WO2008047267A3 - X-ray tube with ion deflecting and collecting device made from a getter material - Google Patents

X-ray tube with ion deflecting and collecting device made from a getter material Download PDF

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Publication number
WO2008047267A3
WO2008047267A3 PCT/IB2007/054121 IB2007054121W WO2008047267A3 WO 2008047267 A3 WO2008047267 A3 WO 2008047267A3 IB 2007054121 W IB2007054121 W IB 2007054121W WO 2008047267 A3 WO2008047267 A3 WO 2008047267A3
Authority
WO
WIPO (PCT)
Prior art keywords
ion
ray tube
getter material
manipulation arrangement
collecting device
Prior art date
Application number
PCT/IB2007/054121
Other languages
French (fr)
Other versions
WO2008047267A2 (en
Inventor
Stefan Hauttmann
Original Assignee
Philips Intellectual Property
Koninkl Philips Electronics Nv
Stefan Hauttmann
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Intellectual Property, Koninkl Philips Electronics Nv, Stefan Hauttmann filed Critical Philips Intellectual Property
Priority to EP07826703A priority Critical patent/EP2082411A2/en
Priority to JP2009531964A priority patent/JP2010507188A/en
Publication of WO2008047267A2 publication Critical patent/WO2008047267A2/en
Publication of WO2008047267A3 publication Critical patent/WO2008047267A3/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/20—Selection of substances for gas fillings; Means for obtaining or maintaining the desired pressure within the tube, e.g. by gettering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J41/00—Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas; Discharge tubes for evacuation by diffusion of ions
    • H01J41/12—Discharge tubes for evacuating by diffusion of ions, e.g. ion pumps, getter ion pumps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J7/00—Details not provided for in the preceding groups and common to two or more basic types of discharge tubes or lamps
    • H01J7/14—Means for obtaining or maintaining the desired pressure within the vessel
    • H01J7/18—Means for absorbing or adsorbing gas, e.g. by gettering
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/20—Arrangements for controlling gases within the X-ray tube
    • H01J2235/205—Gettering

Landscapes

  • X-Ray Techniques (AREA)

Abstract

It is described an X-ray tube (100) comprising an ion manipulation arrangement (140) having at least one ion collector electrode (141). The ion collector electrode (141) is made at least partially from a getter material. The ion manipulation arrangement (140) is in particular beneficial for high-end X-ray-tubes including an electrical field-free region (131). The ion manipulation arrangement (140) produces an electrical field, which deflects ions (150). When impinging onto the getter electrode (141) the ions (150) are permanently collected and thus removed from the interior of an evacuated envelope of the X-ray tube (100). This avoids ion bombardment on an electron emitter (111) of the X-ray tube (100). Additionally the arcing rate caused by residual gas can be reduced significantly. A heating of the getter material may be realized with heating wires or by a defined bombardment of scattered electrons (322) onto the electrodes (341, 342) comprising the getter material.
PCT/IB2007/054121 2006-10-16 2007-10-10 X-ray tube with ion deflecting and collecting device made from a getter material WO2008047267A2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP07826703A EP2082411A2 (en) 2006-10-16 2007-10-10 X-ray tube with ion deflecting and collecting device made from a getter material
JP2009531964A JP2010507188A (en) 2006-10-16 2007-10-10 X-ray tube with ion deflection and collection device made of getter material

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06122319.4 2006-10-16
EP06122319 2006-10-16

Publications (2)

Publication Number Publication Date
WO2008047267A2 WO2008047267A2 (en) 2008-04-24
WO2008047267A3 true WO2008047267A3 (en) 2008-09-04

Family

ID=39231810

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/IB2007/054121 WO2008047267A2 (en) 2006-10-16 2007-10-10 X-ray tube with ion deflecting and collecting device made from a getter material

Country Status (4)

Country Link
EP (1) EP2082411A2 (en)
JP (1) JP2010507188A (en)
CN (1) CN101523543A (en)
WO (1) WO2008047267A2 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8284900B2 (en) * 2010-10-26 2012-10-09 General Electric Company Apparatus and method for improved transient response in an electromagnetically controlled X-ray tube
US9564283B2 (en) 2012-06-14 2017-02-07 Excillum Ab Limiting migration of target material
CN102842477B (en) * 2012-09-20 2015-09-23 苏州生物医学工程技术研究所 X-ray tube
CN104616952B (en) * 2012-12-31 2019-03-15 同方威视技术股份有限公司 Yin controls more cathode distribution X-ray apparatus
JP6244897B2 (en) * 2013-12-26 2017-12-13 株式会社島津製作所 X-ray analyzer

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1061793A (en) * 1963-06-24 1967-03-15 Field Emission Corp Method of producing x-ray pulses
JPS5590039A (en) * 1978-12-28 1980-07-08 Jeol Ltd X-ray generator
US6044129A (en) * 1997-11-21 2000-03-28 Picker International, Inc. Gas overload and metalization prevention for x-ray tubes
JP2003016981A (en) * 2001-06-29 2003-01-17 Toshiba Corp Rotating anode type x-ray tube
JP2004146158A (en) * 2002-10-23 2004-05-20 Shigekimi Kita Field emission type x-ray source

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1061793A (en) * 1963-06-24 1967-03-15 Field Emission Corp Method of producing x-ray pulses
JPS5590039A (en) * 1978-12-28 1980-07-08 Jeol Ltd X-ray generator
US6044129A (en) * 1997-11-21 2000-03-28 Picker International, Inc. Gas overload and metalization prevention for x-ray tubes
JP2003016981A (en) * 2001-06-29 2003-01-17 Toshiba Corp Rotating anode type x-ray tube
JP2004146158A (en) * 2002-10-23 2004-05-20 Shigekimi Kita Field emission type x-ray source

Also Published As

Publication number Publication date
CN101523543A (en) 2009-09-02
EP2082411A2 (en) 2009-07-29
JP2010507188A (en) 2010-03-04
WO2008047267A2 (en) 2008-04-24

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