TWI815877B - 光接收裝置及距離測量裝置 - Google Patents

光接收裝置及距離測量裝置 Download PDF

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Publication number
TWI815877B
TWI815877B TW108112418A TW108112418A TWI815877B TW I815877 B TWI815877 B TW I815877B TW 108112418 A TW108112418 A TW 108112418A TW 108112418 A TW108112418 A TW 108112418A TW I815877 B TWI815877 B TW I815877B
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TW
Taiwan
Prior art keywords
pixel
light receiving
light
photosensitive element
avalanche diode
Prior art date
Application number
TW108112418A
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English (en)
Chinese (zh)
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TW202001288A (zh
Inventor
小澤治
上水流隼人
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日商索尼半導體解決方案公司
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Publication of TW202001288A publication Critical patent/TW202001288A/zh
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491Details of non-pulse systems
    • G01S7/4912Receivers
    • G01S7/4913Circuits for detection, sampling, integration or read-out
    • G01S7/4914Circuits for detection, sampling, integration or read-out of detector arrays, e.g. charge-transfer gates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06Systems determining position data of a target
    • G01S17/08Systems determining position data of a target for measuring distance only
    • G01S17/10Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88Lidar systems specially adapted for specific applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483Details of pulse systems
    • G01S7/486Receivers
    • G01S7/4861Circuits for detection, sampling, integration or read-out
    • G01S7/4863Detector arrays, e.g. charge-transfer gates
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483Details of pulse systems
    • G01S7/486Receivers
    • G01S7/487Extracting wanted echo signals, e.g. pulse detection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01SRADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491Details of non-pulse systems
    • G01S7/4912Receivers
    • G01S7/4918Controlling received signal intensity, gain or exposure of sensor
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/225Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/802Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • H10F39/8027Geometry of the photosensitive area
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/4413Type
    • G01J2001/442Single-photon detection or photon counting
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/4413Type
    • G01J2001/4433Peak sensing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44Electric circuits
    • G01J2001/444Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Electromagnetism (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Light Receiving Elements (AREA)
  • Measurement Of Optical Distance (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
TW108112418A 2018-04-20 2019-04-10 光接收裝置及距離測量裝置 TWI815877B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018081068A JP7246863B2 (ja) 2018-04-20 2018-04-20 受光装置、車両制御システム及び測距装置
JP2018-081068 2018-04-20

Publications (2)

Publication Number Publication Date
TW202001288A TW202001288A (zh) 2020-01-01
TWI815877B true TWI815877B (zh) 2023-09-21

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TW108112418A TWI815877B (zh) 2018-04-20 2019-04-10 光接收裝置及距離測量裝置
TW112131520A TWI885453B (zh) 2018-04-20 2019-04-10 光接收裝置及距離測量裝置

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Country Status (8)

Country Link
US (2) US11714172B2 (enExample)
EP (1) EP3781967A1 (enExample)
JP (1) JP7246863B2 (enExample)
KR (1) KR102740857B1 (enExample)
CN (2) CN210166495U (enExample)
DE (1) DE112019002068T5 (enExample)
TW (2) TWI815877B (enExample)
WO (1) WO2019203057A1 (enExample)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7246863B2 (ja) 2018-04-20 2023-03-28 ソニーセミコンダクタソリューションズ株式会社 受光装置、車両制御システム及び測距装置
EP3591712A1 (en) * 2018-07-05 2020-01-08 STMicroelectronics (Research & Development) Limited Optical sensor and method of operating an optical sensor
CN110530515A (zh) * 2019-08-23 2019-12-03 上海禾赛光电科技有限公司 光电探测电路、激光雷达和控制方法
WO2021100314A1 (ja) * 2019-11-20 2021-05-27 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置及び測距システム
JP2021089962A (ja) * 2019-12-04 2021-06-10 ソニーセミコンダクタソリューションズ株式会社 受光装置及び受光装置の制御方法、並びに、測距装置
US11346924B2 (en) 2019-12-09 2022-05-31 Waymo Llc SiPM with cells of different sizes
JP7383542B2 (ja) * 2020-03-24 2023-11-20 株式会社東芝 光検出器及び距離計測装置
TWI735191B (zh) * 2020-03-27 2021-08-01 國立陽明交通大學 光達除霧系統與方法
CN111830530B (zh) * 2020-06-04 2023-02-24 深圳奥锐达科技有限公司 一种距离测量方法、系统及计算机可读存储介质
EP4163642A4 (en) 2020-06-05 2023-11-15 Sony Group Corporation Solid-state imaging device, method for controlling solid-state imaging device, and movable body
JP7527853B2 (ja) * 2020-06-11 2024-08-05 キヤノン株式会社 光電変換装置
JP7527871B2 (ja) * 2020-07-10 2024-08-05 キヤノン株式会社 光電変換装置及びその駆動方法
JP2023145810A (ja) * 2020-08-11 2023-10-12 ソニーセミコンダクタソリューションズ株式会社 面発光レーザ装置及び電子機器
CN114167431B (zh) * 2020-08-21 2025-05-09 上海禾赛科技有限公司 利用激光雷达探测的方法以及激光雷达
JP7476033B2 (ja) * 2020-08-24 2024-04-30 株式会社東芝 受光装置及び電子装置
CN112816999A (zh) * 2020-08-25 2021-05-18 神盾股份有限公司 光感测阵列与飞行时间测距装置
CN116547821A (zh) * 2020-12-10 2023-08-04 松下知识产权经营株式会社 光电检测器、光电检测器阵列及距离测量系统
US11509848B2 (en) * 2021-01-11 2022-11-22 Microsoft Technology Licensing, Llc Photodiode assembly
JP7730659B2 (ja) * 2021-04-26 2025-08-28 キヤノン株式会社 測距装置および電子機器
JP7766413B2 (ja) * 2021-04-26 2025-11-10 キヤノン株式会社 投光ユニットおよびそれを用いた測距装置
JP7701799B2 (ja) 2021-04-26 2025-07-02 キヤノン株式会社 測距装置および計測ユニット、ならびに測距装置の制御方法
US11784196B2 (en) * 2021-05-04 2023-10-10 Globalfoundries Singapore Pte. Ltd. Trenchless single-photon avalanche diodes
WO2023044176A1 (en) 2021-09-15 2023-03-23 Halliburton Energy Services, Inc. Improved steerability of downhole ranging tools using rotary magnets
PH12022551324A1 (en) * 2021-09-15 2023-11-20 Halliburton Energy Services Inc Improved steerability of downhole ranging tools using rotary magnets
KR102774273B1 (ko) * 2021-12-31 2025-02-27 주식회사 트루픽셀 단일 광자 검출 픽셀 및 이를 포함하는 단일 광자 검출 픽셀 어레이
CN115291663B (zh) * 2022-08-03 2025-04-08 深圳市灵明光子科技有限公司 一种spad控制电路、spad阵列和激光测距装置
CN118566932A (zh) * 2023-02-28 2024-08-30 上海禾赛科技有限公司 集成的光探测和数据处理装置、激光雷达及其探测方法
CN119375897A (zh) * 2023-07-25 2025-01-28 爱思开海力士有限公司 用于感测距离的图像感测装置
CN120871071A (zh) * 2024-04-15 2025-10-31 深圳引望智能技术有限公司 一种面阵列探测器、探测装置、激光雷达和终端

