪科技有限公司 一种呼气质谱检测方法、系统及设备

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
WO2003103007A1 (en) * 2002-06-03 2003-12-11 The State Of Oregon Acting By And Through The State Board Of Higher Education Onbehalf Of Oregonof Oregon State University Mass spectrometer
US20070015158A1 (en) * 2003-05-30 2007-01-18 Mcluckey Scott A Process for increasing ionic charge in mass spectrometry
US20070057176A1 (en) * 2003-09-05 2007-03-15 Grossenbacher John W Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry
US20140048701A1 (en) * 2011-03-14 2014-02-20 Micromass Uk Limited Pre-Scan For Mass to Charge Ratio Range

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4933551A (en) * 1989-06-05 1990-06-12 The United State Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Reversal electron attachment ionizer for detection of trace species
JP4186889B2 (ja) * 1999-04-15 2008-11-26 株式会社日立製作所 質量分析装置
US6919562B1 (en) * 2002-05-31 2005-07-19 Analytica Of Branford, Inc. Fragmentation methods for mass spectrometry
DE112016001458T5 (de) * 2015-03-29 2017-12-14 Meridion, Llc Vorrichtung zur Massenanalyse von Analyten durch gleichzeitige positive und negative Ionisation

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5340983A (en) * 1992-05-18 1994-08-23 The State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Oregon State University Method and apparatus for mass analysis using slow monochromatic electrons
WO2003103007A1 (en) * 2002-06-03 2003-12-11 The State Of Oregon Acting By And Through The State Board Of Higher Education Onbehalf Of Oregonof Oregon State University Mass spectrometer
US20070015158A1 (en) * 2003-05-30 2007-01-18 Mcluckey Scott A Process for increasing ionic charge in mass spectrometry
US20070057176A1 (en) * 2003-09-05 2007-03-15 Grossenbacher John W Ion detection methods, mass spectrometry analysis methods, and mass spectrometry instrument circuitry
US20140048701A1 (en) * 2011-03-14 2014-02-20 Micromass Uk Limited Pre-Scan For Mass to Charge Ratio Range

Also Published As

Publication number Publication date
HK1250551A1 (zh) 2018-12-21
GB2552615A (en) 2018-01-31
US20190115201A1 (en) 2019-04-18
US10720317B2 (en) 2020-07-21
JP2018514909A (ja) 2018-06-07
DE112016001458T5 (de) 2017-12-14
US10153150B2 (en) 2018-12-11
JP6550468B2 (ja) 2019-07-24
GB201715070D0 (en) 2017-11-01
US20180068841A1 (en) 2018-03-08
WO2016160835A1 (en) 2016-10-06

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