DE112013003726T5 - Mit einem Strahl geladener Teilchen arbeitende Vorrichtung und Probenbeobachtungsverfahren - Google Patents
Mit einem Strahl geladener Teilchen arbeitende Vorrichtung und Probenbeobachtungsverfahren Download PDFInfo
- Publication number
- DE112013003726T5 DE112013003726T5 DE201311003726 DE112013003726T DE112013003726T5 DE 112013003726 T5 DE112013003726 T5 DE 112013003726T5 DE 201311003726 DE201311003726 DE 201311003726 DE 112013003726 T DE112013003726 T DE 112013003726T DE 112013003726 T5 DE112013003726 T5 DE 112013003726T5
- Authority
- DE
- Germany
- Prior art keywords
- sample
- charged particle
- detector
- particle beam
- housing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/16—Vessels; Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2002—Controlling environment of sample
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/244—Detection characterized by the detecting means
- H01J2237/24455—Transmitted particle detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2602—Details
- H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012-181305 | 2012-08-20 | ||
| JP2012181305A JP5936484B2 (ja) | 2012-08-20 | 2012-08-20 | 荷電粒子線装置及び試料観察方法 |
| PCT/JP2013/067756 WO2014030430A1 (ja) | 2012-08-20 | 2013-06-28 | 荷電粒子線装置及び試料観察方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE112013003726T5 true DE112013003726T5 (de) | 2015-05-13 |
Family
ID=50149746
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE202013012246.3U Expired - Lifetime DE202013012246U1 (de) | 2012-08-20 | 2013-06-28 | Mit einem Strahl geladener Teilchen arbeitende Vorrichtung |
| DE201311003726 Ceased DE112013003726T5 (de) | 2012-08-20 | 2013-06-28 | Mit einem Strahl geladener Teilchen arbeitende Vorrichtung und Probenbeobachtungsverfahren |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE202013012246.3U Expired - Lifetime DE202013012246U1 (de) | 2012-08-20 | 2013-06-28 | Mit einem Strahl geladener Teilchen arbeitende Vorrichtung |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9418818B2 (enExample) |
| JP (1) | JP5936484B2 (enExample) |
| KR (1) | KR101671323B1 (enExample) |
| CN (1) | CN104584181B (enExample) |
| DE (2) | DE202013012246U1 (enExample) |
| GB (1) | GB2519038A (enExample) |
| IN (1) | IN2015DN00908A (enExample) |
| WO (1) | WO2014030430A1 (enExample) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE112014001777T5 (de) * | 2013-05-10 | 2016-01-14 | Hitachi High-Technologies Corporation | Mit einem Strahl geladener Teilchen arbeitende Vorrichtung |
| CN107272352B (zh) * | 2013-09-07 | 2021-02-02 | Asml荷兰有限公司 | 目标处理单元 |
| JP6169506B2 (ja) * | 2014-02-19 | 2017-07-26 | 株式会社日立ハイテクノロジーズ | 試料ホルダ、観察システム、および画像生成方法 |
| NL2012780B1 (en) | 2014-05-08 | 2016-02-23 | Univ Delft Tech | Apparatus and method for inspecting a sample using a plurality of charged particle beams. |
| US10903042B2 (en) | 2014-05-08 | 2021-01-26 | Technische Universiteit Delft | Apparatus and method for inspecting a sample using a plurality of charged particle beams |
| AT516561B1 (de) * | 2014-12-10 | 2019-07-15 | Verein Zur Foerderung Der Elektronenmikroskopie Und Feinstrukturforschung | Elektronenmikroskop und Verfahren zum Untersuchen einer Probe mit einem Elektronenmikroskop |
| JP2017050046A (ja) * | 2015-08-31 | 2017-03-09 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
| US11024481B2 (en) * | 2016-03-04 | 2021-06-01 | Fei Company | Scanning electron microscope |
| NL2016367B1 (en) * | 2016-03-04 | 2017-09-19 | Phenom-World Holding B V | Scanning electron microscope |
| US20210233740A1 (en) * | 2016-04-22 | 2021-07-29 | Hitachi High-Technologies Corporation | Charged Particle Microscope and Method of Imaging Sample |
| CN109155226B (zh) * | 2016-05-23 | 2020-04-24 | 株式会社日立高新技术 | 试样保持装置及具备该试样保持装置的带电粒子线装置 |
| JP2020017415A (ja) * | 2018-07-26 | 2020-01-30 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
| US10777379B1 (en) * | 2019-03-19 | 2020-09-15 | Hitachi High-Tech Corporation | Holder and charged particle beam apparatus |
| CN113966465B (zh) * | 2019-06-12 | 2025-06-06 | 学校法人东海大学 | 观察试样用覆盖用具、覆盖用具包装体及观察试样的覆盖方法 |
| BE1028265B1 (nl) * | 2020-05-05 | 2021-12-06 | Matthias Iturrospe | Scanning microscoop mechanisme en werkwijze voor het laden van preparaten |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2066618A (en) | 1979-12-28 | 1981-07-08 | Nat Res Dev | Electron microscope image recording system |
| JP2602287B2 (ja) | 1988-07-01 | 1997-04-23 | 株式会社日立製作所 | X線マスクの欠陥検査方法及びその装置 |
| US4975578A (en) * | 1989-04-17 | 1990-12-04 | The Research Foundation Of State University Of Ny | Method and apparatus for determining distribution of mass density |
| JPH1064467A (ja) * | 1996-08-23 | 1998-03-06 | Toshiba Corp | 電子顕微鏡 |
| JPH10283978A (ja) * | 1997-04-10 | 1998-10-23 | Hamamatsu Photonics Kk | 電子検出器 |
| WO2000039836A1 (en) | 1998-12-29 | 2000-07-06 | Philips Electron Optics B.V. | Sem for transmission operation with a location-sensitive detector |
| IL156027A0 (en) | 2000-12-01 | 2003-12-23 | El Mul Technologies Ltd | Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope |
| US6844543B2 (en) * | 2002-07-03 | 2005-01-18 | The Regents Of The University Of California | Quantitation of absorbed or deposited materials on a substrate that measures energy deposition |
| JP4636897B2 (ja) * | 2005-02-18 | 2011-02-23 | 株式会社日立ハイテクサイエンスシステムズ | 走査電子顕微鏡 |
| JP5002251B2 (ja) * | 2006-12-06 | 2012-08-15 | 日本電子株式会社 | 試料検査方法及び試料検査装置 |
| JP5253800B2 (ja) | 2007-12-26 | 2013-07-31 | 日本電子株式会社 | 試料保持体及び観察・検査方法並びに観察・検査装置 |
| EP2105944A1 (en) | 2008-03-28 | 2009-09-30 | FEI Company | Environmental cell for a particle-optical apparatus |
| WO2010001399A1 (en) | 2008-07-03 | 2010-01-07 | B-Nano | A scanning electron microscope, an interface and a method for observing an object within a non-vacuum environment |
| US8299432B2 (en) * | 2008-11-04 | 2012-10-30 | Fei Company | Scanning transmission electron microscope using gas amplification |
| JP2011129343A (ja) * | 2009-12-17 | 2011-06-30 | Jeol Ltd | 荷電粒子線装置の試料ホルダ |
| JP2011243483A (ja) | 2010-05-20 | 2011-12-01 | Jeol Ltd | 試料保持体、検査装置、及び検査方法 |
| JP5320418B2 (ja) * | 2011-01-31 | 2013-10-23 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
| JP5699023B2 (ja) * | 2011-04-11 | 2015-04-08 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置 |
-
2012
- 2012-08-20 JP JP2012181305A patent/JP5936484B2/ja not_active Expired - Fee Related
-
2013
- 2013-06-28 KR KR1020147036503A patent/KR101671323B1/ko not_active Expired - Fee Related
- 2013-06-28 IN IN908DEN2015 patent/IN2015DN00908A/en unknown
- 2013-06-28 GB GB1501866.6A patent/GB2519038A/en not_active Withdrawn
- 2013-06-28 DE DE202013012246.3U patent/DE202013012246U1/de not_active Expired - Lifetime
- 2013-06-28 DE DE201311003726 patent/DE112013003726T5/de not_active Ceased
- 2013-06-28 US US14/422,552 patent/US9418818B2/en not_active Expired - Fee Related
- 2013-06-28 WO PCT/JP2013/067756 patent/WO2014030430A1/ja not_active Ceased
- 2013-06-28 CN CN201380040935.6A patent/CN104584181B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20150228447A1 (en) | 2015-08-13 |
| WO2014030430A1 (ja) | 2014-02-27 |
| JP2014038787A (ja) | 2014-02-27 |
| KR101671323B1 (ko) | 2016-11-02 |
| DE202013012246U1 (de) | 2015-10-21 |
| IN2015DN00908A (enExample) | 2015-06-12 |
| JP5936484B2 (ja) | 2016-06-22 |
| CN104584181A (zh) | 2015-04-29 |
| KR20150022907A (ko) | 2015-03-04 |
| US9418818B2 (en) | 2016-08-16 |
| GB2519038A (en) | 2015-04-08 |
| GB201501866D0 (en) | 2015-03-18 |
| CN104584181B (zh) | 2017-07-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R138 | Derivation of utility model |
Ref document number: 202013012246 Country of ref document: DE |
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| R012 | Request for examination validly filed | ||
| R002 | Refusal decision in examination/registration proceedings | ||
| R003 | Refusal decision now final |