CN206193135U - 指纹模组测试机 - Google Patents
指纹模组测试机 Download PDFInfo
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- CN206193135U CN206193135U CN201621105083.1U CN201621105083U CN206193135U CN 206193135 U CN206193135 U CN 206193135U CN 201621105083 U CN201621105083 U CN 201621105083U CN 206193135 U CN206193135 U CN 206193135U
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106291208A (zh) * | 2016-10-08 | 2017-01-04 | 深圳格兰达智能装备股份有限公司 | 指纹模组测试机 |
CN107656162A (zh) * | 2017-10-27 | 2018-02-02 | 昆山精讯电子技术有限公司 | 一种指纹识别模组测试装置 |
CN107861043A (zh) * | 2017-09-26 | 2018-03-30 | 广东利扬芯片测试股份有限公司 | 触控芯片电性测试装置、设备及测试方法 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106291208A (zh) * | 2016-10-08 | 2017-01-04 | 深圳格兰达智能装备股份有限公司 | 指纹模组测试机 |
CN107861043A (zh) * | 2017-09-26 | 2018-03-30 | 广东利扬芯片测试股份有限公司 | 触控芯片电性测试装置、设备及测试方法 |
CN107861043B (zh) * | 2017-09-26 | 2020-05-19 | 广东利扬芯片测试股份有限公司 | 触控芯片电性测试装置、设备及测试方法 |
CN107656162A (zh) * | 2017-10-27 | 2018-02-02 | 昆山精讯电子技术有限公司 | 一种指纹识别模组测试装置 |
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Legal Events
Date | Code | Title | Description |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Lin Yilong Inventor after: Chen Wei Inventor after: Liu Fei Inventor after: Cai Deen Inventor before: Lin Yilong |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20230407 Address after: Building 2, Building 2, No. 33 Cuijing Road, Zhukeng Community, Longtian Street, Pingshan District, Shenzhen City, Guangdong Province, 518000, Building 101 to 701, Granda Equipment Industrial Park Factory Patentee after: Shenzhen Granda Precision Machinery Co.,Ltd. Address before: 518000 Granda equipment Industrial Park, 33 Cuijing Road, Pingshan new area, Shenzhen City, Guangdong Province Patentee before: SHENZHEN GRAND INTELLIGENT EQUIPMENT Co.,Ltd. |