WO2008067681A1 - Elektronenquelle für vakuumdruckmessgerät - Google Patents
Elektronenquelle für vakuumdruckmessgerät Download PDFInfo
- Publication number
- WO2008067681A1 WO2008067681A1 PCT/CH2007/000588 CH2007000588W WO2008067681A1 WO 2008067681 A1 WO2008067681 A1 WO 2008067681A1 CH 2007000588 W CH2007000588 W CH 2007000588W WO 2008067681 A1 WO2008067681 A1 WO 2008067681A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- vacuum
- vacuum pressure
- pressure gauge
- nanomembrane
- cathode
- Prior art date
Links
- 239000012528 membrane Substances 0.000 claims abstract description 35
- 150000002500 ions Chemical class 0.000 claims abstract description 14
- 239000000463 material Substances 0.000 claims description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 11
- 239000002041 carbon nanotube Substances 0.000 claims description 11
- 229910021393 carbon nanotube Inorganic materials 0.000 claims description 11
- 239000000919 ceramic Substances 0.000 claims description 7
- 239000011888 foil Substances 0.000 claims description 7
- 230000005540 biological transmission Effects 0.000 claims description 6
- 230000001133 acceleration Effects 0.000 claims description 5
- 238000005516 engineering process Methods 0.000 claims description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 4
- 238000012423 maintenance Methods 0.000 claims description 4
- 239000010935 stainless steel Substances 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 4
- 238000005273 aeration Methods 0.000 claims description 3
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 2
- 229910045601 alloy Inorganic materials 0.000 claims description 2
- 239000000956 alloy Substances 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- 229910052759 nickel Inorganic materials 0.000 claims description 2
- 150000004767 nitrides Chemical class 0.000 claims description 2
- 229910000510 noble metal Inorganic materials 0.000 claims description 2
- 239000011224 oxide ceramic Substances 0.000 claims description 2
- 229910052574 oxide ceramic Inorganic materials 0.000 claims description 2
- 238000005086 pumping Methods 0.000 claims description 2
- 229910052594 sapphire Inorganic materials 0.000 claims description 2
- 239000010980 sapphire Substances 0.000 claims description 2
- 239000011343 solid material Substances 0.000 claims description 2
- GEIAQOFPUVMAGM-UHFFFAOYSA-N ZrO Inorganic materials [Zr]=O GEIAQOFPUVMAGM-UHFFFAOYSA-N 0.000 claims 1
- 238000005192 partition Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 description 14
- 238000009530 blood pressure measurement Methods 0.000 description 9
- 239000007789 gas Substances 0.000 description 8
- 238000005259 measurement Methods 0.000 description 8
- 238000000605 extraction Methods 0.000 description 7
- 238000005530 etching Methods 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 238000009423 ventilation Methods 0.000 description 4
- 239000002245 particle Substances 0.000 description 3
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 238000011109 contamination Methods 0.000 description 2
- 230000006378 damage Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010894 electron beam technology Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- HXELGNKCCDGMMN-UHFFFAOYSA-N [F].[Cl] Chemical compound [F].[Cl] HXELGNKCCDGMMN-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 239000010405 anode material Substances 0.000 description 1
- 239000012876 carrier material Substances 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 239000010406 cathode material Substances 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000005342 ion exchange Methods 0.000 description 1
- 238000000752 ionisation method Methods 0.000 description 1
- 239000002082 metal nanoparticle Substances 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 231100000572 poisoning Toxicity 0.000 description 1
- 230000000607 poisoning effect Effects 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000003380 propellant Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012549 training Methods 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/32—Vacuum gauges by making use of ionisation effects using electric discharge tubes with thermionic cathodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L21/00—Vacuum gauges
- G01L21/30—Vacuum gauges by making use of ionisation effects
- G01L21/34—Vacuum gauges by making use of ionisation effects using electric discharge tubes with cold cathodes
Definitions
- the invention relates to a vacuum pressure gauge with an electron source and with a reaction zone for the formation of ions by impact ionization, according to the preamble of claim 1.
- the invention relates to the vacuum pressure measurement or vacuum pressure gauges, which is based on ionization of the gas molecules, both for the total pressure measurement (lonisationsmanometer) and for the partial pressure measurement (mass spectrometer).
- an electron source is necessary, which is arranged in close proximity to the ionization space, as is known in the prior art.
- the electron source has under measurement conditions in vacuum pressure ranges of less than 1 Pa (10 2 mbar), in high pressure measuring tubes 1 to 2 decades higher, the task of emitting electrons in the ionization space.
- For the electron emission especially hot cathodes (annealing emission) have been used.
- electron sources with field emitters (field emission) have also been proposed for vacuum pressure measurement, which hitherto could not prevail commercially in terms of their conditions of use and / or the production outlay.
- An interaction between the electron source and the ionization or measuring chamber is conditionally necessary in such vacuum pressure measuring cells.
- a rapid ventilation of the arrangement for example for opening a process vacuum chamber for the charging of workpieces to be treated, is particularly problematic because the oxygen attack leads to the destruction of the active, electron-emitting hot cathode (see incandescent lamp).
- special protective measures must be taken in each case.
- Further problems arise with contaminations, above all by means of propellants Backing pumps, such as rotary vane pumps.
- the present invention has the object of protecting the electron source of a vacuum pressure measuring device from the influences of the vacuum processes in which such measuring devices are used.
- a protection should also be realized in relation to ventilation of the vacuum process chambers and thus also of the measuring device, so that the electron source is not unduly contaminated or even destroyed or expensive additional electronic protective measures are necessary.
- sensitive vacuum processes are to be protected from harmful emissions of the measuring cell itself and in particular those that emanate from the electron source of the measuring cell.
- the measuring cell should be economical to produce.
- the vacuum pressure measuring device contains an electron source with a reaction zone for the formation of ions by collision, wherein the electron source is communicatively connected to the reaction zone via a passage opening for the electrons.
- the electron source is enclosed by an insulating housing with a vacuum space, and a wall part is formed as a membrane carrier which at least in a partial area carries a nanomembrane which separates the vacuum space from the outside in a gas-tight manner and at least partially electron-permeable, wherein in this vacuum space, a cathode is arranged for the emission of electrons and that in the region and / or on the nanomembrane an anode arrangement is provided such that electrons against the nanomembrane and at least partially therethrough are passed, wherein the nanomembrane adjacent to the vacuum space of the vacuum pressure gauge.
- the electron source is thus eliminated by decoupling electron source and ionization or measuring space by a vacuum-technically effective separation of both regions, while maintaining the ionization principle.
- the separation is achieved by encapsulating the electron source in a vacuum-tight manner in a housing and arranging a nanomembrane between the electron source and the ionization or measuring space such that electrostatically accelerated electrons (electron beam) pass through the nanomembrane.
- this nanomembrane prevents gas and ion exchange between the electron source region and the ionization or measurement space.
- a substantial advantage of the separation of electron source and ionization or measuring space by means of a nanomembrane is that very different physical and chemical conditions, in particular also vacuum conditions, can be maintained or adjusted separately in both spatial regions, even during a vacuum total. Partial pressure measurement, resulting in new or extended applications for such vacuum pressure gauges.
- the electrode arrangement is to be designed so that a maximum electron transmission through the nanomembrane is achieved, preferably below Use of suitable cathode and anode materials, arrangements and geometries.
- the nanomembrane is permeable for appropriately accelerated electrons. It must be gas-tight, so the evacuated housing with the sensitive parts, such as cathodes, to reliably separate the electrons from the external influences and thereby protect and still be sufficiently permeable to accelerated electrons.
- the pressure difference, which the membrane has to withstand in extreme cases, can in this case go up to about 1.5 times the atmospheric pressure, for example if a process chamber is vacuumed very quickly with the vacuum pressure gauge. Accordingly, high demands are placed on this nanomembrane.
- Suitable materials for this membrane are: metal foils and preferably ceramic membranes, preferably nitride (eg Si 3 N 4 ) and oxide ceramics, in particular aluminum oxide (Al 2 O 3 ), zirconium oxide (ZrO 2 ) and yttrium oxide (Y 2 O 3 ) because these materials are especially temperature- and etch-resistant. Also possible are mixed forms of ceramics. The use of alpha-alumina or, preferably, sapphire or mixed forms thereof is advantageous. When using a metal foil as a nanomembrane (5), this advantageously consists of a nickel, aluminum, copper or noble metal foil or alloys thereof. A very cost-effective embodiment is that the nanomembrane (5) is formed from a stainless steel foil, preferably from the same material of the housing wall (42) of the vacuum gauge.
- nitride eg Si 3 N 4
- oxide ceramics in particular aluminum oxide (Al 2 O 3 ), zirconium oxide (ZrO 2 ) and yttrium oxide (
- the thickness of the membrane is in the range of 25 to 500 nm, preferably in the range of 100 to 200 nm and is vacuum-tight.
