CN204405705U - For device and the cradle thereof of chip testing - Google Patents
For device and the cradle thereof of chip testing Download PDFInfo
- Publication number
- CN204405705U CN204405705U CN201420866281.4U CN201420866281U CN204405705U CN 204405705 U CN204405705 U CN 204405705U CN 201420866281 U CN201420866281 U CN 201420866281U CN 204405705 U CN204405705 U CN 204405705U
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- CN
- China
- Prior art keywords
- conductive contact
- contact blade
- row
- cradle
- chip
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn - After Issue
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Abstract
The utility model relates to device for chip testing and cradle thereof.A kind of cradle for chip testing comprises: substrate; First row conductive contact blade, it to be arranged on described substrate and to comprise multiple conductive contact blade be arranged in parallel; Second row conductive contact blade, it to be arranged on described substrate and to comprise multiple conductive contact blade be arranged in parallel, and aligns with described first row conductive contact blade; At least onely arrange the 3rd conductive contact blade, it to be arranged on described substrate and between described first row conductive contact blade and second row conductive contact blade; Described first row conductive contact blade and second row conductive contact blade are configured to the pin being connected chip to be tested, and what described 3rd conductive contact blade was configured to connect chip bottom to be tested exposes pad.In at least part of embodiment of the present utility model, for the pad that exposes of chip to be tested is provided with special measurement circuit, and these measurement circuits are and arrange regularly, avoid the extra all inconvenience manually added circuit and bring.
Description
Technical field
The utility model relates generally to chip package test, more specifically, relates to the device for chip testing and cradle thereof.
Background technology
In chip testing, need each pin of chip to be electrically connected among test circuit.
Utility model content
In some prior art, by card extender, chip is electrically connected at testing circuit board.Traditional chip bottom has and exposes pad, and exposes the setting that pad does not have electric function, and parts chip exposed pad not being electrically connected to by card extender testing circuit board are arranged.And in recent chip design, some chip bottom expose the function setting that pad also has ground connection concurrently, existing testing tool has not met the requirement of application.
There is a kind of needs, to improve existing chip test tool.
In an embodiment of the present utility model, disclose a kind of cradle for chip testing, this cradle comprises: substrate; First row conductive contact blade, it to be arranged on described substrate and to comprise multiple conductive contact blade be arranged in parallel; Second row conductive contact blade, it to be arranged on described substrate and to comprise multiple conductive contact blade be arranged in parallel, and aligns with described first row conductive contact blade; At least onely arrange the 3rd conductive contact blade, it to be arranged on described substrate and between described first row conductive contact blade and second row conductive contact blade; Described first row conductive contact blade and second row conductive contact blade are configured to the pin being connected chip to be tested, and what described 3rd conductive contact blade was configured to connect chip bottom to be tested exposes pad.
In a specific embodiment of above-mentioned cradle, described first row conductive contact blade, second row conductive contact blade, the 3rd conductive contact blade are set to have elasticity.
In a specific embodiment of above-mentioned cradle, described first row conductive contact blade, second row conductive contact blade respectively comprise 4 ~ 16 conductive contact blades.
In a specific embodiment of above-mentioned cradle, described first row conductive contact blade, second row conductive contact blade respectively comprise 8 conductive contact blades.
In a specific embodiment of above-mentioned cradle, described first row conductive contact blade, second row conductive contact blade have projection at phase near-end.
In a specific embodiment of above-mentioned cradle, at least one each row arranged in the 3rd conductive contact blade comprise two conductive contact blades, and described two conductive contact blades have projection at phase near-end.
In a specific embodiment of above-mentioned cradle, described substrate is plastic substrate material.
In another embodiment of the present utility model, disclose a kind of device for chip testing, this device comprises: aforesaid cradle; And card extender, be provided with multiple conductive pin regularly in the side of described card extender, the 3rd conductive contact blade of at least one in described multiple conductive pin and cradle is electrically connected.
In prior art for chip to be tested expose the custom-designed measurement circuit of pad, need additionally manually to add circuit to the test exposing pad, not only operate inconvenience, and the extra circuit added easily is caused the change of electric parameter (such as inductance capacitance etc.) by touching, thus affect the Stability and veracity of chip testing result.
In at least part of embodiment of the present utility model, for the pad that exposes of chip to be tested is provided with special measurement circuit, comprise conductive contact blade and conductive pin, and these measurement circuits are and arrange regularly, avoid the extra all inconvenience manually added circuit and bring.
Accompanying drawing explanation
By reference to the accompanying drawings, will be easier to understand about the detailed description of preferred embodiment of the present utility model below.The utility model is explained by way of example, is not limited to accompanying drawing, and Reference numeral similar in accompanying drawing indicates similar element.
Fig. 1 shows the schematic perspective view of the cradle 100 for chip testing in an embodiment;
Fig. 2 A shows chip 130 support in the schematic perspective view of cradle 100;
Fig. 2 B shows chip 130 support in the schematic cross-section of cradle 100;
Fig. 3 A shows the schematic diagram that the cradle 100 that is fixed on card extender 150 is separated with testing circuit board 170;
Fig. 3 B shows the schematic diagram that the cradle 100 that is fixed on card extender 150 engages with testing circuit board 170.
Embodiment
The detailed description of accompanying drawing is intended to the explanation as currently preferred embodiment of the present utility model, and is not intended to represent that the utility model can be achieved only has form.It should be understood that identical or equivalent function can complete by being intended to the different embodiments be contained within spirit and scope of the present utility model.
Fig. 1 shows the schematic perspective view of the cradle 100 for chip testing in an embodiment.As shown in the figure, cradle 100 comprises substrate 101, and substrate 101 can be the plastic substrate material of this area routine.The corner of substrate 101 has through hole 106 for installing fixing cradle 100.Substrate 101 has the conductive contact blade 111 and 112 that two rows be arranged in parallel.The conductive contact blade of first row shown in figure 111 and second row conductive contact blade 112 respectively have eight contacts, and these contacts are used for contacting with the pin of chip to be tested.In some other embodiment, two row's conductive contact blades respectively have 4 ~ 7 or 9 ~ 16 contacts.First row conductive contact blade 111 and the spaced apart segment distance of second row conductive contact blade 112, and be provided with two row conductive contact blades 113 and 114 between, this two row conductive contact blade 113 with 114 for contacting with the pad (ground pad) that exposes of chip to be tested.First row conductive contact blade 113 is substantial parallel with secondary series conductive contact blade 114, and each row comprises two contacts, and the length direction of its contact is essentially perpendicular to the length direction of first row conductive contact blade 111 and second row conductive contact blade 112.In some other embodiment, for contacting with the pin of chip to be tested two arrange between conductive contact blade and only have a row conductive contact blade; In further embodiments, for contacting with the pin of chip to be tested two arrange between conductive contact blade and have more than two row conductive contact blades.In some other embodiment, for the exposing each row conductive contact blade that pad (ground pad) contacts and only can comprise a conductive contact blade or more than two conductive contact blades of chip to be tested.
Fig. 2 A and Fig. 2 B respectively illustrates chip 130 support in the schematic perspective view of cradle 100 and schematic cross-section.As shown in the figure, each four pins of chip 130 both sides contact each four contacts in first row conductive contact blade 111 and second row conductive contact blade 112 respectively.Cradle 100 is connected to testing circuit board via card extender again, makes the pin of chip 130 and expose pad (ground pad) to be connected in the related circuit on testing circuit board, thus can test chip 130.Two row conductive contact blades 113 contact with the pad (ground pad) that exposes of chip 130 with each contact in 114.In each row conductive contact blade 113,114, the phase near-end of two contacts has projection, is beneficial to expose pad bottom contact chip.On cradle 100, the setting of the conductive contact blade in a row of 2 × 8 and the conductive contact blade in column of 2 × 2 is suitable for support and tests the chip with 2 × 4 to 2 × 8 scale pin array.Preferably, each conductive contact blade is set to resilient, is beneficial to conductive contact blade and chip pin, exposes good contact between pad.
Fig. 3 A and Fig. 3 B respectively illustrate the schematic diagram that the cradle 100 that is fixed on card extender 150 is separated with testing circuit board 170 and engages.As shown in the figure, cradle 100 and card extender 150 are fixed together, and each conductive contact blade on cradle 100 is electrically connected with the conductive pin on card extender 150 respectively.Conductive pin 151 to 157 on card extender 150 has been shown in Fig. 3 A, such as but not limited to, conductive pin 154 with on cradle 100 for being electrically connected with the two row conductive contact blades 113 and 114 (as shown in Figure 1) that pad (ground pad) contacts that expose of chip to be tested.Testing circuit board 170 has and the socket one to one of the conductive pin on card extender 150, illustrate only conductive pin 151 to 157 and socket 171 to 177 in figure, those skilled in the art will be understood that and can also comprise more conductive pin and socket.Socket 171 to 177 (and other sockets) is electrically connected in the related circuit on testing circuit board 170.Engage corresponding with the socket of testing circuit board 170 for the contact pin of card extender 150, each conductive contact blade of cradle 100 is made to be connected in the related circuit on testing circuit board 170, regularly support in the chip 130 of cradle 100 pin and expose pad (ground pad) and be thus connected in the related circuit on testing circuit board 170, thus can to test chip 130.
In prior art for chip to be tested expose the custom-designed measurement circuit of pad, need additionally manually to add circuit to the test exposing pad, not only operate inconvenience, and the extra circuit added easily is caused the change of electric parameter (such as inductance capacitance etc.) by touching, thus affect the Stability and veracity of chip testing result.
In at least part of embodiment of the present utility model, for the pad that exposes of chip to be tested is provided with special measurement circuit, comprise conductive contact blade and conductive pin, and these measurement circuits are and arrange regularly, avoid the extra all inconvenience manually added circuit and bring.
Although illustrated and described different embodiment of the present utility model, the utility model has been not limited to these embodiments.The technical characteristic only occurred in some claim or embodiment does not also mean that and can not combine with other features in other claims or embodiment to realize useful new technical scheme.When not deviating from the spirit and scope of the present utility model described by claims, many amendments, change, distortion, substitute and equivalent be obvious to those skilled in the art.
Claims (8)
1. for a cradle for chip testing, it is characterized in that, this cradle comprises:
Substrate;
First row conductive contact blade, it to be arranged on described substrate and to comprise multiple conductive contact blade be arranged in parallel;
Second row conductive contact blade, it to be arranged on described substrate and to comprise multiple conductive contact blade be arranged in parallel, and aligns with described first row conductive contact blade;
At least onely arrange the 3rd conductive contact blade, it to be arranged on described substrate and between described first row conductive contact blade and second row conductive contact blade;
Described first row conductive contact blade and second row conductive contact blade are configured to the pin being connected chip to be tested, and what described 3rd conductive contact blade was configured to connect chip bottom to be tested exposes pad.
2., as claimed in claim 1 for the cradle of chip testing, it is characterized in that, described first row conductive contact blade, second row conductive contact blade, the 3rd conductive contact blade are set to have elasticity.
3., as claimed in claim 1 for the cradle of chip testing, it is characterized in that, described first row conductive contact blade, second row conductive contact blade respectively comprise 4 ~ 16 conductive contact blades.
4., as claimed in claim 3 for the cradle of chip testing, it is characterized in that, described first row conductive contact blade, second row conductive contact blade respectively comprise 8 conductive contact blades.
5., as claimed in claim 3 for the cradle of chip testing, it is characterized in that, described first row conductive contact blade, second row conductive contact blade have projection at phase near-end.
6., as claimed in claim 1 for the cradle of chip testing, it is characterized in that, at least one each row arranged in the 3rd conductive contact blade comprise two conductive contact blades, and described two conductive contact blades have projection at phase near-end.
7., as claimed in claim 1 for the cradle of chip testing, it is characterized in that, described substrate is plastic substrate material.
8. for a device for chip testing, it is characterized in that, this device comprises:
Cradle according to any one of claim 1-7; And
Card extender, is provided with multiple conductive pin regularly in the side of described card extender, and at least one in described multiple conductive pin and described 3rd conductive contact blade are electrically connected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420866281.4U CN204405705U (en) | 2014-12-31 | 2014-12-31 | For device and the cradle thereof of chip testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420866281.4U CN204405705U (en) | 2014-12-31 | 2014-12-31 | For device and the cradle thereof of chip testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204405705U true CN204405705U (en) | 2015-06-17 |
Family
ID=53429555
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420866281.4U Withdrawn - After Issue CN204405705U (en) | 2014-12-31 | 2014-12-31 | For device and the cradle thereof of chip testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204405705U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483517A (en) * | 2014-12-31 | 2015-04-01 | 日月光半导体（昆山）有限公司 | Chip testing tool |
-
2014
- 2014-12-31 CN CN201420866281.4U patent/CN204405705U/en not_active Withdrawn - After Issue
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104483517A (en) * | 2014-12-31 | 2015-04-01 | 日月光半导体（昆山）有限公司 | Chip testing tool |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20150617 Effective date of abandoning: 20180327 |