CN203012063U - Test board for batched electronic component testing - Google Patents
Test board for batched electronic component testing Download PDFInfo
- Publication number
- CN203012063U CN203012063U CN 201220611742 CN201220611742U CN203012063U CN 203012063 U CN203012063 U CN 203012063U CN 201220611742 CN201220611742 CN 201220611742 CN 201220611742 U CN201220611742 U CN 201220611742U CN 203012063 U CN203012063 U CN 203012063U
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- Prior art keywords
- test
- components
- electronic devices
- measured
- electric contact
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Abstract
The utility model relates to a test board for batched electronic component testing, which comprises a plurality of groups of test sections, wherein each of the test section is used for testing one type of electronic components. Each test section of the group of the test sections is provided with a groove, two electrical contact members and two adjusting devices, wherein the groove is used for arranging an electronic component to be tested; the two electrical contact members are arranged at two sides of the groove and correspond to two electrodes of the component to be tested respectively; the two adjusting devices are connected on the surface of the test board, and one of the adjusting devices is connected with the electrical contact member and used for enabling the electrical contact member to be electrically contacted with the electronic component in the corresponding test section under normal conditions and enabling the electrical contact member to depart from the electronic component to be tested when the electronic component is placed in or taken out. The test board further comprises a contact part, and a plurality of pairs of electrical connecting wires are led to the plurality of groups of the test sections from the contact part, wherein one pair of the electrical connecting wires corresponds to the electrical contact member of one test section and is used for powering up the electronic component to be tested in the groove.
Description
Technical field
The utility model relates to field tests, relates more specifically to a kind of test board for the test of batch electronic devices and components.
Background technology
The instrument used in the oil exploration & development industry often comprises a large amount of different types of electronic devices and components, and the environment faced due to oil exploration & development, and these electronic devices and components often need to experience the particular surroundingss such as high temperature, low temperature.Need to before the assembling instrument, to used various types of electronic devices and components (such as resistor, capacitor, inductor etc.), carry out the height temperature detector surveys, screens for this reason.The test board that electronic devices and components checkout equipment in the market is equipped with, be all single one or several similar components and parts are detected, and when testing the components and parts of other kind, needs the repeated test step.This exists poor compatibility, and the problem of complex operation especially, when component number is many, need to expend a large amount of manpowers and time.
Consider above-mentioned reason, existence can realize different types of electronic devices and components are carried out the demand of the device of burn-in test.
The utility model content
The utility model relates to a kind of test board for the test of batch electronic devices and components, it is characterized in that comprising:
Be arranged on the many groups test department on this test plate surface, every group of test department be for the electronic devices and components of a type, and wherein, each test department in every group of test department all has:
For settling the groove of electronic devices and components to be measured;
Two relative electric contact pieces are distinguished with two electrodes of electronic devices and components to be measured in the groove both sides; With
Be connected to two regulating devices on this test plate surface, a regulating device is connected with an electric contact piece, for make this electric contact piece under normal conditions in working position and when placing or taking out electronic devices and components to be measured in retracted position, wherein working position makes the electronic devices and components to be measured in this electric contact piece and corresponding test department electrically contact, and retracted position makes this electric contact piece leave this electronic devices and components to be measured;
Contact site, draw multipair electric connection line from contact site to these many group test departments, and wherein a pair of electric connection line is corresponding with the electric contact piece of a test department, for the electronic devices and components to be measured to this slot, powers up.
Preferably, these many group test departments at least comprise two groups, are respectively used at least two kinds in test patch resistor, chip capacitor and SMT Inductor.
Preferably, every group of test department comprises a plurality of test departments, and wherein the groove size in each test department differs from one another, for placing the electronic devices and components to be measured of different size.
Preferably, this each test department has a plurality of grooves, between each groove, is provided with baffle plate.
Preferably, the electric contact piece of this each test department comprise connecting portion and from connecting portion, stretch out there is flexible sheet metal, when test, this sheet metal utilizes elastic compression on the respective electrode of correspondence electronic devices and components to be measured.
Preferably, this regulating device is that lower end is fixed on test plate surface and upper end flexure strip freely, and has teat on it, and this jut, against corresponding electric contact piece, makes it in working position under normal conditions; When needs are placed or taken out electronic devices and components to be measured, upper end is pulled by the direction to away from electronic devices and components to be measured, thereby teat drives the electric contact piece connected, moves, and makes it in retracted position.
Preferably, this regulating device comprises the first elastomeric element be fixed on test plate surface, be supported on pressing component 1225 and the second elastomeric element on the first elastomeric element, wherein, pressing component has successively bottom on the direction away from test plate surface, transition part and top, this bottom and upper side are plane to the surface of electronic devices and components to be measured, and transition part is faced the surface of electronic devices and components to be measured for smoothly domatic, and wherein, pressing component this in the face of electronic devices and components to be measured surface on be provided with draw-in groove, the second elastomeric element one end slides and is connected in this draw-in groove, the other end is connected with corresponding electric contact piece, between the bottom that this second elastomeric element is connected to pressing component compressedly under normal conditions and corresponding electric contact piece, make this electric contact piece in working position, when needs are placed or are taken out electronic devices and components to be measured, pressing component is pressed by the direction towards test plate surface, the first elastomeric element is compressed, thereby the second elastomeric element moves to top from bottom through transition part along draw-in groove and is released, drive thus the electric contact piece connected and move, make it in retracted position.
Preferably, described first, second elastomeric element is spring.
Preferably, shown in test board be pcb board, described multipair electric connection line all is routed in pcb board inside.
The utlity model has following benefit: it can realize the electronic devices and components test simultaneously in batches to variety classes, different size.Thereby, there is advantage easy and simple to handle, compatible good.Simultaneously, mounting related components is also very convenient, especially small-sized patch resistor, capacitor and inductor.
The accompanying drawing explanation
In order to understand better the utility model and to illustrate, how to make it come into force, will come with reference to accompanying drawing, wherein by example now:
Fig. 1 a shows the vertical view schematic diagram of test board;
Fig. 1 b shows along the part surface chart of the line AA ' intercepting of Fig. 1 a;
Fig. 2 a, 2b illustrate the schematic diagram of electric contact piece in working position and retracted position respectively; And
Fig. 3 a, 3b illustrate respectively two embodiment of the regulating device realized in the utility model.
Embodiment
Below, one or more aspects of embodiment of the present utility model are described with reference to the drawings, wherein in whole accompanying drawing, generally with identical reference marker, refer to identical element.In the following description, for the purpose of explaining, many specific details have been set forth so that the thorough understanding to one or more aspects of the utility model embodiment to be provided.Yet, it is evident that for a person skilled in the art, can utilize these specific detail of less degree to carry out one or more aspects of the utility model embodiment.
In addition, although come special characteristic or the aspect of disclosed embodiment with regard to the only embodiment in some embodiments, such feature or aspect can be in conjunction with may be one or more further features or the aspect of other embodiment expectation and favourable for any given or application-specific.
Fig. 1 a shows the schematic top plan view of the related test board of the utility model.Fig. 1 b is the part surface chart along the line AA ' intercepting of Fig. 1 a.Test board 10 comprises the many groups test department be arranged on this test plate surface.Schematically show three groups in figure, be respectively first group 100
1, 100
2second group 100 '
1, 100 '
2the 3rd group 100 ' '
1, 100 ' '
2Every group of test department is used for the electronic devices and components of a type, for example first group of test patch resistor, second group of test patch capacitor, the 3rd group of test patch inductor etc.In fact, can also comprise more groups of test departments.But it is noted that and be at least two groups, to realize the purpose of at least two kinds of dissimilar electronic devices and components of test.
Each test department in every group of test department all has the groove 105 for settling electronic devices and components to be measured.The degree of depth of groove depends on the size of electronic devices and components to be measured.Preferably, each test department has a plurality of measure-alike grooves, for example, for the electronic devices and components (, the patch resistor of same size) of measuring same size simultaneously.In this case, further preferably, be provided with baffle plate 130 between each groove, for when measuring, do not interfere with each other between electronic devices and components to be measured, especially in the situation that measure capacitor in the alternation situation and inductor especially true.
In addition, preferably, in order to test the electronic devices and components of different specification size, every group of test department can comprise a plurality of test departments, the size of the groove in test department is different from the groove size in other test department, when design, can design for the electronic devices and components of specification commonly used in several specific works the size of groove.Like this, improved the dirigibility of test.