- the surface sizes can be in the range of 0.1 to 40.0 mm 2 .
- Particularly suitable surface sizes are in the range of 0.1 to 1.0 mm 2 , preferably in the range of 0.3 to 0.7 mm 2 .
- a square shape 0.1 x 0.1 mm 2 to 1, O x 1, 0 mm 2 preferably square from 0.3 x 0.3 mm 2 to 0.5 x 0.5 mm 2 , or circular with Diameter 0.3 mm to 0.7 mm or even rectangular with the narrow side in the preferred dimensions 0.3 mm to 0.5 mm with lengths up to a few centimeters depending on the application needs adapted to the geometry of the electron emitter or cathode used.
- the dimensions are also adjusted depending on the material and the thickness of the nanomembrane, wherein the maintenance of vacuum tightness under operating conditions is an important dimensioning criterion. In addition, care must be taken that the membrane can withstand the atmospheric pressure that occurs when the system is ventilated and is not destroyed. The thickness and dimensions of the material used must be carefully dimensioned accordingly. It is favorable if dimensioning is carried out in such a way that the extent in one direction at such a load through aeration is a maximum of 0.7 mm, preferably a maximum of 0.5 mm. For the stability of the nanomembrane to atmospheric pressure, it is sufficient if these have a max. Width less than about 0.7 mm (width depending on the nanomembrane thickness) has.
- the length can then be adjusted arbitrarily, ie the application task, eg for a line emitter with the length of the anode grid in a Bayard-Alpert measuring tube (BAG).
- the entire surface can thus be larger than 40mm 2 .
- the electrons are accelerated away from the electron emitter or the cathode with an accelerating voltage against the membrane window, so that they have enough energy to pass through the membrane effectively with a corresponding degree of efficiency.
- the anode voltage is a grid arrangement in front of the membrane or the membrane itself.
- the acceleration voltage between cathode and anode is in the range of a few kV up to several 10 kV, preferably in the range of 5 kV to 50 kV and in particular in the range of preferably 10KV to 50KV. It is selected, for example, depending on the thickness of the membrane and the material, preferably a ceramic, such that an electron transmission of more than 90% is achieved.
- the acceleration voltage V E for extraction and transmission of the electrons through the nanomembrane should not be chosen larger than necessary, so that the ionization probability does not decrease significantly and the effort for the anode voltage supply V A remains limited.
- the nanomembrane is produced, for example, by etching from the materials Si 3 N 4 , SiO 2 or SiC material, as is known from the prior art.
- Such examples are presented in: Friedemann Völklein, Thomas Zetterer "Introduction to Microsystems Technology - Fundamentals and Practical Examples" Friedr. Vieweg & Sohn Verlagsgesellschaft mbH, Braunschweig / Wiesbaden, August 2000 (ISBN 3-528-03891-8).
- An advantageous effect of the invention is the prevention of gas- or ion-based interactions between electron source region and ionization or measuring range. That is the condition for the
- cathodes as known from tube technology, in particular television tube technology (CRT), but which are sensitive to oxygen (poisoning or destruction of the cathode), for example during aeration of the vacuum process system or the vacuum pressure measuring device.
- CRT television tube technology
- Such cathodes for CRT's are produced in large quantities cost-effectively and with high constant quality.
- field emission cathodes in particular of the type microtip or carbon nanotube (CNT).
- Nanostructured field emission surfaces such as a structured field emission film which is deposited on a cathode support, or the surface is structured on the solid material of the support and is preferably made of a stainless steel, are also particularly suitable.
- a field emission cathode of this type is disclosed in the patent application US 2006/0202701 A1 and its content is explained as an integral part of the present application.
- FIG. 1 shows schematically and in cross-section an electron source according to the invention with a directly heated hot cathode, arranged inside the housing,
- FIG. 2 shows schematically and in cross section an electron source according to the invention with an indirectly heated hot cathode, disposed within the housing,
- FIG. 5 shows a detailed detail of the diode arrangement according to FIG. 4 with microtip field emitter cathode
- FIG. 6 shows a detail of the diode arrangement according to FIG. 4 with field emitter cathode as CNT field emitter, FIG.
