CN218734312U - QSFP active optical cable test fixture - Google Patents
QSFP active optical cable test fixture Download PDFInfo
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- CN218734312U CN218734312U CN202223180521.9U CN202223180521U CN218734312U CN 218734312 U CN218734312 U CN 218734312U CN 202223180521 U CN202223180521 U CN 202223180521U CN 218734312 U CN218734312 U CN 218734312U
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Abstract
The utility model relates to an optical cable test technical field, concretely relates to QSFP active optical cable test fixture, including the panel that adjusts the temperature, the temperature sensing piece, supporting shoe and first arch, the panel that adjusts the temperature is connected with the temperature sensing piece, the edge and the supporting shoe and the first protruding connection of temperature sensing piece, the panel that adjusts the temperature is used for adjusting test fixture's temperature, and keep constant temperature, adjust first bellied temperature through the temperature sensing piece, the supporting shoe is located first bellied side, the supporting shoe is used for placing QSFP active optical cable and surveys test panel, first bellied relative supporting shoe is protruding, protruding height is QSFP active optical cable test panel thickness, be provided with the breach unanimous with first bellied size on the QSFP active optical cable survey test panel, the temperature sensing piece only needs to survey the size that can give first bellied homothermal, consequently, the shared tester test panel of whole test fixture is less, only need survey the breach of first bellied active optical cable of embedding QSFP, insert QSFP active optical cable again and just can carry out high temperature or low temperature test, and convenient operation.
Description
Technical Field
The utility model relates to an optical cable test technical field, concretely relates to QSFP active optical cable test fixture.
Background
Under the high-speed development of active optical cables, the fields and environments of QSFP active optical cables are more and more wide, so that new requirements for the quality of the QSFP active optical cables are met, including stable use in high-temperature and low-temperature environments, and the QSFP active optical cables need to accurately test the error rates in various environments in the research and development test stage so as to accurately know product parameters.
At present, when testing the error rate of the QSFP active optical cable at high temperature or low temperature, the optical cable needs to be put into a high temperature box or a low temperature box together with a test board, on one hand, the professional high temperature box and low temperature box are expensive, and have large volume, and the consumed power is also large, which can further increase the enterprise cost, and on the other hand, but the current high temperature box or low temperature box heats or cools the optical cable together with the test board integrally, and the chip and the circuit of the test board do not adapt to the high temperature or low temperature environment, and the deviation of the tested data under the high temperature or low temperature environment easily occurs, so that a QSFP active optical cable test fixture which only directly adjusts the temperature of the optical cable part and has low power consumption and miniaturization is urgently needed.
SUMMERY OF THE UTILITY MODEL
The utility model aims to provide a: aiming at the problem that the existing QSFP active optical cable cannot conveniently and quickly test the error rate at high temperature or low temperature, a QSFP active optical cable test fixture is designed, and the temperature is directly transmitted to the QSFP active optical cable through a protrusion.
In order to realize the purpose of the utility model, the utility model provides a following technical scheme:
a QSFP active optical cable test fixture comprises a temperature adjusting panel, a temperature sensing block, a supporting block and a first bulge,
the temperature adjusting panel is connected with the temperature sensing block, the edge of the temperature sensing block is connected with the supporting block and the first bulge, the temperature adjusting panel is used for adjusting the temperature of the test fixture and keeping constant temperature, the temperature of the first bulge is adjusted through the temperature sensing block,
the supporting block is positioned on the side edge of the first bulge, the supporting block is used for placing a QSFP active optical cable testing plate, the first bulge is opposite to the supporting block bulge, the height of the bulge is equal to the thickness of the QSFP active optical cable testing plate,
the QSFP active optical cable test board is provided with a notch with the same size as the first protrusion, the QSFP active optical cable is inserted into the QSFP active optical cable test board, and the first protrusion is embedded into the notch of the QSFP active optical cable test board and is in direct contact with the QSFP active optical cable.
Furthermore, the contact surface of the first protrusion and the QSFP active optical cable further comprises a filling layer, and the filling layer is soft in texture and is used for filling the gap of the contact surface after the first protrusion is contacted with the QSFP active optical cable.
Furthermore, a first cavity is formed in the first protrusion, and liquid nitrogen is filled in the first cavity to cool the first protrusion.
Furthermore, the temperature sensing block is provided with a second cavity, and the second cavity is used for placing a QSFP active optical cable to be tested.
Further, the height of the inlet of the second cavity in the inward direction is gradually reduced, and a recess is formed in the second cavity.
Furthermore, the support block is provided with a first recess at a power interface of the QSFP active optical cable test board, and the first recess prevents the power interface of the QSFP active optical cable test board from directly contacting the support block.
Furthermore, the temperature sensing block is in a cube shape, the QSFP active optical cable test board is in a disc shape, and the side length of the temperature sensing block is equal to the diameter of the QSFP active optical cable test board.
Furthermore, the support block supports one side of the QSFP active optical cable inserted into the QSFP active optical cable test board, the temperature sensing block is further provided with a plurality of temperature insulation rods, and the temperature insulation rods are consistent with the support block in height and used for placing the QSFP active optical cable test board together with the support block.
Furthermore, a plurality of limiting blocks are arranged on the temperature sensing block and are positioned at the edge of the QSFP active optical cable test board.
Furthermore, a positioning hole is formed in the supporting block and used for fixedly connecting the QSFP active optical cable test plate with the supporting block.
Compared with the prior art, the beneficial effects of the utility model are that:
1. at present, when the error rate of a QSFP active optical cable at high temperature or low temperature is tested, the optical cable and the test board are required to be placed into a high temperature box or a low temperature box together, and when the high temperature box or the low temperature box returns to heat or cool the test board, the first bulge is embedded into a gap of the QSFP active optical cable test board to be in direct contact with the QSFP active optical cable, the first bulge is only in contact with a small part of the gap of the QSFP active optical cable test board and is not in direct contact with other parts of the test board, including a chip, a circuit and the like, so that the normal operation of the test board can be maintained, the first bulge is consistent with the size of a joint of the QSFP active optical cable, and the temperature sensing block only needs to provide constant temperature for the first bulge, so that the whole test jig needs to embed the whole QSFP active optical cable into the gap of the QSFP active optical cable and the high temperature box or the low temperature box into which the QSFP active optical cable can be installed, the occupied test personnel are small, and the high temperature test board can be conveniently operated by embedding the first bulge into the gap of the QSFP active optical cable into the QSFP active optical cable;
2. seamless direct contact transmission temperature's between the object effect is best, can furthest avoid the temperature to air loss, consequently first arch has still set up the filling layer with QSFP active optical cable's contact surface, the filling layer texture is soft, produces deformation after receiving QSFP active optical cable to press, fills up the gap between the contact surface, and transmission temperature is effectual. Furthermore, the filling layer is made of a viscous material, and the QSFP active optical cable can be adhered to the first protrusion after deformation, so that connection is stable;
3. the temperature adjusting panel is difficult to reduce the temperature to be below zero, so in the technical scheme disclosed by the application, a first cavity is arranged in the first protrusion, and the first cavity is used for filling liquid nitrogen to reduce the temperature of the first protrusion, so that the low-temperature error rate of the QSFP active optical cable is tested;
4. after the QSFP active optical cable test fixture starts working, a plurality of QSFP active optical cables can be kept constant in temperature in the test process, energy loss caused by frequent temperature rise and temperature reduction is reduced, therefore, the temperature sensing block is provided with the second cavity, the second cavity is used for placing the QSFP active optical cables to be tested, the QSFP active optical cables are enabled to be excessively heated before testing, the QSFP active optical cables are prevented from being directly contacted with high temperature or low temperature from the normal temperature state, the QSFP active optical cables are prevented from being damaged due to the fact that the QSFP active optical cables are arranged in the second cavity, meanwhile, the QSFP active optical cables with excessive temperatures can reach required test temperatures more quickly, test time is shortened, and test efficiency is improved. Furthermore, the second cavity is arranged to have an inlet higher than the inside, so that a QSFP active optical cable can be placed in the second cavity, and the QSFP active optical cable can move towards the inside after being placed in the second cavity, so that the QSFP active optical cable is prevented from falling off;
5. for further stable operation and safety of the QSFP active optical cable test board, the support block is provided with a first recess at a power interface of the QSFP active optical cable test board, so that the direct contact between the power interface and a test fixture is avoided, and the stable operation of the test is ensured;
6. the side length of the temperature sensing block is the same as the diameter of the QSFP active optical cable test plate, the QSFP active optical cable test plate is placed inside the temperature sensing block, constant temperature test of the QSFP active optical cable is guaranteed, further, various functional modules and chips are arranged at the bottom of the QSFP active optical cable test plate, and the functional modules and the chips are not suitable for being in direct contact with high-temperature or low-temperature objects, so that the QSFP active optical cable is supported by the supporting block to be inserted into one side of the QSFP active optical cable test plate, a plurality of temperature insulation rods are arranged on a suspended part, and the supporting block and the temperature insulation rods avoid the functional modules and the chips, so that the QSFP active optical cable test plate can stably run;
7. the side length of the temperature sensing block is the same as the diameter of the QSFP active optical cable test board, so that limiting blocks can be arranged at four right-angle positions of the temperature sensing block to limit the QSFP active optical cable test board in the temperature sensing block, the QSFP active optical cable test board can also be kept stable during test operation and can be conveniently taken and placed, a positioning hole is further formed in the supporting block, and the positioning hole is used for fixedly connecting the QSFP active optical cable test board with the supporting block under the condition that the test fixture needs to be turned over or moved.
