CN218956063U - SFP active optical cable high temperature test fixture - Google Patents

Abstract

The utility model relates to the technical field of optical cable testing, in particular to an SFP active optical cable high-temperature testing jig which comprises a first platform and a second platform, wherein a heater is arranged in the first platform and used for heating the first platform and keeping the first platform constant, the second platform and the first platform are connected to the upper surface of the first platform, the length of the second platform is smaller than or equal to that of the first platform, the width of the second platform is smaller than that of the first platform, and the temperature of the second platform and the temperature of the first platform are kept consistent; be provided with first passageway on the second platform, first passageway is used for placing the joint of SFP active optical cable, and after the heater heating, the joint of SFP active optical cable inserts the test board and carries out high temperature test to SFP active optical cable, has the space between test board and the first platform, therefore the temperature of test board can be less than first platform, and the second platform can give SFP active optical cable with self temperature transfer, and the joint of first passageway and SFP active optical cable is trilateral contact at least, and the effect of transfer temperature is good.

Description

SFP active optical cable high temperature test fixture

Technical Field

The utility model relates to the technical field of optical cable testing, in particular to an SFP active optical cable high-temperature testing jig.

Background

At present, the active optical cable has gradually increased market occupation ratio due to the superiority of the performance of the active optical cable, and the multi-environment use requirement of the active optical cable is gradually increased when the demand of the market for the active optical cable is increased, wherein the active optical cable needs to maintain good mechanical performance at high temperature due to the fact that the self power and the use environment are mostly in environments with higher temperature such as a machine room.

Therefore, the active optical cable needs to be improved by testing the error rate at high temperature in the research and development stage, the high temperature error rate of the product needs to be tested as a product parameter in the delivery stage, the high temperature test of the SFP active optical cable can heat the SFP active optical cable test board and the SFP active optical cable together at high temperature, the structure of the SFP active optical cable test board, such as a circuit and a chip, is suitable for the working environment or normal temperature, and the problem that inaccurate test results and shortened service life of the SFP active optical cable test board are easily caused when the SFP active optical cable test board is used at high temperature is solved, so that a high temperature test fixture for independently heating the joint of the SFP active optical cable and not directly contacting the SFP active optical cable test board is needed.

Disclosure of Invention

The utility model aims at: aiming at the problems that the SFP active optical cable test board is heated at high temperature together in the high-temperature test of the current SFP active optical cable, which is easy to cause inaccurate test results and shortened service life of the SFP active optical cable test board, the SFP active optical cable high-temperature test fixture is designed, and the SFP active optical cable test board is not directly contacted with the high-temperature fixture by suspending the test board, so that the influence of high temperature on the SFP active optical cable test board is avoided.

In order to achieve the above object, the present utility model provides the following technical solutions:

the SFP active optical cable high-temperature test fixture comprises a first platform and a second platform, wherein a heater is arranged in the first platform and used for heating the first platform and keeping the first platform constant, the second platform and the first platform are connected to the upper surface of the first platform, the length of the second platform is smaller than or equal to that of the first platform, the width of the second platform is smaller than that of the first platform, and the temperature of the second platform is kept consistent with that of the first platform;

the second platform is provided with a first channel, the first channel is used for placing a connector of an SFP active optical cable, after the heater is heated, the connector of the SFP active optical cable is inserted into an SFP active optical cable test board to perform high-temperature test on the SFP active optical cable, the first platform is arranged below the SFP active optical cable test board, and a gap is reserved between the SFP active optical cable test board and the first platform.

Further, a second channel is further arranged on the second platform and used for placing a connector at the other end of the SFP active optical cable, the second channel and the first channel are located on the same horizontal plane, the connectors of the SFP active optical cable of the first channel and the second channel are respectively inserted into respective SFP active optical cable test boards, the first platform is arranged below the SFP active optical cable test boards, and a gap is reserved between the SFP active optical cable test boards and the first platform.

Further, the distance between the first channel and the second channel may be such that two of the SFP active optical cable test boards are located on the same side of the second platform.

Further, the first channel and the second channel are in contact with each other, and the two SFP active optical cable test boards are located at opposite sides of the second platform.

Further, the first channel and/or the second channel are/is further provided with a cover, and the cover is used for opening or closing the first channel and/or the second channel.

Further, the contact surfaces of the first channel and the second channel and the joint of the SFP active optical cable are further provided with an elastic layer, the elastic layer has elasticity, and the elastic layer is used for filling gaps between the first channel and the joint of the second channel and the SFP active optical cable.

Further, the outer surface of the SFP active optical cable test jig is provided with a heat insulation layer except the first channel and the second channel, and the heat insulation layer is used for reducing heat dissipation to air.