- FIG. 7 shows a detailed detail of the diode arrangement according to FIG. 4 with field emitter cathode, which is designed as a nanostructured surface or as a structured applied field emitter thin film,
- FIG. 8 shows an ionization total pressure measuring cell with electron source mounted laterally on the housing wall of the measuring cell
- FIG. 10 shows an ionization total pressure measuring cell with an electron source mounted inside the measuring cell, in which the housing of the electron source has an opening which connects the vacuum space of the electron source to the vacuum space of the total pressure measuring cell,
- the electron source 1 comprises an insulating housing 6, for example of a ceramic, which encloses a vacuum space 7 and on one side on the housing wall, a nanomembrane 5 with the thickness d n and the dimensions di at square, circular or rectangular (while in the second side dimension freely selectable) membrane design which separates the vacuum chamber 7 from the environment gas-tight.
- the environment is another vacuum zone which forms part of a vacuum pressure gauge or a mass spectrometer which is communicatively connected to fulfill its measuring task with a vacuum chamber in which a vacuum process takes place.
- the membrane 5 is advantageously arranged on a membrane carrier 4, which can advantageously form part of the wall of the housing 6 directly.
- the vacuum within the housing 6 is maintained advantageously by a getter 8 to a good and stable vacuum preferably better than 10 "6 mbar, to be able to maintain. Getter 8 may be disposed directly within the housing 6 or au- sser Halb of the housing 6 in an encapsulated separate volume which is connected through an opening to the vacuum space 7.
- the housing has dimensions ranging from a few mm to a few cm, making it compact and usable as a module
- the housing 6 has a connection or connection with a vacuum valve with a vacuum pump system arranged thereon, preferably with a turbomolecular pump, for the continuous or discontinuous maintenance of the vacuum conditions A getter 8 is then no longer necessary.
- a cathode 2 is arranged, which is carried out sealingly via a bushing 10 with connection contacts through the housing wall in order to connect them with an electrical power supply can.
- the cathodes 2 can be designed in different ways. Opposite the cathode 2, spaced apart with the distance a, a1, in the region of the membrane 5, an anode 3 is arranged, which in turn is connected to a lead-out terminal contact 11 is.
- the anode 3 may surround the membrane 5 or is formed as a lattice structure, which is arranged over the membrane surface, wherein the anode 3 also advantageously serves to dissipate the heat loss from the membrane 5.
- the cathode 2 can be designed in various ways, and thus also the cathode-anode configuration.
- FIG. 1 shows an electron source with a hot cathode or a thermionic cathode 2 as electron emitter, which is arranged at a distance from the anode 3 and the membrane 5 by a1.
- Distance a1 here is chosen slightly larger, also to keep the thermal load of the membrane 5 within limits. In the case of thermionic cathodes 2, it is necessary to focus specifically on the thermal load in the dimensioning of the membrane 5 with the
- Membrane carrier 4 are respected.
- thermionic cathode 2 is shown as an indirectly heated, highly efficient cathode with surface emitter in Figure 2.
- the cathode-anode distance a1 can also be chosen slightly lower.
- the cathode 2 is designed as a field emitter, for example as a field center array.
- the field emitter is in this case arranged on a cathode support 9 or formed thereon.
- a control grid 12 is advantageously arranged, which is positioned at a short distance with a spacer 13 in front of the areally arranged field emitter.
- the control grid 12 also serves as an extraction grid for the extraction of the electrons and is connected to an electrical connection 14 which is also guided to the outside to drive.
- This arrangement forms a triode configuration with the cathode 2, the grid 12 and the anode 3. In this case, the distance a1 between the cathode 2 with grid 12 from the anode 3 is rather chosen.
- FIG. 4 shows a diode configuration.
- the field emission cathode arranged flat on the cathode support 9 is brought to the membrane 5 at a smaller distance a1, so that no control grid 12 is necessary.
- Various preferred embodiments of field emitter cathodes 2 are shown in detail section 15 in FIGS. 5 to 7.
- the field emitter arrangements shown there can be used both in the triode and in the diode configuration, ie with or without control grid 12.
- FIG. 5 shows an arrangement with a microtip field emitter cathode.
- cathode 2 a plurality of small tips are arranged in a surface, preferably a plane, which emit electrons at a sufficiently high field strength, the microtip field emitter cathode having a long service life protected by the diaphragm 5.
- FIG. 6 shows the diode arrangement according to FIG. 4, in which the field emitter cathode is designed as a carbon nanotube (CNT) field emitter.
- CNT carbon nanotube
- a field emitter cathode which is designed as a nanostructured surface or as a structured applied field emitter thin layer. In this case, for example, by etching the surface of a layer or the support material itself on the surface tip-like or edge-like electron-emissive structures are generated from the base material.
- Very advantageous here is the direct use of the carrier material 9, in particular if it consists of an Inox material.
- a preferred use of the electron source 1, according to the present invention, is schematically for total pressure vacuum measuring cells and shown for example in Figures 8 to 10. It is an ionization cell or tube, such as the Art Bayard-Alpert tube or an extractor gauge.
- the measuring cell is arranged on a base plate 41. This carries the tubular measuring cell housing wall 42, which accommodates the anode 45 which is arranged spirally or lattice-like in it and which encloses the reaction space 30 with the ion collector 44 arranged therein.
- the electron source 1 according to the invention tion is arranged laterally on the wall 42 in which an opening 40 is formed for the passage of the electrons.
- the electrons are thus injected directly from the membrane 5 of the electron source 1 via the opening 40 into the reaction zone 30 of the measuring cell. Due to the completely gas-tight encapsulation of the electron source 1, it is protected and there are no impurities which can disturb a measurement.
- the acceleration voltage V E which is applied between the cathode 2 of the electron source 1 and the housing of the measuring cell, the base plate 41 and the wall 42, the electrons can be extracted and fed into the measuring cell.
- the measuring cell is operated in a known manner with an anode voltage V A and a regulator 46, which regulates this constant by detecting the anode current U.
- the measuring cell includes the measurement of the ion collector current hc with appropriate evaluation for vacuum pressure determination.
- FIG. 10 shows the vacuum pressure measuring cell with an axial arrangement of the electron source 1, wherein it is arranged inside the measuring cell and the membrane 5 is directed against the reaction zone 30.
- This integrated design is possible because the electron source 1 can be realized with small dimensions.
- FIG. 10 A particularly inexpensive type of training is shown in FIG. 10 where the electron source housing 6 is indirectly communicatively connected via an opening to the vacuum region of the measuring cell. The opening is remote from the reaction zone 30 of the measuring cell, so that the electron source housing 6 acts as a shield and protects the inner region of the electron source 1 and also the measuring cell from undesired influences, while ensuring the electron transmission into the reaction space 30 via the membrane 5.
- no additional expense is necessary to generate and maintain a vacuum 7 within the electron source. However, then a complete protection of the electron source 1, for example in a ventilation no longer exists.
- FIG. 11 shows a further preferred embodiment.
- a brake grid 43 is arranged in the vacuum gauge.
- V 6 a braking voltage
- the kinetic energy of the electrons transmitted through the nanomembrane 5 can be lowered so far that a higher ionization probability of the gas molecules in the reaction zone 30 and thus a higher measurement sensitivity of the vacuum gauge, eg to extend the lower vacuum pressure measurement limit, is set.
- FIG. 12 shows a further preferred application for partial pressure measuring devices, such as mass spectrometers, in section, along the longitudinal axis, the electron source 1 being arranged orthogonal to the ion source, for the radial feeding of the electrons into the ion source, that is to say the reaction zone 30, mass spectrometer.
- the electrons 21 pass through the membrane 5 and are guided with the electron extraction lens 25, which surrounds the reaction zone 30 like a chamber through an opening 40 in this zone.
- the neutral particles 20 to be measured are ionized by ionization and ions 22 are formed.
- one or more openings 23 are provided for introducing the neutral particles to be analyzed 20.
- this chamber 3 closes off again with an ion extraction lens 24 for extraction of the ions 22 formed which further lenses 26, focusing lens 27, injection aperture 28 are guided into the analysis system of the mass spectrometer 29.
- the electron source 1 and thus the electron injection can also take place in the axial direction when the arrangement is to be carried out particularly easily.
- the radial arrangement is preferred because of the better measurement quality.
- the electron source 1 according to the invention can be advantageously used in various types of mass spectrometers.
- a quadrupole mass spectrometer is particularly suitable here, as has been described in the present example according to FIG. 11, since the membrane separation of the electron source 1 guarantees particularly pure conditions, which leads to high measurement resolution and reproducibility of the measurements.
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- General Physics & Mathematics (AREA)
- Measuring Fluid Pressure (AREA)
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0907151A GB2457831B (en) | 2006-12-06 | 2007-11-23 | Electron source for a vacuum pressure measuring device |
US12/516,375 US8018234B2 (en) | 2006-12-06 | 2007-11-23 | Electron source for a vacuum pressure measuring device |
DE112007002399.6T DE112007002399B4 (de) | 2006-12-06 | 2007-11-23 | Elektronenquelle für Vakuumdruckmessgerät |
JP2009539582A JP5252739B2 (ja) | 2006-12-06 | 2007-11-23 | 真空圧力測定装置 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CH19832006 | 2006-12-06 | ||
CH1983/06 | 2006-12-06 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008067681A1 true WO2008067681A1 (de) | 2008-06-12 |
Family
ID=37840464
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CH2007/000588 WO2008067681A1 (de) | 2006-12-06 | 2007-11-23 | Elektronenquelle für vakuumdruckmessgerät |
Country Status (5)
Country | Link |
---|---|
US (1) | US8018234B2 (de) |
JP (1) | JP5252739B2 (de) |
DE (1) | DE112007002399B4 (de) |
GB (1) | GB2457831B (de) |
WO (1) | WO2008067681A1 (de) |
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US7845235B2 (en) | 2007-11-06 | 2010-12-07 | Costin Sandu | Non-invasive system and method for measuring vacuum pressure in a fluid |
DE102011055089A1 (de) * | 2011-11-07 | 2013-05-08 | Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh | Ionisationsmanometer |
US11406415B2 (en) | 2012-06-11 | 2022-08-09 | Tenex Health, Inc. | Systems and methods for tissue treatment |
US11457937B2 (en) | 2014-09-02 | 2022-10-04 | Tenex Health, Inc. | Subcutaneous wound debridement |
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US8785874B2 (en) | 2010-12-30 | 2014-07-22 | Walter Kidde Portable Equipment, Inc. | Ionization window |
WO2014014742A1 (en) * | 2012-07-17 | 2014-01-23 | Fergenson David Phillip | System for and techniques of manufacturing a monolithic analytical instrument |
US10692692B2 (en) * | 2015-05-27 | 2020-06-23 | Kla-Tencor Corporation | System and method for providing a clean environment in an electron-optical system |
US10545258B2 (en) * | 2016-03-24 | 2020-01-28 | Schlumberger Technology Corporation | Charged particle emitter assembly for radiation generator |
EP3998467B1 (de) * | 2019-09-13 | 2024-01-03 | Canon Anelva Corporation | Ionisationsvakuummeter und kartusche |
CN114364960A (zh) * | 2019-09-20 | 2022-04-15 | 英福康有限公司 | 真空密封的电气馈通装置 |
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- 2007-11-23 JP JP2009539582A patent/JP5252739B2/ja not_active Expired - Fee Related
- 2007-11-23 DE DE112007002399.6T patent/DE112007002399B4/de not_active Expired - Fee Related
- 2007-11-23 US US12/516,375 patent/US8018234B2/en not_active Expired - Fee Related
- 2007-11-23 GB GB0907151A patent/GB2457831B/en not_active Expired - Fee Related
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US20050028602A1 (en) * | 2003-08-08 | 2005-02-10 | Raffaele Correale | Ionisation vacuum gauge |
WO2006119251A2 (en) * | 2005-04-29 | 2006-11-09 | University Of Rochester | Ultrathin porous nanoscale membranes, methods of making, and uses thereof |
Cited By (7)
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US7845235B2 (en) | 2007-11-06 | 2010-12-07 | Costin Sandu | Non-invasive system and method for measuring vacuum pressure in a fluid |
GB2460729A (en) * | 2008-07-09 | 2009-12-16 | Draegerwerk Ag & Co Kgaa | Miniaturised non-radioactive electron emitter |
DE102008032333A1 (de) * | 2008-07-09 | 2010-06-10 | Drägerwerk AG & Co. KGaA | Miniaturisierter nicht-radioaktiver Elektronenemitter |
DE102011055089A1 (de) * | 2011-11-07 | 2013-05-08 | Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh | Ionisationsmanometer |
DE102011055089B4 (de) * | 2011-11-07 | 2014-10-09 | Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh | Messvorrichtung |
US11406415B2 (en) | 2012-06-11 | 2022-08-09 | Tenex Health, Inc. | Systems and methods for tissue treatment |
US11457937B2 (en) | 2014-09-02 | 2022-10-04 | Tenex Health, Inc. | Subcutaneous wound debridement |
Also Published As
Publication number | Publication date |
---|---|
US20100066380A1 (en) | 2010-03-18 |
JP5252739B2 (ja) | 2013-07-31 |
DE112007002399A5 (de) | 2009-10-22 |
JP2010511875A (ja) | 2010-04-15 |
DE112007002399B4 (de) | 2014-02-06 |
GB2457831A (en) | 2009-09-02 |
GB2457831B (en) | 2011-08-24 |
GB0907151D0 (en) | 2009-06-03 |
US8018234B2 (en) | 2011-09-13 |
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