DE10323085A1 - CVD-Beschichtungsvorrichtung - Google Patents
CVD-Beschichtungsvorrichtung Download PDFInfo
- Publication number
- DE10323085A1 DE10323085A1 DE10323085A DE10323085A DE10323085A1 DE 10323085 A1 DE10323085 A1 DE 10323085A1 DE 10323085 A DE10323085 A DE 10323085A DE 10323085 A DE10323085 A DE 10323085A DE 10323085 A1 DE10323085 A1 DE 10323085A1
- Authority
- DE
- Germany
- Prior art keywords
- plate
- compensation
- carrier plate
- particular according
- compensation plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
Landscapes
- Chemical & Material Sciences (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10323085A DE10323085A1 (de) | 2003-05-22 | 2003-05-22 | CVD-Beschichtungsvorrichtung |
JP2006530160A JP4637844B2 (ja) | 2003-05-22 | 2004-03-18 | Cvdコーティング装置 |
KR1020057020806A KR101233502B1 (ko) | 2003-05-22 | 2004-03-18 | 결정질층 증착장치 |
PCT/EP2004/050325 WO2004104265A1 (de) | 2003-05-22 | 2004-03-18 | Cvd-beschichtungsvorrichtung |
CN2004800129479A CN1788107B (zh) | 2003-05-22 | 2004-03-18 | Cvd涂敷装置 |
EP04721543A EP1625243B1 (de) | 2003-05-22 | 2004-03-18 | Cvd-beschichtungsvorrichtung |
TW093110836A TWI346716B (en) | 2003-05-22 | 2004-04-19 | Chemical vapor deposition device |
US11/284,987 US8152927B2 (en) | 2003-05-22 | 2005-11-22 | CVD coating device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10323085A DE10323085A1 (de) | 2003-05-22 | 2003-05-22 | CVD-Beschichtungsvorrichtung |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10323085A1 true DE10323085A1 (de) | 2004-12-09 |
Family
ID=33441122
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10323085A Withdrawn DE10323085A1 (de) | 2003-05-22 | 2003-05-22 | CVD-Beschichtungsvorrichtung |
Country Status (8)
Country | Link |
---|---|
US (1) | US8152927B2 (ko) |
EP (1) | EP1625243B1 (ko) |
JP (1) | JP4637844B2 (ko) |
KR (1) | KR101233502B1 (ko) |
CN (1) | CN1788107B (ko) |
DE (1) | DE10323085A1 (ko) |
TW (1) | TWI346716B (ko) |
WO (1) | WO2004104265A1 (ko) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005055252A1 (de) * | 2005-11-19 | 2007-05-24 | Aixtron Ag | CVD-Reaktor mit gleitgelagerten Suszeptorhalter |
DE102007026348A1 (de) * | 2007-06-06 | 2008-12-11 | Aixtron Ag | Verfahren und Vorrichtung zur Temperatursteuerung der Oberflächentemperaturen von Substraten in einem CVD-Reaktor |
DE102012106796A1 (de) * | 2012-07-26 | 2014-01-30 | Aixtron Se | Thermische Behandlungsvorrichtung mit einem auf einem Substratträgersockel aufsetzbaren Substratträgerring |
DE102012108986A1 (de) | 2012-09-24 | 2014-03-27 | Aixtron Se | Substrathalter einer CVD-Vorrichtung |
DE102014104218A1 (de) | 2014-03-26 | 2015-10-01 | Aixtron Se | CVD-Reaktor mit Vorlaufzonen-Temperaturregelung |
DE102014223301B3 (de) * | 2014-11-14 | 2016-03-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Substrathalter, Plasmareaktor und Verfahren zur Abscheidung von Diamant |
WO2018037014A1 (de) | 2016-08-23 | 2018-03-01 | Aixtron Se | Suszeptor für einen cvd-reaktor |
DE102019105913A1 (de) * | 2019-03-08 | 2020-09-10 | Aixtron Se | Suszeptoranordnung eines CVD-Reaktors |
WO2021144161A1 (de) * | 2020-01-17 | 2021-07-22 | Aixtron Se | Cvd-reaktor mit doppelter vorlaufzonenplatte |
DE102020117645A1 (de) | 2020-07-03 | 2022-01-05 | Aixtron Se | Transportring für einen CVD-Reaktor |
DE102020123326A1 (de) | 2020-09-07 | 2022-03-10 | Aixtron Se | CVD-Reaktor mit temperierbarem Gaseinlassbereich |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102006018514A1 (de) * | 2006-04-21 | 2007-10-25 | Aixtron Ag | Vorrichtung und Verfahren zur Steuerung der Oberflächentemperatur eines Substrates in einer Prozesskammer |