Further, the surface of the first platform is further provided with a plurality of support columns, and the support columns are used for supporting the SFP active optical cable test board.

Further, the contact surface of the support column and the SFP active optical cable test board is also provided with a connecting piece, and the connecting piece is used for detachable connection between the support column and the SFP active optical cable test board.

Further, the first platform is further provided with a groove, and the groove is used for placing the SFP active optical cable to be tested.

Compared with the prior art, the utility model has the beneficial effects that:

1. after the heater is heated, the joint of the SFP active optical cable is inserted into the SFP active optical cable test board to perform high-temperature test on the SFP active optical cable, the first platform is arranged below the SFP active optical cable test board, a gap is formed between the SFP active optical cable test board and the first platform, the SFP active optical cable test board is not in direct contact with the first platform, the temperature of the first platform is greatly dissipated due to air, the temperature of the SFP active optical cable test board is far lower than that of the SFP active optical cable test board through the direct contact, so that the temperature of the SFP active optical cable test board is far lower than that of the first platform, the second platform is connected with the first platform, the second platform is smaller than that of the first platform, the second platform and the first platform form a step shape, the temperature of the second platform is kept consistent with that of the first platform, the joint of the SFP active optical cable is placed on a first channel on the second platform, the joint of the SFP active optical cable is placed on the first channel, the SFP active optical cable is in direct contact with the first channel, the SFP active optical cable joint is placed on the first channel, and the SFP active optical cable joint is in direct contact with the SFP optical cable, and the temperature of the joint is at least one surface of the SFP active optical cable joint is good, and the SFP joint is placed on the first surface of the joint, and the SFP active optical cable is in contact technology;

2. the SFP active optical cable is provided with a head end and a tail end, and for the test of the SFP active optical cable, the head end and the tail end are inserted into the SFP active optical cable test board, and the test party can test the error rate of one SFP active optical cable at the same time, so in the technical scheme disclosed by the application, the first channel and the second channel are arranged on the second platform, the head end and the tail end of the SFP active optical cable are tested on one test fixture, and compared with the test of the two ends on the two test fixtures, the power consumption of one test fixture is reduced, and the occupied test position is smaller;

3. the first channel and the second channel are provided with a plurality of arrangement modes, one preferable arrangement mode is that when the distance between the first channel and the second channel is right, two SFP active optical cable test boards are arranged side by side and are positioned on the same side of the second platform, so that the SFP active optical cable test boards and the SFP active optical cables are convenient to take, the occupied space of a jig is smaller, the other preferable arrangement mode is that the first channel and the second channel are in contact with each other, the two SFP active optical cable test boards are positioned on the opposite sides of the second platform, and the positions of heating areas of the arrangement modes are close, so that the heating areas of the second platform and the first platform can be smaller, the required power is reduced, and the purpose of reducing power consumption is achieved;

4. the first channel and the second channel are further provided with sealing covers, three-side contact of the joints of the first channel and the second channel with the SFP active optical cable is increased to four sides, the effect of transferring temperature is further improved, further, the effect of seamless direct contact between objects is best, air exists between the objects, the temperature is transferred to the air, most of the temperature in the air is lost outwards, the other part of the air is transferred to another object through the air, and the temperature loss is large, so that the elastic layer is further arranged on the contact surfaces of the first channel and the second channel with the SFP active optical cable, the elastic layer has elasticity, deformation is generated after the SFP active optical cable is contacted with the first channel and the second channel, the elastic layer fills up air gaps between the contact surfaces, and the effect of transferring the temperature is good;

5. the outer surface of the SFP active optical cable test jig is provided with heat insulation layers except the first channel and the second channel, so that the loss of temperature to the air is reduced, the temperature is more transferred to the first channel and the second channel, meanwhile, the temperature born by the SFP active optical cable test board can be further reduced due to the arrangement of the heat insulation layers, and the temperature of the SFP active optical cable test board is further lower than that of the first platform and the second platform, which is beneficial to long-time test of the SFP active optical cable test board;

6. because the SFP active optical cable test board is not contacted with the first platform, the SFP active optical cable test board is connected with the joint of the SFP active optical cable only, the rest part of the SFP active optical cable test board is suspended, the arrangement mode easily enables the joint of the SFP active optical cable to be connected with the SFP active optical cable test board, the SFP active optical cable test board is unstable in connection and even damaged due to gravity, a plurality of support columns are further arranged on the surface of the first platform, the support columns are made of heat insulation materials and used for supporting the suspended SFP active optical cable test board, the joint of the SFP active optical cable is prevented from being damaged at the joint of the SFP active optical cable and the SFP active optical cable test board, the test is stable, and further, the SFP active optical cable test board is connected through the support columns, so that the test fixture can be connected stably when moving and overturning;

7. after the SFP active optical cable test fixture starts to work, a plurality of QSFP active optical cables can be tested, energy loss caused by frequent temperature rise and reduction can be avoided in the test process by keeping the temperature constant, meanwhile, because of the existence of the heat insulation plate, the temperature reduction can be relatively slow, the groove is formed in the first platform, the groove is used for placing the SFP active optical cable to be tested, so that the SFP active optical cable is excessively heated before the test, the SFP active optical cable is prevented from being damaged due to the fact that the SFP active optical cable suddenly and directly contacts with the second platform at a high temperature in a normal temperature state, meanwhile, the SFP active optical cable with excessive temperature can reach the required test temperature faster, the test time can be shortened, and the test efficiency is improved.

Drawings

FIG. 1 is a schematic diagram of a dual-channel SFP test fixture;

FIG. 2 is a schematic diagram of the structure of the SFP test fixture with two test boards respectively located at opposite sides of the second platform;

figure 3 is a schematic diagram of an SFP test fixture according to an embodiment,

the figures indicate: 1-first platform, 2-second platform, 3-first passageway, 4-second passageway, 5-closing cap, 6-support column, 7-elastic layer, 8-recess.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present utility model more clear, the technical solutions of the embodiments of the present utility model will be clearly and completely described below with reference to the accompanying drawings. It will be apparent that the described embodiments are some, but not all, embodiments of the utility model.

Thus, the following detailed description of the embodiments of the utility model is not intended to limit the scope of the utility model, as claimed, but is merely representative of some embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

It should be noted that, under the condition of no conflict, the embodiments of the present utility model and the features and technical solutions in the embodiments may be combined with each other.

It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.

In the description of the present utility model, it should be noted that, the terms "upper", "lower", and the like indicate an azimuth or a positional relationship based on the azimuth or the positional relationship shown in the drawings, or an azimuth or a positional relationship conventionally put in use of the inventive product, or an azimuth or a positional relationship conventionally understood by those skilled in the art, such terms are merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the apparatus or element to be referred must have a specific azimuth, be constructed and operated in a specific azimuth, and thus should not be construed as limiting the present utility model. Furthermore, the terms "first," "second," and the like, are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.

Embodiment one: as shown in figures 1-3 of the drawings,

the SFP active optical cable high-temperature test fixture comprises a first platform 1 and a second platform 2, wherein a heater is arranged in the first platform 1 and used for heating the first platform 1 and keeping the first platform 1 constant, the second platform 2 and the first platform 1 are connected to the upper surface of the first platform 1, the length of the second platform 2 is smaller than or equal to that of the first platform 1, the width of the second platform 2 is smaller than that of the first platform 1, and the temperature of the second platform 2 and the first platform 1 are kept consistent;

the second platform 2 is provided with a first channel 3, and the first channel 3 is used for placing a joint of an SFP active optical cable.

After the heater is heated, the connector of the SFP active optical cable is inserted into the SFP active optical cable test board to perform high-temperature test on the SFP active optical cable, the first platform 1 is arranged below the SFP active optical cable test board, a gap is formed between the SFP active optical cable test board and the first platform 1, the SFP active optical cable test board is not in direct contact with the first platform 1, the temperature of the first platform 1 is greatly lost due to air, the SFP active optical cable test board is far lower than that of the direct contact through the air heat conduction effect, therefore, the temperature of the SFP active optical cable test board is lower than that of the first platform 1, the second platform 2 is connected with the first platform 1, and the second platform 2 is smaller than the first platform 1, the second platform 2 and the first platform 1 form a ladder shape, the temperature of the second platform 2 and the temperature of the first platform 1 are kept consistent, the joint of the SFP active optical cable is arranged on the first channel 3 on the second platform 2, so the second platform 2 can directly transfer the temperature of the second platform to the SFP active optical cable, in some prior art, the joint of the SFP active optical cable is arranged on a jig, only one surface is contacted between the joint of the SFP active optical cable and the jig, and the joint of the first channel 3 and the SFP active optical cable is at least three-surface contact, thereby the temperature transferring effect is good.

Referring to fig. 1, further, the second platform 2 is further provided with a second channel 4, where the second channel 4 is used for placing a connector at the other end of the SFP active optical cable, the second channel 4 and the first channel 3 are located at the same horizontal plane, the connectors of the SFP active optical cables of the first channel 3 and the second channel 4 are respectively inserted into respective SFP active optical cable test boards, and a gap is formed between the SFP active optical cable test boards and the first platform 1 below the SFP active optical cable test boards.

The SFP active optical cable has two ends of head and tail, and to the test of SFP active optical cable needs two ends of head and tail all to insert SFP active optical cable test board, carries out the test simultaneously just can test out one SFP active optical cable's error rate, therefore in the disclosed technical scheme of this application be provided with on the second platform 2 first passageway 3 with second passageway 4, SFP active optical cable two ends accomplish the test on a test fixture, for two ends test on two test fixtures, reduced the power consumption of a test fixture, and the test position occupies less.

Referring to fig. 2, further, the distance between the first channel 3 and the second channel 4 may be such that two SFP active optical cable test boards are located on the same side of the second platform 2. Further, the first channel 3 and the second channel 4 are in contact with each other, and two SFP active optical cable test boards are located at opposite sides of the second platform 2.

The first channel 3 and the second channel 4 have multiple setting modes, one preferable setting mode is that when the distance between the first channel 3 and the second channel 4 is right, two SFP active optical cable test boards are arranged side by side and are positioned on the same side of the second platform 2, so that the SFP active optical cable test boards and the SFP active optical cables are convenient to take, the occupied space of the jig is smaller, the other preferable setting mode is that the first channel 3 and the second channel 4 are in contact with each other, the two SFP active optical cable test boards are positioned on the opposite sides of the second platform 2, and the positions of heating areas of the setting modes are close, so that the heating areas of the second platform 2 and the first platform 1 can be smaller, required power is reduced, and the purpose of reducing power consumption is achieved.

As shown in fig. 3, further, the first channel 3 and/or the second channel 4 is/are provided with a cover 5, and the cover 5 is used for opening or closing the first channel 3 and/or the second channel 4. Further, the contact surfaces of the first channel 3 and the second channel 4 and the joint of the SFP active optical cable are further provided with an elastic layer 7, the elastic layer 7 has elasticity, and the elastic layer 7 is used for filling gaps between the first channel 3 and the joint of the second channel 4 and the joint of the SFP active optical cable.

The first channel 3 and the second channel 4 are further provided with a sealing cover 5, three surfaces of the joints of the first channel 3 and the second channel 4 and the SFP active optical cable are contacted with each other to four sides, the effect of further improving the transmission temperature is achieved, further, the effect of seamless direct contact transmission temperature between objects is best, air exists between the objects, the temperature is transmitted to the air, most of the temperature in the air is lost outwards, the other part of the temperature is transmitted to another object through the air, the temperature loss is large, therefore, the elastic layer 7 is further arranged on the contact surface of the first channel 3 and the second channel 4 and the SFP active optical cable, the elastic layer 7 has elasticity, deformation is produced after the SFP active optical cable is contacted with the first channel 3 and the second channel 4, the air gap between the contact surfaces is filled by the elastic layer 7, and the effect of transmitting the temperature is good.

Further, the outer surface of the SFP active optical cable testing jig is provided with a heat insulation layer except the first channel 3 and the second channel 4, and the heat insulation layer is used for reducing heat dissipation to air.

The outer surface of the SFP active optical cable test jig is provided with a heat insulation layer except the first channel 3 and the second channel 4, so that the temperature is reduced to be lost in the air, the temperature is more transferred to the first channel 3 and the second channel 4, meanwhile, the temperature born by the SFP active optical cable test board can be further reduced due to the arrangement of the heat insulation layer, and the temperature of the SFP active optical cable test board is further lower than that of the first platform 1 and the second platform 2, which is beneficial to long-time test of the SFP active optical cable test board.

Further, a plurality of support columns 6 are further arranged on the surface of the first platform 1, and the support columns 6 are used for supporting the SFP active optical cable testing board. Further, the SFP active optical cable test board is provided with a fixing hole, the fixing hole is used for being connected with the support column 6, and the support column 6 is detachably connected with the SFP active optical cable test board.

Because the SFP active optical cable test board is not contacted with the first platform 1, the SFP active optical cable test board is connected with the joint of the SFP active optical cable only, the rest part of the SFP active optical cable test board is suspended, the joint of the SFP active optical cable is easy to be connected with the SFP active optical cable test board in a setting mode, the joint of the SFP active optical cable test board is unstable and even damaged due to gravity of the SFP active optical cable test board, a plurality of support columns 6 are further arranged on the surface of the first platform 1, the support columns 6 are made of heat insulation materials and are used for supporting the suspended SFP active optical cable test board, so that the joint of the SFP active optical cable is prevented from being damaged at the joint of the SFP active optical cable test board, the test is stable, and further, the test fixture can be connected stably when moving and overturning through the support columns 6 and the SFP active optical cable test board.

Further, the first platform 1 is further provided with a groove 8, and the groove 8 is used for placing an SFP active optical cable to be tested.

After the SFP active optical cable test fixture starts to work, a plurality of QSFP active optical cables can be tested, the constant temperature is kept in the test process, so that energy loss caused by frequent temperature rise and reduction can be avoided, meanwhile, because of the existence of a heat insulation plate, the temperature reduction can be relatively slow, the groove 8 is formed in the first platform 1, the groove 8 is used for placing the SFP active optical cable to be tested, so that the SFP active optical cable is excessively heated before the test, the SFP active optical cable is prevented from being damaged due to the fact that the SFP active optical cable suddenly and directly contacts with the second platform 2 at a high temperature in a normal temperature state, meanwhile, the SFP active optical cable which is excessively heated can reach the required test temperature faster, the test time can be shortened, and the test efficiency is improved.

The above embodiments are only for illustrating the present utility model and not for limiting the technical solutions described in the present utility model, and although the present utility model has been described in detail in the present specification with reference to the above embodiments, the present utility model is not limited to the above specific embodiments, and thus any modifications or equivalent substitutions are made to the present utility model; all technical solutions and modifications thereof that do not depart from the spirit and scope of the utility model are intended to be included in the scope of the appended claims.

Claims (10)

1. The utility model provides an active optical cable high temperature test tool of SFP which characterized in that: the device comprises a first platform (1) and a second platform (2), wherein a heater is arranged in the first platform (1) and is used for heating the first platform (1) and keeping the first platform (1) at a constant temperature, the second platform (2) and the first platform (1) are connected to the upper surface of the first platform (1), the length of the second platform (2) is smaller than or equal to that of the first platform (1), the width of the second platform (2) is smaller than that of the first platform (1), and the temperature of the second platform (2) is kept consistent with that of the first platform (1); the second platform (2) is provided with a first channel (3), and the first channel (3) is used for placing a joint of an SFP active optical cable.

2. The SFP active optical cable high-temperature test fixture of claim 1, wherein: the utility model discloses a SFP active optical cable testing device, including first platform (1), second platform (2), second passageway (4) are last still to be provided with second passageway (4), second passageway (4) are used for placing the joint of SFP active optical cable other end, second passageway (4) with first passageway (3) are located same horizontal plane, first passageway (3) with the joint of SFP active optical cable of second passageway (4) inserts respectively the active optical cable test board of respective SFP, the below of the active optical cable test board of SFP is first platform (1), the active optical cable test board of SFP with have the space between the first platform (1).

3. The SFP active optical cable high-temperature test fixture of claim 2, wherein: the distance between the first channel (3) and the second channel (4) may be such that two of the SFP active optical cable test boards are located on the same side of the second platform (2).

4. The SFP active optical cable high-temperature test fixture of claim 2, wherein: the first channel (3) and the second channel (4) are in contact with each other, and the two SFP active optical cable test boards are located on opposite sides of the second platform (2).

5. The SFP active optical cable high temperature test fixture as recited in any of claims 2-4, wherein: the first channel (3) and/or the second channel (4) are further provided with a cover (5), the cover (5) being used for opening or closing the first channel (3) and/or the second channel (4).

6. The SFP active optical cable high-temperature test fixture of claim 5, wherein: the contact surfaces of the first channel (3) and the second channel (4) and the joint of the SFP active optical cable are further provided with an elastic layer (7), the elastic layer (7) has elasticity, and the elastic layer (7) is used for filling gaps between the first channel (3) and the joint of the second channel (4) and the SFP active optical cable.

7. The SFP active optical cable high temperature test fixture as recited in any of claims 2-4, wherein: the outer surface of the SFP active optical cable testing jig is provided with a heat insulation layer except the first channel (3) and the second channel (4), and the heat insulation layer is used for reducing heat dissipation to air.

8. The SFP active optical cable high-temperature test fixture of claim 7, wherein: the surface of the first platform (1) is also provided with a plurality of support columns (6), and the support columns (6) are used for supporting the SFP active optical cable test board.

9. The SFP active optical cable high-temperature test fixture of claim 8, wherein: the contact surface of the support column (6) and the SFP active optical cable test board is also provided with a connecting piece, and the connecting piece is used for detachable connection between the support column (6) and the SFP active optical cable test board.

10. The SFP active optical cable high temperature test fixture as recited in any of claims 1-4, wherein: the first platform (1) is further provided with a groove (8), and the groove (8) is used for placing an SFP active optical cable to be tested.

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