CN208255338U - A kind of leakage current test macro of chip - Google Patents
A kind of leakage current test macro of chip Download PDFInfo
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- CN208255338U CN208255338U CN201820764742.5U CN201820764742U CN208255338U CN 208255338 U CN208255338 U CN 208255338U CN 201820764742 U CN201820764742 U CN 201820764742U CN 208255338 U CN208255338 U CN 208255338U
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- pedestal
- electric machine
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Abstract
The utility model provides a kind of leakage current test macro of chip, including pedestal, the pedestal is U-shaped structure, the first side plate is connected on one vertical part of the pedestal, the second side plate is connected on another vertical part of the pedestal, first side plate and second side plate are horizontal opposite, the first rotating electric machine and the second rotating electric machine are respectively equipped on the transverse part of the pedestal, the utility model passes through transport mechanism to mechanism for testing self-feeding, mechanism for testing carries out electric leakage current test to chip to be measured, the electric leakage of each pin flows through multi-channel analog selection switch feeding control module and is handled, and determine non-defective unit or waste product, non-defective unit is put into non-defective unit case respectively according to the judgement result of control module or waste product is put into collecting receptacle by mechanism for sorting, automation and intelligence degree are high, greatly reduce labor intensity, improve testing efficiency, It ensure that measuring accuracy, improve production and processing efficiency.
Description
Technical field
The utility model relates to chip detecting equipment technical field, in particular to the leakage current test macro of a kind of chip.
Background technique
It is open circuit under ideal conditions, between the pin and the earth of chip, is high resistant shape between them but under actual conditions
State flows through in addition might have small electric current when voltage, and this electric current is known as leakage current.After chip flow, need to survey
Whether the leakage current for trying chip is up to standard, and the leakage current such as fruit chip is excessive, for example is applied to mobile phone, laptop etc. and needs electricity
On battery-powered electronic equipment, chip can serious influence stand-by time, influence the quality of product, thus leakage current need it is prudent
Consider.
In recent years, with the development of integrated circuit, various chip pins are closer and closer, and pin is more and more, pin spacing
Also smaller and smaller, many difficulties are brought to production, maintenance, Integration Assembly And Checkout.Existing leakage current measurement method is usually people
Work uses test fixture and multimeter, tests the leakage current of chip pin one by one, and this method testing efficiency is very low, test essence
Degree is unable to get guarantee, leverages production and processing efficiency.
Utility model content
(1) the technical issues of solving
To solve the above-mentioned problems, the utility model provides a kind of leakage current test macro of chip, passes through conveyer
Structure carries out electric leakage current test to chip to be measured to mechanism for testing self-feeding, mechanism for testing, and the electric leakage of each pin flows through multichannel mould
Quasi- selection switch is sent into control module and is handled, and determines non-defective unit or waste product, and mechanism for sorting is according to the judgement knot of control module
Non-defective unit is put into non-defective unit case respectively or waste product is put into collecting receptacle by fruit, and automation and intelligence degree are high, greatly reduce artificial
Labor intensity improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency.
(2) technical solution
A kind of leakage current test macro of chip, including pedestal, the pedestal are U-shaped structure, and one of the pedestal is perpendicular
The first side plate is connected in portion, and the second side plate, first side plate and described second side are connected on another vertical part of the pedestal
Plate is that level is opposite, and the first rotating electric machine and the second rotating electric machine, first rotation are respectively equipped on the transverse part of the pedestal
The transverse part both ends positioned at the pedestal of motor and second rotating electric machine opposite to each other, the first rotation of first rotating electric machine
Axis runs through a vertical part of the pedestal and stretches out outside a vertical part of the pedestal, the second rotation of second rotating electric machine
Axis runs through another vertical part of the pedestal and stretches out outside another vertical part of the pedestal, first side plate and described second
Transport mechanism is equipped between side plate, the transport mechanism includes the first driven voller and the second driven voller, first driven voller
One end is run through one end of first side plate and is stretched out outside first side plate, and the other end of first driven voller is through described
One end of second side plate is simultaneously stretched out outside second side plate, and one end of second driven voller is through the another of first side plate
It holds and stretches out outside first side plate, the other end of second driven voller runs through the other end of second side plate and stretches out institute
It states outside the second side plate, stretches out between first rotary shaft and first driven voller outside a vertical part of the pedestal and set
Have the first tightening belt, stretch out in second rotary shaft outside another vertical part of the pedestal and first driven voller it
Between be equipped with the second tightening belt, conveyer belt is equipped between first driven voller and second driven voller, on the conveyer belt
Equipped with a pair of of rib, the opposite two sides positioned at the conveyer belt of a pair of rib, the inside of the rib is equipped with slot, and one
To chip support plate is equipped between the rib, the two sides of the chip support plate are equipped with inserted block, and the inserted block is opposite with the slot
It answers, the chip support plate is connected by the inserted block with the slot with the rib, and the upper surface of the chip support plate is set
There are several placing grooves, the placing groove is located on the central axes of the chip support plate, and the conveyer belt is equipped with mechanism for testing, institute
Stating mechanism for testing includes testing jig, and the testing jig is inverted U-shaped structure, a vertical part of the testing jig and first side plate
It is connected, another vertical part of the testing jig is connected with second side plate, and control is equipped in the transverse part of the testing jig
Module, the transverse part bottom side of the testing jig it is placed in the middle be equipped with first straight line motor, the first telescopic rod of the first straight line motor
End connecting test head, the measuring head includes data reception board, and multi-channel analog selection is equipped in the data reception board and is opened
It closes, the bottom of the data reception board is equipped with the connection base being recessed inwardly, the multi-channel analog selection switch and the connection
Base is electrically connected, and the multi-channel analog selection switch is electrically connected by data line and the control module, the number
Line collecting plate is connected according to the bottom of receiver board, the bottom of the line collecting plate is equipped with several test probes, the position of the test probe
Corresponding with the pin of chip to be measured with quantity, the top of the line collecting plate is equipped with connecting male, the connecting male with it is described
Connection base is corresponding, and the line collecting plate is connected by the connecting male with the connection base with the data reception board
It connects, the test probe and the connecting male are electrically connected, and are additionally provided with mechanism for sorting, the mechanism for sorting on the conveyer belt
Close to second driven voller, the mechanism for sorting includes non-defective unit case and collecting receptacle, the non-defective unit case and first side plate
Outside is connected, and is connected on the outside of the collecting receptacle and second side plate, sets between the non-defective unit case and the collecting receptacle
There is sorting frame, the sorting frame is also inverted U-shaped structure, and a vertical part of the sorting frame is connected with the outside of the non-defective unit case
Connect, be connected on the outside of another vertical part of the sorting frame and the collecting receptacle, the transverse part bottom side of the sorting frame be equipped with to
The guide rail of sunken inside, the guide rail are embedded with electronics sliding block, and in the guide rail slidably, the electronics is sliding for the electronics sliding block
The bottom of block is equipped with second straight line motor, and the end of the second telescopic rod of the second straight line motor connects adsorption head, the suction
Attached head includes absorptive table and vacuum chuck, and the absorptive table is hollow structure, and the absorptive table includes shell, the top of the shell
It is connected on the outside of portion with second telescopic rod, the inside top of the shell is equipped with vacuum pump, the vacuum tube of the vacuum pump
Through the bottom of the shell, the bottom of the shell is connected with the vacuum chuck, and the vacuum tube and the vacuum are inhaled
Disk is connected, and the test probe connects the control module with the data line by multi-channel analog selection switch
Input terminal, the output end of the control module is separately connected first rotating electric machine, second rotating electric machine, described
One linear motor, the second straight line motor, the electronics sliding block and the vacuum pump, external power supply provide work electricity for system
Pressure.
Further, first rotating electric machine and second rotating electric machine select RS-380SH type stepper motor.
Further, the multi-channel analog selection switch selects 16 path analoging switch CD4067.
Further, the connection base and the connecting male are made of carbon fibre material.
Further, the initial position of the electronics sliding block is located at the centre of the guide rail.
Further, the vacuum pump selects minipump.
Further, the vacuum chuck selects soft silica gel material to be made.
Further, the control module selects 16 single-chip microcontroller MC95S12DJ128.
(3) beneficial effect
The utility model provides a kind of leakage current test macro of chip, is put into chip for chip front side to be measured is directed downwardly
In the placing groove of support plate, chip support plate is connected by the inserted block of two sides with the slot of rib, thus it is fixed on a moving belt with
Conveyer belt moves together, and the installation connection type of inserted block and slot is highly convenient for dismounting, time saving and energy saving, meets different model core
The testing requirement of piece, control module control the first rotating electric machine and the second rotating electric machine synchronous working, the first rotating electric machine and the
Two rotating electric machines pass through the first tightening belt and the second tightening belt respectively while driving the rotation of the first driven voller, the first driven voller
The second driven voller is driven to follow rotation by conveyer belt, so that transmit transport mechanism chip to be measured toward mechanism for testing direction,
When chip to be measured enters in mechanism for testing, first straight line motor puts down measuring head, and test probe passes through connecting male and number
It is connected according to the connection base of receiver board, so that test probe be made to be fixedly mounted on data reception board bottom, connecting male and company
The installation connection type for connecing base is also very easy to disassemble, can be used for replacing the test probe of corresponding chip to be measured, meets not
With the testing requirement of model chip, tests probe and be connected with the pin of chip to be measured, measure the electric leakage of the pin of chip to be measured
Flow data, A/ of the leakage data through multi-channel analog selection switch and data line feeding control module in data reception board
D converter is handled, and determines whether the leakage data of pin up to standard, therefore, it is determined that chip to be measured be non-defective unit or waste product, together
When control module will determine accordingly result send electron sliding block, when chip to be measured enters in mechanism for sorting, second straight line
Motor puts down adsorption head, and vacuum pump generates negative pressure of vacuum at vacuum chuck, adsorbs chip to be measured by vacuum chuck, electricity
Sub- sliding block is mobile toward the movement of non-defective unit case direction or past collecting receptacle direction accordingly according to the judgement result of control module, then vacuum
Pump, which is deflated, makes vacuum chuck discharge chip to be measured, so that chip to be measured is put into non-defective unit case or collecting receptacle, automation and intelligence
Degree is high, greatly reduces labor intensity, improves testing efficiency, ensure that measuring accuracy, improves production and processing
Efficiency, simple in sturcture, ingenious in design, detection accuracy is high, fast response time, and stability and good reliability have good reality
With property and scalability, other occasions of chip testing can be widely used in.
Detailed description of the invention
Fig. 1 is a kind of structural schematic diagram of the leakage current test macro of chip involved in the utility model.
Fig. 2 is a kind of connection of the chip support plate and rib of the leakage current test macro of chip involved in the utility model
Schematic diagram.
Fig. 3 shows for a kind of Facad structure of the transport mechanism of the leakage current test macro of chip involved in the utility model
It is intended to.
Fig. 4 shows for a kind of Facad structure of the mechanism for testing of the leakage current test macro of chip involved in the utility model
It is intended to.
Fig. 5 is a kind of structural schematic diagram of the measuring head of the leakage current test macro of chip involved in the utility model.
Fig. 6 shows for a kind of Facad structure of the mechanism for sorting of the leakage current test macro of chip involved in the utility model
It is intended to.
Fig. 7 is a kind of connection of the electronics sliding block and guide rail of the leakage current test macro of chip involved in the utility model
Schematic diagram.
Fig. 8 is a kind of internal structure signal of the adsorption head of the leakage current test macro of chip involved in the utility model
Figure.
Fig. 9 is a kind of working principle diagram of the leakage current test macro of chip involved in the utility model.
Specific embodiment
Embodiment involved in the utility model is described in further details with reference to the accompanying drawing.
In conjunction with FIG. 1 to FIG. 9, a kind of leakage current test macro of chip, including pedestal 1, pedestal 1 are U-shaped structure, pedestal 1
A vertical part on connect the first side plate 2, the second side plate 3, the first side plate 2 and second side are connected on another vertical part of pedestal 1
Plate 3 is that level is opposite, and the first rotating electric machine 12 and the second rotating electric machine 13, the first electric rotating are respectively equipped on the transverse part of pedestal 1
Machine 12 and the opposite transverse part both ends positioned at pedestal 1 of the second rotating electric machine 13, the first rotary shaft 14 of the first rotating electric machine 12 are passed through
It wears a vertical part of pedestal 1 and stretches out outside a vertical part of pedestal 1, the second rotary shaft 16 of the second rotating electric machine 13 runs through pedestal
1 another vertical part is simultaneously stretched out outside another vertical part of pedestal 1, and transport mechanism is equipped between the first side plate 2 and the second side plate 3,
Transport mechanism includes the first driven voller 4 and the second driven voller 5, and one end of the first driven voller 4 is run through one end of the first side plate 2 and stretched
Out outside the first side plate 2, the other end of the first driven voller 4 through the second side plate 3 one end and stretch out outside the second side plate 3, second from
Outside the other end and the first side plate 2 of stretching of the first side plate 2, the other end of the second driven voller 5 runs through second for one end of dynamic roller 5
The other end of side plate 3 simultaneously stretches out outside the second side plate 3, stretch out in the first rotary shaft 14 outside a vertical part of pedestal 1 and first from
It is equipped with the first tightening belt 15 between dynamic roller 4, stretches out in the second rotary shaft 16 outside another vertical part of pedestal 1 and first driven
It is equipped with the second tightening belt 17 between roller 4, conveyer belt 6 is equipped between the first driven voller 4 and the second driven voller 5, is set on conveyer belt 6
Have a pair of of rib 7, the opposite two sides positioned at conveyer belt 6 of a pair of of rib 7, the inside of rib 7 is equipped with slot 8, a pair of of rib 7 it
Between be equipped with chip support plate 9, the two sides of chip support plate 9 are equipped with inserted block 10, and inserted block 10 is corresponding with slot 8, chip support plate 9 and rib
7 are connected by inserted block 10 with slot 8, and the upper surface of chip support plate 9 is equipped with several placing grooves 11, and placing groove 11 is located at chip load
On the central axes of plate 9, conveyer belt 6 is equipped with mechanism for testing, and mechanism for testing includes testing jig 18, and testing jig 18 is inverted U-shaped structure,
One vertical part of testing jig 18 is connected with the first side plate 2, another vertical part of testing jig 18 is connected with the second side plate 3, surveys
Try to be equipped with control module 19 in the transverse part of frame 18, the transverse part bottom side of testing jig 18 it is placed in the middle be equipped with first straight line motor 20, first
The end connecting test head of first telescopic rod 21 of linear motor 20, measuring head include data reception board 22, data reception board 22
The interior multi-channel analog that is equipped with selects switch 23, and the bottom of data reception board 22 is equipped with the connection base 24 being recessed inwardly, multi-channel analog
Selection switch 23 is electrically connected with base 24 is connect, and multi-channel analog selects switch 23 to pass through data line 25 and control module 19
It is electrically connected, the bottom of data reception board 22 connects line collecting plate 26, and the bottom of line collecting plate 26 is equipped with several test probes 27, test
The position of probe 27 and quantity are corresponding with the pin of chip to be measured, and the top of line collecting plate 26 is equipped with connecting male 28, and connection is public
Seat 28 is corresponding with connection base 24, and line collecting plate 26 is connected by connecting male 28 with base 24 is connect with data reception board 22
It connects, test probe 27 and connecting male 28 are electrically connected, and are additionally provided with mechanism for sorting on conveyer belt 6, and mechanism for sorting is close to described the
Two driven vollers 5, mechanism for sorting include non-defective unit case 29 and collecting receptacle 30, and non-defective unit case 29 is connected with the outside of the first side plate 2, waste product
Case 30 is connected with the outside of the second side plate 3, sorting frame 31 is equipped between non-defective unit case 29 and collecting receptacle 30, sorting frame 31 is also for
One vertical part of U-shaped structure, sorting frame 31 is connected with the outside of non-defective unit case 29, another vertical part of sorting frame 31 and collecting receptacle
30 outside is connected, and the transverse part bottom side of sorting frame 31 is equipped with the guide rail 33 being recessed inwardly, and guide rail 33 is embedded with electronics sliding block 32,
In guide rail 33 slidably, the bottom of electronics sliding block 32 is equipped with second straight line motor 34, second straight line motor 34 to electronics sliding block 32
The end of the second telescopic rod 35 connect adsorption head, adsorption head includes absorptive table 36 and vacuum chuck 37, and absorptive table 36 is hollow
Structure, absorptive table 36 include shell, and the top outer of shell is connected with the second telescopic rod 35, and the inside top of shell is equipped with true
Sky pump 38, the vacuum tube 39 of vacuum pump 38 run through the bottom of shell, and the bottom of shell is connected with vacuum chuck 37, vacuum tube 39
It is connected with vacuum chuck 37, test probe 27 selects switch 23 and 25 link control module of data line by multi-channel analog
19 input terminal, the output end of control module 19 are separately connected the first rotating electric machine 12, the second rotating electric machine 13, first straight line electricity
Machine 20, second straight line motor 34, electronics sliding block 32 and vacuum pump 38, external power supply provides operating voltage for system.
The alignment of inserted block 10 of chip support plate 9 is inserted into the slot 8 of rib 7, so that chip support plate 9 is fixed on conveyer belt
The upper surface of 6, make chip support plate 9 that conveyer belt 6 be followed to move together.Inserted block 10 and the installation connection type of slot 8 are highly convenient for tearing open
Dress, it is time saving and energy saving, meet the testing requirement of different model chip.
By in the chip front side to be measured placing groove 11 directed downwardly for being put into chip support plate 9, i.e., so that the pin court of chip to be measured
On.External power supply is connected, system is made to enter working condition.Control module 19 exports two-way synchronous control signal control first respectively
Rotating electric machine 12 and the work of the second rotating electric machine 13, the first rotating electric machine 12 drive the rotation of the first rotary shaft 14, the second electric rotating
Machine 13 drives the rotation of the second rotary shaft 16, and the first rotary shaft 14 and the second rotary shaft 16 pass through the first tightening belt 15 and the respectively
Two tightening belts 17 drive the rotation of the first driven voller 4 simultaneously, the first driven voller 4 further through conveyer belt 6 drive the second driven voller 5 with
With rotation, to make transport mechanism move toward mechanism for testing direction, by the chip support plate 9 on conveyer belt 6 toward mechanism for testing direction
Transmission.First rotating electric machine 12 and the second rotating electric machine 13 select RS-380SH type stepper motor, can very easily set
The step frequency of rotating electric machine, so that the speed of rotation of rotary shaft is adjusted, to adjust the transfer rate of transport mechanism.
When chip to be measured enters in mechanism for testing, control module 19 controls first straight line motor 20 and works, the first telescopic rod
21 put down the measuring head of end.The lead harness of test probe 27 comes together in connecting male 28 by line collecting plate 26, and test is visited
Needle 27 is fixedly linked by connecting male 28 and the connection base 24 of data reception board 22, connecting male 28 with connect base 24
Installation connection type is also very easy to disassemble, can be used for replacing the test probe 27 of different chips to be measured, meets different model
The testing requirement of chip.Connecting male 28 and connection base 24 are made of carbon fibre material, and carbon fiber axle is to intensity and modulus
Height, density is low, higher than performance, no creep, and superhigh temperature resistant under non-oxidizing atmosphere, fatigue performance is good, and thermal expansion coefficient is small and has
There are anisotropy, good corrosion resistance, good conductive and heat-conductive and electromagnetism performance tired out, can repeatedly plug, service life is lasting.
Measuring head is put down by first straight line motor 20, and the test probe 27 of bottom is pressed against above the pin of chip to be measured,
To make pin and the test probe 27 of chip to be measured form test loop, the pin of chip to be measured is measured by test probe 27
Leakage data.The test leakage data gating of multi-channel analog selection 23 pairs of test probes 27 of switch in data reception board 22
It receives, multi-channel analog selects switch 23 to select 16 path analoging switch CD4067, can pass through 16 tunnel leakage datas simultaneously, meets exhausted
The testing requirement of most of chip.Multi-channel analog selection switch 23 is connected by data line 25 with control module 19, is leaked
Current data is admitted to the analog signal input channel of control module 19 through multi-channel analog selection switch 23 and data line 25.
A/D converter built in the analog signal input channel of control module 19 carries out analog-to-digital conversion process to leakage data, and determines
Whether leakage data is up to standard.If the leakage data of one of pin of chip to be measured is not up to standard, control module 19 is sentenced
The fixed chip to be measured is waste product, and otherwise control module 19 determines that the chip to be measured is non-defective unit, and control module 19 will determine that result passes
The electronics sliding block 32 of mechanism for sorting is given to sort out non-defective unit and waste product.
When chip to be measured enters in mechanism for sorting, control module 19 controls second straight line motor 34 and works, the second telescopic rod
35 put down the adsorption head of end.The initial position of setting electronics sliding block 32 is located at the centre of guide rail 33, when adsorption head is put down,
The vacuum chuck 37 of bottom is just pressed against chip top to be measured.Control module 19 controls vacuum pump 38 and works, and can quickly lead to
It crosses vacuum tube 39 and forms negative pressure of vacuum at vacuum chuck 37, so that chip to be measured firmly be adsorbed, then second straight line
The revolution of motor 34 resets the second telescopic rod 35, thus by chip to be measured from adsorbing in placing groove 11.32 basis of electronics sliding block
The judgement result of control module 19 is mobile toward the movement of 29 direction of non-defective unit case or toward 30 direction of collecting receptacle, when electronics sliding block 32 is mobile
Above to non-defective unit case 29 or when 30 top of collecting receptacle, the deflation of vacuum pump 38 makes vacuum chuck 37 discharge chip to be measured, thus will
Chip to be measured is put into non-defective unit case 29 or collecting receptacle 30, realizes the sorting of chip to be measured.Vacuum pump 38 selects minipump,
Have many advantages, such as compact, oil-free environmental protection, low noise, it is non-maintaining, can operate within continuous 24 hours.Vacuum chuck 37 is selected soft
Silica gel material is made, and can tightly fit with chip to be measured, has better adsorption effect, improves adsorption efficiency.It will be electric
The centre of guide rail 33 is arranged in the initial position of sub- sliding block 32, reduces the moving distance of electronics sliding block 32, decreases electronics
The power consumption of sliding block 32, improves sorting efficiency.
The input detection signal of 19 pairs of test probes 27 of control module is handled, respectively output control signal control first
Rotating electric machine 12, the second rotating electric machine 13, first straight line motor 20, second straight line motor 34, electronics sliding block 32 and vacuum pump 38
It works.In order to simplify circuit, cost is reduced, the scalability in system later period is improved, control module 19 selects 16 monolithics
The EEPROM of the RAM and 2KB of machine MC95S12DJ128, Flash, 8KB of built-in 128KB have 5V input and driving capability,
CPU working frequency can reach 50MHz.The independent number I/O interface in 29 tunnels, 20 road bands interrupt and the digital I/O of arousal function connects
Mouthful, 10 A/D converters in 28 channels, input capture/output with 8 channels is compared, and also has 8 programmable PWM logical
Road.With 2 serial asynchronous communication interface SCI, 2 synchronous serial Peripheral Interface SPI, I2C buses and CAN functional module etc.,
Meet design requirement.
The utility model provides a kind of leakage current test macro of chip, is put into chip for chip front side to be measured is directed downwardly
In the placing groove of support plate, chip support plate is connected by the inserted block of two sides with the slot of rib, thus it is fixed on a moving belt with
Conveyer belt moves together, and the installation connection type of inserted block and slot is highly convenient for dismounting, time saving and energy saving, meets different model core
The testing requirement of piece, control module control the first rotating electric machine and the second rotating electric machine synchronous working, the first rotating electric machine and the
Two rotating electric machines pass through the first tightening belt and the second tightening belt respectively while driving the rotation of the first driven voller, the first driven voller
The second driven voller is driven to follow rotation by conveyer belt, so that transmit transport mechanism chip to be measured toward mechanism for testing direction,
When chip to be measured enters in mechanism for testing, first straight line motor puts down measuring head, and test probe passes through connecting male and number
It is connected according to the connection base of receiver board, so that test probe be made to be fixedly mounted on data reception board bottom, connecting male and company
The installation connection type for connecing base is also very easy to disassemble, can be used for replacing the test probe of corresponding chip to be measured, meets not
With the testing requirement of model chip, tests probe and be connected with the pin of chip to be measured, measure the electric leakage of the pin of chip to be measured
Flow data, A/ of the leakage data through multi-channel analog selection switch and data line feeding control module in data reception board
D converter is handled, and determines whether the leakage data of pin up to standard, therefore, it is determined that chip to be measured be non-defective unit or waste product, together
When control module will determine accordingly result send electron sliding block, when chip to be measured enters in mechanism for sorting, second straight line
Motor puts down adsorption head, and vacuum pump generates negative pressure of vacuum at vacuum chuck, adsorbs chip to be measured by vacuum chuck, electricity
Sub- sliding block is mobile toward the movement of non-defective unit case direction or past collecting receptacle direction accordingly according to the judgement result of control module, then vacuum
Pump, which is deflated, makes vacuum chuck discharge chip to be measured, so that chip to be measured is put into non-defective unit case or collecting receptacle, automation and intelligence
Degree is high, greatly reduces labor intensity, improves testing efficiency, ensure that measuring accuracy, improves production and processing
Efficiency, simple in sturcture, ingenious in design, detection accuracy is high, fast response time, and stability and good reliability have good reality
With property and scalability, other occasions of chip testing can be widely used in.
Embodiment described above is only that preferred embodiments of the present invention are described, not practical to this
Novel conception and scope is defined.Without departing from the design concept of the present utility model, ordinary people in the field couple
The all variations and modifications that the technical solution of the utility model is made, should fall within the protection scope of the present utility model, this reality
With novel claimed technology contents, it is all described in the claims.
Claims (8)
1. a kind of leakage current test macro of chip, it is characterised in that: including pedestal, the pedestal is U-shaped structure, the pedestal
A vertical part on connect the first side plate, the second side plate, first side plate and institute are connected on another vertical part of the pedestal
It states the second side plate and is respectively equipped with the first rotating electric machine and the second rotating electric machine on the transverse part of the pedestal relatively to be horizontal, it is described
The transverse part both ends positioned at the pedestal of first rotating electric machine and second rotating electric machine opposite to each other, first rotating electric machine
First rotary shaft runs through a vertical part of the pedestal and stretches out outside a vertical part of the pedestal, second rotating electric machine
Second rotary shaft through the pedestal another vertical part and stretch out outside another vertical part of the pedestal, first side plate and
Between second side plate be equipped with transport mechanism, the transport mechanism include the first driven voller and the second driven voller, described first
One end of driven voller is run through one end of first side plate and is stretched out outside first side plate, the other end of first driven voller
Through second side plate one end and stretch out outside second side plate, first side is run through in one end of second driven voller
The other end of plate simultaneously stretches out outside first side plate, and the other end of second driven voller runs through the other end of second side plate
And stretch out outside second side plate, stretch out in first rotary shaft outside a vertical part of the pedestal and described first driven
It is equipped with the first tightening belt between roller, stretches out in second rotary shaft and described first outside another vertical part of the pedestal
It is equipped with the second tightening belt between driven voller, conveyer belt is equipped between first driven voller and second driven voller, it is described
Conveyer belt is equipped with a pair of of rib, the opposite two sides positioned at the conveyer belt of a pair of rib, sets on the inside of the rib
Have a slot, be equipped with chip support plate between a pair of rib, the two sides of the chip support plate are equipped with inserted block, the inserted block with it is described
Slot is corresponding, and the chip support plate is connected by the inserted block with the slot with the rib, the chip support plate
Upper surface is equipped with several placing grooves, and the placing groove is located on the central axes of the chip support plate, and the conveyer belt, which is equipped with, to be surveyed
Test-run a machine structure, the mechanism for testing include testing jig, and the testing jig is inverted U-shaped structure, a vertical part of the testing jig and institute
It states the first side plate to be connected, another vertical part of the testing jig is connected with second side plate, the transverse part of the testing jig
It is interior to be equipped with control module, the transverse part bottom side of the testing jig it is placed in the middle be equipped with first straight line motor, the first straight line motor
The end connecting test head of first telescopic rod, the measuring head includes data reception board, and multichannel is equipped in the data reception board
Analog selection switch, the bottom of the data reception board are equipped with the connection base being recessed inwardly, the multi-channel analog selection switch
It is electrically connected with the connection base, the multi-channel analog selection switch is electrically connected by data line with the control module
It connects, the bottom of the data reception board connects line collecting plate, and the bottom of the line collecting plate is equipped with several test probes, and the test is visited
The position of needle and quantity are corresponding with the pin of chip to be measured, and the top of the line collecting plate is equipped with connecting male, and the connection is public
Seat is corresponding with the connection base, and the line collecting plate and the data reception board are female by the connecting male and the connection
Seat is connected, the test probe and connecting male electric connection, is additionally provided with mechanism for sorting on the conveyer belt, and described point
Mechanism is picked close to second driven voller, the mechanism for sorting includes non-defective unit case and collecting receptacle, the non-defective unit case and described first
It is connected on the outside of side plate, is connected on the outside of the collecting receptacle and second side plate, the non-defective unit case and the collecting receptacle
Between be equipped with sorting frame, the sorting frame is also inverted U-shaped structure, the outside of a vertical part of the sorting frame and the non-defective unit case
It is connected, is connected on the outside of another vertical part of the sorting frame and the collecting receptacle, the transverse part bottom side of the sorting frame is set
Have a guide rail being recessed inwardly, the guide rail is embedded with electronics sliding block, the electronics sliding block in the guide rail slidably, the electricity
The bottom of sub- sliding block is equipped with second straight line motor, and the end of the second telescopic rod of the second straight line motor connects adsorption head, institute
Stating adsorption head includes absorptive table and vacuum chuck, and the absorptive table is hollow structure, and the absorptive table includes shell, the shell
Top outer be connected with second telescopic rod, the inside top of the shell is equipped with vacuum pump, the vacuum pump it is true
Blank pipe runs through the bottom of the shell, and the bottom of the shell is connected with the vacuum chuck, the vacuum tube and it is described very
Suction disk is connected, and the test probe connects the control with the data line by multi-channel analog selection switch
The input terminal of module, the output end of the control module are separately connected first rotating electric machine, second rotating electric machine, institute
It states first straight line motor, the second straight line motor, the electronics sliding block and the vacuum pump, external power supply and provides work for system
Make voltage.
2. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: first rotating electric machine
RS-380SH type stepper motor is selected with second rotating electric machine.
3. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: the multi-channel analog selection
Switch selects 16 path analoging switch CD4067.
4. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: the connection base and institute
Connecting male is stated to be made of carbon fibre material.
5. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: at the beginning of the electronics sliding block
Beginning position is located at the centre of the guide rail.
6. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: the vacuum pump is selected micro-
Type vacuum pump.
7. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: the vacuum chuck is selected
Soft silica gel material is made.
8. a kind of leakage current test macro of chip according to claim 1, it is characterised in that: the control module is selected
16 single-chip microcontroller MC95S12DJ128.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201820764742.5U CN208255338U (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test macro of chip |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820764742.5U CN208255338U (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test macro of chip |
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| CN208255338U true CN208255338U (en) | 2018-12-18 |
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ID=66481381
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112147501A (en) * | 2020-09-29 | 2020-12-29 | 潘龙 | Attraction type electronic component self-checking device |
| CN113671345A (en) * | 2021-08-18 | 2021-11-19 | 贺莉军 | Factory detection device based on nfc chip and detection method thereof |
| CN113701909A (en) * | 2021-08-24 | 2021-11-26 | 深圳市智佳能自动化有限公司 | Thermocouple temperature measurement system for semiconductor seal measurement equipment |
-
2018
- 2018-05-22 CN CN201820764742.5U patent/CN208255338U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112147501A (en) * | 2020-09-29 | 2020-12-29 | 潘龙 | Attraction type electronic component self-checking device |
| CN113671345A (en) * | 2021-08-18 | 2021-11-19 | 贺莉军 | Factory detection device based on nfc chip and detection method thereof |
| CN113701909A (en) * | 2021-08-24 | 2021-11-26 | 深圳市智佳能自动化有限公司 | Thermocouple temperature measurement system for semiconductor seal measurement equipment |
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Effective date of registration: 20190910 Address after: 518000 Chegongmiao Industrial Zone, Shatou Street, Futian District, Shenzhen City, Guangdong Province Patentee after: Shenzhen MOZAT Electric Co. Ltd. Address before: 313000 920 rooms, SEG Digital City, Huzhou economic and Technological Development Zone, Huzhou, Zhejiang, 2 Patentee before: Huzhou Jingyuan Information Technology Co., Ltd. |