CN212410651U

CN212410651U - Test fixture and test device

Info

Publication number: CN212410651U
Application number: CN202021894021.XU
Authority: CN
Inventors: 张贻杰; 王汉青; 张毛屯
Original assignee: Shanghai Kelai Luojin Electrical And Mechanical Automation Engineering Co ltd; Shanghai Kelai Shengluo Automation Equipment Co ltd; SHANGHAI KELAI ELECTROMECHANICAL AUTOMATION ENGINEERING CO LTD
Current assignee: Shanghai aokewei Intelligent Equipment Co.,Ltd.; SHANGHAI KELAI ELECTROMECHANICAL AUTOMATION ENGINEERING Co.,Ltd.; SHANGHAI KELAI SHENGLUO AUTOMATION EQUIPMENT Co.,Ltd.
Priority date: 2020-09-02
Filing date: 2020-09-02
Publication date: 2021-01-26
Anticipated expiration: 2030-09-02

Abstract

The utility model relates to an electronic product detects technical field, discloses a test fixture and testing arrangement. The test fixture comprises a base plate, a limiting plate assembly, a first chuck, a second chuck and a driving assembly, wherein the base plate is used for fixing the test probe group; the limiting plate assembly is movably connected with the base plate and is used for supporting and limiting the position of a workpiece; the first chuck is movably connected with the substrate and can slide on the limiting plate assembly along a first horizontal direction so as to press the first connector on the limiting plate assembly; the second chuck is movably connected with the substrate and can slide on the limiting plate assembly along a second horizontal direction so as to press the second connector on the limiting plate assembly; the driving assembly can drive the limiting plate assembly to move in the vertical direction, and meanwhile the first chuck and the second chuck respectively compress the two connectors. The clamping and fixing beat of the test fixture to the workpiece is fast, and the test fixture is simple in structure and low in cost. The testing device can improve the testing efficiency by arranging the testing clamp, and has simple structure and low cost.

Description

Test fixture and test device

Technical Field

The utility model relates to an electronic product detects technical field, especially relates to a test fixture and testing arrangement.

Background

Electronic products usually include one or more connectors, and the connectors include multiple testing Pin pins therein for connecting an integrated circuit board inside the electronic product with an external testing socket. Before the electronic product leaves a factory, the connector needs to be tested so as to evaluate the performance and quality of the electronic product.

In the prior art, a testing apparatus generally includes a testing fixture for supporting and positioning a product to be tested, and a testing probe for electrically connecting with a Pin of a connector for testing. During the test, when the probe contacts with the Pin of the connector, a certain pressing force is applied to the Pin, so that the connector needs to be clamped and fixed in order to ensure the contact reliability of the probe and the Pin, and therefore, the test fixture comprises a positioning structure and a clamping structure. The test process of the connector in the prior art is as follows: firstly, placing a connector on a positioning structure; secondly, the clamping structure clamps and fixes the connector; and driving the test probe to contact and press the Pin needle of the connector, thereby realizing the matching connection with the connector and carrying out the subsequent electrical property test. According to the testing device, on one hand, the connector positioning, the clamping action and the Pin needle contact action are sequentially performed in the testing process, the beat is slow in the whole testing process, and the testing efficiency is low; on the other hand, if a product includes two connectors, in order to ensure the accuracy of the test, the two connectors need to be clamped respectively, and then, the test fixture needs to be provided with two driving sources for clamping and a driving source for probe movement respectively, which results in a complex structure and high cost of the whole test fixture.

Therefore, it is desirable to provide a test fixture and a test apparatus to solve the above problems.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a test fixture, it is fast to the fixed beat of centre gripping of work piece, and simple structure, with low costs.

Another object of the utility model is to provide a testing arrangement, it can improve efficiency of software testing through setting up foretell test fixture, and simple structure is with low costs.

To achieve the purpose, the utility model adopts the following technical proposal:

a test fixture for holding a workpiece including two connectors, comprising:

a substrate for fixing the test probe set;

the limiting plate assembly is movably connected with the base plate and is used for supporting and limiting the position of the workpiece in the horizontal plane;

the first chuck is movably connected with the base plate and can slide on the limiting plate assembly along a first horizontal direction so as to press the first connector on the limiting plate assembly;

the second chuck is movably connected with the base plate and can slide on the limiting plate assembly along a second horizontal direction so as to press the second connector on the limiting plate assembly;

and the driving assembly can drive the limiting plate assembly to be close to the test probe group along the vertical direction, and simultaneously the first chuck and the second chuck respectively compress the two connectors on the limiting plate assembly.

Optionally, the test fixture further comprises:

the first guide plate is perpendicular to the second horizontal direction and fixed on the base plate, a first inclined groove is formed in the first guide plate, and one end of the first chuck is movably connected with the first inclined groove, so that the first chuck can move along the first horizontal direction while moving up and down;

and the second guide plate is perpendicular to the first horizontal direction and is fixed on the base plate, a second inclined groove is formed in the second guide plate, and one end of the second chuck is movably connected with the second inclined groove, so that the first chuck can move in the second horizontal direction while moving up and down.

Optionally, the limiting plate assembly comprises:

the supporting plate is connected with the driving assembly, and the driving assembly can drive the supporting plate to move along the vertical direction;

and the positioning assemblies are connected above the supporting plate, and each positioning assembly is used for supporting and limiting one workpiece.

Optionally, the positioning assembly comprises:

the first type groove plate is connected above the supporting plate and provided with a first type groove, and the first connector can be inserted into the first type groove;

the second type groove plate is connected above the supporting plate and provided with a second type groove, and the second connector can be inserted into the second type groove;

and the at least two positioning pins are arranged on the first type groove plate or the second type groove plate and are used for positioning the workpiece.

Optionally, the test fixture further comprises:

the first chuck is arranged below the first type trough plate and can slide along the first guide rail;

and the second guide rail is arranged on the supporting plate in the second horizontal direction, and the second chuck is arranged below the second grooved plate and can slide along the second guide rail.

Optionally, the test fixture further comprises a support assembly for assisting in supporting the support plate, the support assembly comprising:

the support is fixedly connected with the substrate;

the connecting rod is parallel to the supporting plate and is positioned between the support and the supporting plate, and a plurality of pin shafts are arranged on the connecting rod at intervals;

the two ends of each first supporting rod are respectively in rotating fit with the supporting plate and the pin shaft;

and two ends of each second supporting rod are respectively matched with the support and the pin shaft in a rotating manner.

Optionally, be provided with first supporting seat on the base plate, be provided with the slot hole that extends along the horizontal direction on the first supporting seat, drive assembly includes the rocking arm, the axis of rotation of rocking arm roll set up in the slot hole, the backup pad with the axis of rotation eccentric connection of rocking arm.

Optionally, the test fixture further comprises:

the two second supporting seats are arranged on the supporting plate at intervals;

and two ends of the rotating shaft are respectively in running fit with the two second supporting seats, and the rotating shaft is eccentrically connected with the rotating shaft of the rocker arm.

Optionally, the test fixture further comprises an electromagnetic lock assembly, the electromagnetic lock assembly is disposed on the base plate, and the electromagnetic lock assembly can lock the position of the rocker arm, so that the Pin needles in the workpiece on the limiting plate assembly are in reliable contact with the test probe set.

A testing device comprises the testing clamp, and a testing probe group is arranged on a substrate.

The utility model discloses beneficial effect does:

the test fixture of the utility model, the drive component drives the limit board component and the workpiece on the limit board component to move towards the base board along the vertical direction, so that the test probe group on the base board can be electrically connected with the two connectors on the workpiece for testing; in the process that the driving assembly drives the limiting plate assembly to move, the first chuck can be driven to move along a first horizontal direction so as to press the first connector on the limiting plate assembly, and the second chuck is driven to move along a second horizontal direction so as to press the second connector on the limiting plate assembly; on the other hand, the workpiece is driven to be in contact with the test probe group, so that the workpiece is pressed, the test process is fast in beat, and the test efficiency can be improved; in addition, the action that the first chuck and the second chuck compress tightly the connector is to realize the linkage in the process of limiting plate subassembly vertical motion, need not set up extra driving source to make whole test fixture simple structure, with low costs.

The utility model discloses a testing arrangement, it can improve efficiency of software testing through setting up foretell test fixture, and simple structure, with low costs.

Drawings

FIG. 1 is a schematic structural diagram of a test fixture according to an embodiment of the present invention;

FIG. 2 is a schematic view of an exploded structure of a test fixture according to an embodiment of the present invention;

FIG. 3 is an enlarged view taken at A in FIG. 2;

FIG. 4 is a schematic view of a partial structure of a test fixture according to an embodiment of the present invention;

fig. 5 is a schematic structural diagram of a driving assembly of a test fixture according to an embodiment of the present invention;

fig. 6 is a schematic structural diagram of a part of a driving assembly of a test fixture according to an embodiment of the present invention;

FIG. 7 is a schematic structural diagram of another view angle of the test fixture according to an embodiment of the present invention;

fig. 8 is an enlarged view at B in fig. 7.

In the figure:

100-a workpiece; 101-a first connector; 102-a second connector; 103-a first limit projection; 104-a second limit projection; 105-first connector outside step; 106-second connector outside step;

200-a test probe set; 201-a first test probe; 202-a second test probe;

1-a substrate; 11-a second avoidance hole;

2-a limiting plate component; 21-a support plate; 211-a first relief hole; 22-first type channel plate; 23-a second type channel plate; 24-a locating pin; 25-a first guide rail; 26-a second guide rail; 27-a middle plate;

31-a first collet; 311-a first body; 312-a first snap; 313-a first roller; 32-a second collet; 321-a second body; 322-a second clasp; 323-a second roller;

41-a first guide plate; 411-a first inclined groove; 412-a first vertical slot; 42-a second guide plate; 421-a second inclined groove; 422-a second vertical slot;

5-a support assembly; 51-a support; 52-a connecting rod; 53-a first strut; 54-a second strut; 55-a pin shaft; 56-connecting rod;

61-a first support; 611-a first elongated hole; 62-a second support seat; 63-a rotating shaft; 64-a disc;

7-a rocker arm;

8-an electromagnetic lock assembly;

91-a first guide post; 92-a guide sleeve; 93-a second guide post; 94-linear bearing.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.

In the description of the present invention, unless expressly stated or limited otherwise, the terms "connected," "connected," and "fixed" are to be construed broadly, e.g., as meaning permanently connected, detachably connected, or integral to one another; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

In the present disclosure, unless expressly stated or limited otherwise, the first feature "on" or "under" the second feature may comprise direct contact between the first and second features, or may comprise contact between the first and second features not directly. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.

In the description of the present embodiment, the terms "upper", "lower", "right", etc. are used in an orientation or positional relationship based on that shown in the drawings only for convenience of description and simplicity of operation, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used only for descriptive purposes and are not intended to have a special meaning.

The embodiment provides a test fixture, which can be used in the technical field of electronic product detection, and is particularly suitable for detecting an electronic product comprising two connectors. As shown in fig. 1, the X direction is a first horizontal direction, the Y direction is a second horizontal direction, and the Z direction is a vertical direction, wherein the X direction, the Y direction, and the Z direction are perpendicular to each other, and the X direction, the Y direction, and the Z direction only represent a spatial direction, which has no practical significance.

As shown in fig. 1 and 2, the test fixture includes a substrate 1, a limiting plate assembly 2, a first chuck 31, a second chuck 32 and a driving assembly, wherein, the substrate 1 is used for fixing the test probe group 200, the limiting plate assembly 2 is movably connected with the substrate 1, the limiting plate assembly 2 is used for supporting and limiting the position of the workpiece 100 in the horizontal plane, the first chuck 31 is movably connected with the substrate 1 and can slide on the limiting plate assembly 2 along the first horizontal direction, so as to press the first connector 101 against the position-limiting plate assembly 2, the second chuck 32 is movably connected with the substrate 1 and can slide on the position-limiting plate assembly 2 along the second horizontal direction, to press the second connector 102 against the retainer plate assembly 2, the driving assembly can drive the retainer plate assembly 2 to approach the test probe set 200 in the vertical direction, and simultaneously, the first clamping head 31 and the second clamping head 32 respectively press the two connectors to the limiting plate component 2.

In the test fixture of the embodiment, the driving assembly drives the limiting plate assembly 2 and the workpiece 100 thereon to move towards the substrate 1 along the vertical direction, so that the test probe group 200 on the substrate 1 can be electrically connected with the two connectors on the workpiece 100 for testing; in the process that the driving assembly drives the limiting plate assembly 2 to move, the first chuck 31 can be driven to move along the first horizontal direction so as to press the first connector 101 on the limiting plate assembly 2, and the second chuck 32 can be driven to move along the second horizontal direction so as to press the second connector 102 on the limiting plate assembly 2; on the other hand, the workpiece 100 is pressed in the process of driving the workpiece 100 to contact with the test probe group 200, so that the test process is accelerated in beat, and the test efficiency can be improved; in addition, the action of the first chuck 31 and the second chuck 32 for compressing the connector is linkage realized in the vertical movement process of the limiting plate assembly 2, and an additional driving source is not required, so that the whole test fixture is simple in structure and low in cost.

Specifically, in the present embodiment, the testing probe set 200 includes a first testing probe 201 and a second testing probe 202, wherein the first testing probe 201 is used for contacting with the first connector 101 and testing, and the second testing probe 202 is used for contacting with the second connector 102 and testing. In this embodiment, the first horizontal direction is an X direction, the second horizontal direction is a Y direction, and the X direction is perpendicular to the Y direction. In other embodiments, the first horizontal direction and the second horizontal direction may not be perpendicular to each other.

Preferably, as shown in fig. 2, the limiting plate assembly 2 includes a supporting plate 21 and a plurality of sets of positioning assemblies, the supporting plate 21 is connected to a driving assembly, the driving assembly can drive the supporting plate 21 to move along the vertical direction, the plurality of sets of positioning assemblies are connected above the supporting plate 21, and each set of positioning assembly is used for supporting and limiting one workpiece 100, so that the test fixture can simultaneously perform a clamping test on a plurality of workpieces 100. It is understood that when a plurality of sets of positioning assemblies are disposed on the supporting plate 21, a plurality of sets of test probe sets 200 are correspondingly disposed on the substrate 1, and each set of test probe sets 200 respectively tests one workpiece 100. Specifically, in this embodiment, the test fixture further includes a first guide post 91 and a guide sleeve 92, the first guide post 91 is disposed on the base plate 1 and vertically disposed, the guide sleeve 92 is disposed on the support plate 21, and the first guide post 91 and the guide sleeve 92 are slidably engaged with each other, so as to ensure that the limiting plate assembly 2 can only move in the vertical direction.

Further, as shown in fig. 3 and 4, the positioning assembly includes a first type groove plate 22, a second type groove plate 23, and at least two positioning pins 24, wherein the first type groove plate 22 is connected above the supporting plate 21 and is provided with a first type groove, and the first connector 101 can be inserted into the first type groove; the second type groove plate 23 is connected above the support plate 21 and provided with a second type groove, into which the second connector 102 can be inserted, and at least two positioning pins 24 are provided on the first type groove plate 22 or the second type groove plate 23, the two positioning pins 24 being used for positioning the workpiece 100. Specifically, in the present embodiment, two positioning holes (not shown in the drawings) are disposed on the end surface of the workpiece 100 where the connector is disposed, the positioning assembly includes two positioning pins 24, the two positioning pins 24 are respectively inserted into the two positioning holes of the workpiece 100 to limit the workpiece 100 on the horizontal plane, and the first type groove plate 22 and the second type groove plate 23 cooperate to support the workpiece 100. Alternatively, the second channel plate 23 is fixedly attached to the support plate 21 to move in a vertical direction along with the support plate 21.

Optionally, the test fixture further comprises an intermediate plate 27, the intermediate plate 27 is connected between the first type groove plate 22 and the support plate 21, the intermediate plate 27 and the first type groove plate 22 are arranged at a distance in the vertical direction, and the intermediate plate 27 can be higher than the first type groove plate 22, so that the height relationship between the first type groove plate 22 and the second type groove plate 23 can be matched with the size of the two connectors on the workpiece 100. Further, the test fixture further comprises a second guide post 93 and a linear bearing 94, wherein the second guide post 93 is connected to the base plate 1 and is vertically disposed, the linear bearing 94 is disposed on the middle plate 27, and the linear bearing 94 is slidably engaged with the second guide post 93, so that the first type slot plate 22 can only move in the vertical direction.

In this embodiment, as shown in fig. 2 and 4, a first limiting protrusion 103 is disposed on a sidewall of the first connector 101 of the workpiece 100, a second limiting protrusion 104 is disposed on a sidewall of the second connector 102, and when the first collet 31 moves along the first horizontal direction, the first collet can be clamped on an upper side of the first limiting protrusion 103, so as to compress the first connector 101 on the limiting plate assembly 2, and when the second collet 32 moves along the second horizontal direction, the second collet can be clamped on an upper side of the second limiting protrusion 104, so as to compress the second connector 102 on the limiting plate assembly 2.

In order to realize the linkage of the first chuck 31 and the second chuck 32 in the vertical movement process of the support plate 21, as shown in fig. 2-4, the test fixture further comprises a first guide plate 41 and a second guide plate 42, wherein the first guide plate 41 is perpendicular to the second horizontal direction (i.e. the Y direction) and is fixed on the base plate 1, the first guide plate 41 is provided with a first inclined slot 411, and one end of the first chuck 31 is movably connected with the first inclined slot 411, so that the first chuck 31 can move along the first horizontal direction while moving up and down; the second guide plate 42 is perpendicular to the first horizontal direction and fixed to the substrate 1, the second guide plate 42 is provided with a second inclined groove 421, and one end of the second chuck 32 is movably connected to the second inclined groove 421, so that the first chuck 31 can move along the second horizontal direction while moving up and down.

The principle of linkage of the first chuck 31 and the second chuck 32 is as follows: when the first chuck 31 moves up and down along with the limiting plate assembly 2, one end of the first chuck 31 moves along the inclined direction of the first inclined groove 411 under the limiting action of the first inclined groove 411, so that a movement component along a first horizontal direction is generated, the limiting plate assembly 2 only moves along a vertical direction, and the workpiece 200 only moves along the vertical direction, so that the first chuck 31 moves along the first horizontal direction relative to the limiting plate assembly 2, and can be clamped on the upper side of the first limiting protrusion 103, thereby realizing a pressing action; similarly, when the second chuck 32 moves along the vertical direction along with the limiting plate assembly 2, the end of the second chuck 32 moves along the inclined direction of the second inclined groove 421 under the limiting effect of the second inclined groove 421, so that a movement component along the second horizontal direction is generated, and the limiting plate assembly 2 only moves along the vertical direction, so that the second chuck 32 moves along the second horizontal direction relative to the limiting plate assembly 2, and can be clamped on the upper side of the second limiting protrusion 104 to realize the pressing action. In this embodiment, as shown in fig. 3, the supporting plate 21 is provided with a first avoiding hole 211, and the first guiding plate 41 on the substrate 1 passes through the first avoiding hole 211 and then extends out of the upper side of the supporting plate 21, so that the first chuck 31 is movably connected to the first guiding plate 41.

Preferably, the first guide plate 41 is further provided with a first vertical slot 412, and the first vertical slot 412 is connected to the lower end of the first inclined slot 411; the second guide plate 42 is further provided with a second vertical groove 422, and the second vertical groove 422 is connected to the lower end of the second inclined groove 421. In the process that the limiting plate assembly 2 drives the workpiece 100 to downwardly approach the test probe group 200 on the substrate 1, the first chuck 31 and the second chuck 32 firstly slide along the first inclined groove 411 and the second inclined groove 421 respectively, so as to press the workpiece 100 onto the limiting plate assembly 2, and then the first chuck 31 and the second chuck 32 respectively move along the first vertical groove 412 and the second vertical groove 422, and do not move horizontally relative to the limiting plate assembly 2, so that the workpiece 100 is guaranteed to continue to move downwards in a state of being pressed onto the limiting plate assembly 2 until contacting with the test probe group 200, namely before the connector contacts with the test probe group 200, the clamping action on the connector is completed.

In order to ensure that the first chuck 31 accurately moves along the first horizontal direction and the second chuck 32 accurately moves along the second horizontal direction, as shown in fig. 3, the test fixture further includes a first guide rail 25 and a second guide rail 26, wherein the first guide rail 25 is disposed on the support plate 21 along the first horizontal direction, the first chuck 31 is disposed below the first type groove plate 22 and can slide along the first guide rail 25, the second guide rail 26 is disposed on the support plate 21 along the second horizontal direction, and the second chuck 32 is disposed below the second type groove plate 23 and can slide along the second guide rail 26. Specifically, in the present embodiment, the first guide rail 25 is provided on the intermediate plate 27 in the space between the first-type groove plate 22 and the intermediate plate 27.

Alternatively, as shown in fig. 2 to 4, the first collet 31 includes a first body 311, a first buckle 312, a first roller 313 and a first slider, wherein the first slider is connected below the first body 311 and is in sliding fit with the first guide rail 25, the first buckle 312 is disposed on the upper side of the first body 311 and is spaced apart from the upper surface of the first body 311, and the first roller 313 is connected to one side of the first body 311 and is movably connected to the first inclined groove 411. After the first connector 101 is inserted into the first groove on the first groove plate 22, the step 105 outside the first connector abuts on the upper surface of the first groove plate 22, and the first buckle 312 can abut on the upper side of the first limiting protrusion 103 after moving along the first horizontal direction, so that the first connector 101 is pressed on the limiting plate assembly 2.

Similarly, the second chuck 32 includes a second body 321, a second buckle 322, a second roller 323 and a second slider, wherein the second slider is disposed below the second body 321 and slidably engaged with the second guide rail 26, the second buckle 322 is disposed on the upper side of the second body 321 and spaced from the upper surface of the second body 321, and the second roller 323 is disposed on one side of the second body 321 and movably connected to the second guide plate 42. After the second connector 102 is inserted into the second groove on the second groove plate 23, the step 106 on the outer side of the second connector abuts on the upper surface of the second groove plate 23, and the second buckle 322 moves along the second horizontal direction and can abut on the upper side of the second limiting protrusion 104, so that the second connector 102 is pressed on the limiting plate component 2. In other embodiments, the structures of the first collet 31 and the second collet 32 are not limited thereto, as long as the connector can be pressed against the position-limiting plate assembly 2 when moving in the horizontal direction.

In order to realize the movement of the driving limit plate assembly 2 in the vertical direction, as shown in fig. 5, the base plate 1 is provided with a first supporting seat 61, the first supporting seat 61 is provided with a long hole 611 extending in the horizontal direction, the driving assembly includes a rocker arm 7, the rotating shaft of the rocker arm 7 is arranged in the long hole 611 in a rolling manner, and the supporting plate 21 is eccentrically connected with the rotating shaft of the rocker arm 7. Because the support plate 21 is eccentrically connected with respect to the rotation axis of the swing arm 7, when the swing arm 7 rotates around the rotation axis thereof and the rotation axis is always positioned in the horizontally arranged long hole 611, the support plate 21 can generate a displacement in the vertical direction, and the structure is simple and the operation is convenient. In other embodiments, the driving assembly may also directly drive the support plate 21 to move in the vertical direction by a linear driving source such as an air cylinder.

Preferably, as shown in fig. 5, the test fixture further includes two second supporting seats 62 and a rotating shaft 63, wherein the two second supporting seats 62 are disposed on the supporting plate 21 at intervals, two ends of the rotating shaft 63 are respectively rotatably engaged with the two second supporting seats 62, and the rotating shaft 63 is eccentrically connected with the rotating shaft of the swing arm 7. In the process of rotating the rocker arm 7, the stress of the support plate 21 is more balanced and the motion process is more stable through the transmission of the rotating shaft 63 and the two second support seats 62. Specifically, in this embodiment, the second support seat 62 may be a bearing seat. Further, as shown in fig. 6, the test fixture further includes a disc 64, wherein the rotating shaft of the swing arm 7 is fixedly connected to an eccentric position of the disc 64, and the rotating shaft 63 is fixedly connected to the axial center of the disc 64.

Preferably, the test fixture further comprises an electromagnetic lock assembly 8, wherein the electromagnetic lock assembly 8 is disposed on the base plate 1, and the electromagnetic lock assembly 8 can lock the position of the rocker arm 7, so that the Pin needle of the workpiece 100 on the limiting plate assembly 2 is kept in reliable contact with the test probe set 200. When rotating rocking arm 7, when the connector of the work piece 100 on the limiting plate subassembly 2 and the test probe group 200 contact on the base plate 1 and electricity are connected, rocking arm 7 just right with electromagnetic lock subassembly 8's position this moment, and electromagnetic lock subassembly 8 moves the position that can lock rocking arm 7 this moment to guarantee the test probe group 200 and the stable connection of connector, guarantee the accuracy of test. When the test is finished, the electromagnetic lock assembly 8 releases the rocker arm 7 to enable the test probe set to be separated from the connector. Specifically, in this embodiment, the electromagnetic lock assembly 8 may be an electromagnet, and the rocker arm 7 is provided with a part made of ferromagnetic material, so that the electromagnet can attract the rocker arm 7. In other embodiments, the electromagnetic lock assembly 8 may be augmented with other structures to achieve the position of the locking rocker arm 7.

When a plurality of workpieces 100 are fixed on the stop plate assembly 2, the weight of the whole stop plate assembly 2 may be large, and preferably, as shown in fig. 7 and 8, the test fixture further includes a support assembly 5, and the support assembly 5 is used for assisting in supporting the support plate 21. Specifically, the support assembly 5 comprises a support 51, a connecting rod 52, a plurality of first support rods 53 and a plurality of second support rods 54, wherein the support 51 is fixedly connected with the substrate 1, the connecting rod 52 is parallel to the support plate 21 and is located between the support 51 and the support plate 21, a plurality of pin shafts 55 are arranged on the connecting rod 52 at intervals, a hinged support is arranged on the bottom surface of the support plate 21, two ends of each first support rod 53 are respectively in rotating fit with the hinged support and the pin shaft 55 on the support plate 21, and two ends of each second support rod 54 are respectively in rotating fit with the support 51 and the pin shaft 55. When the support plate 21 is raised, the angle between the first and

second struts

53 and 54 increases, so that the height of the entire support assembly 5 increases; when the support plate 21 descends, the included angle between the first support rod 53 and the second support rod 54 is reduced, so that the height of the whole support assembly 5 is reduced, and the support assembly 5 can support the support plate 21 all the time. It should be noted that the support 51 is fixedly connected to the substrate 1, which only means that the relative position between the support 51 and the substrate 1 is fixed, the support 51 may be directly connected to the substrate 1, or both the support 51 and the substrate 1 may be fixedly connected to the same supporting platform. Specifically, in the present embodiment, the supporting member 5 is disposed below the supporting plate 21, and the substrate 1 is provided with the second avoiding hole 11, and the second avoiding hole 11 is used for exposing the lower surface of the supporting plate 21 to connect with the first supporting rod 53.

Preferably, as shown in fig. 8, the supporting assembly 5 includes two connecting rods 52 arranged in parallel at intervals, a plurality of pins 55 are correspondingly arranged on each connecting rod 52, and the pins 55 corresponding to the positions on the two connecting rods 52 are connected through a connecting rod 56, so as to improve the supporting effect of the supporting assembly 5.

The embodiment further provides a testing device, which includes the testing fixture, and the testing probe set 200 is fixed on the substrate 1. Preferably, a plurality of groups of test probe sets 200 are arranged on the substrate 1, and each group of test probe sets 200 is arranged corresponding to one positioning component on the supporting plate 21, so that the testing device can test a plurality of workpieces 100 at the same time, and the testing efficiency is improved.

The working process of the testing device of the embodiment is as follows:

step 1: rotating the rocker arm 7 to enable the limiting plate component 2 to ascend to the highest point;

step 2: placing the first connector 101 of the workpiece 100 into the first type of groove plate and the second connector 102 into the second type of groove plate;

and step 3: rotating the rocker arm 7 to make the limiting plate assembly 2 and the workpiece 100 thereon descend along the vertical direction, wherein the descending process comprises the following steps:

31: the workpiece 100, the limiting plate assembly 2, the first chuck 31 and the second chuck 32 descend along the vertical direction, meanwhile, the first buckle 312 moves along the X direction to abut against the upper side of the first limiting protrusion 103 to compress the first connector 101, and the second buckle 322 moves along the Y direction to abut against the upper side of the second limiting protrusion 104 to compress the second connector 102;

32: the workpiece 100, the limiting plate assembly 2, the first chuck 31 and the second chuck 32 continue to descend in the vertical direction until the Pin of the first connector 101 abuts against the first test probe 201, and the Pin of the second connector 102 abuts against the second test probe 202;

and 4, step 4: the electromagnetic lock assembly 8 locks the position of the rocker arm 7 at this time to detect.

Obviously, the above embodiments of the present invention are only examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention, and for those skilled in the art, there are variations on the specific embodiments and the application scope according to the idea of the present invention, and the content of the description should not be construed as a limitation to the present invention. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. A test fixture for holding a workpiece (100) containing two connectors, comprising:

a substrate (1) for holding a test probe set (200);

the limiting plate component (2) is movably connected with the base plate (1), and the limiting plate component (2) is used for supporting and limiting the position of the workpiece (100) in a horizontal plane;

the first chuck (31) is movably connected with the base plate (1) and can slide on the limiting plate component (2) along a first horizontal direction so as to press the first connector (101) on the limiting plate component (2);

the second chuck (32) is movably connected with the base plate (1) and can slide on the limiting plate component (2) along a second horizontal direction so as to press the second connector (102) to the limiting plate component (2);

the driving assembly can drive the limiting plate assembly (2) to approach the test probe group (200) along the vertical direction, and meanwhile the first clamping head (31) and the second clamping head (32) respectively press the two connectors to the limiting plate assembly (2).

2. The test fixture of claim 1, further comprising:

the first guide plate (41) is perpendicular to the second horizontal direction and fixed on the base plate (1), a first inclined groove (411) is formed in the first guide plate (41), and one end of the first chuck (31) is movably connected with the first inclined groove (411) so that the first chuck (31) can move in the first horizontal direction while moving up and down;

the second guide plate (42) is perpendicular to the first horizontal direction and fixed on the base plate (1), a second inclined groove (421) is formed in the second guide plate (42), and one end of the second chuck (32) is movably connected with the second inclined groove (421) so that the first chuck (31) can move in the second horizontal direction while moving up and down.

3. Test fixture according to claim 1 or 2, wherein the retaining plate assembly (2) comprises:

the supporting plate (21) is connected with the driving assembly, and the driving assembly can drive the supporting plate (21) to move along the vertical direction;

a plurality of sets of positioning elements connected above the support plate (21), each set of positioning elements being adapted to support and define one of the workpieces (100).

4. The test fixture of claim 3, wherein the positioning assembly comprises:

a first groove plate (22) connected above the support plate (21) and provided with a first groove, into which the first connector (101) can be inserted;

a second profiled groove plate (23) connected above the support plate (21) and provided with a second profiled groove into which the second connector (102) can be inserted;

at least two positioning pins (24) arranged on the first type groove plate (22) or the second type groove plate (23), wherein the at least two positioning pins (24) are used for positioning the workpiece (100).

5. The test fixture of claim 4, further comprising:

a first guide rail (25) disposed on the support plate (21) along the first horizontal direction, the first collet (31) being disposed below the first type groove plate (22) and being slidable along the first guide rail (25);

and the second guide rail (26) is arranged on the support plate (21) along the second horizontal direction, and the second chuck (32) is arranged below the second groove plate (23) and can slide along the second guide rail (26).

6. The test fixture of claim 3, further comprising a support assembly (5) for assisting in supporting the support plate (21), the support assembly (5) comprising:

a support (51) fixedly connected to the base plate (1);

the connecting rod (52) is parallel to the supporting plate (21) and is positioned between the support (51) and the supporting plate (21), and a plurality of pin shafts (55) are arranged on the connecting rod (52) at intervals;

the two ends of each first supporting rod (53) are respectively in rotating fit with the supporting plate (21) and the pin shaft (55);

and two ends of each second supporting rod (54) are respectively in running fit with the support (51) and the pin shaft (55).

7. The test fixture according to claim 3, wherein the base plate (1) is provided with a first support seat (61), the first support seat (61) is provided with a long hole (611) extending in a horizontal direction, the driving assembly comprises a rocker arm (7), a rotating shaft of the rocker arm (7) is arranged in the long hole (611) in a rolling manner, and the support plate (21) is eccentrically connected with the rotating shaft of the rocker arm (7).

8. The test fixture of claim 7, further comprising:

two second supporting seats (62) which are arranged on the supporting plate (21) at intervals;

and two ends of the rotating shaft (63) are respectively in running fit with the two second supporting seats (62), and the rotating shaft (63) is eccentrically connected with a rotating shaft of the rocker arm (7).

9. The test fixture of claim 7, further comprising an electromagnetic lock assembly (8), the electromagnetic lock assembly (8) being disposed on the base plate (1), the electromagnetic lock assembly (8) being capable of locking the position of the rocker arm (7) to maintain the Pin pins in the workpiece (100) on the limiting plate assembly (2) in reliable contact with the test probe set (200).

10. A testing device, characterized in that it comprises a test fixture according to any one of claims 1-9, a test probe set (200) being arranged on said substrate (1).