DE10197113T1 - Verbesserter spezieller Programmiermodus - Google Patents
Verbesserter spezieller ProgrammiermodusInfo
- Publication number
- DE10197113T1 DE10197113T1 DE10197113T DE10197113T DE10197113T1 DE 10197113 T1 DE10197113 T1 DE 10197113T1 DE 10197113 T DE10197113 T DE 10197113T DE 10197113 T DE10197113 T DE 10197113T DE 10197113 T1 DE10197113 T1 DE 10197113T1
- Authority
- DE
- Germany
- Prior art keywords
- programming mode
- special programming
- improved special
- improved
- mode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/46—Test trigger logic
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/752,594 US7007131B2 (en) | 2000-12-27 | 2000-12-27 | Method and apparatus including special programming mode circuitry which disables internal program verification operations by a memory |
US09/752,594 | 2000-12-27 | ||
PCT/US2001/044877 WO2002052576A1 (en) | 2000-12-27 | 2001-11-28 | Enhanced special programming mode |
Publications (2)
Publication Number | Publication Date |
---|---|
DE10197113T1 true DE10197113T1 (de) | 2003-12-04 |
DE10197113B3 DE10197113B3 (de) | 2013-09-12 |
Family
ID=25026964
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10197113T Expired - Fee Related DE10197113B3 (de) | 2000-12-27 | 2001-11-28 | Verfahren zum Aktivieren eines speziellen Programmiermodus eines Speichers und Einrichtung mit einem Speicher mit speziellem Programmiermodus |
Country Status (6)
Country | Link |
---|---|
US (1) | US7007131B2 (de) |
CN (1) | CN100431055C (de) |
DE (1) | DE10197113B3 (de) |
GB (1) | GB2388227B (de) |
TW (1) | TWI250529B (de) |
WO (1) | WO2002052576A1 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6859399B1 (en) | 2000-05-17 | 2005-02-22 | Marvell International, Ltd. | Memory architecture and system and multiport interface protocol |
EP1318440B1 (de) * | 2001-12-04 | 2005-08-17 | STMicroelectronics S.r.l. | Architektur und Verfahren zur Verwaltung einer Schnittstelle, basierend auf einem endlichen Automaten |
US20040049617A1 (en) * | 2002-09-05 | 2004-03-11 | Integrated Circuit Solution Inc. | Method of firmware update by USB interface |
JP5055971B2 (ja) * | 2006-11-16 | 2012-10-24 | 株式会社ニコン | 表面処理方法及び表面処理装置、露光方法及び露光装置、並びにデバイス製造方法 |
US9727277B2 (en) * | 2012-12-21 | 2017-08-08 | Sandisk Technologies Llc | Storage device and method for enabling hidden functionality |
JP2014225309A (ja) * | 2013-05-16 | 2014-12-04 | ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. | 半導体装置 |
CN104217757B (zh) * | 2013-05-31 | 2018-01-05 | 华邦电子股份有限公司 | 非易失性存储器的编程方法 |
US9798493B2 (en) * | 2013-12-16 | 2017-10-24 | International Business Machines Corporation | Firmware bypass for medium-access commands |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2172127B (en) * | 1985-03-06 | 1988-10-12 | Ferranti Plc | Data compression system |
ATE65632T1 (de) * | 1985-07-08 | 1991-08-15 | Siemens Ag | Verfahren zum kontrollieren eines speicherzugriffs auf einer chipkarte und anordnung zur durchfuehrung des verfahrens. |
JPH081760B2 (ja) * | 1987-11-17 | 1996-01-10 | 三菱電機株式会社 | 半導体記憶装置 |
US4873705A (en) * | 1988-01-27 | 1989-10-10 | John Fluke Mfg. Co., Inc. | Method of and system for high-speed, high-accuracy functional testing of memories in microprocessor-based units |
US5053990A (en) * | 1988-02-17 | 1991-10-01 | Intel Corporation | Program/erase selection for flash memory |
JP2648840B2 (ja) * | 1988-11-22 | 1997-09-03 | 株式会社日立製作所 | 半導体記憶装置 |
US5016009A (en) * | 1989-01-13 | 1991-05-14 | Stac, Inc. | Data compression apparatus and method |
JP3408552B2 (ja) * | 1991-02-11 | 2003-05-19 | インテル・コーポレーション | 不揮発性半導体メモリをプログラム及び消去する回路とその方法 |
US5333300A (en) * | 1991-02-11 | 1994-07-26 | Intel Corporation | Timing circuitry and method for controlling automated programming and erasing of a non-volatile semiconductor memory |
US5559971A (en) * | 1991-10-30 | 1996-09-24 | I-Cube, Inc. | Folded hierarchical crosspoint array |
US5412793A (en) * | 1991-12-03 | 1995-05-02 | Intel Corporation | Method for testing erase characteristics of a flash memory array |
US5506803A (en) * | 1992-04-01 | 1996-04-09 | Intel Corporation | Apparatus and method for minimizing verify time in a semiconductor memory by constantly charging n-well capacitance |
US5509134A (en) * | 1993-06-30 | 1996-04-16 | Intel Corporation | Method and apparatus for execution of operations in a flash memory array |
FR2708763B1 (fr) * | 1993-06-30 | 2002-04-05 | Intel Corp | Dispositif de mémoire flash, procédé et circuit de traitement d'un ordre d'utilisateur dans un dispositif de mémoire flash et système d'ordinateur comprenant un dispositif de mémoire flash. |
US5526311A (en) * | 1993-12-30 | 1996-06-11 | Intel Corporation | Method and circuitry for enabling and permanently disabling test mode access in a flash memory device |
DE69427277T2 (de) * | 1994-01-31 | 2001-09-13 | St Microelectronics Srl | Verfahren zur Programmierung und Prüfung eines nichtflüchtigen Speichers |
JP3015661B2 (ja) * | 1994-04-27 | 2000-03-06 | 株式会社東芝 | 不揮発性半導体メモリ |
US5701266A (en) * | 1995-12-14 | 1997-12-23 | Intel Corporation | Programming flash memory using distributed learning methods |
US5729489A (en) * | 1995-12-14 | 1998-03-17 | Intel Corporation | Programming flash memory using predictive learning methods |
US5796746A (en) * | 1995-12-22 | 1998-08-18 | Micron Technology, Inc. | Device and method for testing integrated circuit dice in an integrated circuit module |
US5873113A (en) * | 1996-09-24 | 1999-02-16 | Altera Corporation | System and method for programming eprom cells using shorter duration pulse(s) in repeating the programming process of a particular cell |
US5974499A (en) * | 1997-04-23 | 1999-10-26 | Micron Technology, Inc. | Memory system having read modify write function and method |
US5959911A (en) * | 1997-09-29 | 1999-09-28 | Siemens Aktiengesellschaft | Apparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devices |
JPH11203266A (ja) * | 1998-01-07 | 1999-07-30 | Mitsubishi Electric Corp | マイクロコンピュータ |
US6834323B2 (en) * | 2000-12-26 | 2004-12-21 | Intel Corporation | Method and apparatus including special programming mode circuitry which disables internal program verification operations by a memory |
-
2000
- 2000-12-27 US US09/752,594 patent/US7007131B2/en not_active Expired - Fee Related
-
2001
- 2001-11-28 CN CNB018228755A patent/CN100431055C/zh not_active Expired - Fee Related
- 2001-11-28 GB GB0315744A patent/GB2388227B/en not_active Expired - Fee Related
- 2001-11-28 WO PCT/US2001/044877 patent/WO2002052576A1/en not_active Application Discontinuation
- 2001-11-28 DE DE10197113T patent/DE10197113B3/de not_active Expired - Fee Related
- 2001-12-24 TW TW090132039A patent/TWI250529B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
DE10197113B3 (de) | 2013-09-12 |
TWI250529B (en) | 2006-03-01 |
US20020080652A1 (en) | 2002-06-27 |
WO2002052576A1 (en) | 2002-07-04 |
GB2388227A (en) | 2003-11-05 |
CN1502111A (zh) | 2004-06-02 |
CN100431055C (zh) | 2008-11-05 |
GB2388227B (en) | 2005-04-20 |
GB0315744D0 (en) | 2003-08-13 |
US7007131B2 (en) | 2006-02-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
ATE290000T1 (de) | Muscarinagonisten | |
ATE252099T1 (de) | Biarylcarboxamide | |
ATE312098T1 (de) | Thiazinoxazolidinon | |
ATA2932001A (de) | Schneefräse | |
DE50102988D1 (de) | Bodenwischer | |
DE50104056D1 (de) | Gewichtsmanschette | |
DE50100710D1 (de) | Wischblatt | |
ATE298751T1 (de) | 7-oxopyridoryrimidine | |
ATE262530T1 (de) | Indolochinazolinone | |
DE50104651D1 (de) | Fahrzeugfaltverdeck | |
DE10192638T1 (de) | Bohrstangenladevorrichtung | |
ATE509008T1 (de) | Sulfonylguanidine | |
DE10196064T1 (de) | Halbleiterfotodektionsgerät | |
DE50100817D1 (de) | Kugelgelenk | |
DE50011511D1 (de) | Blowby-Heizung | |
AR028061A1 (es) | 2-enamino-cetonitrilos fenil-substituidos | |
AR027931A1 (es) | Antitranspirantes | |
DE10197113T1 (de) | Verbesserter spezieller Programmiermodus | |
DE10052925B4 (de) | Schaukelbett | |
ATE476423T1 (de) | Benzoylpyridazine | |
DE10195909T1 (de) | Viehfüttervorrichtung | |
DE10085445T1 (de) | Drahterodierbearbeitungseinrichtung | |
AR027982A1 (es) | Aril- y heteroarilsulfonatos | |
DE10195992T1 (de) | Oberflächenendbearbeitungsbelag | |
ATE284887T1 (de) | Thienopyrrolidinone |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law |
Ref document number: 10197113 Country of ref document: DE Date of ref document: 20031204 Kind code of ref document: P |
|
R016 | Response to examination communication | ||
R016 | Response to examination communication | ||
R018 | Grant decision by examination section/examining division | ||
R020 | Patent grant now final |
Effective date: 20131213 |
|
R119 | Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee |