CN111308213A - Plastic vibrator standing wave test system and test method - Google Patents
Plastic vibrator standing wave test system and test method Download PDFInfo
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- CN111308213A CN111308213A CN201911135818.3A CN201911135818A CN111308213A CN 111308213 A CN111308213 A CN 111308213A CN 201911135818 A CN201911135818 A CN 201911135818A CN 111308213 A CN111308213 A CN 111308213A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
- G01R27/06—Measuring reflection coefficients; Measuring standing-wave ratio
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Abstract
The embodiment of the invention relates to a plastic vibrator standing wave test system and a test method, which comprises a high-low temperature test box, a microwave shielding dark box, a test tool and a network analyzer; the high-low temperature test chamber is provided with an inner cavity capable of accommodating the microwave shielding camera bellows and is used for accommodating the microwave shielding camera bellows; the microwave shielding camera bellows is used for accommodating the test tool; placing the plastic vibrator to be tested on the testing tool, and carrying out standing wave testing; and the network analyzer is electrically connected with the test tool and is used for recording standing wave test data. The standing wave test system can be used for carrying out standing wave test on the plastic vibrator under high and low temperature environments.
Description
Technical Field
The invention belongs to the technical field of antenna testing, and particularly relates to a plastic vibrator standing wave testing system and a testing method.
Background
With the arrival of the 5G era, the antenna oscillator manufactured by the traditional sheet metal and die-casting process is limited by process precision, is easy to generate directional deviation, and cannot meet the performance requirement of the antenna. The plastic vibrator is manufactured by one-step molding of a complex 3D three-dimensional shape in an injection molding mode, and then the surface of the plastic is metalized through a plastic electroplating process. The plastic vibrator is used for a 5G mobile communication base station, the weight of a product is greatly reduced while the antenna is ensured to meet the electrical performance of 5G communication, dangerous procedures are reduced, the cost is saved, and the plastic vibrator becomes a great trend of the 5G antenna.
Because the plastic vibrator is generally used outdoors, the use environment condition is worse. If the linear expansion coefficient of the plastic is too large, the circuit electroplated on the antenna element can be broken. The integrity of the circuit can be effectively judged through the test of the standing-wave ratio. However, the conventional standing wave test method cannot monitor the standing wave ratio change of the plastic vibrator in real time under high and low temperature environments.
Disclosure of Invention
In view of this, the embodiment of the invention provides a standing wave test system and a test method for a plastic vibrator.
According to a first aspect of the invention, an embodiment of the invention provides a standing wave test system for a plastic vibrator.
A plastic vibrator standing wave test system comprises a high-low temperature test box, a microwave shielding dark box, a test tool and a network analyzer; the high-low temperature test chamber is provided with an inner cavity capable of accommodating the microwave shielding camera bellows and is used for accommodating the microwave shielding camera bellows; the microwave shielding camera bellows is used for accommodating the test tool and the plastic vibrator to be tested; placing the plastic vibrator to be tested on the testing tool, and carrying out standing wave testing; and the network analyzer is electrically connected with the test tool and is used for recording standing wave test data.
Further, the width of the inner cavity of the high-low temperature test box is more than 100mm larger than the width of the microwave shielding dark box, and the height of the inner cavity of the high-low temperature test box is more than 50mm larger than the height of the microwave shielding dark box.
Further, the microwave shielding camera bellows comprises a box body, a wave absorbing module is arranged on the inner wall of the box body, preferably, the wave absorbing module comprises a wave absorbing cone and a mounting plate, and the wave absorbing cone is arranged on the mounting plate.
Further, the wave-absorbing cone is made of a wave-absorbing material comprising a ferrite material, or made of a wave-absorbing material comprising silicon carbide; and/or the presence of a gas in the gas,
the wave-absorbing cone is bonded and solidified on the mounting plate through silicon rubber; and/or the presence of a gas in the gas,
the lower part of the wave-absorbing cone is provided with a cone guide groove, the mounting plate is provided with a mounting groove, and the mounting groove is in limit fit with the cone guide groove; preferably, a limiting part is arranged above the mounting groove, and the limiting part can be embedded into the cone guide groove; and/or the presence of a gas in the gas,
the mounting plate is an aluminum alloy mounting plate.
Further, a support table is further arranged in the microwave shielding dark box and used for supporting the test tool, and preferably, the support table is a bakelite support table; and/or the presence of a gas in the gas,
the bottom of the microwave shielding camera bellows is provided with a sliding rail or a sliding groove.
Further, the test fixture can be electrically connected with the plastic vibrator to be tested, and the test fixture sequentially comprises a reflecting plate, a bakelite plate, an impedance matching circuit board and a base plate which are fixedly connected from top to bottom.
Further, the reflecting plate is used for reflecting the radiation signal; the bakelite plate is used for supporting the plastic vibrator to be tested and insulating the reflecting plate from the impedance matching circuit board; the impedance matching circuit board is used for impedance conversion and circuit connection, one end of the impedance matching circuit board is provided with an SMA connector, and the other end of the impedance matching circuit board is provided with a probe; the backing plate is used for supporting and protecting the impedance matching circuit board.
According to a second aspect of the present invention, an embodiment of the present invention provides a method for performing standing wave testing on a plastic vibrator.
A method for carrying out standing wave test on a plastic vibrator is completed by utilizing one of the plastic vibrator standing wave test systems.
Further, the method comprises the steps of:
s1, placing a microwave shielding dark box in the high-low temperature test box;
s2, electrically connecting a network analyzer and a test tool;
s3, placing the plastic vibrator to be tested on a testing tool, and electrically connecting the plastic vibrator to be tested with the testing tool;
s4, placing the plastic vibrator to be tested and the test tool in a microwave shielding dark box;
and S5, adjusting the temperature cycle range and the change rate of the high-low temperature test chamber, and observing and recording standing wave test data on a network analyzer.
Further, in S2, the network analyzer and the SMA connector on the test fixture are electrically connected; in S3, electrically connecting a feed pin of the plastic vibrator to be tested with a probe of an impedance matching circuit board of the test tool; and S4, placing the plastic vibrator to be tested and the test tool on a support table in a microwave shielding dark box.
The embodiment of the invention has the following beneficial effects: the standing wave test system and the test method for the plastic vibrator provided by the embodiment of the invention can monitor the standing wave ratio change of the plastic vibrator in real time in a high-temperature and low-temperature environment, and the temperature test range can reach minus 40 ℃ to 120 ℃.
Drawings
Fig. 1 is a schematic structural diagram of a standing wave test system for a plastic vibrator according to an embodiment of the present invention.
Fig. 2a is a schematic front view of a microwave shielding dark box according to an embodiment of the present invention.
Fig. 2b is a schematic cross-sectional view of a microwave shielding dark box according to an embodiment of the present invention.
Fig. 3a is a schematic structural diagram of a wave-absorbing module according to an embodiment of the present invention.
Fig. 3b is a schematic view of a connection structure of the wave-absorbing cone and the mounting plate according to the embodiment of the invention.
Fig. 3c is a schematic structural diagram of a wave-absorbing cone proposed in the embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a test fixture according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to specific embodiments and the accompanying drawings. Those skilled in the art will appreciate that the present invention is not limited to the drawings and the following examples.
Embodiment 1 standing wave test system for plastic vibrator
The embodiment of the invention provides a plastic vibrator standing wave test system which can be used for plastic vibrator standing wave test in high and low temperature environments and comprises a high and low temperature test box 10, a microwave shielding dark box 20, a test tool 30 and a network analyzer 40; the high-low temperature test chamber 10 is provided with an inner cavity capable of accommodating the microwave shielding camera chamber 20 and is used for accommodating the microwave shielding camera chamber 20; the microwave shielding dark box 20 is used for accommodating the test tool 30 and the plastic vibrator M to be tested; placing the plastic vibrator M to be tested on a testing tool 30 for standing wave testing; the network analyzer 40 is used to record standing wave test data.
The high-low temperature test chamber 10 is preferably a high-low temperature test chamber 10 capable of bearing the weight of more than 110kg, the width of the inner cavity of the high-low temperature test chamber is more than 100mm larger than the width of the microwave shielding dark box 20, and the height of the inner cavity is more than 50mm larger than the height of the microwave shielding dark box 20. The side wall of the high-low temperature test box 10 is provided with a wire passing hole, a test cable can pass through the wire passing hole, one end of the test cable is connected with the test tool 30, and the other end of the test cable is connected with the network analyzer 40, so that the electrical connection between the network analyzer 40 and the test tool 30 is realized. Preferably, the test cable is an SMA-N type phase-stable cable. The high-low temperature test box 10 is provided with a temperature control system, is used for adjusting the temperature of the inner cavity of the high-low temperature test box 10, and can adjust the temperature within the range of minus 40 ℃ to 120 ℃.
The microwave shielding dark box 20 comprises a box body 21, a wave absorbing module 22 is arranged on the inner wall of the box body 21, the box body 21 is a box body 21 with an opening at the front end, and the opening at the front end of the box body 21 is used for taking and placing the plastic vibrator M to be tested.
Preferably, the wave-absorbing module 22 includes a wave-absorbing cone 221 and a mounting plate 222, the wave-absorbing cone 221 is preferably made of a wave-absorbing material including a ferrite material, and more preferably made of a ferrite material, or the wave-absorbing cone 221 is made of a wave-absorbing material including silicon carbide, and more preferably made of silicon carbide ceramic, and the silicon carbide wave-absorbing material is high temperature resistant, low in volatility, clean, powder-free, and high in structural strength.
The wave-absorbing cone 221 has a main body in a shape of a cone or a square cone, for example, and the wave-absorbing cone 221 includes a pointed cone. The wave absorbing cone 221 is arranged on the mounting plate 222.
Preferably, the total height of the wave absorbing cone 221 is about 85 mm.
Preferably, the reflection loss of the wave-absorbing cone 221 under the frequency of 2.1-5GHz is less than or equal to-15 dB.
Further, a cone guide groove 2211 is arranged at the lower part of the wave absorbing cone 221, and exemplarily, the cone guide groove 2211 is a groove formed at the lower part of the wave absorbing cone 221 along the circumferential direction thereof; the mounting plate 222 is provided with a mounting groove 2221, and the mounting groove 2221 is, for example, a plurality of strip-shaped grooves arranged in parallel; the mounting groove 2221 is in spacing fit with the cone guide groove 2211, for example, a spacing portion 2222 is arranged above the mounting groove 2221, and the spacing portion 2222 can be embedded into the cone guide groove 2211.
Preferably, the wave absorbing cone 221 is in clearance fit with the installation groove of the installation groove 2221. Further, the wave-absorbing cone 221 and the mounting plate 222 are bonded and cured by silicon rubber, for example, by using heat-conducting rubber GD414, and the bonding and curing of the silicon rubber can ensure the heat-conducting property between the wave-absorbing cone 221 and the mounting plate 222 and enhance the connection strength between the wave-absorbing cone 221 and the mounting plate 222.
Therefore, the wave absorbing cones 221 are fixed on the mounting plate 222 to form the wave absorbing module 22, and the mounting plate 222 is fixed on the inner wall of the box body 21 of the microwave shielding dark box 20 to enclose the microwave shielding dark box 20.
The mounting plate 222 is an aluminum alloy mounting plate 222, for example, drawn from aluminum alloy 6061.
Preferably, a support table is further disposed in the microwave shielding dark box 20 for supporting the test fixture 30. Preferably, the support table is a bakelite support table. More preferably, a limiting hole is formed in the lower surface of the supporting table, and the limiting hole is in limiting fit with the wave absorbing module 22. For example, the supporting table is arranged on a pointed cone part of the wave absorbing cone 221 of the wave absorbing module 22 at the bottom of the microwave shielding dark box 20, and the limiting hole of the supporting table is in limiting fit with the pointed cone part of the wave absorbing cone 221, so as to limit the supporting table.
Preferably, the bottom of the microwave shielding camera bellows 20 is provided with a sliding rail or a sliding groove, so that the microwave shielding camera bellows 20 can move directionally. Preferably, handles are further disposed on two sides of the microwave shielding dark box 20, so that the user can carry the microwave shielding dark box conveniently.
The test tool 30 is used for electrically connecting the plastic vibrator M to be tested, and the test tool 30 sequentially comprises a reflecting plate 31, a bakelite plate 32, an impedance matching circuit board 33 and a backing plate 34 which are fixedly connected from top to bottom. For example, the four parts are screwed and fixed.
The reflecting plate 31 is used for reflecting radiation signals, for example, radiation signals with a frequency of 2.1GHz-5GHz sent by the network analyzer 40, so as to simulate the actual use environment of the plastic vibrator M to be tested, and is also used for grounding the test fixture 30, and is preferably an aluminum reflecting plate.
The bakelite board 32 is used to support the plastic vibrator to be tested and insulate the reflection board 31 from the impedance matching circuit board 33.
The impedance matching circuit board 33 is used for impedance conversion and circuit connection; an SMA connector 331 is disposed at one end of the impedance matching circuit board 33, and a probe 332 is disposed at the other end for circuit connection, wherein the probe 332 is preferably a patch elastic probe; the SMA connector 331 and the probe 332 are soldered to the impedance matching circuit board 33.
The backing plate 34 is preferably a bakelite backing plate for supporting and protecting the impedance matching circuit board 33.
The bottom of the plastic vibrator M to be tested is provided with a feed pin M1 for circuit connection, such as a copper feed pin, and preferably, the bottom of the plastic vibrator M to be tested is injection-molded and embedded with the feed pin or welded with the feed pin. During testing, the plastic vibrator M to be tested is lightly pressed on the testing tool 30.
Embodiment 2 standing wave test method for plastic vibrator
The embodiment of the invention also provides a method for carrying out standing wave test on the plastic vibrator by using the plastic vibrator standing wave test system, which comprises the following steps:
s1, placing the microwave shielding dark box 20 in the high-low temperature test box 10, and enabling the distance between the outer wall of the microwave shielding dark box 20 and the inner wall of the high-low temperature test box 10 to be not less than 50mm so as to ensure good internal circulation during heat exchange;
s2, electrically connecting the network analyzer 40 and the SMA connector 331 on the test fixture 30;
s3, placing the plastic vibrator M to be tested on the testing tool 30, and enabling a feed pin M1 on the plastic vibrator M to be tested to be in contact with a probe fixed on an impedance matching circuit board 33 of the testing tool 30 so as to enable the feed pin M1 and the probe to be electrically connected;
s4, placing the plastic vibrator M to be tested and the test tool 30 on a support table in the microwave shielding dark box 20;
and S5, adjusting the temperature cycle range and the change rate of the high-low temperature test chamber 10, and observing and recording standing wave test data on the network analyzer 40.
It should be noted that the steps for implementing the above method are not limited by serial numbers, and those skilled in the art can easily determine the test steps.
The embodiments of the present invention have been described above. However, the present invention is not limited to the above embodiment. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A plastic vibrator standing wave test system is characterized by comprising a high-low temperature test box, a microwave shielding dark box, a test tool and a network analyzer; the high-low temperature test chamber is provided with an inner cavity capable of accommodating the microwave shielding camera bellows and is used for accommodating the microwave shielding camera bellows; the microwave shielding camera bellows is used for accommodating the test tool and the plastic vibrator to be tested; placing the plastic vibrator to be tested on the testing tool, and carrying out standing wave testing; and the network analyzer is electrically connected with the test tool and is used for recording standing wave test data.
2. The test system of claim 1, wherein the width of the inner cavity of the high-low temperature test chamber is more than 100mm larger than the width of the microwave shielding dark box, and the height of the inner cavity of the high-low temperature test chamber is more than 50mm larger than the height of the microwave shielding dark box.
3. The test system of claim 1, wherein the microwave shielding camera bellows comprises a box body, and a wave absorbing module is arranged on the inner wall of the box body, preferably, the wave absorbing module comprises a wave absorbing cone and a mounting plate, and the wave absorbing cone is arranged on the mounting plate.
4. The test system of claim 3, wherein the absorbing cone is made of an absorbing material comprising ferrite material or an absorbing material comprising silicon carbide; and/or the presence of a gas in the gas,
preferably, the wave-absorbing cone is bonded and solidified on the mounting plate through silicon rubber; and/or the presence of a gas in the gas,
preferably, the lower part of the wave-absorbing cone is provided with a cone guide groove, the mounting plate is provided with a mounting groove, and the mounting groove is in limit fit with the cone guide groove; preferably, a limiting part is arranged above the mounting groove, and the limiting part can be embedded into the cone guide groove; and/or the presence of a gas in the gas,
the mounting plate is an aluminum alloy mounting plate.
5. The test system of claim 1, wherein a support table is further arranged in the microwave shielding camera bellows and used for supporting the test fixture, and preferably, the support table is a bakelite support table; and/or the presence of a gas in the gas,
the bottom of the microwave shielding camera bellows is provided with a sliding rail or a sliding groove.
6. The test system of claim 1, wherein the test fixture can be electrically connected to the plastic vibrator to be tested, and the test fixture sequentially comprises a fixedly connected reflection plate, a bakelite plate, an impedance matching circuit board and a backing plate from top to bottom.
7. The test system of claim 6, wherein the reflective plate is configured to reflect a radiation signal; the bakelite plate is used for supporting the plastic vibrator to be tested and insulating the reflecting plate from the impedance matching circuit board; the impedance matching circuit board is used for impedance conversion and circuit connection, one end of the impedance matching circuit board is provided with an SMA connector, and the other end of the impedance matching circuit board is provided with a probe; the backing plate is used for supporting and protecting the impedance matching circuit board.
8. A method for performing standing wave test on a plastic vibrator, wherein the method is completed by using the plastic vibrator standing wave test system as claimed in any one of claims 1 to 7.
9. The method of claim 8, wherein the method comprises the steps of:
s1, placing a microwave shielding dark box in the high-low temperature test box;
s2, electrically connecting a network analyzer and a test tool;
s3, placing the plastic vibrator to be tested on a testing tool, and electrically connecting the plastic vibrator to be tested with the testing tool;
s4, placing the plastic vibrator to be tested and the test tool in a microwave shielding dark box;
and S5, adjusting the temperature cycle range and the change rate of the high-low temperature test chamber, and observing and recording standing wave test data on a network analyzer.
10. The method of claim 9,
in S2, electrically connecting the network analyzer with the SMA connector on the test fixture;
in S3, electrically connecting a feed pin of the plastic vibrator to be tested with a probe of an impedance matching circuit board of the test tool;
and S4, placing the plastic vibrator to be tested and the test tool on a support table in a microwave shielding dark box.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911135818.3A CN111308213A (en) | 2019-11-19 | 2019-11-19 | Plastic vibrator standing wave test system and test method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911135818.3A CN111308213A (en) | 2019-11-19 | 2019-11-19 | Plastic vibrator standing wave test system and test method |
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| CN111308213A true CN111308213A (en) | 2020-06-19 |
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| CN201911135818.3A Pending CN111308213A (en) | 2019-11-19 | 2019-11-19 | Plastic vibrator standing wave test system and test method |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112305277A (en) * | 2020-10-29 | 2021-02-02 | 深圳合一测试科技有限公司 | Embedded tuned circuit board probe for testing radio frequency signals based on radio frequency-free test seat |
-
2019
- 2019-11-19 CN CN201911135818.3A patent/CN111308213A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112305277A (en) * | 2020-10-29 | 2021-02-02 | 深圳合一测试科技有限公司 | Embedded tuned circuit board probe for testing radio frequency signals based on radio frequency-free test seat |
| CN112305277B (en) * | 2020-10-29 | 2021-10-26 | 深圳合一测试科技有限公司 | Embedded tuned circuit board probe for testing radio frequency signals based on radio frequency-free test seat |
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