CN217506053U - Test fixture suitable for BGA encapsulation microwave assembly - Google Patents
Test fixture suitable for BGA encapsulation microwave assembly Download PDFInfo
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- CN217506053U CN217506053U CN202221313908.4U CN202221313908U CN217506053U CN 217506053 U CN217506053 U CN 217506053U CN 202221313908 U CN202221313908 U CN 202221313908U CN 217506053 U CN217506053 U CN 217506053U
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Abstract
The utility model belongs to the technical field of measure the test, a test fixture suitable for BGA encapsulation microwave subassembly is disclosed, including the metal test seat, be equipped with spacing enclosing frame on the metal test seat, wear to be equipped with a plurality of first metal probes and a plurality of second metal probe on the metal test seat, first metal probe and second metal probe upper end parallel and level, the cover is equipped with the insulator on the second metal probe, and second metal probe links to each other with the connector. The utility model provides a test fixture suitable for BGA encapsulates microwave assembly, microwave assembly bottom tin ball is through first metal probe and the contact of metal test seat for microwave assembly radio frequency ground is good. The input and the output are combined by adopting the insulator and the second metal probe to form impedance matching, so that the problem of testing accuracy of radio frequency indexes at high frequency is effectively solved.
Description
Technical Field
The utility model belongs to the technical field of measure and test, concretely relates to test fixture suitable for BGA encapsulates microwave assembly.
Background
The existing BGA packaging microwave assembly testing tool mostly adopts a mode that a metal spring probe or a metal reed is connected with a tin ball pin at the bottom of the BGA packaging microwave assembly, the two modes are simple to realize and low in cost, but in the working process of signal transmission and microwave assemblies, the radio frequency characteristic of the metal spring probe or the metal reed is poor, good impedance matching cannot be formed between the metal spring probe or the metal reed and the input end and the output end of the BGA packaging microwave assembly, microwave assembly signal distortion can be caused, and the test result is deviated.
SUMMERY OF THE UTILITY MODEL
The utility model discloses aim at solving above-mentioned technical problem to a certain extent at least. Therefore, the utility model aims at providing a test fixture suitable for BGA encapsulation microwave subassembly.
The utility model discloses the technical scheme who adopts does:
the utility model provides a test fixture suitable for BGA encapsulates microwave subassembly, includes the metal test seat, is equipped with spacing enclosing frame on the metal test seat, wears to be equipped with a plurality of first metal probes and a plurality of second metal probe on the metal test seat, first metal probe and second metal probe upper end parallel and level, the cover is equipped with the insulator on the second metal probe, the second metal probe links to each other with the connector.
Preferably, a printed circuit board is arranged in the metal test seat, the printed circuit board is electrically connected with the at least one second metal probe, a glass insulator connector is arranged on the side wall of the metal test seat, and the glass insulator connector is electrically connected with the printed circuit board.
Preferably, coaxial connectors are respectively arranged on two opposite side walls of the metal test seat, and each coaxial connector is electrically connected with one second metal probe.
Preferably, the limit surrounding frame is detachably mounted on the metal test seat through screws.
Preferably, a pressure plate is arranged on the limit surrounding frame.
Preferably, the insulator is made of polytetrafluoroethylene.
The utility model has the advantages that:
the utility model provides a test fixture suitable for BGA encapsulates microwave assembly, microwave assembly bottom tin ball is through first metal probe and the contact of metal test seat for microwave assembly radio frequency ground is good. The input and the output adopt the combination of the insulator and the second metal probe to form impedance matching, the radio frequency signal range can cover DC-10GHz, and the problem of the test accuracy of the radio frequency index under high frequency is effectively solved.
Drawings
Fig. 1 is a front view of the testing tool of the present invention.
Fig. 2 is a top view of the testing tool of the present invention.
Fig. 3 is a cross-sectional view taken along a-a in fig. 2.
Fig. 4 is a bottom view of the testing tool of the present invention.
Fig. 5 is a left side view of the testing tool of the present invention.
In the figure: 1-a metal test socket; 2-limiting surrounding frames; 3-a first metal probe; 4-a second metal probe; 5, an insulator; 6-a printed circuit board; 7-glass insulator connectors; 8-coaxial connector.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be used for explaining the present invention, and should not be construed as limiting the present invention. The components of embodiments of the present invention, as generally described and illustrated in the figures herein, may be arranged and designed in a wide variety of different configurations.
In the description of the embodiments of the present invention, it should be noted that the indication of the position or the positional relationship is based on the position or the positional relationship shown in the drawings, or the position or the positional relationship which is usually placed when the product of the present invention is used, or the position or the positional relationship which is conventionally understood by those skilled in the art, and is only for the convenience of describing the present invention and simplifying the description, but it is not to indicate or suggest that the indicated device or element must have a specific position, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used merely to distinguish one description from another, and are not to be construed as indicating or implying relative importance.
In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements.
The invention will be further described with reference to the accompanying drawings and specific embodiments.
As shown in fig. 1 to 5, a testing tool suitable for a BGA package microwave assembly of the present embodiment includes a metal testing base 1 having a substantially rectangular shape, a limiting enclosure frame 2 for fixing the microwave assembly is disposed on the metal testing base 1, and an inner frame of the limiting enclosure frame 2 is matched with a tested microwave assembly; the metal test seat 1 is provided with a plurality of first metal probes 3 and a plurality of second metal probes 4 in a penetrating mode, the upper ends of the first metal probes 3 and the upper ends of the second metal probes 4 are parallel and level, the first metal probes are arranged in rows and columns and used for communicating tin ball pins at the bottom of the microwave assembly with the metal test seat 1, and therefore the microwave assembly is well grounded.
The second metal probe 4 is provided with three positions, an insulator 5 is sleeved on the second metal probe at each position, and the insulator 5 is made of polytetrafluoroethylene. The polytetrafluoroethylene insulator and the metal probe are combined to form impedance matching, the radio frequency signal range can cover DC-10GHz, and the problem of testing accuracy of radio frequency indexes at high frequency is effectively solved.
The metal test seat 1 is internally provided with a printed circuit board 6, the printed circuit board 6 is electrically connected with a second metal probe, the second metal probe is totally provided with three second metal probes, the side wall of the metal test seat 1 is provided with a glass insulator connector 7, the glass insulator connector 7 is electrically connected with the printed circuit board 6, and the glass insulator connector is used as a power supply and a radio frequency signal connector.
The left side wall and the right side wall of the metal test seat 1 are respectively provided with a coaxial connector 8, the metal test seat 1 is also provided with two second metal probes distributed left and right, the second metal probes at the two positions only comprise one second metal probe, and each coaxial connector is electrically connected with one second metal probe.
The limiting enclosure frame 2 is detachably mounted on the metal test seat 1 through screws, and a pressing plate (not shown in the figure) made of metal is arranged on the limiting enclosure frame 2.
The working principle and the process of the test tool are as follows: when the microwave assembly is tested, the tested microwave assembly is placed in the limiting enclosing frame of the testing tool, the metal pressing plate at the top is pressed downwards, the tested microwave assembly is fixed in the limiting enclosing frame, and then the external power supply and the radio frequency signal required by the test of the microwave assembly are communicated through the coaxial connector and the glass insulator connector, so that the microwave assembly can normally work. The solder ball pin at the bottom of the microwave component to be tested is in complete contact with the first metal probe of the test tool, so that the radio frequency grounding of the microwave component is good. The input and output adopt an insulator and a second metal probe to form 50 ohm impedance, so that the microwave component and the load can be well matched and can normally work.
The present invention is not limited to the above-mentioned optional embodiments, and any other products in various forms can be obtained by anyone under the teaching of the present invention, and any changes in the shape or structure thereof, all the technical solutions falling within the scope of the present invention, are within the protection scope of the present invention.
Claims (6)
1. The utility model provides a test fixture suitable for BGA encapsulates microwave subassembly which characterized in that: including metal test seat (1), be equipped with spacing frame (2) of enclosing on metal test seat (1), wear to be equipped with a plurality of first metal probe (3) and a plurality of second metal probe (4) on metal test seat (1), first metal probe (3) and second metal probe (4) upper end parallel and level, the cover is equipped with insulator (5) on second metal probe (4), second metal probe (4) link to each other with the connector.
2. The test tool of claim 1, wherein: the metal testing seat is characterized in that a printed circuit board (6) is arranged in the metal testing seat (1), the printed circuit board (6) is electrically connected with at least one second metal probe (4), a glass insulator connector (7) is arranged on the side wall of the metal testing seat (1), and the glass insulator connector (7) is electrically connected with the printed circuit board (6).
3. The test tool of claim 1, wherein: the two opposite side walls of the metal test seat (1) are respectively provided with a coaxial connector (8), and each coaxial connector (8) is electrically connected with one second metal probe (4).
4. The test tool of claim 1, wherein: the limiting enclosure frame (2) is detachably mounted on the metal test seat (1) through screws.
5. The test tool of claim 1, wherein: and a pressing plate is arranged on the limiting surrounding frame (2).
6. The test tool of claim 1, wherein: the insulator (5) is made of polytetrafluoroethylene.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221313908.4U CN217506053U (en) | 2022-05-27 | 2022-05-27 | Test fixture suitable for BGA encapsulation microwave assembly |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202221313908.4U CN217506053U (en) | 2022-05-27 | 2022-05-27 | Test fixture suitable for BGA encapsulation microwave assembly |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217506053U true CN217506053U (en) | 2022-09-27 |
Family
ID=83357468
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202221313908.4U Active CN217506053U (en) | 2022-05-27 | 2022-05-27 | Test fixture suitable for BGA encapsulation microwave assembly |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217506053U (en) |
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2022
- 2022-05-27 CN CN202221313908.4U patent/CN217506053U/en active Active
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