DE112012006049T5 - Strömungssensor mit Herstellungsverfahren - Google Patents
Strömungssensor mit Herstellungsverfahren Download PDFInfo
- Publication number
- DE112012006049T5 DE112012006049T5 DE112012006049.0T DE112012006049T DE112012006049T5 DE 112012006049 T5 DE112012006049 T5 DE 112012006049T5 DE 112012006049 T DE112012006049 T DE 112012006049T DE 112012006049 T5 DE112012006049 T5 DE 112012006049T5
- Authority
- DE
- Germany
- Prior art keywords
- semiconductor chip
- frame body
- detection unit
- flow sensor
- flow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
- G01F1/684—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow
- G01F1/688—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow using a particular type of heating, cooling or sensing element
- G01F1/69—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow using a particular type of heating, cooling or sensing element of resistive type
- G01F1/692—Thin-film arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
- G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
- G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
- G01F1/684—Structural arrangements; Mounting of elements, e.g. in relation to fluid flow
- G01F1/6845—Micromachined devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/1015—Shape
- H01L2924/10155—Shape being other than a cuboid
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Landscapes
- Physics & Mathematics (AREA)
- Fluid Mechanics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Volume Flow (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012062577A JP5763575B2 (ja) | 2012-03-19 | 2012-03-19 | 流量センサおよびその製造方法 |
JP2012-062577 | 2012-03-19 | ||
PCT/JP2012/081340 WO2013140674A1 (ja) | 2012-03-19 | 2012-12-04 | 流量センサおよびその製造方法 |
Publications (1)
Publication Number | Publication Date |
---|---|
DE112012006049T5 true DE112012006049T5 (de) | 2014-12-18 |
Family
ID=49222161
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE112012006049.0T Withdrawn DE112012006049T5 (de) | 2012-03-19 | 2012-12-04 | Strömungssensor mit Herstellungsverfahren |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5763575B2 (ja) |
CN (2) | CN104024807B (ja) |
DE (1) | DE112012006049T5 (ja) |
WO (1) | WO2013140674A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE112013006033B4 (de) | 2012-12-17 | 2021-10-07 | Hitachi Automotive Systems, Ltd. | Sensor für physikalische Größen |
DE112013006408B4 (de) | 2013-01-11 | 2021-10-14 | Hitachi Automotive Systems, Ltd. | Durchflusssensor und Fertigungsverfahren dafür |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10444175B2 (en) | 2015-04-03 | 2019-10-15 | Denso Corporation | Measurement device |
JP6507804B2 (ja) * | 2015-04-03 | 2019-05-08 | 株式会社デンソー | 空気流量測定装置 |
JP6553587B2 (ja) * | 2016-12-20 | 2019-07-31 | Nissha株式会社 | ガスセンサモジュール及びその製造方法 |
JP6905962B2 (ja) * | 2018-07-12 | 2021-07-21 | 日立Astemo株式会社 | 流量センサ |
WO2022208931A1 (ja) * | 2021-03-29 | 2022-10-06 | 日立Astemo株式会社 | 流量測定装置 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0469958A (ja) * | 1990-07-10 | 1992-03-05 | Mitsubishi Electric Corp | 半導体装置 |
CN1040577C (zh) * | 1990-08-01 | 1998-11-04 | 涂相征 | 一种集成硅膜热流量传感器及其制造方法 |
JP3882592B2 (ja) * | 2001-11-26 | 2007-02-21 | 松下電工株式会社 | 半導体イオンセンサとその製造方法 |
EP1365216B1 (en) * | 2002-05-10 | 2018-01-17 | Azbil Corporation | Flow sensor and method of manufacturing the same |
JP4609019B2 (ja) * | 2004-09-24 | 2011-01-12 | 株式会社デンソー | 熱式流量センサ及びその製造方法 |
JP4966526B2 (ja) * | 2005-09-07 | 2012-07-04 | 日立オートモティブシステムズ株式会社 | 流量センサ |
JP5012330B2 (ja) * | 2007-08-29 | 2012-08-29 | 株式会社デンソー | センサ装置の製造方法及びセンサ装置 |
JP5168184B2 (ja) * | 2009-02-23 | 2013-03-21 | 株式会社デンソー | センサ装置およびその製造方法 |
JP5208099B2 (ja) * | 2009-12-11 | 2013-06-12 | 日立オートモティブシステムズ株式会社 | 流量センサとその製造方法、及び流量センサモジュール |
JP5315304B2 (ja) * | 2010-07-30 | 2013-10-16 | 日立オートモティブシステムズ株式会社 | 熱式流量計 |
-
2012
- 2012-03-19 JP JP2012062577A patent/JP5763575B2/ja not_active Expired - Fee Related
- 2012-12-04 WO PCT/JP2012/081340 patent/WO2013140674A1/ja active Application Filing
- 2012-12-04 DE DE112012006049.0T patent/DE112012006049T5/de not_active Withdrawn
- 2012-12-04 CN CN201280065517.8A patent/CN104024807B/zh not_active Expired - Fee Related
- 2012-12-04 CN CN201610390927.XA patent/CN106092233B/zh not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE112013006033B4 (de) | 2012-12-17 | 2021-10-07 | Hitachi Automotive Systems, Ltd. | Sensor für physikalische Größen |
DE112013006408B4 (de) | 2013-01-11 | 2021-10-14 | Hitachi Automotive Systems, Ltd. | Durchflusssensor und Fertigungsverfahren dafür |
Also Published As
Publication number | Publication date |
---|---|
CN104024807A (zh) | 2014-09-03 |
JP5763575B2 (ja) | 2015-08-12 |
JP2013195231A (ja) | 2013-09-30 |
CN104024807B (zh) | 2016-07-06 |
CN106092233B (zh) | 2019-01-22 |
CN106092233A (zh) | 2016-11-09 |
WO2013140674A1 (ja) | 2013-09-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R012 | Request for examination validly filed | ||
R016 | Response to examination communication | ||
R081 | Change of applicant/patentee |
Owner name: HITACHI ASTEMO, LTD., HITACHINAKA-SHI, JP Free format text: FORMER OWNER: HITACHI AUTOMOTIVE SYSTEMS, LTD., HITACHINAKA-SHI, IBARAKI, JP |
|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |