CN108787500A - A kind of leakage current test device of chip - Google Patents
A kind of leakage current test device of chip Download PDFInfo
- Publication number
- CN108787500A CN108787500A CN201810496800.5A CN201810496800A CN108787500A CN 108787500 A CN108787500 A CN 108787500A CN 201810496800 A CN201810496800 A CN 201810496800A CN 108787500 A CN108787500 A CN 108787500A
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- China
- Prior art keywords
- side plate
- pedestal
- vertical part
- chip
- driven voller
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The present invention provides a kind of leakage current test devices of chip,Including device body,Described device ontology includes pedestal,The pedestal is U-shaped structure,The first side plate is connected on one vertical part of the pedestal,The second side plate is connected on another vertical part of the pedestal,First side plate and second side plate are horizontal opposite,Transport mechanism is equipped between first side plate and second side plate,The present invention is by transport mechanism to mechanism for testing self-feeding,Mechanism for testing carries out electric leakage current test to chip to be measured,The electric leakage of each pin flows through multi-channel analog selecting switch feeding control module and is handled,And judge non-defective unit or waste product,Non-defective unit is put into non-defective unit case respectively according to the judgement result of control module or waste product is put into collecting receptacle by mechanism for sorting,Automation and intelligence degree are high,Greatly reduce hand labor intensity,Improve testing efficiency,It ensure that measuring accuracy,Improve production and processing efficiency.
Description
Technical field
The present invention relates to chip testing devices technical field, more particularly to a kind of leakage current test device of chip.
Background technology
It is open circuit under ideal conditions, between the pin and the earth of chip, is high resistant shape between them but under actual conditions
State flows through in addition might have small electric current when voltage, and this electric current is known as leakage current.After chip flow, need to survey
Whether the leakage current for trying chip is up to standard, and the leakage current such as fruit chip is excessive, for example is applied to mobile phone, laptop etc. and needs electricity
On battery-powered electronic equipment, chip can serious influence stand-by time, influence the quality of product, thus leakage current need it is prudent
Consider.
In recent years, with the development of integrated circuit, various chip pins are closer and closer, and pin is more and more, pin spacing
Also smaller and smaller, many difficulties are brought to production, repair, Integration Assembly And Checkout.Existing leakage current measurement method is usually people
Work uses measurement jig and multimeter, one by one the leakage current of test chip pin, and this method testing efficiency is very low, test essence
Degree is unable to get guarantee, leverages production and processing efficiency.
Invention content
(1) the technical issues of solving
To solve the above-mentioned problems, the present invention provides a kind of leakage current test device of chip, by transport mechanism to
Mechanism for testing self-feeding, mechanism for testing carry out electric leakage current test to chip to be measured, and the electric leakage of each pin flows through multi-channel analog choosing
It selects switch feeding control module to be handled, and judges non-defective unit or waste product, mechanism for sorting is according to the judgement result of control module point
Non-defective unit is not put into non-defective unit case or waste product is put into collecting receptacle, automation and intelligence degree are high, greatly reduce hand labor
Intensity improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency.
(2) technical solution
A kind of leakage current test device of chip, including device body, described device ontology include pedestal, and the pedestal is
U-shaped structure connects the first side plate on one vertical part of the pedestal, the second side plate is connected on another vertical part of the pedestal,
First side plate and second side plate are horizontal opposite, and conveyer is equipped between first side plate and second side plate
Structure, the transport mechanism include the first driven voller and the second driven voller, and first side is run through in one end of first driven voller
One end of plate is simultaneously stretched out outside first side plate, and the other end of first driven voller through one end of second side plate and is stretched
Go out outside second side plate, one end of second driven voller runs through the other end of first side plate and stretches out first side
Outside plate, the other end of second driven voller runs through the other end of second side plate and stretches out outside second side plate, described
It is equipped with conveyer belt between first driven voller and second driven voller, several placing grooves, institute are uniformly equipped on the conveyer belt
It states placing groove to be located on the central axes of the conveyer belt, the first electric rotating machine and the second rotation is respectively equipped on the transverse part of the pedestal
Rotating motor, first electric rotating machine and second electric rotating machine it is opposite positioned at the transverse part both ends of the pedestal, described the
First rotary shaft of one electric rotating machine is through a vertical part of the pedestal and stretches out outside a vertical part of the pedestal, stretches out in
The first tightening belt is equipped between first rotary shaft and first driven voller outside one vertical part of the pedestal, it is described
Second rotary shaft of the second electric rotating machine is through another vertical part of the pedestal and stretches out outside another vertical part of the pedestal,
It stretches out in second rotary shaft outside another vertical part of the pedestal and is equipped with the second tensioning between first driven voller
Belt, the conveyer belt are equipped with mechanism for testing, and the mechanism for testing includes testing jig, and the testing jig is inverted U-shaped structure, institute
A vertical part for stating testing jig is connected with first side plate, another vertical part of the testing jig and the second side plate phase
Connection, is equipped with control module in the transverse part of the testing jig, the transverse part bottom side of the testing jig it is placed in the middle be equipped with first straight line electricity
The end of machine, the first telescopic rod of the first straight line motor is equipped with connecting plate, and being equipped with multi-channel analog in the connecting plate selects
Switch, the bottom of the connecting plate are equipped with several test probes, and the position of the test probe and quantity are drawn with chip to be measured
Foot is corresponding, and the test probe is electrically connected with the multi-channel analog selecting switch, and the multi-channel analog selecting switch passes through
Data line is electrically connected with the control module, is additionally provided with mechanism for sorting on the conveyer belt, the mechanism for sorting is close
Second driven voller, the mechanism for sorting include non-defective unit case and collecting receptacle, the outside of the non-defective unit case and first side plate
It is connected, is connected on the outside of the collecting receptacle and second side plate, is equipped with and divides between the non-defective unit case and the collecting receptacle
Frame is picked, the sorting frame is also inverted U-shaped structure, is connected on the outside of a vertical part of the sorting frame and the non-defective unit case, institute
It states and is connected on the outside of another vertical part and the collecting receptacle of sorting frame, silk is equipped between two vertical parts of the sorting frame
Bar, the lead screw are fixed on by the way that screw rodb base is horizontal on the sorting frame, and the lead screw is equipped with sliding block, the bottom of the sliding block
Portion is equipped with second straight line motor, and the end of the second telescopic rod of the second straight line motor connects vacuum cup, and the test is visited
Needle connects the input terminal of the control module, the control mould by the multi-channel analog selecting switch with the data line
The output end of block is separately connected first electric rotating machine, second electric rotating machine, the first straight line motor, described second
Linear motor and the lead screw, external power supply provide operating voltage for described device ontology.
Further, first electric rotating machine and second electric rotating machine select RS-380SH type stepper motors.
Further, the multi-channel analog selecting switch selects 16 path analoging switch CD4067.
Further, the initial position of the sliding block is located at the centre of the lead screw.
Further, the vacuum cup selects soft silica gel material to be made.
Further, the control module selects 16 microcontroller MC95S12DJ128.
(3) advantageous effect
The present invention provides a kind of leakage current test device of chip, it is put into chip front side to be measured is directed downwardly on conveyer belt
Placing groove in, control module control the first electric rotating machine and the second electric rotating machine synchronous working, the first electric rotating machine and second
Electric rotating machine drives the rotation of the first driven voller, the first driven voller logical simultaneously by the first tightening belt and the second tightening belt respectively
Crossing conveyer belt drives the second driven voller to follow rotation, to make transport mechanism transmit chip to be measured toward mechanism for testing direction, when
When chip to be measured is entered in mechanism for testing, first straight line motor is put down probe is tested, and tests the pin of probe and chip to be measured
It is connected, measures the leakage data of the pin of chip to be measured, leakage data is through the multi-channel analog selecting switch in connecting plate
The A/D converter that control module is sent into data line is handled, and judges whether the leakage data of pin is up to standard, to
Judge chip to be measured for non-defective unit or waste product, while corresponding judgement result is sent to lead screw by control module, when chip to be measured into
When entering in mechanism for sorting, second straight line motor, which puts down vacuum cup, has adsorbed chip to be measured, and lead screw is sentenced according to control module
Determine result to put down precession toward non-defective unit case accordingly or put down precession toward collecting receptacle, to which chip to be measured is put into non-defective unit case or waste product
Case, automation and intelligence degree are high, greatly reduce hand labor intensity, improve testing efficiency, ensure that measuring accuracy,
Production and processing efficiency are improved, simple in sturcture, ingenious in design, accuracy of detection is high, fast response time, stability and reliability
It is good, there is good practicability and scalability, other occasions of chip testing can be widely used in.
Description of the drawings
Fig. 1 is a kind of structural schematic diagram of the leakage current test device of chip according to the present invention.
Fig. 2 is a kind of Facad structure signal of transport mechanism of the leakage current test device of chip according to the present invention
Figure.
Fig. 3 is a kind of Facad structure signal of mechanism for testing of the leakage current test device of chip according to the present invention
Figure.
Fig. 4 is a kind of Facad structure signal of mechanism for sorting of the leakage current test device of chip according to the present invention
Figure.
Fig. 5 is a kind of System Working Principle figure of the leakage current test device of chip according to the present invention.
Specific implementation mode
Embodiment according to the present invention is described in further details below in conjunction with the accompanying drawings.
In conjunction with Fig. 1~Fig. 5, a kind of leakage current test device of chip, including device body, device body include pedestal 1,
Pedestal 1 is U-shaped structure, connects the first side plate 2 on a vertical part of pedestal 1, the second side plate is connected on another vertical part of pedestal 1
3, the first side plate 2 and the second side plate 3 are horizontal opposite, and transport mechanism, conveyer are equipped between the first side plate 2 and the second side plate 3
Structure includes the first driven voller 4 and the second driven voller 5, and one end of the first driven voller 4 through one end of the first side plate 2 and stretches out first
Outside side plate 2, the other end of the first driven voller 4 through one end of the second side plate 3 and stretches out outside the second side plate 3, the second driven voller 5
One end is outside the other end and the first side plate 2 of stretching of the first side plate 2, and the other end of the second driven voller 5 is through the second side plate 3
The other end simultaneously stretches out outside the second side plate 3, and conveyer belt 6 is equipped between the first driven voller 4 and the second driven voller 5, on conveyer belt 6 uniformly
Be equipped with several placing grooves 7, placing groove 7 is located on the central axes of conveyer belt 6, and the first rotation is respectively equipped on the transverse part of pedestal 1
Motor 8 and the second electric rotating machine 11, the first electric rotating machine 8 and the second electric rotating machine 11 it is opposite positioned at the transverse part both ends of pedestal 1,
First rotary shaft 9 of the first electric rotating machine 8 is through a vertical part of pedestal 1 and stretches out outside a vertical part of pedestal 1, stretches out in bottom
It is equipped with the first tightening belt 10, the second electric rotating machine between the first rotary shaft 9 and the first driven voller 4 outside one vertical part of seat 1
11 the second rotary shaft 12 is through another vertical part of pedestal 1 and stretches out outside another vertical part of pedestal 1, stretches out in pedestal 1
The second tightening belt 13 is equipped between the second rotary shaft 12 and the first driven voller 4 outside another vertical part, conveyer belt 6, which is equipped with, to be surveyed
Test-run a machine structure, mechanism for testing include testing jig 14, and testing jig 14 is inverted U-shaped structure, a vertical part and the first side plate 2 of testing jig 14
It is connected, another vertical part of testing jig 14 is connected with the second side plate 3, and control module 15 is equipped in the transverse part of testing jig 14,
The transverse part bottom side of testing jig 14 it is placed in the middle be equipped with first straight line motor 16, the end of the first telescopic rod 17 of first straight line motor 16
Equipped with connecting plate 18, multi-channel analog selecting switch is equipped in connecting plate 18, the bottom of connecting plate 18 is equipped with several test probes 19,
Position and the quantity for testing probe 19 are corresponding with the pin of chip to be measured, test probe 19 and multi-channel analog selecting switch is electrical
Connection, multi-channel analog selecting switch are electrically connected by data line 20 and control module 15, and sorting is additionally provided on conveyer belt 6
Mechanism, for mechanism for sorting close to the second driven voller 5, mechanism for sorting includes non-defective unit case 21 and collecting receptacle 22, non-defective unit case 21 and the first side
The outside of plate 2 is connected, and collecting receptacle 22 is connected with the outside of the second side plate 3, is equipped with and divides between non-defective unit case 21 and collecting receptacle 22
Frame 23 is picked, sorting frame 23 is also inverted U-shaped structure, and a vertical part of sorting frame 23 is connected with the outside of non-defective unit case 21, sorting frame
23 another vertical part is connected with the outside of collecting receptacle 22, and lead screw 24, lead screw 24 are equipped between two vertical parts of sorting frame 23
It is fixed on sorting frame 23 by the way that screw rodb base 25 is horizontal, lead screw 24 is equipped with sliding block 26, and the bottom of sliding block 26 is equipped with second directly
The end of line motor 27, the second telescopic rod 28 of second straight line motor 27 connects vacuum cup 29, and test probe 19 passes through multichannel
Analog selection switchs and the input terminal of 20 link control module 15 of data line, and the output end of control module 15 is separately connected the
One electric rotating machine 8, the second electric rotating machine 11, first straight line motor 16, second straight line motor 27 and lead screw 24, external power supply are dress
It sets ontology and operating voltage is provided.
By in the chip front side to be measured placing groove 7 directed downwardly for being put into conveyer belt 6, that is, make the pin of chip to be measured upward.
Connect external power supply so that device body enters working condition.Control module 15 exports the control of two-way synchronous control signal respectively
First electric rotating machine 8 and the work of the second electric rotating machine 11, the first electric rotating machine 8 drive the rotation of the first rotary shaft 9, the second electric rotating
Machine 11 drives the rotation of the second rotary shaft 12, and the first rotary shaft 9 and the second rotary shaft 12 pass through the first tightening belt 10 and the respectively
Two tightening belts 13 drive the rotation of the first driven voller 4 simultaneously, the first driven voller 4 further through conveyer belt 6 drive the second driven voller 5 with
With rotation, to make transport mechanism be moved toward mechanism for testing direction, the chip to be measured on conveyer belt 6 is passed toward mechanism for testing direction
It send.First electric rotating machine 8 and the second electric rotating machine 11 select RS-380SH type stepper motors, can very easily set rotation
The step frequency of motor, to adjust the speed of rotation of rotary shaft, to adjust the transfer rate of transport mechanism.
When chip to be measured enters in mechanism for testing, control module 15 controls first straight line motor 16 and works, the first telescopic rod
17 put down the connecting plate 18 of end and test probe 19 so that and test probe 19 is pressed against above the pin of chip to be measured, from
And the pin of chip to be measured is made to form test loop with test probe 19, the leakage of the pin of chip to be measured is measured by test probe 19
Current data.Multi-channel analog selecting switch is equipped in connecting plate 18, multi-channel analog selecting switch selects 16 path analoging switch
CD4067 can meet the testing requirement of most chips simultaneously by 16 tunnel leakage datas.Multi-channel analog selecting switch is logical
It crosses data line 20 with control module 15 to be connected, leakage data is through 20 quilt of multi-channel analog selecting switch and data line
It is sent into the analog signal input channel of control module 15.A/D converter built in the analog signal input channel of control module 15, it is right
Leakage data carries out analog-to-digital conversion process, and judges whether leakage data is up to standard.If one of chip to be measured pin
Leakage data it is not up to standard, then control module 15 judges that the chip to be measured is waste product, and otherwise control module 15 judges that this is to be measured
Chip is non-defective unit, and control module 15 will judge that result sends the lead screw 24 of mechanism for sorting to sort out non-defective unit and waste product.
When chip to be measured enters in mechanism for sorting, control module 15 controls second straight line motor 27 and works, the second telescopic rod
28 put down the vacuum cup 29 of end.The initial position of setting sliding block 26 is located at the centre of lead screw 24, when 29 quilt of vacuum cup
When putting down, it is set just to be pressed against chip top to be measured, and chip to be measured is adsorbed.Vacuum cup 29 selects soft silica gel material
It is made, can be tightly fit with chip to be measured has better adsorption effect, improve adsorption efficiency.Chip absorption to be measured
Finish, lead screw 24 according to the judgement result of control module 15 toward the 21 direction precession of non-defective unit case or toward 22 direction precession of collecting receptacle,
To make sliding block 26 be moved accordingly toward mobile or past 22 direction of collecting receptacle in 21 direction of non-defective unit case, chip to be measured is put into non-defective unit case
21 or collecting receptacle 22 in.Sorting finishes, and lead screw 24 resets, and sliding block 26 is made to return to initial centre position, to carry out next round point
It picks.The initial position of sliding block 26, which is arranged, reduces the displacement distance of sliding block 26 in the centre of lead screw 24, decreases lead screw 24
Power consumption, improve sorting efficiency.
Control module 15 handles the input detection signal for testing probe 19, respectively output control signal control first
Electric rotating machine 8, the second electric rotating machine 11, first straight line motor 16, second straight line motor 27 and lead screw 24 work.For letter
To change circuit, reduce cost, improves the scalability in system later stage, control module 15 selects 16 microcontroller MC95S12DJ128,
The EEPROM of the RAM and 2KB of Flash, 8KB of its built-in 128KB have 5V inputs and driving capability, CPU working frequencies reachable
To 50MHz.The independent number I/O interfaces in 29 tunnels, 20 road bands interrupt and the digital I/O interfaces of arousal function, and the 10 of 28 channels
Position A/D converter, input capture/output with 8 channels are compared, and also have 8 programmable channels PWM.It is serial different with 2
Communication interface SCI is walked, 2 synchronous serial Peripheral Interface SPI, I2C buses and CAN function modules etc. meet design requirement.
The present invention provides a kind of leakage current test device of chip, it is put into chip front side to be measured is directed downwardly on conveyer belt
Placing groove in, control module control the first electric rotating machine and the second electric rotating machine synchronous working, the first electric rotating machine and second
Electric rotating machine drives the rotation of the first driven voller, the first driven voller logical simultaneously by the first tightening belt and the second tightening belt respectively
Crossing conveyer belt drives the second driven voller to follow rotation, to make transport mechanism transmit chip to be measured toward mechanism for testing direction, when
When chip to be measured is entered in mechanism for testing, first straight line motor is put down probe is tested, and tests the pin of probe and chip to be measured
It is connected, measures the leakage data of the pin of chip to be measured, leakage data is through the multi-channel analog selecting switch in connecting plate
The A/D converter that control module is sent into data line is handled, and judges whether the leakage data of pin is up to standard, to
Judge chip to be measured for non-defective unit or waste product, while corresponding judgement result is sent to lead screw by control module, when chip to be measured into
When entering in mechanism for sorting, second straight line motor, which puts down vacuum cup, has adsorbed chip to be measured, and lead screw is sentenced according to control module
Determine result to put down precession toward non-defective unit case accordingly or put down precession toward collecting receptacle, to which chip to be measured is put into non-defective unit case or waste product
Case, automation and intelligence degree are high, greatly reduce hand labor intensity, improve testing efficiency, ensure that measuring accuracy,
Production and processing efficiency are improved, simple in sturcture, ingenious in design, accuracy of detection is high, fast response time, stability and reliability
It is good, there is good practicability and scalability, other occasions of chip testing can be widely used in.
The above-described embodiments are merely illustrative of preferred embodiments of the present invention, not to the structure of the present invention
Think and range is defined.Under the premise of not departing from design concept of the present invention, technology of the ordinary people in the field to the present invention
The all variations and modifications that scheme is made, should all drop into protection scope of the present invention, the claimed technology contents of the present invention,
It has all recorded in detail in the claims.
Claims (6)
1. a kind of leakage current test device of chip, including device body, it is characterised in that：Described device ontology includes pedestal,
The pedestal is U-shaped structure, connects the first side plate on a vertical part of the pedestal, is connected on another vertical part of the pedestal
Second side plate, first side plate and second side plate are horizontal opposite, between first side plate and second side plate
Equipped with transport mechanism, the transport mechanism includes the first driven voller and the second driven voller, and one end of first driven voller is run through
One end of first side plate is simultaneously stretched out outside first side plate, and the other end of first driven voller runs through second side plate
One end and stretch out outside second side plate, the other end and stretching of one end of second driven voller through first side plate
Outside first side plate, the other end of second driven voller runs through the other end of second side plate and stretches out the second side
Outside plate, it is equipped with conveyer belt between first driven voller and second driven voller, is uniformly equipped on the conveyer belt several
Placing groove, the placing groove are located on the central axes of the conveyer belt, and the first electric rotating is respectively equipped on the transverse part of the pedestal
The opposite transverse part two positioned at the pedestal of machine and the second electric rotating machine, first electric rotating machine and second electric rotating machine
First rotary shaft at end, first electric rotating machine runs through a vertical part of the pedestal and stretches out a vertical part of the pedestal
Outside, it stretches out in first rotary shaft outside a vertical part of the pedestal and is equipped with the first tensioning between first driven voller
Second rotary shaft of belt, second electric rotating machine through another vertical part of the pedestal and stretches out the another of the pedestal
Outside a vertical part, stretches out in second rotary shaft outside another vertical part of the pedestal and be equipped between first driven voller
Second tightening belt, the conveyer belt are equipped with mechanism for testing, and the mechanism for testing includes testing jig, and the testing jig is U
One vertical part of type structure, the testing jig is connected with first side plate, another vertical part of the testing jig with it is described
Second side plate is connected, and control module is equipped in the transverse part of the testing jig, and the transverse part bottom side of the testing jig is placed in the middle to be equipped with
The end of first straight line motor, the first telescopic rod of the first straight line motor is equipped with connecting plate, is equipped in the connecting plate more
The bottom of road analog selection switch, the connecting plate is equipped with several test probes, the position for testing probe and quantity and waits for
The pin for surveying chip is corresponding, and the test probe is electrically connected with the multi-channel analog selecting switch, the multi-channel analog choosing
It selects switch to be electrically connected by data line and the control module, is additionally provided with mechanism for sorting on the conveyer belt, described point
Mechanism is picked close to second driven voller, the mechanism for sorting includes non-defective unit case and collecting receptacle, the non-defective unit case and described first
It is connected on the outside of side plate, is connected on the outside of the collecting receptacle and second side plate, the non-defective unit case and the collecting receptacle
Between be equipped with sorting frame, the sorting frame also be inverted U-shaped structure, the outside of the vertical part and the non-defective unit case of the sorting frame
Be connected, be connected on the outside of another vertical part of the sorting frame and the collecting receptacle, two vertical parts of the sorting frame it
Between be equipped with lead screw, the lead screw is fixed on by the way that screw rodb base is horizontal on the sorting frame, and the lead screw is equipped with sliding block, described
The bottom of sliding block is equipped with second straight line motor, and the end of the second telescopic rod of the second straight line motor connects vacuum cup, institute
State the input terminal that test probe connects the control module by the multi-channel analog selecting switch with the data line, institute
State control module output end be separately connected first electric rotating machine, second electric rotating machine, the first straight line motor,
The second straight line motor and the lead screw, external power supply provide operating voltage for described device ontology.
2. a kind of leakage current test device of chip according to claim 1, it is characterised in that：First electric rotating machine
RS-380SH type stepper motors are selected with second electric rotating machine.
3. a kind of leakage current test device of chip according to claim 1, it is characterised in that：The multi-channel analog selection
Switch selects 16 path analoging switch CD4067.
4. a kind of leakage current test device of chip according to claim 1, it is characterised in that：The initial bit of the sliding block
Setting in the centre of the lead screw.
5. a kind of leakage current test device of chip according to claim 1, it is characterised in that：The vacuum cup is selected
Soft silica gel material is made.
6. a kind of leakage current test device of chip according to claim 1, it is characterised in that：The control module is selected
16 microcontroller MC95S12DJ128.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810496800.5A CN108787500A (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test device of chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810496800.5A CN108787500A (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test device of chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108787500A true CN108787500A (en) | 2018-11-13 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810496800.5A Withdrawn CN108787500A (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test device of chip |
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| CN110703123A (en) * | 2019-11-18 | 2020-01-17 | 固纬电子(苏州)有限公司 | Multi-channel power supply testing method |
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| CN113725131A (en) * | 2021-11-02 | 2021-11-30 | 西安奕斯伟材料科技有限公司 | Wafer pretreatment device and wafer defect detection method |
| CN115308569A (en) * | 2022-07-11 | 2022-11-08 | 深圳市力子光电科技有限公司 | Touch control chip electrical property testing device and testing method |
| CN115608659A (en) * | 2022-12-20 | 2023-01-17 | 镇江矽佳测试技术有限公司 | Automatic chip testing device |
-
2018
- 2018-05-22 CN CN201810496800.5A patent/CN108787500A/en not_active Withdrawn
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110703123A (en) * | 2019-11-18 | 2020-01-17 | 固纬电子(苏州)有限公司 | Multi-channel power supply testing method |
| CN112222019A (en) * | 2020-09-25 | 2021-01-15 | 安徽新虹新材料科技有限公司 | Semi-automatic heating film product insulation voltage-resistant detection equipment |
| CN112122171A (en) * | 2020-10-06 | 2020-12-25 | 许同 | Unqualified product removing device for integrated circuit resistor |
| CN113725131A (en) * | 2021-11-02 | 2021-11-30 | 西安奕斯伟材料科技有限公司 | Wafer pretreatment device and wafer defect detection method |
| CN115308569A (en) * | 2022-07-11 | 2022-11-08 | 深圳市力子光电科技有限公司 | Touch control chip electrical property testing device and testing method |
| CN115608659A (en) * | 2022-12-20 | 2023-01-17 | 镇江矽佳测试技术有限公司 | Automatic chip testing device |
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Application publication date: 20181113 |