Drawings
Fig. 1 is a schematic structural diagram of a QSFP active optical cable test fixture;
figure 2 is a schematic diagram of a QSFP active optical cable test fixture in use,
the figures are marked by: the optical cable temperature measurement device comprises a 1-QSFP active optical cable test board, a 2-temperature sensing block, a 3-supporting block, a 4-first bulge, a 5-filling layer, a 6-first cavity, a 7-second cavity, a 8-first recess, a 9-temperature insulation rod, a 10-limiting block and a 11-positioning hole.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. It is to be understood that the embodiments described are only some of the embodiments of the present invention, and not all of them.
Thus, the following detailed description of the embodiments of the present invention is not intended to limit the scope of the invention as claimed, but is merely representative of some embodiments of the invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
It should be noted that, in the present invention, the embodiments and the features and technical solutions in the embodiments may be combined with each other without conflict.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
In the description of the present invention, it should be noted that the terms "upper" and "lower" indicate the orientation or position relationship based on the orientation or position relationship shown in the drawings, or the orientation or position relationship that the utility model is usually placed when using, or the orientation or position relationship that the skilled person usually understands, and such terms are only for convenience of describing the present invention and simplifying the description, but do not indicate or imply that the device or element that is referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be interpreted as limiting the present invention. Furthermore, the terms "first," "second," and the like are used merely to distinguish one description from another, and are not to be construed as indicating or implying relative importance.
The first embodiment is as follows: as shown in reference to figures 1 and 2,
referring to fig. 1, the QSFP active optical cable test fixture provided by this embodiment includes a temperature adjustment panel, a temperature sensing block 2, a supporting block 3 and a first protrusion 4,
the temperature adjusting panel is connected with the temperature sensing block 2, the edge of the temperature sensing block 2 is connected with the supporting block 3 and the first bulge 4, the temperature adjusting panel is used for adjusting the temperature of the test fixture, keeping constant temperature, adjusting the temperature of the first bulge 4 through the temperature sensing block 2,
the supporting block 3 is positioned at the side edge of the first bulge 4, the supporting block 3 is used for placing the QSFP active optical cable test board 1, the first bulge 4 is bulged relative to the supporting block 3, the bulge height is the thickness of the QSFP active optical cable test board 1,
a gap with the size consistent with that of the first protrusion 4 is formed in the QSFP active optical cable test board 1, the QSFP active optical cable is inserted into the QSFP active optical cable test board 1, and the first protrusion 4 is embedded into the gap of the QSFP active optical cable test board 1 and is in direct contact with the QSFP active optical cable.
At present, when the error rate of the QSFP active optical cable is tested at high temperature or low temperature, the optical cable and the test board are required to be placed into a high temperature box or a low temperature box together, and the test board is also heated or cooled when the high temperature box or the low temperature box returns, but the technical scheme disclosed by the application can keep normal operation of the test board by embedding the first bulge 4 into the gap of the QSFP active optical cable test board 1 and directly contacting the QSFP active optical cable, the first bulge 4 only contacts with a small part of the gap of the QSFP active optical cable test board 1, and does not directly contact with other parts of the test board, including chips, circuits and the like, and the first bulge 4 and the QSFP active optical cable are consistent in size, the temperature sensing block 2 only needs to be capable of keeping the temperature for the first bulge 4, so that the whole test fixture relatively needs to be small for the high temperature box or the low temperature box into which the whole QSFP active optical cable 1 and the FP active optical cable are installed, the test board occupies a small test table surface, the test personnel can be conveniently inserted into the gap of the QSFP active optical cable, and the low temperature test board can be operated by inserting the high temperature optical cable or the low temperature active optical cable test board 1.
Further, the contact surface of the first protrusion 4 and the QSFP active optical cable further comprises a filling layer 5, and the filling layer 5 is soft and is used for filling the gap of the contact surface after the first protrusion 4 is contacted with the QSFP active optical cable.
