CN108362973A - A kind of leakage current test equipment of chip - Google Patents
A kind of leakage current test equipment of chip Download PDFInfo
- Publication number
- CN108362973A CN108362973A CN201810496777.XA CN201810496777A CN108362973A CN 108362973 A CN108362973 A CN 108362973A CN 201810496777 A CN201810496777 A CN 201810496777A CN 108362973 A CN108362973 A CN 108362973A
- Authority
- CN
- China
- Prior art keywords
- side plate
- pedestal
- chip
- driven voller
- rotating machine
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
Abstract
The present invention provides a kind of leakage current test equipment of chip,Including apparatus body,The apparatus body includes pedestal,The pedestal is U-shaped structure,The first side plate is connected on one vertical part of the pedestal,The second side plate is connected on another vertical part of the pedestal,First side plate and second side plate are horizontal opposite,Transport mechanism is equipped between first side plate and second side plate,The transport mechanism includes the first driven voller and the second driven voller,The present invention is by transport mechanism to mechanism for testing self-feeding,Mechanism for testing carries out electric leakage current test to chip to be measured,The electric leakage of each pin flows through multi-channel analog selecting switch feeding control module and is handled,And judge non-defective unit or waste product,To wait for that subsequent handling sorts chip to be measured,Automation and intelligence degree are high,Greatly reduce hand labor intensity,Improve testing efficiency,It ensure that measuring accuracy,Improve production and processing efficiency.
Description
Technical field
The present invention relates to chip testing devices technical field, more particularly to the leakage current test equipment of a kind of chip.
Background technology
It is open circuit under ideal conditions, between the pin and the earth of chip, is high resistant between them but under actual conditions
State flows through in addition might have small electric current when voltage, and this electric current is known as leakage current.After chip flow, need
Whether the leakage current of test chip is up to standard, and the leakage current such as fruit chip is excessive, for example is applied to mobile phone, laptop etc. and needs
Want on battery powered electronic equipment, chip can serious influence stand-by time, influence the quality of product, therefore leakage current needs
It considers carefully.
In recent years, with the development of integrated circuit, various chip pins are closer and closer, and pin is more and more, pin spacing
Also smaller and smaller, many difficulties are brought to production, repair, Integration Assembly And Checkout.Existing leakage current measurement method, usually
Measurement jig and multimeter are manually used, one by one the leakage current of test chip pin, this method testing efficiency is very low, surveys
Examination precision is unable to get guarantee, leverages production and processing efficiency.
Invention content
(1) the technical issues of solving
To solve the above-mentioned problems, the present invention provides a kind of leakage current test equipment of chip, by transport mechanism to
Mechanism for testing self-feeding, mechanism for testing carry out electric leakage current test to chip to be measured, and the electric leakage of each pin flows through multi-channel analog choosing
It selects switch feeding control module to be handled, and judges non-defective unit or waste product, to wait for that subsequent handling sorts chip to be measured,
Automation and intelligence degree are high, greatly reduce hand labor intensity, improve testing efficiency, ensure that measuring accuracy,
Improve production and processing efficiency.
(2) technical solution
A kind of leakage current test equipment of chip, including apparatus body, the apparatus body include pedestal, the pedestal
For U-shaped structure, the first side plate is connected on a vertical part of the pedestal, the second side is connected on another vertical part of the pedestal
Plate, first side plate and second side plate are horizontal opposite, are equipped with and pass between first side plate and second side plate
It includes the first driven voller and the second driven voller to send mechanism, the transport mechanism, and one end of first driven voller is through described
One end of first side plate is simultaneously stretched out outside first side plate, and the other end of first driven voller is through second side plate
One end is simultaneously stretched out outside second side plate, and the other end and the stretching of first side plate are run through in one end of second driven voller
Outside first side plate, the other end of second driven voller runs through the other end of second side plate and stretches out described second
Outside side plate, conveyer belt is equipped between first driven voller and second driven voller, the conveyer belt is equipped with a pair of keep off
Side, a pair of rib it is opposite be located at the both sides of the conveyer belt, the inside of the rib is equipped with slot, a pair gear
Chip support plate is equipped between side, the both sides of the chip support plate are equipped with inserted block, and the inserted block is corresponding with the slot, described
Chip support plate is connected by the inserted block with the slot with the rib, and the upper surface of the chip support plate is equipped with several
Placing groove, the placing groove are located on the central axes of the chip support plate, and the first rotation is respectively equipped on the transverse part of the pedestal
The opposite cross positioned at the pedestal of motor and the second electric rotating machine, first electric rotating machine and second electric rotating machine
First rotary shaft at portion both ends, first electric rotating machine through a vertical part of the pedestal and stretches out the one of the pedestal
Outside a vertical part, stretches out in first rotary shaft outside a vertical part of the pedestal and be equipped between first driven voller
First tightening belt, the second rotary shaft of second electric rotating machine is through described in another vertical part of the pedestal and stretching
Outside another vertical part of pedestal, stretch out in second rotary shaft outside another vertical part of the pedestal with described first from
The second tightening belt is equipped between dynamic roller, the conveyer belt is equipped with mechanism for testing, and the mechanism for testing includes testing jig, institute
It is inverted U-shaped structure to state testing jig, and a vertical part of the testing jig is connected with first side plate, the testing jig it is another
One vertical part is connected with second side plate, and control module, the transverse part of the testing jig are equipped in the transverse part of the testing jig
Bottom side it is placed in the middle be equipped with linear motor, the end connecting test head of the telescopic rod of the linear motor, the measuring head includes number
According to receiver board, multi-channel analog selecting switch is equipped in the data reception board, the bottom of the data reception board is equipped with inwardly
The connection female seat of recess, the multi-channel analog selecting switch are electrically connected with the connection female seat, and the multi-channel analog selection is opened
It closes and is electrically connected by data line and the control module, the bottom of the data reception board connects line collecting plate, the collection
The bottom of line plate is equipped with several test probes, and the position of the test probe and quantity are corresponding with the pin of chip to be measured,
The top of the line collecting plate is equipped with connecting male, and the connecting male is corresponding with the connection female seat, the line collecting plate and institute
It states data reception board by the connecting male to be connected with the connection female seat, the test probe and the connecting male
It is electrically connected, the test probe connects the control mould with the data line by the multi-channel analog selecting switch
The input terminal of block, the output end of the control module be separately connected first electric rotating machine, second electric rotating machine and
The linear motor, external power supply provide operating voltage for system.
Further, first electric rotating machine and second electric rotating machine select RS-380SH type stepper motors.
Further, the multi-channel analog selecting switch selects 16 path analoging switch CD4067.
Further, the connection female seat and the connecting male are made of carbon fibre material.
Further, the control module selects 16 microcontroller MC95S12DJ128.
(3) advantageous effect
The present invention provides a kind of leakage current test equipment of chip, and the chip front side to be measured chip directed downwardly that is put into is carried
In the placing groove of plate, chip support plate is connected by the inserted block of both sides with the slot of rib, to it is fixed on a moving belt with biography
Band is sent to move together, the installation connection type of inserted block and slot is highly convenient for dismounting, time saving and energy saving, meets different model core
The testing requirement of piece, control module control the first electric rotating machine and the second electric rotating machine synchronous working, the first electric rotating machine and
Second electric rotating machine drives the rotation of the first driven voller simultaneously by the first tightening belt and the second tightening belt respectively, first from
Dynamic roller drives the second driven voller to follow rotation by conveyer belt, to make transport mechanism by chip to be measured toward mechanism for testing direction
Transmission, when chip to be measured enters in mechanism for testing, linear motor puts down measuring head, test probe by connecting male with
The connection female seat of data reception board is connected, to make test probe be fixedly mounted on data reception board bottom, connecting male
It is also very easy to disassemble with the installation connection type of connection female seat, it can be used for replacing the test probe of corresponding chip to be measured, meet
The testing requirement of different model chip, test probe are connected with the pin of chip to be measured, measure the pin of chip to be measured
Leakage data, leakage data is through the multi-channel analog selecting switch and data line feeding control mould in data reception board
The A/D converter of block is handled, and judges whether the leakage data of pin up to standard, to judge chip to be measured for non-defective unit or
Waste product, to wait for that subsequent handling sorts chip to be measured, automation and intelligence degree are high, greatly reduce hand labor
Intensity improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency, simple in structure, and design is skilful
Wonderful, accuracy of detection is high, fast response time, and stability and good reliability have good practicability and scalability, can be extensive
Other occasions applied to chip testing.
Description of the drawings
Fig. 1 is a kind of structural schematic diagram of the leakage current test equipment of chip according to the present invention.
Fig. 2 is that a kind of connection of the chip support plate and rib of the leakage current test equipment of chip according to the present invention is shown
It is intended to.
Fig. 3 is a kind of Facad structure signal of transport mechanism of the leakage current test equipment of chip according to the present invention
Figure.
Fig. 4 is a kind of Facad structure signal of mechanism for testing of the leakage current test equipment of chip according to the present invention
Figure.
Fig. 5 is a kind of structural schematic diagram of the measuring head of the leakage current test equipment of chip according to the present invention.
Fig. 6 is a kind of System Working Principle figure of the leakage current test equipment of chip according to the present invention.
Specific implementation mode
Embodiment according to the present invention is described in further details below in conjunction with the accompanying drawings.
In conjunction with Fig. 1~Fig. 6, a kind of leakage current test equipment of chip, including apparatus body, apparatus body include pedestal
1, pedestal 1 is U-shaped structure, connects the first side plate 2 on a vertical part of pedestal 1, second is connected on another vertical part of pedestal 1
Side plate 3, the first side plate 2 and the second side plate 3 are horizontal opposite, and transport mechanism is equipped between the first side plate 2 and the second side plate 3,
Transport mechanism includes the first driven voller 4 and the second driven voller 5, and one end of the first side plate 2 is run through simultaneously in one end of the first driven voller 4
It stretches out outside the first side plate 2, the other end of the first driven voller 4 through one end of the second side plate 3 and stretches out outside the second side plate 3, second
Outside the other end and the first side plate 2 of stretching of the first side plate 2, the other end of the second driven voller 5 runs through for one end of driven voller 5
The other end of second side plate 3 simultaneously stretches out outside the second side plate 3, and conveyer belt 6 is equipped between the first driven voller 4 and the second driven voller 5,
Conveyer belt 6 is equipped with a pair of of rib 7, a pair of of rib 7 it is opposite be located at the both sides of conveyer belt 6, the inside of rib 7 is equipped with slot
8, chip support plate 9 is equipped between a pair of of rib 7, the both sides of chip support plate 9 are equipped with inserted block 10, and inserted block 10 is corresponding with slot 8,
Chip support plate 9 is connected by inserted block 10 with slot 8 with rib 7, and the upper surface of chip support plate 9 is equipped with several placing grooves 11, puts
It sets slot 11 to be located on the central axes of chip support plate 9, the rotation of the first electric rotating machine 12 and second is respectively equipped on the transverse part of pedestal 1
Motor 13, the first electric rotating machine 12 and the second electric rotating machine 13 it is opposite positioned at the transverse part both ends of pedestal 1, the first electric rotating machine
12 the first rotary shaft 14 is through a vertical part of pedestal 1 and stretches out outside a vertical part of pedestal 1, stretches out in one of pedestal 1
It is equipped with the first tightening belt 15 between the first rotary shaft 14 and the first driven voller 4 outside vertical part, the of the second electric rotating machine 13
Two rotary shafts 16 are through another vertical part of pedestal 1 and stretch out outside another vertical part of pedestal 1, stretch out in another of pedestal 1
The second tightening belt 17 is equipped between the second rotary shaft 16 and the first driven voller 4 outside vertical part, conveyer belt 6 is equipped with test machine
Structure, mechanism for testing include testing jig 18, and testing jig 18 is inverted U-shaped structure, a vertical part and 2 phase of the first side plate of testing jig 18
Connection, another vertical part of testing jig 18 are connected with the second side plate 3, and control module 19 is equipped in the transverse part of testing jig 18, survey
Try frame 18 transverse part bottom side it is placed in the middle be equipped with linear motor 20, the end connecting test head of the telescopic rod 21 of linear motor 20 is surveyed
Examination head includes data reception board 22, and multi-channel analog selecting switch 23, the bottom of data reception board 22 are equipped in data reception board 22
Portion is equipped with the connection female seat 24 being recessed inwardly, and multi-channel analog selecting switch 23 is electrically connected with female seat 24 is connect, multi-channel analog choosing
Switch 23 to be selected to be electrically connected by data line 25 and control module 19, the bottom of data reception board 22 connects line collecting plate 26,
The bottom of line collecting plate 26 is equipped with several test probes 27, and position and the quantity for testing probe 27 are opposite with the pin of chip to be measured
It answers, the top of line collecting plate 26 is equipped with connecting male 28, and connecting male 28 is corresponding with connection female seat 24, line collecting plate 26 and data
Receiver board 22 is connected by connecting male 28 with female seat 24 is connect, and test probe 27 is electrically connected with connecting male 28, is surveyed
It sounds out needle 27 and passes through the input terminal of 25 link control module 19 of multi-channel analog selecting switch 23 and data line, control module
19 output end is separately connected the first electric rotating machine 12, the second electric rotating machine 13 and linear motor 20, and external power supply carries for system
For operating voltage.
The alignment of inserted block 10 of chip support plate 9 is inserted into the slot 8 of rib 7, to which chip support plate 9 is fixed on transmission
The upper surface of band 6 makes chip support plate 9 that conveyer belt 6 be followed to move together.Inserted block 10 and the installation connection type of slot 8 are highly convenient for
Dismounting, it is time saving and energy saving, meet the testing requirement of different model chip.
By in the chip front side to be measured placing groove 11 directed downwardly for being put into chip support plate 9, that is, make the pin court of chip to be measured
On.External power supply is connected, system is made to enter working condition.Control module 19 exports two-way synchronous control signal control the respectively
One electric rotating machine 12 and the work of the second electric rotating machine 13, the first electric rotating machine 12 drive the rotation of the first rotary shaft 14, the second rotation
Motor 13 drives the rotation of the second rotary shaft 16, and the first rotary shaft 14 and the second rotary shaft 16 pass through the first tightening belt 15 respectively
Drive the rotation of the first driven voller 4, the first driven voller 4 driven further through the drive second of conveyer belt 6 simultaneously with the second tightening belt 17
Roller 5 follows rotation, to make transport mechanism be moved toward mechanism for testing direction, by the chip support plate 9 on conveyer belt 6 toward test machine
It transmits in structure direction.First electric rotating machine 12 and the second electric rotating machine 13 select RS-380SH type stepper motors, can be very convenient
Setting electric rotating machine step frequency, to adjust the speed of rotation of rotary shaft, to adjust the transfer rate of transport mechanism.
When chip to be measured enters in mechanism for testing, control module 19 controls linear motor 20 and works, and telescopic rod 21 is by end
Measuring head put down.The lead harness for testing probe 27 comes together in connecting male 28 by line collecting plate 26, and test probe 27 passes through
Connecting male 28 and the connection female seat 24 of data reception board 22 are fixedly linked, and connecting male 28 connects with the installation for connecting female seat 24
It connects that mode is also very easy to disassemble, can be used for replacing the test probe 27 of different chips to be measured, meet different model chip
Testing requirement.Connecting male 28 and connection female seat 24 are made of carbon fibre material, and carbon fiber axle is high to intensity and modulus,
Density is low, higher than performance, no creep, and superhigh temperature resistant under non-oxidizing atmosphere, fatigue performance is good, and coefficient of thermal expansion is small and has
Anisotropy, good corrosion resistance, good conductive and heat-conductive and electromagnetism performance tired out, can repeatedly plug, service life is lasting.
Measuring head is put down by linear motor 20, and the test probe 27 of bottom is pressed against above the pin of chip to be measured, to
The pin and test probe 27 for making chip to be measured form test loop, and the leakage of the pin of chip to be measured is measured by test probe 27
Current data.Multi-channel analog selecting switch 23 in data reception board 22 gates the test leakage data for testing probe 27
It receives, multi-channel analog selecting switch 23 selects 16 path analoging switch CD4067, can meet simultaneously by 16 tunnel leakage datas
The testing requirement of most chips.Multi-channel analog selecting switch 23 is connected by data line 25 with control module 19,
The analog signal input that leakage data is admitted to control module 19 through multi-channel analog selecting switch 23 and data line 25 is logical
Road.A/D converter built in the analog signal input channel of control module 19 carries out analog-to-digital conversion process to leakage data,
And judge whether leakage data is up to standard.If the leakage data of one of chip to be measured pin is not up to standard, mould is controlled
Block 19 judges that the chip to be measured is waste product, and otherwise control module 19 judges that the chip to be measured is non-defective unit, to wait for that subsequent handling is treated
Chip is surveyed to be sorted.
Control module 19 handles the input detection signal for testing probe 27, respectively output control signal control the
One electric rotating machine 12, the second electric rotating machine 13 and linear motor 20 work.In order to simplify circuit, cost is reduced, system is improved
The scalability in system later stage, control module 19 select 16 microcontrollers MC95S12DJ128, Flash, 8KB of built-in 128KB
RAM and 2KB EEPROM, have 5V input and driving capability, CPU working frequencies can reach 50MHz.The independent number in 29 tunnels
Word I/O interfaces, 20 road bands interrupt and the digital I/O interfaces of arousal function, 10 A/D converters in 28 channels, have 8 to lead to
Input capture/the output in road is compared, and also has 8 programmable channels PWM.With 2 serial asynchronous communication interface SCI, 2
Synchronous serial Peripheral Interface SPI, I2C bus and CAN function modules etc., meet design requirement.
The present invention provides a kind of leakage current test equipment of chip, and the chip front side to be measured chip directed downwardly that is put into is carried
In the placing groove of plate, chip support plate is connected by the inserted block of both sides with the slot of rib, to it is fixed on a moving belt with biography
Band is sent to move together, the installation connection type of inserted block and slot is highly convenient for dismounting, time saving and energy saving, meets different model core
The testing requirement of piece, control module control the first electric rotating machine and the second electric rotating machine synchronous working, the first electric rotating machine and
Second electric rotating machine drives the rotation of the first driven voller simultaneously by the first tightening belt and the second tightening belt respectively, first from
Dynamic roller drives the second driven voller to follow rotation by conveyer belt, to make transport mechanism by chip to be measured toward mechanism for testing direction
Transmission, when chip to be measured enters in mechanism for testing, linear motor puts down measuring head, test probe by connecting male with
The connection female seat of data reception board is connected, to make test probe be fixedly mounted on data reception board bottom, connecting male
It is also very easy to disassemble with the installation connection type of connection female seat, it can be used for replacing the test probe of corresponding chip to be measured, meet
The testing requirement of different model chip, test probe are connected with the pin of chip to be measured, measure the pin of chip to be measured
Leakage data, leakage data is through the multi-channel analog selecting switch and data line feeding control mould in data reception board
The A/D converter of block is handled, and judges whether the leakage data of pin up to standard, to judge chip to be measured for non-defective unit or
Waste product, to wait for that subsequent handling sorts chip to be measured, automation and intelligence degree are high, greatly reduce hand labor
Intensity improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency, simple in structure, and design is skilful
Wonderful, accuracy of detection is high, fast response time, and stability and good reliability have good practicability and scalability, can be extensive
Other occasions applied to chip testing.
The above-described embodiments are merely illustrative of preferred embodiments of the present invention, not to the present invention's
Conception and scope is defined.Under the premise of not departing from design concept of the present invention, skill of the ordinary people in the field to the present invention
The all variations and modifications that art scheme is made, should all drop into protection scope of the present invention, in the claimed technology of the present invention
Hold, has all recorded in detail in the claims.
Claims (5)
1. a kind of leakage current test equipment of chip, including apparatus body, it is characterised in that：The apparatus body includes pedestal,
The pedestal is U-shaped structure, connects the first side plate on a vertical part of the pedestal, is connected on another vertical part of the pedestal
Second side plate, first side plate and second side plate are horizontal opposite, between first side plate and second side plate
Equipped with transport mechanism, the transport mechanism includes the first driven voller and the second driven voller, and one end of first driven voller is run through
One end of first side plate is simultaneously stretched out outside first side plate, and the other end of first driven voller runs through second side plate
One end and stretch out outside second side plate, the other end and stretching of one end of second driven voller through first side plate
Outside first side plate, the other end of second driven voller runs through the other end of second side plate and stretches out the second side
Outside plate, it being equipped with conveyer belt between first driven voller and second driven voller, the conveyer belt is equipped with a pair of of rib, and one
Opposite to the rib inside of the rib is equipped with slot positioned at the both sides of the conveyer belt, between a pair of rib
Equipped with chip support plate, the both sides of the chip support plate are equipped with inserted block, and the inserted block is corresponding with the slot, the chip support plate
It is connected with the slot by the inserted block with the rib, the upper surface of the chip support plate is equipped with several placing grooves, institute
It states placing groove to be located on the central axes of the chip support plate, the first electric rotating machine and second is respectively equipped on the transverse part of the pedestal
Electric rotating machine, first electric rotating machine and second electric rotating machine it is opposite positioned at the transverse part both ends of the pedestal, it is described
First rotary shaft of the first electric rotating machine is through a vertical part of the pedestal and stretches out outside a vertical part of the pedestal, stretches out
It is equipped in first rotary shaft outside a vertical part of the pedestal and between first driven voller the first tightening belt, institute
The second rotary shaft of the second electric rotating machine is stated through another vertical part of the pedestal and stretches out another vertical part of the pedestal
Outside, second rotary shaft outside another vertical part of the pedestal is stretched out in and between first driven voller equipped with second
Tight belt, the conveyer belt are equipped with mechanism for testing, and the mechanism for testing includes testing jig, and the testing jig is inverted U-shaped structure,
One vertical part of the testing jig is connected with first side plate, another vertical part of the testing jig and second side plate
Be connected, be equipped with control module in the transverse part of the testing jig, the transverse part bottom side of the testing jig it is placed in the middle be equipped with linear motor,
The end connecting test head of the telescopic rod of the linear motor, the measuring head includes data reception board, the data reception board
Interior to be equipped with multi-channel analog selecting switch, the bottom of the data reception board is equipped with the connection female seat being recessed inwardly, the multichannel mould
Quasi- selecting switch is electrically connected with the connection female seat, and the multi-channel analog selecting switch passes through data line and the control
Module is electrically connected, and the bottom of the data reception board connects line collecting plate, and the bottom of the line collecting plate is equipped with several test probes,
The position of the test probe and quantity are corresponding with the pin of chip to be measured, and the top of the line collecting plate is equipped with connecting male,
The connecting male is corresponding with the connection female seat, the line collecting plate and the data reception board by the connecting male with
The connection female seat is connected, and the test probe is electrically connected with the connecting male, and the test probe passes through described more
Road analog selection switch connects the input terminal of the control module, the output end point of the control module with the data line
First electric rotating machine, second electric rotating machine and the linear motor, external power supply are not connected provides work for system
Voltage.
2. a kind of leakage current test equipment of chip according to claim 1, it is characterised in that：First electric rotating machine
RS-380SH type stepper motors are selected with second electric rotating machine.
3. a kind of leakage current test equipment of chip according to claim 1, it is characterised in that：The multi-channel analog selection
Switch selects 16 path analoging switch CD4067.
4. a kind of leakage current test equipment of chip according to claim 1, it is characterised in that：The connection female seat and institute
Connecting male is stated to be made of carbon fibre material.
5. a kind of leakage current test equipment of chip according to claim 1, it is characterised in that：The control module is selected
16 microcontroller MC95S12DJ128.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810496777.XA CN108362973A (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test equipment of chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810496777.XA CN108362973A (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test equipment of chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108362973A true CN108362973A (en) | 2018-08-03 |
Family
ID=63012246
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810496777.XA Withdrawn CN108362973A (en) | 2018-05-22 | 2018-05-22 | A kind of leakage current test equipment of chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108362973A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116540168A (en) * | 2023-05-22 | 2023-08-04 | 内蒙古送变电有限责任公司 | High-safety portable polarity testing device for current transformer |
-
2018
- 2018-05-22 CN CN201810496777.XA patent/CN108362973A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116540168A (en) * | 2023-05-22 | 2023-08-04 | 内蒙古送变电有限责任公司 | High-safety portable polarity testing device for current transformer |
| CN116540168B (en) * | 2023-05-22 | 2024-02-02 | 内蒙古送变电有限责任公司 | High-safety portable polarity testing device for current transformer |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
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| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20180803 |
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| WW01 | Invention patent application withdrawn after publication |