JP5566669B2 (ja) * | 2009-11-19 | 2014-08-06 | 昭和電工株式会社 | インライン式成膜装置及び磁気記録媒体の製造方法 |
JP5310512B2 (ja) * | 2009-12-02 | 2013-10-09 | 東京エレクトロン株式会社 | 基板処理装置 |
JP5409413B2 (ja) * | 2010-01-26 | 2014-02-05 | 日本パイオニクス株式会社 | Iii族窒化物半導体の気相成長装置 |
JP5613083B2 (ja) * | 2011-02-28 | 2014-10-22 | 大陽日酸株式会社 | サセプタカバー、該サセプタカバーを備えた気相成長装置 |
US20130171350A1 (en) * | 2011-12-29 | 2013-07-04 | Intermolecular Inc. | High Throughput Processing Using Metal Organic Chemical Vapor Deposition |
TWI506163B (zh) * | 2012-07-13 | 2015-11-01 | Epistar Corp | 應用於氣相沉積的反應器及其承載裝置 |
CN103996643A (zh) * | 2014-05-30 | 2014-08-20 | 沈阳拓荆科技有限公司 | 立柱式陶瓷环定位用销 |
JP6335683B2 (ja) * | 2014-06-30 | 2018-05-30 | 昭和電工株式会社 | SiCエピタキシャルウェハの製造装置 |
JP6478364B2 (ja) * | 2015-04-09 | 2019-03-06 | 信越化学工業株式会社 | 被覆グラファイト部材及びこれと保持手段とのアセンブリ |
KR102369676B1 (ko) | 2017-04-10 | 2022-03-04 | 삼성디스플레이 주식회사 | 표시 장치의 제조장치 및 표시 장치의 제조방법 |
KR102614741B1 (ko) * | 2021-08-14 | 2023-12-14 | 램 리써치 코포레이션 | 반도체 제조 툴들에서 사용하기 위한 클록 가능한 (clockable) 기판 프로세싱 페데스탈 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3027934A1 (de) * | 1980-07-23 | 1982-02-25 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur einseitigen aetzung von halbleiterscheiben |
JPH06310438A (ja) * | 1993-04-22 | 1994-11-04 | Mitsubishi Electric Corp | 化合物半導体気相成長用基板ホルダおよび化合物半導体気相成長装置 |
US6113702A (en) * | 1995-09-01 | 2000-09-05 | Asm America, Inc. | Wafer support system |
US6001183A (en) * | 1996-06-10 | 1999-12-14 | Emcore Corporation | Wafer carriers for epitaxial growth processes |
US6030509A (en) * | 1998-04-06 | 2000-02-29 | Taiwan Semiconductor Manufacturing Co., Ltd | Apparatus and method for shielding a wafer holder |
JP2001127142A (ja) * | 1999-10-27 | 2001-05-11 | Hitachi Kokusai Electric Inc | 半導体製造装置 |
DE10043600B4 (de) * | 2000-09-01 | 2013-12-05 | Aixtron Se | Vorrichtung zum Abscheiden insbesondere kristalliner Schichten auf einem oder mehreren, insbesondere ebenfalls kristallinen Substraten |
JP2002146540A (ja) * | 2000-11-14 | 2002-05-22 | Ebara Corp | 基板加熱装置 |
US20030209326A1 (en) * | 2002-05-07 | 2003-11-13 | Mattson Technology, Inc. | Process and system for heating semiconductor substrates in a processing chamber containing a susceptor |
-
2003
- 2003-05-22 DE DE10323085A patent/DE10323085A1/de not_active Withdrawn
-
2004
- 2004-03-18 KR KR1020057020806A patent/KR101233502B1/ko active IP Right Grant
- 2004-03-18 EP EP04721543A patent/EP1625243B1/de not_active Expired - Lifetime
- 2004-03-18 JP JP2006530160A patent/JP4637844B2/ja not_active Expired - Fee Related
- 2004-03-18 WO PCT/EP2004/050325 patent/WO2004104265A1/de active Application Filing
- 2004-03-18 CN CN2004800129479A patent/CN1788107B/zh not_active Expired - Lifetime
- 2004-04-19 TW TW093110836A patent/TWI346716B/zh not_active IP Right Cessation
-
2005
- 2005-11-22 US US11/284,987 patent/US8152927B2/en active Active
Cited By (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102005055252A1 (de) * | 2005-11-19 | 2007-05-24 | Aixtron Ag | CVD-Reaktor mit gleitgelagerten Suszeptorhalter |
DE102007026348A1 (de) * | 2007-06-06 | 2008-12-11 | Aixtron Ag | Verfahren und Vorrichtung zur Temperatursteuerung der Oberflächentemperaturen von Substraten in einem CVD-Reaktor |
US8308867B2 (en) | 2007-06-06 | 2012-11-13 | Aixtron Inc. | Device for the temperature control of the surface temperatures of substrates in a CVD reactor |