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008084962A (ja) * 2006-09-26 2008-04-10 Toshiba Corp 固体撮像装置及びその製造方法
TW200904165A (en) * 2007-03-21 2009-01-16 Eastman Kodak Co Extended dynamic range using variable sensitivity pixels
US20120249998A1 (en) * 2009-09-11 2012-10-04 Robert Bosch Gmbh Optical Distance Measuring Device
JP2014081254A (ja) * 2012-10-16 2014-05-08 Toyota Central R&D Labs Inc 光学的測距装置
TW201546524A (zh) * 2009-08-21 2015-12-16 半導體能源研究所股份有限公司 光偵測器,液晶顯示裝置,和發光裝置
CN106954008A (zh) * 2015-12-03 2017-07-14 松下知识产权经营株式会社 摄像装置
CN107607960A (zh) * 2017-10-19 2018-01-19 深圳市欢创科技有限公司 一种光学测距的方法及装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006253876A (ja) * 2005-03-09 2006-09-21 Sony Corp 物理量分布検知装置および物理量分布検知装置の駆動方法
JP2007288522A (ja) * 2006-04-17 2007-11-01 Fujifilm Corp 撮像装置及び固体撮像素子駆動方法
JP5681176B2 (ja) 2009-06-22 2015-03-04 トヨタ モーター ヨーロッパ ナームロゼ フェンノートシャップ/ソシエテ アノニム パルス光による光学式距離計
DE102009029364A1 (de) 2009-09-11 2011-03-24 Robert Bosch Gmbh Messvorrichtung zur Messung einer Entfernung zwischen der Messvorrichtung und einem Zielobjekt mit Hilfe optischer Messstrahlung
EP2521926B1 (en) * 2010-01-06 2020-07-29 Heptagon Micro Optics Pte. Ltd. Demodulation sensor with separate pixel and storage arrays
WO2015191594A1 (en) * 2014-06-10 2015-12-17 Hui Tian Layout and operation of pixels for image sensors
JP2016103708A (ja) * 2014-11-27 2016-06-02 株式会社ソシオネクスト 撮像装置および撮像方法
JP6650261B2 (ja) 2015-12-21 2020-02-19 浜松ホトニクス株式会社 光電変換素子
JP7062955B2 (ja) * 2016-02-09 2022-05-09 ソニーグループ株式会社 固体撮像素子およびその製造方法、並びに電子機器
JP6814967B2 (ja) * 2016-06-17 2021-01-20 パナソニックIpマネジメント株式会社 撮像装置
WO2018181978A1 (ja) * 2017-03-31 2018-10-04 株式会社デンソー 光検出器
JP7246863B2 (ja) 2018-04-20 2023-03-28 ソニーセミコンダクタソリューションズ株式会社 受光装置、車両制御システム及び測距装置
CN114942453A (zh) * 2019-03-08 2022-08-26 欧司朗股份有限公司 Lidar传感器系统、用于该系统的光学部件、传感器和方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008084962A (ja) * 2006-09-26 2008-04-10 Toshiba Corp 固体撮像装置及びその製造方法
TW200904165A (en) * 2007-03-21 2009-01-16 Eastman Kodak Co Extended dynamic range using variable sensitivity pixels
TW201546524A (zh) * 2009-08-21 2015-12-16 半導體能源研究所股份有限公司 光偵測器,液晶顯示裝置,和發光裝置
US20120249998A1 (en) * 2009-09-11 2012-10-04 Robert Bosch Gmbh Optical Distance Measuring Device
JP2014081254A (ja) * 2012-10-16 2014-05-08 Toyota Central R&D Labs Inc 光学的測距装置
CN106954008A (zh) * 2015-12-03 2017-07-14 松下知识产权经营株式会社 摄像装置
CN107607960A (zh) * 2017-10-19 2018-01-19 深圳市欢创科技有限公司 一种光学测距的方法及装置

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Publication number Publication date
KR102740857B1 (ko) 2024-12-09
KR20210003711A (ko) 2021-01-12
JP2019190892A (ja) 2019-10-31
US12474451B2 (en) 2025-11-18
CN210166495U (zh) 2020-03-20
WO2019203057A1 (en) 2019-10-24
TW202349027A (zh) 2023-12-16
US20210025990A1 (en) 2021-01-28
DE112019002068T5 (de) 2021-01-28
US20230251357A1 (en) 2023-08-10
US11714172B2 (en) 2023-08-01
TW202001288A (zh) 2020-01-01
EP3781967A1 (en) 2021-02-24
JP7246863B2 (ja) 2023-03-28
TWI885453B (zh) 2025-06-01
CN110389332A (zh) 2019-10-29

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