DE102010018830A1 - Flüssigkeitsverdampfer - Google Patents

Flüssigkeitsverdampfer Download PDF

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Publication number
DE102010018830A1
DE102010018830A1 DE102010018830A DE102010018830A DE102010018830A1 DE 102010018830 A1 DE102010018830 A1 DE 102010018830A1 DE 102010018830 A DE102010018830 A DE 102010018830A DE 102010018830 A DE102010018830 A DE 102010018830A DE 102010018830 A1 DE102010018830 A1 DE 102010018830A1
Authority
DE
Germany
Prior art keywords
liquid
chamber
opening
channel
evaporation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE102010018830A
Other languages
German (de)
English (en)
Inventor
Prof. Dr. Müller Jörg
Winfred Kuipers
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Krohne Messtechnik GmbH and Co KG
Bayer Intellectual Property GmbH
Original Assignee
Krohne Messtechnik GmbH and Co KG
Bayer Technology Services GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Krohne Messtechnik GmbH and Co KG, Bayer Technology Services GmbH filed Critical Krohne Messtechnik GmbH and Co KG
Priority to DE102010018830A priority Critical patent/DE102010018830A1/de
Priority to EP11717251A priority patent/EP2563490A1/de
Priority to JP2013506637A priority patent/JP2013527443A/ja
Priority to PCT/EP2011/056593 priority patent/WO2011134968A1/de
Priority to CA2797608A priority patent/CA2797608A1/en
Priority to US13/643,514 priority patent/US20130077943A1/en
Priority to CN2011800324679A priority patent/CN103108682A/zh
Publication of DE102010018830A1 publication Critical patent/DE102010018830A1/de
Withdrawn legal-status Critical Current

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Classifications

    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F24—HEATING; RANGES; VENTILATING
    • F24H—FLUID HEATERS, e.g. WATER OR AIR HEATERS, HAVING HEAT-GENERATING MEANS, e.g. HEAT PUMPS, IN GENERAL
    • F24H9/00—Details
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01B—BOILING; BOILING APPARATUS ; EVAPORATION; EVAPORATION APPARATUS
    • B01B1/00—Boiling; Boiling apparatus for physical or chemical purposes ; Evaporation in general
    • B01B1/005—Evaporation for physical or chemical purposes; Evaporation apparatus therefor, e.g. evaporation of liquids for gas phase reactions
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/80—Apparatus for specific applications
    • H05B6/802—Apparatus for specific applications for heating fluids
    • H05B6/804—Water heaters, water boilers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/40—Concentrating samples
    • G01N1/4022—Concentrating samples by thermal techniques; Phase changes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electromagnetism (AREA)
  • Thermal Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Sampling And Sample Adjustment (AREA)
DE102010018830A 2010-04-29 2010-04-29 Flüssigkeitsverdampfer Withdrawn DE102010018830A1 (de)

Priority Applications (7)

Application Number Priority Date Filing Date Title
DE102010018830A DE102010018830A1 (de) 2010-04-29 2010-04-29 Flüssigkeitsverdampfer
EP11717251A EP2563490A1 (de) 2010-04-29 2011-04-26 Flüssigkeitsverdampfer
JP2013506637A JP2013527443A (ja) 2010-04-29 2011-04-26 液体蒸発器
PCT/EP2011/056593 WO2011134968A1 (de) 2010-04-29 2011-04-26 Flüssigkeitsverdampfer
CA2797608A CA2797608A1 (en) 2010-04-29 2011-04-26 Liquid evaporator
US13/643,514 US20130077943A1 (en) 2010-04-29 2011-04-26 Liquid evaporator
CN2011800324679A CN103108682A (zh) 2010-04-29 2011-04-26 液体蒸发器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102010018830A DE102010018830A1 (de) 2010-04-29 2010-04-29 Flüssigkeitsverdampfer

Publications (1)

Publication Number Publication Date
DE102010018830A1 true DE102010018830A1 (de) 2011-11-03

Family

ID=44359508

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102010018830A Withdrawn DE102010018830A1 (de) 2010-04-29 2010-04-29 Flüssigkeitsverdampfer

Country Status (7)

Country Link
US (1) US20130077943A1 (https=)
EP (1) EP2563490A1 (https=)
JP (1) JP2013527443A (https=)
CN (1) CN103108682A (https=)
CA (1) CA2797608A1 (https=)
DE (1) DE102010018830A1 (https=)
WO (1) WO2011134968A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6103764B2 (ja) * 2013-05-14 2017-03-29 国立大学法人福井大学 試料溶液の質量分析方法及びその装置
CN103529149A (zh) * 2013-10-28 2014-01-22 徐继承 一种防堵塞的低压液化气体检验用进样蒸发器
CN103543228A (zh) * 2013-10-28 2014-01-29 徐继承 一种含有大气平衡装置的低压液化气体检验用进样蒸发器
CN104392883A (zh) * 2014-10-22 2015-03-04 常州博锐恒电子科技有限公司 一种注入机固体进料方法
CN109963324B (zh) 2017-12-22 2023-06-02 华为技术有限公司 无线唤醒包发送与接收方法与装置
CN109289948B (zh) * 2018-10-08 2020-02-18 重庆大学 一种光热定向操控液滴迁移聚合装置及其使用方法
CN109444248B (zh) * 2018-11-20 2020-10-30 中国地质大学（武汉） 一种基于激光的溶液剥蚀进样分析方法
NL2023927B1 (en) 2019-10-01 2021-06-01 Berkin Bv In-flow evaporator
CN115155077B (zh) * 2022-07-04 2023-08-18 枣庄学院 多组分液体微量蒸发装置
US11938414B1 (en) * 2022-10-04 2024-03-26 Honeywell Federal Manufacturing & Technologies, Llc Microfluidic film evaporation with femtosecond laser-patterned surface

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2005016512A1 (de) 2003-08-02 2005-02-24 Bayer Materialscience Ag Verfahren zur entfernung von flüchtigen verbindungen aus stoffgemischen mittels mikroverdampfer
US7309859B2 (en) 1994-07-11 2007-12-18 Agilent Technologies, Inc. Ion sampling for APPI mass spectrometry
WO2008101669A1 (de) 2007-02-19 2008-08-28 Bayer Technology Services Gmbh Massenspektrometer
US7618027B2 (en) 2006-03-20 2009-11-17 Rasirc Vaporizer for delivery of low vapor pressure gases

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
FR2753533B1 (fr) * 1996-09-17 1998-10-09 Commissariat Energie Atomique Procede et dispositif de caracterisation d'une modification au cours du temps de l'etat de condensation de gouttelettes sur une cible
US5917185A (en) * 1997-06-26 1999-06-29 Iowa State University Research Foundation, Inc. Laser vaporization/ionization interface for coupling microscale separation techniques with mass spectrometry
JP3925000B2 (ja) * 1999-09-06 2007-06-06 株式会社日立製作所 噴霧器及びそれを用いた分析装置
DE10049856A1 (de) * 2000-10-09 2002-03-07 Siemens Ag Vorrichtung zum kontinuierlichen Verdampfen kleiner Mengen einer Flüssigkeit
US20040099310A1 (en) * 2001-01-05 2004-05-27 Per Andersson Microfluidic device
JP2003035699A (ja) * 2001-07-19 2003-02-07 Kitakyushu Foundation For The Advancement Of Industry Science & Technology 超音速分子ジェット分光分析方法及び装置
DE10242797A1 (de) * 2002-09-14 2004-03-25 Degussa Ag Verfahren und Vorrichtung zur Phasenumwandlung von Stoffen
UA79331C2 (en) * 2002-11-08 2007-06-11 Oleksandr V Vladimirov Method for manufacturing gas-discharge electron lamps (variants)
ITRM20070105A1 (it) * 2007-02-26 2008-08-27 Univ Roma Impianto di distillazione di acqua per uso iniettabile
JP2009069088A (ja) * 2007-09-18 2009-04-02 Fujitaro Imasaka レーザー蒸発法に基づくパルス試料導入方法
US8586348B2 (en) * 2010-09-22 2013-11-19 California Institute Of Technology Lateral flow microfluidic assaying device and related method

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7309859B2 (en) 1994-07-11 2007-12-18 Agilent Technologies, Inc. Ion sampling for APPI mass spectrometry
WO2005016512A1 (de) 2003-08-02 2005-02-24 Bayer Materialscience Ag Verfahren zur entfernung von flüchtigen verbindungen aus stoffgemischen mittels mikroverdampfer
US7618027B2 (en) 2006-03-20 2009-11-17 Rasirc Vaporizer for delivery of low vapor pressure gases
WO2008101669A1 (de) 2007-02-19 2008-08-28 Bayer Technology Services Gmbh Massenspektrometer

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
"Complex MEMS: A fully integrated TOF micro mass spectrometer" veröffentlicht in Sensors and Actuators A: Physical, 138 (1) (2007), Seiten 22-27
"Fundamentals of Microfabrication" von Marc Madou, CRC Press Boca Raton FLA 1997
"Mikrosystemtechnik für Ingenieure" von W. Menz. J. Mohr und O. Paul, Wiley-VCH, Weinheim 2005
Duck-Jung Lee et al., Glass-to-Glass Anodic Bonding for High Vacuum Packaging of Microelectronics and its Stability, MEMS 2000, The Thirteenth Annual International Conference an Micro Electro Mechanical Systems, 23-27 January 2000, Seiten 253-258
J. Wie et al., Low Temperature Glass-to-Glass Wafer Bonding, IEEE Transactions on advanced packaging, Vol. 26, No. 3, 2003, Seiten 289-294
Q.-Y. Tong, U. Gösele: Semiconductor Wafer Bonding: Science and Technology; The Electrochemical Society Series, Wiley-Verlag, New York (1999)

Also Published As

Publication number Publication date
WO2011134968A1 (de) 2011-11-03
US20130077943A1 (en) 2013-03-28
JP2013527443A (ja) 2013-06-27
EP2563490A1 (de) 2013-03-06
CA2797608A1 (en) 2011-11-03
CN103108682A (zh) 2013-05-15

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Legal Events

Date Code Title Description
R081 Change of applicant/patentee

Owner name: KROHNE MESSTECHNIK GMBH, DE

Free format text: FORMER OWNERS: BAYER TECHNOLOGY SERVICES GMBH, 51373 LEVERKUSEN, DE; KROHNE MESSTECHNIK GMBH, 47058 DUISBURG, DE

Effective date: 20130226

Owner name: BAYER INTELLECTUAL PROPERTY GMBH, DE

Free format text: FORMER OWNERS: BAYER TECHNOLOGY SERVICES GMBH, 51373 LEVERKUSEN, DE; KROHNE MESSTECHNIK GMBH, 47058 DUISBURG, DE

Effective date: 20130226

Owner name: KROHNE MESSTECHNIK GMBH, DE

Free format text: FORMER OWNER: BAYER TECHNOLOGY SERVICES GMBH, KROHNE MESSTECHNIK GMBH, , DE

Effective date: 20130226

Owner name: BAYER INTELLECTUAL PROPERTY GMBH, DE

Free format text: FORMER OWNER: BAYER TECHNOLOGY SERVICES GMBH, KROHNE MESSTECHNIK GMBH, , DE

Effective date: 20130226

R120 Application withdrawn or ip right abandoned