CN108490306A - A kind of electric leakage current test system of chip - Google Patents
A kind of electric leakage current test system of chip Download PDFInfo
- Publication number
- CN108490306A CN108490306A CN201810496117.1A CN201810496117A CN108490306A CN 108490306 A CN108490306 A CN 108490306A CN 201810496117 A CN201810496117 A CN 201810496117A CN 108490306 A CN108490306 A CN 108490306A
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- side plate
- chip
- pedestal
- rotating machine
- vertical part
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
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- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention provides a kind of electric leakage current test systems of chip,Including pedestal,The pedestal is U-shaped structure,The first side plate is connected on one vertical part of the pedestal,The second side plate is connected on another vertical part of the pedestal,First side plate and second side plate are horizontal opposite,The first electric rotating machine and the second electric rotating machine are respectively equipped on the transverse part of the pedestal,The present invention is by transport mechanism to mechanism for testing self-feeding,Mechanism for testing carries out electric leakage current test to chip to be measured,The electric leakage of each pin flows through multi-channel analog selecting switch feeding control module and is handled,And judge non-defective unit or waste product,Non-defective unit is put into non-defective unit case respectively according to the judgement result of control module or waste product is put into collecting receptacle by mechanism for sorting,Automation and intelligence degree are high,Greatly reduce hand labor intensity,Improve testing efficiency,It ensure that measuring accuracy,Improve production and processing efficiency.
Description
Technical field
The present invention relates to chip detecting equipment technical field, more particularly to the electric leakage current test system of a kind of chip.
Background technology
It is open circuit under ideal conditions, between the pin and the earth of chip, is high resistant shape between them but under actual conditions
State flows through in addition might have small electric current when voltage, and this electric current is known as leakage current.After chip flow, need to survey
Whether the leakage current for trying chip is up to standard, and the leakage current such as fruit chip is excessive, for example is applied to mobile phone, laptop etc. and needs electricity
On battery-powered electronic equipment, chip can serious influence stand-by time, influence the quality of product, thus leakage current need it is prudent
Consider.
In recent years, with the development of integrated circuit, various chip pins are closer and closer, and pin is more and more, pin spacing
Also smaller and smaller, many difficulties are brought to production, repair, Integration Assembly And Checkout.Existing leakage current measurement method is usually people
Work uses measurement jig and multimeter, one by one the leakage current of test chip pin, and this method testing efficiency is very low, test essence
Degree is unable to get guarantee, leverages production and processing efficiency.
Invention content
(1) the technical issues of solving
To solve the above-mentioned problems, the present invention provides a kind of electric leakage current test system of chip, by transport mechanism to
Mechanism for testing self-feeding, mechanism for testing carry out electric leakage current test to chip to be measured, and the electric leakage of each pin flows through multi-channel analog choosing
It selects switch feeding control module to be handled, and judges non-defective unit or waste product, mechanism for sorting is according to the judgement result of control module point
Non-defective unit is not put into non-defective unit case or waste product is put into collecting receptacle, automation and intelligence degree are high, greatly reduce hand labor
Intensity improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency.
(2) technical solution
A kind of electric leakage current test system of chip, including pedestal, the pedestal are U-shaped structure, and one of the pedestal is perpendicular
The first side plate is connected in portion, and the second side plate, first side plate and the second side are connected on another vertical part of the pedestal
Plate is horizontal opposite, and the first electric rotating machine and the second electric rotating machine, first rotation are respectively equipped on the transverse part of the pedestal
Motor and second electric rotating machine it is opposite be located at the transverse part both ends of the pedestal, the first of first electric rotating machine rotates
Axis is through a vertical part of the pedestal and stretches out outside a vertical part of the pedestal, the second rotation of second electric rotating machine
Axis is through another vertical part of the pedestal and stretches out outside another vertical part of the pedestal, first side plate and described second
Transport mechanism is equipped between side plate, the transport mechanism includes the first driven voller and the second driven voller, first driven voller
One end is through one end of first side plate and stretches out outside first side plate, and the other end of first driven voller is through described
One end of second side plate is simultaneously stretched out outside second side plate, and one end of second driven voller is through the another of first side plate
It holds and stretches out outside first side plate, the other end of second driven voller runs through the other end of second side plate and stretches out institute
It states outside the second side plate, stretch out in first rotary shaft outside a vertical part of the pedestal and is set between first driven voller
Have the first tightening belt, stretch out in second rotary shaft outside another vertical part of the pedestal and first driven voller it
Between be equipped with the second tightening belt, conveyer belt is equipped between first driven voller and second driven voller, on the conveyer belt
Equipped with a pair of of rib, a pair of rib it is opposite be located at the both sides of the conveyer belt, the inside of the rib is equipped with slot, one
Chip support plate is equipped between the rib, the both sides of the chip support plate are equipped with inserted block, and the inserted block is opposite with the slot
It answers, the chip support plate is connected by the inserted block with the slot with the rib, and the upper surface of the chip support plate is set
There are several placing grooves, the placing groove to be located on the central axes of the chip support plate, the conveyer belt is equipped with mechanism for testing, institute
It includes testing jig to state mechanism for testing, and the testing jig is inverted U-shaped structure, a vertical part and first side plate of the testing jig
It is connected, another vertical part of the testing jig is connected with second side plate, and control is equipped in the transverse part of the testing jig
Module, the transverse part bottom side of the testing jig it is placed in the middle be equipped with first straight line motor, the first telescopic rod of the first straight line motor
End connecting test head, the measuring head includes data reception board, and multi-channel analog selection is equipped in the data reception board and is opened
It closes, the bottom of the data reception board is equipped with the connection female seat being recessed inwardly, the multi-channel analog selecting switch and the connection
Female seat is electrically connected, and the multi-channel analog selecting switch is electrically connected by data line and the control module, the number
Line collecting plate is connected according to the bottom of receiver board, the bottom of the line collecting plate is equipped with several test probes, the position of the test probe
Corresponding with the pin of chip to be measured with quantity, the top of the line collecting plate is equipped with connecting male, the connecting male with it is described
Connection female seat is corresponding, and the line collecting plate is connected by the connecting male with the connection female seat with the data reception board
It connects, the test probe is electrically connected with the connecting male, and mechanism for sorting, the mechanism for sorting are additionally provided on the conveyer belt
Close to second driven voller, the mechanism for sorting includes non-defective unit case and collecting receptacle, the non-defective unit case and first side plate
Outside is connected, and is connected on the outside of the collecting receptacle and second side plate, is set between the non-defective unit case and the collecting receptacle
It is also inverted U-shaped structure to have sorting frame, the sorting frame, and a vertical part of the sorting frame is connected with the outside of the non-defective unit case
Connect, be connected on the outside of another vertical part of the sorting frame and the collecting receptacle, the transverse part bottom side of the sorting frame be equipped with to
The guide rail of sunken inside, the guide rail are embedded with electronics sliding block, and the electronics sliding block in the guide rail slidably, slide by the electronics
The bottom of block is equipped with second straight line motor, and the end of the second telescopic rod of the second straight line motor connects adsorption head, the suction
Attached head includes absorptive table and vacuum cup, and the absorptive table is hollow structure, and the absorptive table includes shell, the top of the shell
It is connected with second telescopic rod on the outside of portion, the inside top of the shell is equipped with vacuum pump, the vacuum tube of the vacuum pump
Through the bottom of the shell, the bottom of the shell is connected with the vacuum cup, and the vacuum tube is inhaled with the vacuum
Disk is connected, and the test probe connects the control module by the multi-channel analog selecting switch with the data line
Input terminal, the output end of the control module is separately connected first electric rotating machine, second electric rotating machine, described
One linear motor, the second straight line motor, the electronics sliding block and the vacuum pump, external power supply provide work electricity for system
Pressure.
Further, first electric rotating machine and second electric rotating machine select RS-380SH type stepper motors.
Further, the multi-channel analog selecting switch selects 16 path analoging switch CD4067.
Further, the connection female seat and the connecting male are made of carbon fibre material.
Further, the initial position of the electronics sliding block is located at the centre of the guide rail.
Further, the vacuum pump selects minipump.
Further, the vacuum cup selects soft silica gel material to be made.
Further, the control module selects 16 microcontroller MC95S12DJ128.
(3) advantageous effect
The present invention provides a kind of electric leakage current test system of chip, chip support plate is put by chip front side to be measured is directed downwardly
Placing groove in, chip support plate is connected by the inserted block of both sides with the slot of rib, to it is fixed on a moving belt with transmission
Band moves together, and the installation connection type of inserted block and slot is highly convenient for dismounting, time saving and energy saving, meets different model chip
Testing requirement, control module control the first electric rotating machine and the second electric rotating machine synchronous working, the first electric rotating machine and the second rotation
Rotating motor drives the rotation of the first driven voller, the first driven voller to pass through simultaneously by the first tightening belt and the second tightening belt respectively
Conveyer belt drives the second driven voller to follow rotation, to make transport mechanism by chip to be measured toward the transmission of mechanism for testing direction, when waiting for
When survey chip is entered in mechanism for testing, first straight line motor puts down measuring head, and test probe is connect by connecting male and data
The connection female seat for receiving plate is connected, and to make test probe be fixedly mounted on data reception board bottom, connecting male and connection are female
The installation connection type of seat is also very easy to disassemble, can be used for replacing the test probe of corresponding chip to be measured, meets different shaped
The testing requirement of number chip, test probe are connected with the pin of chip to be measured, measure the electric leakage fluxion of the pin of chip to be measured
According to A/D of the leakage data through multi-channel analog selecting switch and data line feeding control module in data reception board turns
Parallel operation is handled, and judges whether the leakage data of pin is up to standard, to judge chip to be measured for non-defective unit or waste product, same to time control
Molding block will judge that result sends electron sliding block, when chip to be measured enters in mechanism for sorting, second straight line motor accordingly
Adsorption head is put down, vacuum pump generates negative pressure of vacuum at vacuum cup, adsorbs chip to be measured by vacuum cup, electronics is slided
Root tuber is moved toward the mobile or past collecting receptacle direction in non-defective unit case direction accordingly according to the judgement result of control module, and then vacuum pump is put
Gas makes vacuum cup discharge chip to be measured, to which chip to be measured is put into non-defective unit case or collecting receptacle, automation and intelligence degree
Height greatly reduces hand labor intensity, improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency,
Its is simple in sturcture, ingenious in design, and accuracy of detection is high, fast response time, stability and good reliability, have good practicability and
Scalability can be widely used in other occasions of chip testing.
Description of the drawings
Fig. 1 is a kind of structural schematic diagram of the electric leakage current test system of chip according to the present invention.
Fig. 2 is the connection signal of the chip support plate and rib of a kind of electric leakage current test system of chip according to the present invention
Figure.
Fig. 3 is a kind of Facad structure signal of the transport mechanism of the electric leakage current test system of chip according to the present invention
Figure.
Fig. 4 is a kind of Facad structure signal of the mechanism for testing of the electric leakage current test system of chip according to the present invention
Figure.
Fig. 5 is a kind of structural schematic diagram of the measuring head of the electric leakage current test system of chip according to the present invention.
Fig. 6 is a kind of Facad structure signal of the mechanism for sorting of the electric leakage current test system of chip according to the present invention
Figure.
Fig. 7 is the connection signal of the electronics sliding block and guide rail of a kind of electric leakage current test system of chip according to the present invention
Figure.
Fig. 8 is a kind of internal structure schematic diagram of the adsorption head of the electric leakage current test system of chip according to the present invention.
Fig. 9 is a kind of fundamental diagram of the electric leakage current test system of chip according to the present invention.
Specific implementation mode
Embodiment according to the present invention is described in further details below in conjunction with the accompanying drawings.
In conjunction with Fig. 1~Fig. 9, a kind of electric leakage current test system of chip, including pedestal 1, pedestal 1 are U-shaped structure, pedestal 1
A vertical part on connect the first side plate 2, the second side plate 3, the first side plate 2 and the second side are connected on another vertical part of pedestal 1
Plate 3 is horizontal opposite, and the first electric rotating machine 12 and the second electric rotating machine 13, the first electric rotating are respectively equipped on the transverse part of pedestal 1
Machine 12 and the second electric rotating machine 13 it is opposite positioned at the transverse part both ends of pedestal 1, the first rotary shaft 14 of the first electric rotating machine 12 is passed through
It wears a vertical part of pedestal 1 and stretches out outside a vertical part of pedestal 1, the second rotary shaft 16 of the second electric rotating machine 13 runs through pedestal
1 another vertical part is simultaneously stretched out outside another vertical part of pedestal 1, and transport mechanism is equipped between the first side plate 2 and the second side plate 3,
Transport mechanism includes the first driven voller 4 and the second driven voller 5, and one end of the first driven voller 4 through one end of the first side plate 2 and is stretched
Go out outside the first side plate 2, the other end of the first driven voller 4 is through one end of the second side plate 3 and stretches out outside the second side plate 3, second from
Outside the other end and the first side plate 2 of stretching of the first side plate 2, the other end of the second driven voller 5 runs through second for one end of dynamic roller 5
The other end of side plate 3 simultaneously stretches out outside the second side plate 3, stretch out in the first rotary shaft 14 and first outside a vertical part of pedestal 1 from
It is equipped with the first tightening belt 15 between dynamic roller 4, stretches out in the second rotary shaft 16 outside another vertical part of pedestal 1 and first driven
It is equipped with the second tightening belt 17 between roller 4, conveyer belt 6 is equipped between the first driven voller 4 and the second driven voller 5, is set on conveyer belt 6
Have a pair of of rib 7, a pair of of rib 7 it is opposite positioned at the both sides of conveyer belt 6, the inside of rib 7 is equipped with slot 8, a pair of of rib 7 it
Between be equipped with chip support plate 9, the both sides of chip support plate 9 are equipped with inserted block 10, and inserted block 10 is corresponding with slot 8, chip support plate 9 and rib
7 are connected by inserted block 10 with slot 8, and the upper surface of chip support plate 9 is equipped with several placing grooves 11, and placing groove 11 is located at chip load
On the central axes of plate 9, conveyer belt 6 is equipped with mechanism for testing, and mechanism for testing includes testing jig 18, and testing jig 18 is inverted U-shaped structure,
One vertical part of testing jig 18 is connected with the first side plate 2, another vertical part of testing jig 18 is connected with the second side plate 3, surveys
Try to be equipped with control module 19 in the transverse part of frame 18, the transverse part bottom side of testing jig 18 it is placed in the middle be equipped with first straight line motor 20, first
The end connecting test head of first telescopic rod 21 of linear motor 20, measuring head include data reception board 22, data reception board 22
Interior to be equipped with multi-channel analog selecting switch 23, the bottom of data reception board 22 is equipped with the connection female seat 24 being recessed inwardly, multi-channel analog
Selecting switch 23 is electrically connected with female seat 24 is connect, and multi-channel analog selecting switch 23 passes through data line 25 and control module 19
It is electrically connected, the bottom of data reception board 22 connects line collecting plate 26, and the bottom of line collecting plate 26 is equipped with several test probes 27, test
The position of probe 27 and quantity are corresponding with the pin of chip to be measured, and the top of line collecting plate 26 is equipped with connecting male 28, and connection is public
Seat 28 is corresponding with connection female seat 24, and line collecting plate 26 is connected by connecting male 28 with female seat 24 is connect with data reception board 22
It connects, test probe 27 and connecting male 28 are electrically connected, and are additionally provided with mechanism for sorting on conveyer belt 6, and mechanism for sorting is close to described the
Two driven vollers 5, mechanism for sorting include non-defective unit case 29 and collecting receptacle 30, and non-defective unit case 29 is connected with the outside of the first side plate 2, waste product
Case 30 is connected with the outside of the second side plate 3, and sorting frame 31 is equipped between non-defective unit case 29 and collecting receptacle 30, and sorting frame 31 is also to fall
One vertical part of U-shaped structure, sorting frame 31 is connected with the outside of non-defective unit case 29, another vertical part of sorting frame 31 and collecting receptacle
30 outside is connected, and the transverse part bottom side of sorting frame 31 is equipped with the guide rail 33 being recessed inwardly, and guide rail 33 is embedded with electronics sliding block 32,
In guide rail 33 slidably, the bottom of electronics sliding block 32 is equipped with second straight line motor 34, second straight line motor 34 to electronics sliding block 32
The end of the second telescopic rod 35 connect adsorption head, adsorption head includes absorptive table 36 and vacuum cup 37, and absorptive table 36 is hollow
Structure, absorptive table 36 include shell, and the top outer of shell is connected with the second telescopic rod 35, and the inside top of shell is equipped with very
Sky pump 38, the vacuum tube 39 of vacuum pump 38 run through the bottom of shell, and the bottom of shell is connected with vacuum cup 37, vacuum tube 39
It is connected with vacuum cup 37, test probe 27 passes through 25 link control module of multi-channel analog selecting switch 23 and data line
The output end of 19 input terminal, control module 19 is separately connected the first electric rotating machine 12, the second electric rotating machine 13, first straight line electricity
Machine 20, second straight line motor 34, electronics sliding block 32 and vacuum pump 38, external power supply provides operating voltage for system.
The alignment of inserted block 10 of chip support plate 9 is inserted into the slot 8 of rib 7, to which chip support plate 9 is fixed on conveyer belt
The upper surface of 6, make chip support plate 9 that conveyer belt 6 be followed to move together.Inserted block 10 and the installation connection type of slot 8 are highly convenient for tearing open
Dress, it is time saving and energy saving, meet the testing requirement of different model chip.
By in the chip front side to be measured placing groove 11 directed downwardly for being put into chip support plate 9, that is, make the pin court of chip to be measured
On.External power supply is connected, system is made to enter working condition.Control module 19 exports two-way synchronous control signal control first respectively
Electric rotating machine 12 and the work of the second electric rotating machine 13, the first electric rotating machine 12 drive the rotation of the first rotary shaft 14, the second electric rotating
Machine 13 drives the rotation of the second rotary shaft 16, and the first rotary shaft 14 and the second rotary shaft 16 pass through the first tightening belt 15 and the respectively
Two tightening belts 17 drive the rotation of the first driven voller 4 simultaneously, the first driven voller 4 further through conveyer belt 6 drive the second driven voller 5 with
With rotation, to make transport mechanism be moved toward mechanism for testing direction, by the chip support plate 9 on conveyer belt 6 toward mechanism for testing direction
Transmission.First electric rotating machine 12 and the second electric rotating machine 13 select RS-380SH type stepper motors, can very easily set
The step frequency of electric rotating machine, to adjust the speed of rotation of rotary shaft, to adjust the transfer rate of transport mechanism.
When chip to be measured enters in mechanism for testing, control module 19 controls first straight line motor 20 and works, the first telescopic rod
21 put down the measuring head of end.The lead harness for testing probe 27 comes together in connecting male 28 by line collecting plate 26, and test is visited
Needle 27 is fixedly linked by connecting male 28 and the connection female seat 24 of data reception board 22, connecting male 28 with connect female seat 24
Installation connection type is also very easy to disassemble, can be used for replacing the test probe 27 of different chips to be measured, meets different model
The testing requirement of chip.Connecting male 28 and connection female seat 24 are made of carbon fibre material, and carbon fiber axle is to intensity and modulus
Height, density is low, higher than performance, no creep, and superhigh temperature resistant under non-oxidizing atmosphere, fatigue performance is good, and coefficient of thermal expansion is small and has
There are anisotropy, good corrosion resistance, good conductive and heat-conductive and electromagnetism performance tired out, can repeatedly plug, service life is lasting.
Measuring head is put down by first straight line motor 20, and the test probe 27 of bottom is pressed against above the pin of chip to be measured,
To make the pin of chip to be measured form test loop with test probe 27, the pin of chip to be measured is measured by test probe 27
Leakage data.Multi-channel analog selecting switch 23 in data reception board 22 gates the test leakage data for testing probe 27
It receives, multi-channel analog selecting switch 23 selects 16 path analoging switch CD4067, can meet exhausted simultaneously by 16 tunnel leakage datas
The testing requirement of most of chip.Multi-channel analog selecting switch 23 is connected by data line 25 with control module 19, leakage
Current data is admitted to the analog signal input channel of control module 19 through multi-channel analog selecting switch 23 and data line 25.
A/D converter built in the analog signal input channel of control module 19 carries out analog-to-digital conversion process to leakage data, and judges
Whether leakage data is up to standard.If the leakage data of one of chip to be measured pin is not up to standard, control module 19 is sentenced
The fixed chip to be measured is waste product, and otherwise control module 19 judges that the chip to be measured is non-defective unit, and control module 19 will judge that result passes
The electronics sliding block 32 of mechanism for sorting is given to sort out non-defective unit and waste product.
When chip to be measured enters in mechanism for sorting, control module 19 controls second straight line motor 34 and works, the second telescopic rod
35 put down the adsorption head of end.The initial position of setting electronics sliding block 32 is located at the centre of guide rail 33, when adsorption head is put down,
The vacuum cup 37 of bottom is just pressed against chip top to be measured.Control module 19 controls vacuum pump 38 and works, and can quickly lead to
It crosses vacuum tube 39 and forms negative pressure of vacuum at vacuum cup 37, so that chip to be measured firmly be adsorbed, then second straight line
The revolution of motor 34 makes the second telescopic rod 35 reset, thus by chip to be measured from absorption in placing groove 11.32 basis of electronics sliding block
The judgement result of control module 19 is moved toward mobile or past 30 direction of collecting receptacle in 29 direction of non-defective unit case, when electronics sliding block 32 moves
When to 29 top of non-defective unit case or 30 top of collecting receptacle, the deflation of vacuum pump 38 makes vacuum cup 37 discharge chip to be measured, thus will
Chip to be measured is put into non-defective unit case 29 or collecting receptacle 30, realizes the sorting of chip to be measured.Vacuum pump 38 selects minipump,
Have many advantages, such as compact, oil-free environmental protection, low noise, it is non-maintaining, can operate within continuous 24 hours.Vacuum cup 37 is selected soft
Silica gel material is made, and can be tightly fit with chip to be measured has better adsorption effect, improve adsorption efficiency.It will be electric
The displacement distance for reducing electronics sliding block 32 in the centre of guide rail 33 is arranged in the initial position of sub- sliding block 32, decreases electronics
The power consumption of sliding block 32, improves sorting efficiency.
Control module 19 handles the input detection signal for testing probe 27, respectively output control signal control first
Electric rotating machine 12, the second electric rotating machine 13, first straight line motor 20, second straight line motor 34, electronics sliding block 32 and vacuum pump 38
It works.In order to simplify circuit, cost is reduced, the scalability in system later stage is improved, control module 19 selects 16 monolithics
The EEPROM of the RAM and 2KB of machine MC95S12DJ128, Flash, 8KB of built-in 128KB have 5V inputs and driving capability,
CPU working frequencies can reach 50MHz.The independent number I/O interfaces in 29 tunnels, 20 road bands interrupt and the digital I/O of arousal function connects
Mouthful, 10 A/D converters in 28 channels, input capture/output with 8 channels is compared, and also has 8 programmable PWM logical
Road.With 2 serial asynchronous communication interface SCI, 2 synchronous serial Peripheral Interface SPI, I2C buses and CAN function modules etc.,
Meet design requirement.
The present invention provides a kind of electric leakage current test system of chip, chip support plate is put by chip front side to be measured is directed downwardly
Placing groove in, chip support plate is connected by the inserted block of both sides with the slot of rib, to it is fixed on a moving belt with transmission
Band moves together, and the installation connection type of inserted block and slot is highly convenient for dismounting, time saving and energy saving, meets different model chip
Testing requirement, control module control the first electric rotating machine and the second electric rotating machine synchronous working, the first electric rotating machine and the second rotation
Rotating motor drives the rotation of the first driven voller, the first driven voller to pass through simultaneously by the first tightening belt and the second tightening belt respectively
Conveyer belt drives the second driven voller to follow rotation, to make transport mechanism by chip to be measured toward the transmission of mechanism for testing direction, when waiting for
When survey chip is entered in mechanism for testing, first straight line motor puts down measuring head, and test probe is connect by connecting male and data
The connection female seat for receiving plate is connected, and to make test probe be fixedly mounted on data reception board bottom, connecting male and connection are female
The installation connection type of seat is also very easy to disassemble, can be used for replacing the test probe of corresponding chip to be measured, meets different shaped
The testing requirement of number chip, test probe are connected with the pin of chip to be measured, measure the electric leakage fluxion of the pin of chip to be measured
According to A/D of the leakage data through multi-channel analog selecting switch and data line feeding control module in data reception board turns
Parallel operation is handled, and judges whether the leakage data of pin is up to standard, to judge chip to be measured for non-defective unit or waste product, same to time control
Molding block will judge that result sends electron sliding block, when chip to be measured enters in mechanism for sorting, second straight line motor accordingly
Adsorption head is put down, vacuum pump generates negative pressure of vacuum at vacuum cup, adsorbs chip to be measured by vacuum cup, electronics is slided
Root tuber is moved toward the mobile or past collecting receptacle direction in non-defective unit case direction accordingly according to the judgement result of control module, and then vacuum pump is put
Gas makes vacuum cup discharge chip to be measured, to which chip to be measured is put into non-defective unit case or collecting receptacle, automation and intelligence degree
Height greatly reduces hand labor intensity, improves testing efficiency, ensure that measuring accuracy, improves production and processing efficiency,
Its is simple in sturcture, ingenious in design, and accuracy of detection is high, fast response time, stability and good reliability, have good practicability and
Scalability can be widely used in other occasions of chip testing.
The above-described embodiments are merely illustrative of preferred embodiments of the present invention, not to the structure of the present invention
Think and range is defined.Under the premise of not departing from design concept of the present invention, technology of the ordinary people in the field to the present invention
The all variations and modifications that scheme is made, should all drop into protection scope of the present invention, the claimed technology contents of the present invention,
It has all recorded in detail in the claims.
Claims (8)
1. a kind of electric leakage current test system of chip, it is characterised in that：Including pedestal, the pedestal is U-shaped structure, the pedestal
A vertical part on connect the first side plate, the second side plate, first side plate and institute are connected on another vertical part of the pedestal
It is horizontal opposite to state the second side plate, and the first electric rotating machine and the second electric rotating machine are respectively equipped on the transverse part of the pedestal, described
First electric rotating machine and second electric rotating machine it is opposite positioned at the transverse part both ends of the pedestal, first electric rotating machine
First rotary shaft is through a vertical part of the pedestal and stretches out outside a vertical part of the pedestal, second electric rotating machine
Second rotary shaft through the pedestal another vertical part and stretch out outside another vertical part of the pedestal, first side plate and
Between second side plate be equipped with transport mechanism, the transport mechanism include the first driven voller and the second driven voller, described first
One end of driven voller is through one end of first side plate and stretches out outside first side plate, the other end of first driven voller
It through one end of second side plate and stretches out outside second side plate, first side is run through in one end of second driven voller
The other end of plate simultaneously stretches out outside first side plate, and the other end of second driven voller runs through the other end of second side plate
And stretch out outside second side plate, stretch out in first rotary shaft outside a vertical part of the pedestal and described first driven
It is equipped with the first tightening belt between roller, stretches out in second rotary shaft and described first outside another vertical part of the pedestal
It is equipped with the second tightening belt between driven voller, conveyer belt is equipped between first driven voller and second driven voller, it is described
Conveyer belt is equipped with a pair of of rib, and a pair of rib is opposite to be set on the inside of the both sides of the conveyer belt, the rib
Have a slot, be equipped with chip support plate between a pair of rib, the both sides of the chip support plate are equipped with inserted block, the inserted block with it is described
Slot is corresponding, and the chip support plate is connected by the inserted block with the slot with the rib, the chip support plate
Upper surface is equipped with several placing grooves, and the placing groove is located on the central axes of the chip support plate, and the conveyer belt, which is equipped with, to be surveyed
Test-run a machine structure, the mechanism for testing include testing jig, and the testing jig is inverted U-shaped structure, a vertical part of the testing jig and institute
It states the first side plate to be connected, another vertical part of the testing jig is connected with second side plate, the transverse part of the testing jig
It is interior to be equipped with control module, the transverse part bottom side of the testing jig it is placed in the middle be equipped with first straight line motor, the first straight line motor
The end connecting test head of first telescopic rod, the measuring head includes data reception board, and multichannel is equipped in the data reception board
Analog selection switchs, and the bottom of the data reception board is equipped with the connection female seat being recessed inwardly, the multi-channel analog selecting switch
It is electrically connected with the connection female seat, the multi-channel analog selecting switch is electrically connected by data line and the control module
It connects, the bottom of the data reception board connects line collecting plate, and the bottom of the line collecting plate is equipped with several test probes, and the test is visited
The position of needle and quantity are corresponding with the pin of chip to be measured, and the top of the line collecting plate is equipped with connecting male, and the connection is public
Seat is corresponding with the connection female seat, and the line collecting plate is female by the connecting male and the connection with the data reception board
Seat is connected, the electric connection of the test probe and the connecting male, is additionally provided with mechanism for sorting on the conveyer belt, described point
Mechanism is picked close to second driven voller, the mechanism for sorting includes non-defective unit case and collecting receptacle, the non-defective unit case and described first
It is connected on the outside of side plate, is connected on the outside of the collecting receptacle and second side plate, the non-defective unit case and the collecting receptacle
Between be equipped with sorting frame, the sorting frame also be inverted U-shaped structure, the outside of the vertical part and the non-defective unit case of the sorting frame
It is connected, is connected on the outside of another vertical part of the sorting frame and the collecting receptacle, the transverse part bottom side of the sorting frame is set
Have a guide rail being recessed inwardly, the guide rail is embedded with electronics sliding block, the electronics sliding block in the guide rail slidably, the electricity
The bottom of sub- sliding block is equipped with second straight line motor, and the end of the second telescopic rod of the second straight line motor connects adsorption head, institute
It includes absorptive table and vacuum cup to state adsorption head, and the absorptive table is hollow structure, and the absorptive table includes shell, the shell
Top outer be connected with second telescopic rod, the inside top of the shell is equipped with vacuum pump, the vacuum pump it is true
Blank pipe runs through the bottom of the shell, and the bottom of the shell is connected with the vacuum cup, the vacuum tube with it is described very
Suction disk is connected, and the test probe connects the control by the multi-channel analog selecting switch with the data line
The output end of the input terminal of module, the control module is separately connected first electric rotating machine, second electric rotating machine, institute
It states first straight line motor, the second straight line motor, the electronics sliding block and the vacuum pump, external power supply and provides work for system
Make voltage.
2. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：First electric rotating machine
RS-380SH type stepper motors are selected with second electric rotating machine.
3. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：The multi-channel analog selection
Switch selects 16 path analoging switch CD4067.
4. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：The connection female seat and institute
Connecting male is stated to be made of carbon fibre material.
5. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：At the beginning of the electronics sliding block
Beginning position is located at the centre of the guide rail.
6. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：The vacuum pump is selected micro-
Type vacuum pump.
7. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：The vacuum cup is selected
Soft silica gel material is made.
8. a kind of electric leakage current test system of chip according to claim 1, it is characterised in that：The control module is selected
16 microcontroller MC95S12DJ128.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810496117.1A CN108490306A (en) | 2018-05-22 | 2018-05-22 | A kind of electric leakage current test system of chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810496117.1A CN108490306A (en) | 2018-05-22 | 2018-05-22 | A kind of electric leakage current test system of chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108490306A true CN108490306A (en) | 2018-09-04 |
Family
ID=63351708
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810496117.1A Withdrawn CN108490306A (en) | 2018-05-22 | 2018-05-22 | A kind of electric leakage current test system of chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108490306A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116660589A (en) * | 2023-05-23 | 2023-08-29 | 深圳市凌科凯特电子有限公司 | Test fixture and test structure of automobile-used well accuse circuit board |
-
2018
- 2018-05-22 CN CN201810496117.1A patent/CN108490306A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116660589A (en) * | 2023-05-23 | 2023-08-29 | 深圳市凌科凯特电子有限公司 | Test fixture and test structure of automobile-used well accuse circuit board |
| CN116660589B (en) * | 2023-05-23 | 2024-01-23 | 深圳市凌科凯特电子有限公司 | Test fixture and test structure of automobile-used well accuse circuit board |
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Application publication date: 20180904 |