DE102008004748A1 - Verfahren und Vorrichtung zum Verringern der Ladungsteilung in pixellierten, Energie diskriminierenden Detektoren - Google Patents
Verfahren und Vorrichtung zum Verringern der Ladungsteilung in pixellierten, Energie diskriminierenden Detektoren Download PDFInfo
- Publication number
- DE102008004748A1 DE102008004748A1 DE102008004748A DE102008004748A DE102008004748A1 DE 102008004748 A1 DE102008004748 A1 DE 102008004748A1 DE 102008004748 A DE102008004748 A DE 102008004748A DE 102008004748 A DE102008004748 A DE 102008004748A DE 102008004748 A1 DE102008004748 A1 DE 102008004748A1
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- direct conversion
- detector
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- metallized
- ray
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- 238000000034 method Methods 0.000 title description 10
- 239000000463 material Substances 0.000 claims abstract description 81
- 238000006243 chemical reaction Methods 0.000 claims abstract description 79
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims description 8
- 229910052750 molybdenum Inorganic materials 0.000 claims description 8
- 239000011733 molybdenum Substances 0.000 claims description 8
- 239000011133 lead Substances 0.000 claims description 6
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 6
- 229910052721 tungsten Inorganic materials 0.000 claims description 6
- 239000010937 tungsten Substances 0.000 claims description 6
- 229920000642 polymer Polymers 0.000 claims description 4
- 239000011810 insulating material Substances 0.000 claims 2
- 238000002591 computed tomography Methods 0.000 description 25
- 239000004065 semiconductor Substances 0.000 description 15
- 230000002093 peripheral effect Effects 0.000 description 12
- 238000013170 computed tomography imaging Methods 0.000 description 8
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 7
- 238000003384 imaging method Methods 0.000 description 7
- 239000000758 substrate Substances 0.000 description 7
- 230000004907 flux Effects 0.000 description 6
- 230000003313 weakening effect Effects 0.000 description 6
- MARUHZGHZWCEQU-UHFFFAOYSA-N 5-phenyl-2h-tetrazole Chemical compound C1=CC=CC=C1C1=NNN=N1 MARUHZGHZWCEQU-UHFFFAOYSA-N 0.000 description 5
- 238000001514 detection method Methods 0.000 description 5
- 239000012774 insulation material Substances 0.000 description 5
- 230000004044 response Effects 0.000 description 5
- 239000012876 carrier material Substances 0.000 description 4
- 239000013078 crystal Substances 0.000 description 4
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 230000009467 reduction Effects 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 230000010354 integration Effects 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 229920006395 saturated elastomer Polymers 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 230000002745 absorbent Effects 0.000 description 2
- 239000002250 absorbent Substances 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000001465 metallisation Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- -1 polymethacrylimide Polymers 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- 239000005041 Mylar™ Substances 0.000 description 1
- 238000012879 PET imaging Methods 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 239000002360 explosive Substances 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 239000004800 polyvinyl chloride Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 229920002379 silicone rubber Polymers 0.000 description 1
- 239000004945 silicone rubber Substances 0.000 description 1
- 238000002603 single-photon emission computed tomography Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000012384 transportation and delivery Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Measurement Of Radiation (AREA)
- Light Receiving Elements (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/625,969 US7486764B2 (en) | 2007-01-23 | 2007-01-23 | Method and apparatus to reduce charge sharing in pixellated energy discriminating detectors |
| US11/625,969 | 2007-01-23 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE102008004748A1 true DE102008004748A1 (de) | 2008-07-24 |
Family
ID=39531059
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102008004748A Withdrawn DE102008004748A1 (de) | 2007-01-23 | 2008-01-16 | Verfahren und Vorrichtung zum Verringern der Ladungsteilung in pixellierten, Energie diskriminierenden Detektoren |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7486764B2 (https=) |
| JP (1) | JP5457635B2 (https=) |
| DE (1) | DE102008004748A1 (https=) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011013058A1 (de) * | 2011-03-04 | 2012-09-06 | Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh) | Röntgenkamera zur ortsaufgelösten Detektion von Röntgenstrahlung |
| WO2017085304A1 (en) * | 2015-11-20 | 2017-05-26 | Koninklijke Philips N.V. | Detection values determination system |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007038980B4 (de) * | 2007-08-17 | 2010-08-26 | Siemens Ag | Detektormodul, Strahlungsdetektor und Strahlungserfassungseinrichtung |
| US7813477B2 (en) * | 2009-03-05 | 2010-10-12 | Morpho Detection, Inc. | X-ray diffraction device, object imaging system, and method for operating a security system |
| US20100327173A1 (en) * | 2009-06-29 | 2010-12-30 | Charles Gerard Woychik | Integrated Direct Conversion Detector Module |
| JPWO2012036160A1 (ja) * | 2010-09-14 | 2014-02-03 | 株式会社東芝 | Ｍｏコリメータおよびそれを用いたＸ線検出器、Ｘ線検査装置並びにＣＴ装置 |
| JP5836011B2 (ja) * | 2010-09-22 | 2015-12-24 | 株式会社東芝 | Ｘ線ＣＴ（ＣｏｍｐｕｔｅｄＴｏｍｏｇｒａｐｈｙ）装置、放射線検出器及びその製造方法 |
| US20130315368A1 (en) * | 2012-05-22 | 2013-11-28 | Aribex, Inc. | Handheld X-Ray System for 3D Scatter Imaging |
| JP5914381B2 (ja) * | 2013-02-19 | 2016-05-11 | 株式会社リガク | Ｘ線データ処理装置、ｘ線データ処理方法およびｘ線データ処理プログラム |
| US9510792B2 (en) * | 2013-05-17 | 2016-12-06 | Toshiba Medical Systems Corporation | Apparatus and method for collimating X-rays in spectral computer tomography imaging |
| EP2871496B1 (en) | 2013-11-12 | 2020-01-01 | Samsung Electronics Co., Ltd | Radiation detector and computed tomography apparatus using the same |
| US10117628B2 (en) * | 2014-10-01 | 2018-11-06 | Toshiba Medical Systems Corporation | Photon counting apparatus |
| JP6721682B2 (ja) * | 2015-12-03 | 2020-07-15 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 放射線検出器及び撮像装置 |
| DE102016205702B4 (de) * | 2016-04-06 | 2017-12-14 | Siemens Healthcare Gmbh | Röntgendetektor mit Schutzelement und Klebeelement |
| CN106324649B (zh) * | 2016-08-31 | 2023-09-15 | 同方威视技术股份有限公司 | 半导体探测器 |
| US10216983B2 (en) | 2016-12-06 | 2019-02-26 | General Electric Company | Techniques for assessing group level cognitive states |
| US10398394B2 (en) | 2017-01-06 | 2019-09-03 | General Electric Company | Energy-discriminating photon-counting detector and the use thereof |
| US10222489B2 (en) | 2017-03-13 | 2019-03-05 | General Electric Company | Pixel-design for use in a radiation detector |
| US10779778B2 (en) | 2017-05-08 | 2020-09-22 | General Electric Company | Reference detector elements in conjunction with an anti-scatter collimator |
| US11076823B2 (en) * | 2017-06-28 | 2021-08-03 | Canon Medical Systems Corporation | X-ray CT apparatus including a photon-counting detector and circuitry configured to set a control parameter corresponding to a position of each detecting element in the photon-counting detector |
| EP3444826A1 (en) * | 2017-08-14 | 2019-02-20 | Koninklijke Philips N.V. | Low profile anti scatter and anti charge sharing grid for photon counting computed tomography |
| JP6987345B2 (ja) * | 2018-01-18 | 2021-12-22 | 富士フイルムヘルスケア株式会社 | 放射線撮像装置 |
