DE112007002399B4 - Elektronenquelle für Vakuumdruckmessgerät - Google Patents
Elektronenquelle für Vakuumdruckmessgerät Download PDFInfo
- Publication number
- DE112007002399B4 DE112007002399B4 DE112007002399.6T DE112007002399T DE112007002399B4 DE 112007002399 B4 DE112007002399 B4 DE 112007002399B4 DE 112007002399 T DE112007002399 T DE 112007002399T DE 112007002399 B4 DE112007002399 B4 DE 112007002399B4
- Authority
- DE
- Germany
- Prior art keywords
- vacuum
- pressure gauge
- vacuum pressure
- nanomembrane
- cathode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000012528 membrane Substances 0.000 claims abstract description 30
- 150000002500 ions Chemical class 0.000 claims abstract description 14
- 239000000463 material Substances 0.000 claims description 14
- 239000002041 carbon nanotube Substances 0.000 claims description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 12
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 12
- 239000000919 ceramic Substances 0.000 claims description 7
- 239000011888 foil Substances 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 6
- 238000005516 engineering process Methods 0.000 claims description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 230000001133 acceleration Effects 0.000 claims description 4
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 239000010935 stainless steel Substances 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 4
- 238000012423 maintenance Methods 0.000 claims description 3
- 238000005086 pumping Methods 0.000 claims description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 238000005273 aeration Methods 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 230000015572 biosynthetic process Effects 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- 229910000510 noble metal Inorganic materials 0.000 claims description 2
- 229910052574 oxide ceramic Inorganic materials 0.000 claims description 2
- 239000011224 oxide ceramic Substances 0.000 claims description 2
- 229910052594 sapphire Inorganic materials 0.000 claims description 2
- 239000010980 sapphire Substances 0.000 claims description 2
- 239000011343 solid material Substances 0.000 claims description 2
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 claims 1
- 238000000034 method Methods 0.000 description 14
- 239000007789 gas Substances 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 238000009530 blood pressure measurement Methods 0.000 description 7
- 238000000605 extraction Methods 0.000 description 7
- 238000005530 etching Methods 0.000 description 5
- 238000009423 ventilation Methods 0.000 description 5
- 238000000926 separation method Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- HXELGNKCCDGMMN-UHFFFAOYSA-N [F].[Cl] Chemical compound [F].[Cl] HXELGNKCCDGMMN-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 239000010405 anode material Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000010406 cathode material Substances 0.000 description 1
- 239000000356 contaminant Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000009795 derivation Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- 239000002082 metal nanoparticle Substances 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 231100000572 poisoning Toxicity 0.000 description 1
- 230000000607 poisoning effect Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/32—Vacuum gauges by making use of ionisation effects using electric discharge tubes with thermionic cathodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/34—Vacuum gauges by making use of ionisation effects using electric discharge tubes with cold cathodes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Fluid Pressure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CH19832006 | 2006-12-06 | ||
| CH1983/06 | 2006-12-06 | ||
| PCT/CH2007/000588 WO2008067681A1 (de) | 2006-12-06 | 2007-11-23 | Elektronenquelle für vakuumdruckmessgerät |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE112007002399A5 DE112007002399A5 (de) | 2009-10-22 |
| DE112007002399B4 true DE112007002399B4 (de) | 2014-02-06 |
Family
ID=37840464
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE112007002399.6T Expired - Fee Related DE112007002399B4 (de) | 2006-12-06 | 2007-11-23 | Elektronenquelle für Vakuumdruckmessgerät |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8018234B2 (https=) |
| JP (1) | JP5252739B2 (https=) |
| DE (1) | DE112007002399B4 (https=) |
| GB (1) | GB2457831B (https=) |
| WO (1) | WO2008067681A1 (https=) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7845235B2 (en) | 2007-11-06 | 2010-12-07 | Costin Sandu | Non-invasive system and method for measuring vacuum pressure in a fluid |
| DE102008003676B4 (de) * | 2008-01-09 | 2011-07-21 | Bruker Daltonik GmbH, 28359 | Ionenmobilitätsspektrometer mit einer nicht radioaktiven Elektronenquelle |
| DE102008032333A1 (de) * | 2008-07-09 | 2010-06-10 | Drägerwerk AG & Co. KGaA | Miniaturisierter nicht-radioaktiver Elektronenemitter |
| WO2012091715A1 (en) | 2010-12-30 | 2012-07-05 | Utc Fire & Security Corporation | Ionization window |
| DE102011055089B4 (de) * | 2011-11-07 | 2014-10-09 | Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh | Messvorrichtung |
| US11406415B2 (en) | 2012-06-11 | 2022-08-09 | Tenex Health, Inc. | Systems and methods for tissue treatment |
| WO2014014742A1 (en) * | 2012-07-17 | 2014-01-23 | Fergenson David Phillip | System for and techniques of manufacturing a monolithic analytical instrument |
| US9962181B2 (en) | 2014-09-02 | 2018-05-08 | Tenex Health, Inc. | Subcutaneous wound debridement |
| US10692692B2 (en) * | 2015-05-27 | 2020-06-23 | Kla-Tencor Corporation | System and method for providing a clean environment in an electron-optical system |
| US10545258B2 (en) * | 2016-03-24 | 2020-01-28 | Schlumberger Technology Corporation | Charged particle emitter assembly for radiation generator |
| EP3998467B1 (en) * | 2019-09-13 | 2024-01-03 | Canon Anelva Corporation | Ionization vacuum gauge and cartridge |
| US11976992B2 (en) * | 2019-09-20 | 2024-05-07 | Inficon ag | Vacuum-tight electrical feedthrough |
| CN110702301B (zh) * | 2019-11-19 | 2024-11-01 | 川北真空科技(北京)有限公司 | 一种薄膜真空计 |
| CH719946A2 (de) * | 2022-08-08 | 2024-02-15 | Inficon ag | Kammer für Ionisationsvakuummeter. |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050028602A1 (en) * | 2003-08-08 | 2005-02-10 | Raffaele Correale | Ionisation vacuum gauge |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60139241U (ja) * | 1984-02-27 | 1985-09-14 | 日本原子力研究所 | 荷電粒子分析器の電離真空計 |
| JP3324395B2 (ja) * | 1995-10-31 | 2002-09-17 | 富士電機株式会社 | 電界型真空管とそれを用いた圧力センサ、加速度センサおよびそれらの製造方法 |
| JP2003149069A (ja) * | 2001-11-13 | 2003-05-21 | Ishikawajima Harima Heavy Ind Co Ltd | 真空スイッチ及びこれを用いた真空排気装置並びにイオン式真空計 |
| ITTO20030626A1 (it) * | 2003-08-08 | 2005-02-09 | Varian Spa | Vacuometro a ionizzazione. |
| US7030619B2 (en) * | 2004-02-19 | 2006-04-18 | Brooks Automation, Inc. | Ionization gauge |
| US8182590B2 (en) * | 2005-04-29 | 2012-05-22 | University Of Rochester | Ultrathin porous nanoscale membranes, methods of making, and uses thereof |
-
2007
- 2007-11-23 WO PCT/CH2007/000588 patent/WO2008067681A1/de not_active Ceased
- 2007-11-23 US US12/516,375 patent/US8018234B2/en not_active Expired - Fee Related
- 2007-11-23 GB GB0907151A patent/GB2457831B/en not_active Expired - Fee Related
- 2007-11-23 JP JP2009539582A patent/JP5252739B2/ja not_active Expired - Fee Related
- 2007-11-23 DE DE112007002399.6T patent/DE112007002399B4/de not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050028602A1 (en) * | 2003-08-08 | 2005-02-10 | Raffaele Correale | Ionisation vacuum gauge |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2008067681A1 (de) | 2008-06-12 |
| US20100066380A1 (en) | 2010-03-18 |
| US8018234B2 (en) | 2011-09-13 |
| JP5252739B2 (ja) | 2013-07-31 |
| GB2457831B (en) | 2011-08-24 |
| GB2457831A (en) | 2009-09-02 |
| DE112007002399A5 (de) | 2009-10-22 |
| GB0907151D0 (en) | 2009-06-03 |
| JP2010511875A (ja) | 2010-04-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8110 | Request for examination paragraph 44 | ||
| R016 | Response to examination communication | ||
| R018 | Grant decision by examination section/examining division | ||
| R020 | Patent grant now final | ||
| R020 | Patent grant now final |
Effective date: 20141107 |
|
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |