DE1009404B - Roentgen-Diffraktionsmeter - Google Patents

Roentgen-Diffraktionsmeter

Info

Publication number
DE1009404B
DE1009404B DEN11368A DEN0011368A DE1009404B DE 1009404 B DE1009404 B DE 1009404B DE N11368 A DEN11368 A DE N11368A DE N0011368 A DEN0011368 A DE N0011368A DE 1009404 B DE1009404 B DE 1009404B
Authority
DE
Germany
Prior art keywords
specimen
ray diffraction
crystal
diffraction meter
arm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DEN11368A
Other languages
German (de)
English (en)
Inventor
Pieter Maarten De Wolff
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Philips Gloeilampenfabrieken NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Gloeilampenfabrieken NV filed Critical Philips Gloeilampenfabrieken NV
Publication of DE1009404B publication Critical patent/DE1009404B/de
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
DEN11368A 1954-10-27 1955-10-26 Roentgen-Diffraktionsmeter Pending DE1009404B (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL336204X 1954-10-27

Publications (1)

Publication Number Publication Date
DE1009404B true DE1009404B (de) 1957-05-29

Family

ID=19784547

Family Applications (1)

Application Number Title Priority Date Filing Date
DEN11368A Pending DE1009404B (de) 1954-10-27 1955-10-26 Roentgen-Diffraktionsmeter

Country Status (5)

Country Link
BE (1) BE542322A (enrdf_load_stackoverflow)
CH (1) CH336204A (enrdf_load_stackoverflow)
DE (1) DE1009404B (enrdf_load_stackoverflow)
FR (1) FR1134955A (enrdf_load_stackoverflow)
GB (1) GB781638A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
CH336204A (de) 1959-02-15
BE542322A (enrdf_load_stackoverflow)
FR1134955A (fr) 1957-04-23
GB781638A (en) 1957-08-21

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