DE102012106796A1 (de) * | 2012-07-26 | 2014-01-30 | Aixtron Se | Thermische Behandlungsvorrichtung mit einem auf einem Substratträgersockel aufsetzbaren Substratträgerring |
DE102012108986A1 (de) | 2012-09-24 | 2014-03-27 | Aixtron Se | Substrathalter einer CVD-Vorrichtung |
DE102014104218A1 (de) | 2014-03-26 | 2015-10-01 | Aixtron Se | CVD-Reaktor mit Vorlaufzonen-Temperaturregelung |
US10100433B2 (en) | 2014-11-14 | 2018-10-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V | Substrate holder, plasma reactor and method for depositing diamond |
DE102014223301B3 (de) * | 2014-11-14 | 2016-03-10 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Substrathalter, Plasmareaktor und Verfahren zur Abscheidung von Diamant |
DE102014223301B8 (de) * | 2014-11-14 | 2016-06-09 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Substrathalter, Plasmareaktor und Verfahren zur Abscheidung von Diamant |
WO2018037014A1 (de) | 2016-08-23 | 2018-03-01 | Aixtron Se | Suszeptor für einen cvd-reaktor |
DE102016115614A1 (de) | 2016-08-23 | 2018-03-01 | Aixtron Se | Suszeptor für einen CVD-Reaktor |
US11168410B2 (en) | 2016-08-23 | 2021-11-09 | Aixtron Se | Susceptor for a chemical vapour deposition reactor |
US12110591B2 (en) | 2019-03-08 | 2024-10-08 | Aixtron Se | Susceptor arrangement of a CVD reactor |
DE102019105913A1 (de) * | 2019-03-08 | 2020-09-10 | Aixtron Se | Suszeptoranordnung eines CVD-Reaktors |
WO2020182495A1 (de) | 2019-03-08 | 2020-09-17 | Aixtron Se | Suszeptoranordnung eines cvd-reaktors |
WO2021144161A1 (de) * | 2020-01-17 | 2021-07-22 | Aixtron Se | Cvd-reaktor mit doppelter vorlaufzonenplatte |
WO2022002848A2 (de) | 2020-07-03 | 2022-01-06 | Aixtron Se | Transportring für einen cvd-reaktor |
DE102020117645A1 (de) | 2020-07-03 | 2022-01-05 | Aixtron Se | Transportring für einen CVD-Reaktor |
DE102020123326A1 (de) | 2020-09-07 | 2022-03-10 | Aixtron Se | CVD-Reaktor mit temperierbarem Gaseinlassbereich |
WO2022049063A2 (de) | 2020-09-07 | 2022-03-10 | Aixtron Se | Cvd-reaktor mit temperierbarem gaseinlassbereich |
Also Published As
Publication number | Publication date |
---|---|
JP2007501329A (ja) | 2007-01-25 |
EP1625243A1 (de) | 2006-02-15 |
CN1788107A (zh) | 2006-06-14 |
WO2004104265B1 (de) | 2005-02-17 |
TWI346716B (en) | 2011-08-11 |
EP1625243B1 (de) | 2012-07-04 |
CN1788107B (zh) | 2012-03-21 |
TW200502424A (en) | 2005-01-16 |
JP4637844B2 (ja) | 2011-02-23 |
KR101233502B1 (ko) | 2013-02-14 |
KR20060019521A (ko) | 2006-03-03 |
WO2004104265A1 (de) | 2004-12-02 |
US20060112881A1 (en) | 2006-06-01 |
US8152927B2 (en) | 2012-04-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8127 | New person/name/address of the applicant |
Owner name: AIXTRON AG, 52134 HERZOGENRATH, DE |
|
8110 | Request for examination paragraph 44 | ||
R082 | Change of representative |
Representative=s name: RIEDER & PARTNER PATENTANWAELTE - RECHTSANWALT, 42 Representative=s name: RIEDER & PARTNER PATENTANWAELTE - RECHTSANWALT, DE |
|
R081 | Change of applicant/patentee |
Owner name: AIXTRON SE, DE Free format text: FORMER OWNER: AIXTRON AG, 52134 HERZOGENRATH, DE Effective date: 20111104 |
|
R082 | Change of representative |
Representative=s name: RIEDER & PARTNER MBB PATENTANWAELTE - RECHTSAN, DE Effective date: 20111104 Representative=s name: RIEDER & PARTNER PATENTANWAELTE - RECHTSANWALT, DE Effective date: 20111104 |
|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |
Effective date: 20131203 |