DE10080670T1 - Magnetsensor und Herstellungsverfahren dafür, ferromagnetisches Tunnelübergangselement und Magnetkopf - Google Patents
Magnetsensor und Herstellungsverfahren dafür, ferromagnetisches Tunnelübergangselement und MagnetkopfInfo
- Publication number
- DE10080670T1 DE10080670T1 DE10080670T DE10080670T DE10080670T1 DE 10080670 T1 DE10080670 T1 DE 10080670T1 DE 10080670 T DE10080670 T DE 10080670T DE 10080670 T DE10080670 T DE 10080670T DE 10080670 T1 DE10080670 T1 DE 10080670T1
- Authority
- DE
- Germany
- Prior art keywords
- manufacturing
- tunnel junction
- method therefor
- junction element
- ferromagnetic tunnel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000005291 magnetic effect Effects 0.000 title 2
- 230000005294 ferromagnetic effect Effects 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 title 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3254—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
- H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
- H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/10—Magnetoresistive devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Hall/Mr Elements (AREA)
- Magnetic Heads (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11053020A JP2000251229A (ja) | 1999-03-01 | 1999-03-01 | 磁気センサ、その製造方法及び磁気ヘッド |
JP05397499A JP4124533B2 (ja) | 1999-03-02 | 1999-03-02 | 強磁性トンネル接合素子及びその製造方法 |
PCT/JP2000/000351 WO2000052489A1 (fr) | 1999-03-01 | 2000-01-25 | Capteur magnetique et son procede de fabrication, dispositif de liaison a tunnel ferromagnetique et son procede de fabrication, tete magnetique comportant ces organes |
Publications (1)
Publication Number | Publication Date |
---|---|
DE10080670T1 true DE10080670T1 (de) | 2001-06-13 |
Family
ID=26393723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE10080670T Ceased DE10080670T1 (de) | 1999-03-01 | 2000-01-25 | Magnetsensor und Herstellungsverfahren dafür, ferromagnetisches Tunnelübergangselement und Magnetkopf |
Country Status (5)
Country | Link |
---|---|
US (1) | US6741434B1 (de) |
KR (1) | KR100722334B1 (de) |
CN (2) | CN1267895C (de) |
DE (1) | DE10080670T1 (de) |
WO (1) | WO2000052489A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4177954B2 (ja) * | 2000-06-30 | 2008-11-05 | 株式会社日立グローバルストレージテクノロジーズ | 磁気トンネル接合積層型ヘッド及びその製法 |
KR100382764B1 (ko) * | 2001-01-06 | 2003-05-09 | 삼성전자주식회사 | 터널링 자기저항 소자 및 그 제조방법 |
JP3590006B2 (ja) * | 2001-06-22 | 2004-11-17 | 株式会社東芝 | 磁気抵抗効果素子、磁気ヘッド及び磁気再生装置 |
KR20040011128A (ko) * | 2002-07-29 | 2004-02-05 | 주식회사 씨앤케이 | 고포화자화 박막과 저포화자화 박막을 다층화시킨 자계센서 |
KR20040050128A (ko) * | 2002-12-09 | 2004-06-16 | 주식회사 씨앤케이 | 다층 pcb 제조공법을 이용한 자기임피던스센서 |
US7220602B2 (en) * | 2005-07-29 | 2007-05-22 | Freescale Semiconductor, Inc. | Magnetic tunnel junction sensor method |
JP5987302B2 (ja) * | 2011-11-30 | 2016-09-07 | ソニー株式会社 | 記憶素子、記憶装置 |
GB2502971B (en) | 2012-06-11 | 2017-10-04 | Knowles (Uk) Ltd | A capacitive structure |
JP7203490B2 (ja) | 2017-09-29 | 2023-01-13 | 昭和電工株式会社 | 磁気センサ集合体及び磁気センサ集合体の製造方法 |
CN114062978B (zh) * | 2021-11-15 | 2024-02-02 | 东南大学 | 一种基于压电隧道效应的mems磁场传感器及测量磁场方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0870148A (ja) * | 1994-08-30 | 1996-03-12 | Mitsubishi Materials Corp | 磁気抵抗素子 |
US5650958A (en) * | 1996-03-18 | 1997-07-22 | International Business Machines Corporation | Magnetic tunnel junctions with controlled magnetic response |
JP3617175B2 (ja) * | 1996-03-29 | 2005-02-02 | ソニー株式会社 | 磁気トンネリング接合素子 |
SG72760A1 (en) * | 1996-09-19 | 2000-05-23 | Tdk Corp | Ferromagnetic tunnel junction magnetoresistive element and magnetic head |
US6299990B1 (en) * | 1996-12-18 | 2001-10-09 | Hitachi, Ltd. | Ferromagnetic material and magnetic apparatus employing the ferromagnetic material |
US5968677A (en) * | 1996-12-18 | 1999-10-19 | Hitachi, Ltd. | Ferromagnetic material and magnetic apparatus employing the ferromagnetic material |
JP2871670B1 (ja) * | 1997-03-26 | 1999-03-17 | 富士通株式会社 | 強磁性トンネル接合磁気センサ、その製造方法、磁気ヘッド、および磁気記録/再生装置 |
US6069820A (en) * | 1998-02-20 | 2000-05-30 | Kabushiki Kaisha Toshiba | Spin dependent conduction device |
US6381171B1 (en) * | 1999-05-19 | 2002-04-30 | Kabushiki Kaisha Toshiba | Magnetic element, magnetic read head, magnetic storage device, magnetic memory device |
JP2001084758A (ja) * | 1999-09-17 | 2001-03-30 | Fujitsu Ltd | 強磁性トンネル接合ランダムアクセスメモリ、スピンバルブランダムアクセスメモリ、単一強磁性膜ランダムアクセスメモリ、およびこれらをつかったメモリセルアレイ |
US6331944B1 (en) * | 2000-04-13 | 2001-12-18 | International Business Machines Corporation | Magnetic random access memory using a series tunnel element select mechanism |
US6504689B1 (en) * | 2000-07-12 | 2003-01-07 | International Business Machines Corporation | Tunnel junction read head with flux guide coupled to and magnetically extending a recessed free layer to an air bearing surface |
US6567244B1 (en) * | 2000-10-10 | 2003-05-20 | Hitachi Global Storage Technologies Netherlands | Differential yoke type read head |
-
2000
- 2000-01-25 KR KR1020007012085A patent/KR100722334B1/ko not_active IP Right Cessation
- 2000-01-25 CN CNB2004100058314A patent/CN1267895C/zh not_active Expired - Fee Related
- 2000-01-25 DE DE10080670T patent/DE10080670T1/de not_active Ceased
- 2000-01-25 WO PCT/JP2000/000351 patent/WO2000052489A1/ja active IP Right Grant
- 2000-01-25 CN CNB008004595A patent/CN1165777C/zh not_active Expired - Fee Related
- 2000-11-01 US US09/704,010 patent/US6741434B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CN1165777C (zh) | 2004-09-08 |
KR100722334B1 (ko) | 2007-05-28 |
CN1542743A (zh) | 2004-11-03 |
WO2000052489A1 (fr) | 2000-09-08 |
KR20010043167A (ko) | 2001-05-25 |
CN1297533A (zh) | 2001-05-30 |
CN1267895C (zh) | 2006-08-02 |
US6741434B1 (en) | 2004-05-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
OP8 | Request for examination as to paragraph 44 patent law | ||
8131 | Rejection |