CN210166495U - 受光装置和受光系统 - Google Patents

受光装置和受光系统 Download PDF

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Publication number
CN210166495U
CN210166495U CN201920492618.2U CN201920492618U CN210166495U CN 210166495 U CN210166495 U CN 210166495U CN 201920492618 U CN201920492618 U CN 201920492618U CN 210166495 U CN210166495 U CN 210166495U
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pixel
light receiving
light
receiving device
sensitivity
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Chinese (zh)
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小泽治
上水流隼人
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Sony Semiconductor Solutions Corp
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Sony Semiconductor Solutions Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/10—Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4861—Circuits for detection, sampling, integration or read-out
    • G01S7/4863—Detector arrays, e.g. charge-transfer gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/487—Extracting wanted echo signals, e.g. pulse detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4913—Circuits for detection, sampling, integration or read-out
    • G01S7/4914—Circuits for detection, sampling, integration or read-out of detector arrays, e.g. charge-transfer gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G01S7/4912—Receivers
    • G01S7/4918—Controlling received signal intensity, gain or exposure of sensor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/225—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/802—Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • H10F39/8027—Geometry of the photosensitive area
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/442—Single-photon detection or photon counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/4413—Type
    • G01J2001/4433—Peak sensing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Light Receiving Elements (AREA)
  • Measurement Of Optical Distance (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
CN201920492618.2U 2018-04-20 2019-04-12 受光装置和受光系统 Active CN210166495U (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018081068A JP7246863B2 (ja) 2018-04-20 2018-04-20 受光装置、車両制御システム及び測距装置
JP2018-081068 2018-04-20

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CN201910293488.4A Pending CN110389332A (zh) 2018-04-20 2019-04-12 受光装置和受光系统

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US (2) US11714172B2 (enExample)
EP (1) EP3781967A1 (enExample)
JP (1) JP7246863B2 (enExample)
KR (1) KR102740857B1 (enExample)
CN (2) CN210166495U (enExample)
DE (1) DE112019002068T5 (enExample)
TW (2) TWI815877B (enExample)
WO (1) WO2019203057A1 (enExample)

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WO2022037106A1 (zh) * 2020-08-21 2022-02-24 上海禾赛科技股份有限公司 利用激光雷达探测的方法以及激光雷达
WO2025218469A1 (zh) * 2024-04-15 2025-10-23 深圳引望智能技术有限公司 一种面阵列探测器、探测装置、激光雷达和终端

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JP7246863B2 (ja) 2018-04-20 2023-03-28 ソニーセミコンダクタソリューションズ株式会社 受光装置、車両制御システム及び測距装置
EP3591712A1 (en) * 2018-07-05 2020-01-08 STMicroelectronics (Research & Development) Limited Optical sensor and method of operating an optical sensor
CN110530515A (zh) * 2019-08-23 2019-12-03 上海禾赛光电科技有限公司 光电探测电路、激光雷达和控制方法
WO2021100314A1 (ja) * 2019-11-20 2021-05-27 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置及び測距システム
JP2021089962A (ja) * 2019-12-04 2021-06-10 ソニーセミコンダクタソリューションズ株式会社 受光装置及び受光装置の制御方法、並びに、測距装置
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TWI735191B (zh) * 2020-03-27 2021-08-01 國立陽明交通大學 光達除霧系統與方法
CN111830530B (zh) * 2020-06-04 2023-02-24 深圳奥锐达科技有限公司 一种距离测量方法、系统及计算机可读存储介质
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JP7527853B2 (ja) * 2020-06-11 2024-08-05 キヤノン株式会社 光電変換装置
JP7527871B2 (ja) * 2020-07-10 2024-08-05 キヤノン株式会社 光電変換装置及びその駆動方法
JP2023145810A (ja) * 2020-08-11 2023-10-12 ソニーセミコンダクタソリューションズ株式会社 面発光レーザ装置及び電子機器
JP7476033B2 (ja) * 2020-08-24 2024-04-30 株式会社東芝 受光装置及び電子装置
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JP7766413B2 (ja) * 2021-04-26 2025-11-10 キヤノン株式会社 投光ユニットおよびそれを用いた測距装置
JP7701799B2 (ja) 2021-04-26 2025-07-02 キヤノン株式会社 測距装置および計測ユニット、ならびに測距装置の制御方法
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CN115291663B (zh) * 2022-08-03 2025-04-08 深圳市灵明光子科技有限公司 一种spad控制电路、spad阵列和激光测距装置
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WO2022037106A1 (zh) * 2020-08-21 2022-02-24 上海禾赛科技股份有限公司 利用激光雷达探测的方法以及激光雷达
CN114167431A (zh) * 2020-08-21 2022-03-11 上海禾赛科技有限公司 利用激光雷达探测的方法以及激光雷达
CN114167431B (zh) * 2020-08-21 2025-05-09 上海禾赛科技有限公司 利用激光雷达探测的方法以及激光雷达
WO2025218469A1 (zh) * 2024-04-15 2025-10-23 深圳引望智能技术有限公司 一种面阵列探测器、探测装置、激光雷达和终端

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KR102740857B1 (ko) 2024-12-09
KR20210003711A (ko) 2021-01-12
JP2019190892A (ja) 2019-10-31
US12474451B2 (en) 2025-11-18
WO2019203057A1 (en) 2019-10-24
TWI815877B (zh) 2023-09-21
TW202349027A (zh) 2023-12-16
US20210025990A1 (en) 2021-01-28
DE112019002068T5 (de) 2021-01-28
US20230251357A1 (en) 2023-08-10
US11714172B2 (en) 2023-08-01
TW202001288A (zh) 2020-01-01
EP3781967A1 (en) 2021-02-24
JP7246863B2 (ja) 2023-03-28
TWI885453B (zh) 2025-06-01
CN110389332A (zh) 2019-10-29

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