Seamless direct contact transmission temperature's between the object effect is best, can furthest avoid the temperature to air loss, consequently first arch 4 has still set up filling layer 5 with the contact surface of QSFP active optical cable, 5 soft texture on filling layer produces deformation after receiving QSFP active optical cable to press, fills up the gap between the contact surface, and transmission temperature is effectual. Furthermore, the filling layer 5 is made of a viscous material, and after deformation occurs, the QSFP active optical cable can be adhered to the first protrusion 4, so that connection is stable.
Further, a first cavity 6 is arranged inside the first protrusion 4, and the first cavity 6 is used for filling liquid nitrogen to cool the first protrusion 4.
The panel that adjusts the temperature is difficult to fall to below the zero degree, consequently, in the technical scheme that this application discloses, through first protruding 4 inside sets up first cavity 6, through first cavity 6 is used for filling the liquid nitrogen and makes first protruding 4 cooling, and then the low temperature error rate of test QSFP active optical cable.
Further, the temperature sensing block 2 is provided with a second cavity 7, and the second cavity 7 is used for placing a QSFP active optical cable to be tested. Further, the height of the entrance of the second cavity 7 in the inward direction is gradually reduced, and a recess is formed inside the second cavity 7.
After the QSFP active optical cable test fixture starts working, a plurality of QSFP active optical cables can be kept constant in temperature in the test process, energy loss caused by frequent temperature rise and temperature reduction is reduced, therefore, the temperature sensing block 2 is provided with the second cavity 7, the second cavity 7 is used for placing the QSFP active optical cables to be tested, the QSFP active optical cables are enabled to be excessively heated before testing, the QSFP active optical cables are prevented from being directly contacted with high temperature or low temperature from a normal temperature state by the first bulges 4, the QSFP active optical cables are damaged, meanwhile, the QSFP active optical cables which are excessively heated can reach required test temperature more quickly, test time is shortened, and test efficiency is improved. Further, the second cavity 7 is arranged to have an inlet higher than the inside, so that a QSFP active optical cable can be placed in the second cavity 7, and the QSFP active optical cable can be moved to the inside after being placed in the second cavity 7, so as to avoid falling.
Further, the support block 3 is provided with a first recess 8 at a power interface of the QSFP active optical cable test board 1, and the first recess 8 prevents the power interface of the QSFP active optical cable test board 1 from directly contacting the support block 3.
For further stable operation and safety of the QSFP active optical cable test board 1, a first recess 8 is arranged at a power interface of the QSFP active optical cable test board 1 through the supporting block 3, so that the power interface is prevented from being in direct contact with a test fixture, and stable operation of the test is ensured.
Furthermore, the temperature sensing block 2 is in a cube shape, the QSFP active optical cable test board 1 is in a disc shape, and the side length of the temperature sensing block 2 is equal to the diameter of the QSFP active optical cable test board 1.
Referring to fig. 2, further, the support block 3 supports one side of the QSFP active optical cable test board 1, where the QSFP active optical cable is inserted into the QSFP active optical cable test board 1, and the temperature sensing block 2 is further provided with a plurality of temperature insulating rods 9, where the height of the temperature insulating rods 9 is consistent with that of the support block 3, and the temperature insulating rods 9 are used to place the QSFP active optical cable test board 1 together with the support block 3.
The side length of the temperature sensing block 2 is the same as the diameter of the QSFP active optical cable test board 1, the QSFP active optical cable test board 1 is placed inside the temperature sensing block 2, constant temperature test on the QSFP active optical cable is guaranteed, further, various functional modules and chips are arranged at the bottom of the QSFP active optical cable test board 1, and the functional modules and the chips are not suitable for being in direct contact with high-temperature or low-temperature objects, so that the support block 3 supports the QSFP active optical cable to be inserted into one side of the QSFP active optical cable test board 1, a plurality of temperature isolating rods 9 are arranged for suspended parts, the support block 3 and the temperature isolating rods 9 avoid the functional modules and the chips, and the QSFP active optical cable test board 1 is enabled to run stably.
Furthermore, a plurality of limiting blocks 10 are arranged on the temperature sensing block 2, and the limiting blocks 10 are located at the edge of the QSFP active optical cable test board 1. Furthermore, a positioning hole 11 is formed in the supporting block 3 and used for fixedly connecting the QSFP active optical cable test board 1 with the supporting block 3.
The side length of the temperature sensing block 2 is the same as the diameter of the QSFP active optical cable test board 1, so that limiting blocks 10 can be arranged at four right angles of the temperature sensing block 2 to limit the QSFP active optical cable test board 1 in the temperature sensing block 2, the QSFP active optical cable test board can also be kept stable during test operation and can be taken and placed conveniently, a positioning hole 11 is further formed in the supporting block 3, and the positioning hole 11 is used for fixedly connecting the QSFP active optical cable test board 1 with the supporting block 3 under the condition that the test fixture needs to be turned over or moved.
The above embodiments are only used to illustrate the present invention and not to limit the technical solutions of the present invention, and although the present invention has been described in detail with reference to the above embodiments, the present invention is not limited to the above embodiments, so that any modifications or equivalent substitutions can be made to the present invention; all the technical solutions and modifications without departing from the spirit and scope of the present invention are covered by the claims of the present invention.
Claims (10)
1. The utility model provides a QSFP active optical cable test fixture which characterized in that: comprises a temperature adjusting panel, a temperature sensing block (2), a supporting block (3) and a first bulge (4),
the temperature adjusting panel is connected with the temperature sensing block (2), the edge of the temperature sensing block (2) is connected with the supporting block (3) and the first bulge (4), the temperature adjusting panel is used for adjusting the temperature of the test fixture and keeping constant temperature, the temperature of the first bulge (4) is adjusted through the temperature sensing block (2),
the supporting block (3) is positioned on the side edge of the first bulge (4), the supporting block (3) is used for placing a QSFP active optical cable test board (1), the first bulge (4) is bulged relative to the supporting block (3), the height of the bulge is the thickness of the QSFP active optical cable test board (1),
the QSFP active optical cable test board (1) is provided with a gap with the size of the first protrusion (4), the QSFP active optical cable is inserted into the QSFP active optical cable test board (1), and the first protrusion (4) is embedded into the gap of the QSFP active optical cable test board (1) and the QSFP active optical cable are in direct contact.
2. The QSFP active optical cable test fixture of claim 1, wherein: the contact surface of the first protrusion (4) and the QSFP active optical cable further comprises a filling layer (5), and the filling layer (5) is soft and is used for filling the gap of the contact surface after the first protrusion (4) is contacted with the QSFP active optical cable.
3. The QSFP active optical cable test fixture of claim 2, wherein: a first cavity (6) is formed in the first protrusion (4), and the first cavity (6) is filled with liquid nitrogen to cool the first protrusion (4).
4. The QSFP active optical cable test fixture of claim 1, wherein: the temperature sensing block (2) is provided with a second cavity (7), and the second cavity (7) is used for placing a QSFP active optical cable to be tested.
5. The QSFP active optical cable test fixture of claim 4, wherein: the height of the inlet of the second cavity (7) in the inward direction is gradually reduced.
6. The QSFP active optical cable test fixture of claim 1, wherein: the support block (3) is provided with a first recess (8) at the power interface of the QSFP active optical cable test board (1), and the first recess (8) prevents the power interface of the QSFP active optical cable test board (1) from directly contacting the support block (3).
7. The QSFP active optical cable test fixture of claim 1, wherein: the temperature sensing block (2) is in a cube shape, the QSFP active optical cable test board (1) is in a disc shape, and the side length of the temperature sensing block (2) is equal to the diameter of the QSFP active optical cable test board (1).
8. The QSFP active optical cable test fixture of claim 7, wherein: the temperature sensing plate is characterized in that the supporting block (3) supports one side of the QSFP active optical cable inserted into the QSFP active optical cable testing plate (1), the temperature sensing block (2) is further provided with a plurality of temperature insulating rods (9), and the temperature insulating rods (9) are consistent in height with the supporting block (3) and used for being placed together with the supporting block (3) to form the QSFP active optical cable testing plate (1).
9. The QSFP active optical cable test fixture of claim 8, wherein: a plurality of limiting blocks (10) are arranged on the temperature sensing block (2), and the limiting blocks (10) are located at the edge of the QSFP active optical cable test board (1).
10. The QSFP active optical cable test fixture of any one of claims 1-9, wherein: and a positioning hole (11) is formed in the supporting block (3), and the positioning hole (11) is used for fixedly connecting the QSFP active optical cable test board (1) with the supporting block (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223180521.9U CN218734312U (en) | 2022-11-30 | 2022-11-30 | QSFP active optical cable test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223180521.9U CN218734312U (en) | 2022-11-30 | 2022-11-30 | QSFP active optical cable test fixture |
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| Publication Number | Publication Date |
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| CN218734312U true CN218734312U (en) | 2023-03-24 |
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| CN202223180521.9U Active CN218734312U (en) | 2022-11-30 | 2022-11-30 | QSFP active optical cable test fixture |
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| CN (1) | CN218734312U (en) |
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