| EP3514577A1 (en) * | 2018-01-19 | 2019-07-24 | Koninklijke Philips N.V. | Apparatus, system, method and computer program for reconstructing a spectral image of a region of interest of an object |
| JP7166833B2 (ja) * | 2018-08-03 | 2022-11-08 | キヤノンメディカルシステムズ株式会社 | 放射線検出器及び放射線検出器モジュール |
| US11071514B2 (en) * | 2018-11-16 | 2021-07-27 | Varex Imaging Corporation | Imaging system with energy sensing and method for operation |
| US11246547B2 (en) * | 2019-07-22 | 2022-02-15 | Redlen Technologies, Inc. | Compensation for charge sharing between detector pixels in a pixilated radiation detector |
| JP7492388B2 (ja) * | 2020-07-03 | 2024-05-29 | キヤノンメディカルシステムズ株式会社 | 放射線検出器および放射線診断装置 |
| JP2023055071A (ja) * | 2021-10-05 | 2023-04-17 | キヤノンメディカルシステムズ株式会社 | 検出器モジュール、ｘ線コンピュータ断層撮影装置及びｘ線検出装置 |
| JP2024082392A (ja) * | 2022-12-08 | 2024-06-20 | キヤノンメディカルシステムズ株式会社 | Ｘ線ｃｔ装置、データ処理方法、及びプログラム |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6328076A (ja) * | 1986-07-21 | 1988-02-05 | Matsushita Electric Ind Co Ltd | 半導体放射線検出器 |
| US6194726B1 (en) * | 1994-12-23 | 2001-02-27 | Digirad Corporation | Semiconductor radiation detector with downconversion element |
| JPH11295431A (ja) * | 1998-04-15 | 1999-10-29 | Shimadzu Corp | Ｃｔ用固体検出器 |
| JP2002318283A (ja) * | 2001-04-24 | 2002-10-31 | Shimadzu Corp | ２次元アレイ型放射線検出器とそのｘ線遮蔽壁の製造方法 |
| JP2003209665A (ja) * | 2002-01-16 | 2003-07-25 | Fuji Photo Film Co Ltd | 画像読取方法および画像記録読取装置 |
| US6928144B2 (en) * | 2003-08-01 | 2005-08-09 | General Electric Company | Guard ring for direct photo-to-electron conversion detector array |
| JP2007529738A (ja) * | 2004-03-17 | 2007-10-25 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 干渉性散乱ｃｔのビーム硬化補正および減衰補正 |
| US7145986B2 (en) * | 2004-05-04 | 2006-12-05 | General Electric Company | Solid state X-ray detector with improved spatial resolution |
| JP2006059901A (ja) * | 2004-08-18 | 2006-03-02 | Toshiba Corp | 放射線検出器 |
| US7696481B2 (en) * | 2005-11-22 | 2010-04-13 | General Electric Company | Multi-layered detector system for high resolution computed tomography |
-
2007
- 2007-01-23 US US11/625,969 patent/US7486764B2/en active Active
-
2008
- 2008-01-16 DE DE102008004748A patent/DE102008004748A1/de not_active Withdrawn
- 2008-01-21 JP JP2008009962A patent/JP5457635B2/ja active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102011013058A1 (de) * | 2011-03-04 | 2012-09-06 | Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh) | Röntgenkamera zur ortsaufgelösten Detektion von Röntgenstrahlung |
| DE102011013058A8 (de) * | 2011-03-04 | 2012-11-08 | Helmholtz Zentrum München Deutsches Forschungszentrum Für Gesundheit Und Umwelt (Gmbh) | Röntgenkamera zur ortsaufgelösten Detektion von Röntgenstrahlung |
| US9354329B2 (en) | 2011-03-04 | 2016-05-31 | Helmholtz Zentrum Muenchen Deutsches Forschungszentrum Fuer Gesundheit Und Umwelt (Gmbh) | X-ray camera for the high-resolution detection of X-rays |
| WO2017085304A1 (en) * | 2015-11-20 | 2017-05-26 | Koninklijke Philips N.V. | Detection values determination system |
| US11002865B2 (en) | 2015-11-20 | 2021-05-11 | Koninklijke Philips N.V. | Detection values determination system |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5457635B2 (ja) | 2014-04-02 |
| US20080175347A1 (en) | 2008-07-24 |
| JP2008180713A (ja) | 2008-08-07 |
| US7486764B2 (en) | 2009-02-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| R012 | Request for examination validly filed | ||
| R012 | Request for examination validly filed |
Effective date: 20141202 |
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| R079 | Amendment of ipc main class |
Free format text: PREVIOUS MAIN CLASS: G01T0001290000 Ipc: G01T0001240000 |
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| R016 | Response to examination communication | ||
| R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |