CN220438490U - Testing device capable of simultaneously testing multiple chips to be tested - Google Patents
Testing device capable of simultaneously testing multiple chips to be tested Download PDFInfo
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- CN220438490U CN220438490U CN202321866081.4U CN202321866081U CN220438490U CN 220438490 U CN220438490 U CN 220438490U CN 202321866081 U CN202321866081 U CN 202321866081U CN 220438490 U CN220438490 U CN 220438490U
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- 238000012360 testing method Methods 0.000 title claims abstract description 61
- 238000001514 detection method Methods 0.000 claims abstract description 39
- 238000009434 installation Methods 0.000 claims abstract description 22
- 239000000523 sample Substances 0.000 claims abstract description 14
- 230000000694 effects Effects 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000010030 laminating Methods 0.000 description 4
- 230000002349 favourable effect Effects 0.000 description 3
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
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Abstract
The utility model discloses a testing device capable of simultaneously testing a plurality of chips to be tested, and relates to the technical field of chip testing. This but testing arrangement of a plurality of chips that await measuring of simultaneous testing, including base, first fixed knot constructs and second fixed knot constructs, the top welded mounting of base has the support, welded mounting has the installation pole on the support, the top of base is provided with the casing, installation pole and casing fixed connection, the inside of casing is provided with the detection case, the inboard top fixed mounting of casing has electric putter, electric putter's free end and detection case fixed connection, the detection case is two sets of and for corresponding the setting, the inside of detection case is provided with the detection lid, the bottom of detection lid is connected with the probe, be provided with conveyer on the base, the multiunit test seat has been placed on the conveyer, the inside of test seat is provided with two sets of fixing bases. The device can test a plurality of chips to be tested simultaneously, can also fix the chips, improves the detection effect.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to a testing device capable of simultaneously testing a plurality of chips to be tested.
Background
The development of the emerging electronic information technology depends on the continuous pushing of the semiconductor industry, and a chip is used as a core technology, so that the chip is more and more frequently and important, and is generally an integrated circuit carrier, and is formed by separating wafers, and also refers to the result of the integrated circuit after being designed, manufactured, packaged and tested, and after the chip is produced in a large scale, the basic function of the chip needs to be detected.
Application number CN202020577858.5, a testing device capable of testing a plurality of chips to be tested simultaneously, comprising: the conveying mechanism is provided with a plurality of test seats for placing chips to be tested; the test mechanism is arranged at the upper end of the conveying mechanism and comprises a stroke cylinder and a test cover arranged on the stroke cylinder, a probe connected with the test box is arranged on the test cover, and the probe is matched with each pin of the chip to be tested and is used for testing the performance of the chip to be tested; and the unloading mechanism comprises a picking mechanism for picking the chip to be tested and a power mechanism for driving the picking mechanism to move from the picking area to the unloading area.
According to the device, the stroke cylinder drives the test cover, so that the probe on the test cover is in contact with the pins of the chip to be tested, automatic production is realized, and meanwhile, a plurality of chips to be tested are tested, so that the improvement of production efficiency is facilitated; but when the chip is transported, no fixing structure is used for fixing the chip, so that the chip possibly appears unstable in the transportation process, thereby influencing the subsequent detection and being unfavorable for use.
Disclosure of Invention
The present utility model is directed to a testing device capable of simultaneously testing a plurality of chips to be tested, so as to solve the problems set forth in the background art.
In order to achieve the above purpose, the present utility model provides the following technical solutions: a testing device capable of simultaneously testing a plurality of chips to be tested comprises a base, a first fixing structure and a second fixing structure:
the top of the base is welded with a bracket, the bracket is welded with a mounting rod, a shell is arranged above the base, the mounting rod is fixedly connected with the shell, a detection box is arranged in the shell, an electric push rod is fixedly arranged at the top of the inner side of the shell, the free ends of the electric push rods are fixedly connected with the detection boxes, the two groups of detection boxes are correspondingly arranged, a detection cover is arranged in the detection boxes, the bottom of the detection cover is connected with a probe, a conveying device is arranged on the base, a plurality of groups of test seats are arranged on the conveying device, and two groups of fixing seats are arranged in the test seats;
the first fixing structure is positioned in the fixing seat and comprises a connecting seat, a sliding rod, a sliding block, a spring and a fixing plate;
the second fixed knot constructs the inside that is located the fixing base, and second fixed knot constructs including mount pad, first installation piece, second installation piece, first vaulting pole and second vaulting pole.
Preferably, the inside bottom fixed mounting of fixing base has the connecting seat, and the adjacent inner wall fixed mounting of connecting seat has the slide bar, and slidable mounting has two sets of sliders on the slide bar, and the top fixed mounting of slider has the fixed plate.
Preferably, the slide bar is sleeved with two groups of springs, and the free ends of the two groups of springs are attached to the slide block.
Preferably, the fixing plate is provided with a groove, and the chip is arranged in the groove of the fixing plate to prevent the chip from displacement.
Preferably, the adjacent inner wall fixed mounting of fixing base has the mount pad, and the spout has been seted up to the inside of mount pad, and sliding mounting has two sets of second installation pieces in the spout, has seted up the spout in the fixed plate, and sliding mounting has two sets of first installation pieces in the spout, further improves fixed effect.
Preferably, the first mounting block and the second mounting block are mutually hinged with a first stay bar and a second stay bar.
Compared with the prior art, the utility model has the beneficial effects that:
(1) This but testing arrangement of a plurality of chips that await measuring of simultaneous test uses through the cooperation of detecting case, electric putter, detection lid, probe and test seat for probe and chip pin laminating, thereby detect the work, the device can test a plurality of chips that await measuring simultaneously, is favorable to production efficiency's improvement, sets up the recess through the fixed plate, conveniently fixes a position the chip, avoids appearing being located the phenomenon.
(2) This testing arrangement that can test a plurality of chips that await measuring simultaneously uses through the cooperation of connecting seat, slide bar, slider, spring and fixed plate, fixes the chip, improves the stability of chip operation, makes things convenient for subsequent detection work.
(3) This testing arrangement that can test a plurality of chips that await measuring simultaneously uses through mount pad, first installation piece, second installation piece, first vaulting pole and second vaulting pole's cooperation, further fixes the chip, further improves the stability of chip, excellent in use effect.
Drawings
FIG. 1 is a schematic diagram of the structure of the present utility model;
FIG. 2 is a schematic diagram of a test socket according to the present utility model;
FIG. 3 is an enlarged schematic view of portion A of the present utility model;
fig. 4 is an enlarged schematic view of the portion B in the present utility model.
In the figure: 1 base, 2 support, 3 installation pole, 4 casing, 5 detection case, 6 electric putter, 7 detection lid, 8 probe, 9 test seat, 10 fixing base, 11 first fixed knot construct, 1101 connecting seat, 1102 slide bar, 1103 slider, 1104 spring, 1105 fixed knot constructs, 12 second fixed knot constructs, 1201 mount pad, 1202 first installation piece, 1203 second installation piece, 1204 first vaulting pole, 1205 second vaulting pole.
Detailed Description
Reference will now be made in detail to the present embodiments of the present utility model, examples of which are illustrated in the accompanying drawings, wherein the accompanying drawings are used to supplement the description of the written description so that one can intuitively and intuitively understand each technical feature and overall technical scheme of the present utility model, but not to limit the scope of the present utility model.
In the description of the present utility model, it should be understood that references to orientation descriptions such as upper, lower, front, rear, left, right, etc. are based on the orientation or positional relationship shown in the drawings, are merely for convenience of description of the present utility model and to simplify the description, and do not indicate or imply that the apparatus or elements referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present utility model.
In the description of the present utility model, greater than, less than, exceeding, etc. are understood to exclude this number, and above, below, within, etc. are understood to include this number. The description of the first and second is for the purpose of distinguishing between technical features only and should not be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated or implicitly indicating the precedence of the technical features indicated.
In the description of the present utility model, unless explicitly defined otherwise, terms such as arrangement, installation, connection, etc. should be construed broadly and the specific meaning of the terms in the present utility model can be reasonably determined by a person skilled in the art in combination with the specific contents of the technical scheme.
Referring to fig. 1-4, the present utility model provides a technical solution: the utility model provides a testing arrangement that can test a plurality of chips that await measuring simultaneously, including base 1, first fixed knot constructs 11 and second fixed knot construct 12, the top welded mounting of base 1 has support 2, welded mounting has installation pole 3 on the support 2, the top of base 1 is provided with casing 4, installation pole 3 and casing 4 fixed connection, the inside of casing 4 is provided with detection case 5, the inboard top fixed mounting of casing 4 has electric putter 6, electric putter 6's free end and detection case 5 fixed connection, detection case 5 is two sets of and for corresponding the setting, detection case 5's inside is provided with detection lid 7, detection lid 7's bottom is connected with probe 8, drive electric putter 6, electric putter 6 drives detection case 5 and descends, detection case 5 descends to drive probe 8, make probe 8 and chip pin laminating, thereby detect the work, the device can test a plurality of chips that await measuring simultaneously, be favorable to production efficiency's improvement.
The base 1 is provided with a conveying device, and it should be noted that the conveying device belongs to the prior art, and the internal structure and the working principle thereof are not repeated.
The conveyer is last to have placed multiunit test seat 9, the inside of test seat 9 is provided with two sets of fixing bases 10, first fixed knot constructs 11 and is located the inside of fixing base 10, first fixed knot constructs 11 and includes connecting seat 1101, slide bar 1102, slider 1103, spring 1104 and fixed plate 1105, connecting seat 1101 is fixedly installed to the inboard bottom of fixing base 10, adjacent inner wall fixed mounting of connecting seat 1101 has slide bar 1102, slidable mounting has two sets of sliders 1103 on the slide bar 1102, the cover is equipped with two sets of springs 1104 on the slide bar 1102, the free end and the slider 1103 laminating of two sets of springs 1104 set up, the top fixed mounting of slider 1103 has fixed plate 1105, set up flutedly on the fixed plate 1105, the chip is arranged in the recess of fixed plate 1105, set up the flutedly through the fixed plate 1105, the convenience is located the chip, avoid appearing being located the phenomenon, pulling fixed plate 1105, fixed plate 1105 drives slider 1103 lateral shifting, slider 1103 lateral shifting compression spring 1104, make the fixed plate fixes the chip, improve the stability of chip operation, the convenience follow-up detection work.
The second fixed knot constructs 12 and is located the inside of fixing base 10, second fixed knot constructs 12 and includes mount pad 1201, first installation piece 1202, second installation piece 1203, first vaulting pole 1204 and second vaulting pole 1205, the adjacent inner wall fixed mounting of fixing base 10 has mount pad 1201, the spout has been seted up to the inside of mount pad 1201, sliding mounting has two sets of second installation pieces 1203 in the spout, the spout has been seted up in the fixed plate 1105, sliding mounting has two sets of first installation pieces 1202 in the spout, first installation piece 1202, articulated each other on the second installation piece 1203 has first vaulting pole 1204 and second vaulting pole 1205, fixed plate 1105 lateral shifting drives first vaulting pole 1204 and second vaulting pole 1205 and takes place the position change, further fix the chip, further improve the stability of chip, excellent in use effect.
When the chip detection device is used, the fixing plate 1105 is pulled, the fixing plate 1105 drives the sliding block 1103 to transversely move, and the sliding block 1103 transversely moves the compression spring 1104, so that the fixing plate 1105 fixes the chip, the running stability of the chip is improved, and the subsequent detection work is facilitated;
the fixing plate 1105 moves transversely and drives the first stay 1204 and the second stay 1205 to change in position, so that the chip is further fixed;
the electric putter 6 is driven, and electric putter 6 drives detection case 5 and descends, and detection case 5 descends and drives detection lid 7 and descend, and detection lid 7 descends and drives probe 8 and descend for probe 8 and chip pin laminating, thereby detect the work, the device can test a plurality of chips that await measuring simultaneously, is favorable to production efficiency's improvement.
Claims (6)
1. The utility model provides a testing arrangement that can test a plurality of chips that await measuring simultaneously, includes base (1), first fixed knot structure (11) and second fixed knot structure (12), its characterized in that:
the device is characterized in that a support (2) is welded and installed at the top of the base (1), a mounting rod (3) is welded and installed on the support (2), a shell (4) is arranged above the base (1), the mounting rod (3) is fixedly connected with the shell (4), a detection box (5) is arranged inside the shell (4), an electric push rod (6) is fixedly installed at the top of the inner side of the shell (4), the free end of the electric push rod (6) is fixedly connected with the detection box (5), the detection boxes (5) are two groups and are correspondingly arranged, a detection cover (7) is arranged inside the detection box (5), a probe (8) is connected to the bottom of the detection cover (7), a conveying device is arranged on the base (1), a plurality of groups of test seats (9) are arranged on the conveying device, and two groups of fixing seats (10) are arranged inside the test seats (9);
the first fixing structure (11) is positioned in the fixing seat (10), and the first fixing structure (11) comprises a connecting seat (1101), a sliding rod (1102), a sliding block (1103), a spring (1104) and a fixing plate (1105);
the second fixing structure (12) is located inside the fixing seat (10), and the second fixing structure (12) comprises a mounting seat (1201), a first mounting block (1202), a second mounting block (1203), a first stay bar (1204) and a second stay bar (1205).
2. The test device for simultaneously testing a plurality of chips according to claim 1, wherein: the fixing seat is characterized in that a connecting seat (1101) is fixedly arranged at the bottom of the inner side of the fixing seat (10), sliding rods (1102) are fixedly arranged on the adjacent inner walls of the connecting seat (1101), two groups of sliding blocks (1103) are slidably arranged on the sliding rods (1102), and a fixing plate (1105) is fixedly arranged at the top of each sliding block (1103).
3. The test device for simultaneously testing a plurality of chips according to claim 2, wherein: two groups of springs (1104) are sleeved on the sliding rod (1102), and the free ends of the two groups of springs (1104) are attached to the sliding block (1103).
4. A test apparatus for simultaneously testing a plurality of chips to be tested according to claim 3, wherein: the fixing plate (1105) is provided with a groove, and the chip is arranged in the groove of the fixing plate (1105).
5. The test device for simultaneously testing a plurality of chips according to claim 1, wherein: adjacent inner wall fixed mounting of fixing base (10) has mount pad (1201), and the spout has been seted up to the inside of mount pad (1201), and sliding mounting has two sets of second installation pieces (1203) in the spout, has seted up the spout in fixed plate (1105), and sliding mounting has two sets of first installation pieces (1202) in the spout.
6. The test device for simultaneously testing a plurality of chips according to claim 5, wherein: the first mounting block (1202) and the second mounting block (1203) are mutually hinged with a first stay bar (1204) and a second stay bar (1205).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321866081.4U CN220438490U (en) | 2023-07-17 | 2023-07-17 | Testing device capable of simultaneously testing multiple chips to be tested |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321866081.4U CN220438490U (en) | 2023-07-17 | 2023-07-17 | Testing device capable of simultaneously testing multiple chips to be tested |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN220438490U true CN220438490U (en) | 2024-02-02 |
Family
ID=89687677
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321866081.4U Active CN220438490U (en) | 2023-07-17 | 2023-07-17 | Testing device capable of simultaneously testing multiple chips to be tested |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN220438490U (en) |
-
2023
- 2023-07-17 CN CN202321866081.4U patent/CN220438490U/en active Active
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