Each test department also comprises two electric contact pieces 115 that the groove both sides are relative with two electrodes (being dash area in Fig. 2) difference of electronic devices and components to be measured
1, 115
2.In one embodiment, this electric contact piece can be a sheet metal had an even surface, when test, and pair of metal sheet 115
1, 115
2choke or push down electronic devices and components to be measured, sheet metal face separately contacts corresponding electrode.In a further embodiment, electric contact piece comprise connecting portion 135 and from connecting portion, stretch out there is flexible sheet metal 136, when test, if due to the reason of tolerance, the components and parts height of testing is difference slightly, and this sheet metal can utilize elastic force still can be pressed on respective electrode.
Each test department also comprises two regulating devices 120 that are connected on this test plate surface.Because the shape of regulating device 120 can have multiplely, therefore all draw with the form of signal in Fig. 1 a, 1b, concrete shape is described in Fig. 3.A regulating device is connected with an electric contact piece, for make this electric contact piece under normal conditions (as shown in Figure 2 a) in working position and when placing or taking out electronic devices and components to be measured in retracted position (as shown in Figure 2 b), wherein working position makes the electronic devices and components to be measured in this electric contact piece and corresponding test department electrically contact, and retracted position makes this electric contact piece leave this electronic devices and components to be measured.
In one embodiment, (be similar to sectional view) as shown in Figure 3 a, this regulating device 120 is fixed on test plate surface upper end 1210 flexure strip freely for lower end 1205, and has teat 1215 on it, under normal conditions this jut against corresponding electric contact piece (with 115
1for example), make it in working position; When needs are placed or taken out electronic devices and components to be measured, (as shown in arrow in Fig. 3 a) pulled in upper end 1210 by the direction to away from electronic devices and components to be measured, thereby teat 1215 drives the electric contact piece 115 connected
1mobile, make it in retracted position.
In another embodiment, (be similar to sectional view) as shown in Fig. 3 b, this regulating device 120 comprises for example spring of the first elastomeric element 1220(of being fixed on test plate surface, shell fragment), be supported on for example spring of pressing component 1225 on the first elastomeric element and the second elastomeric element 1230(, shell fragment), wherein, pressing component (being the x direction in figure) on the direction away from test plate surface has bottom 1235 successively, in transition part 1240 and top 1245(figure, with dotted line, separate), this bottom and upper side are plane to the surface of electronic devices and components to be measured, and transition part is faced the surface of electronic devices and components to be measured for smoothly domatic, and wherein, pressing component this in the face of electronic devices and components to be measured surface on be provided with the draw-in groove (not shown), the second elastomeric element one end slides and is connected in this draw-in groove, the other end with corresponding electric contact piece (still with 115
1for example) be connected, between the bottom that this second elastomeric element is connected to pressing component compressedly under normal conditions and corresponding electric contact piece, make this electric contact piece in working position, when needs are placed or are taken out electronic devices and components to be measured, pressing component is pressed (in figure with shown in arrow) by the direction towards test plate surface, the first elastomeric element is compressed, thereby the second elastomeric element moves to top (along figure y direction) from bottom through transition part along draw-in groove is released, drive thus the electric contact piece connected and move, make it in retracted position.
Have benefited from instruction of the present disclosure, those skilled in the art can be easy to expect that other regulating devices realize above-mentioned functions, for example can be designed as pulling force that does not need downward pressure but make progress etc., and these are all in protection domain of the present utility model.
Still, with reference to figure 1, test board also comprises contact site 125, in figure, is narrower zone, bottom.Draw multipair electric connection line from contact site to these many group test departments, mean with dot-and-dash line in figure.Wherein a pair of electric connection line is corresponding with the electric contact piece of a test department, for the electronic devices and components to be measured to this slot, powers up.Preferably, in the situation that shown in test board be pcb board, described multipair electric connection line is arranged on pcb board inside by the PCB layout method, thereby has saved the free space on the test board.
Although we have only described the utility model with the embodiment shown in scheming; but those skilled in the art can easily understand by reading instructions; in the situation that do not break away from the utility model technical side ratio juris and claims institute protection domain of enclosing, can make various modifications, variation to the utility model.
Claims (9)
1. the test board (10) for batch electronic devices and components tests is characterized in that comprising:
Be arranged on the many groups test department (100 on this test plate surface
1, 100
2), every group of test department be for the electronic devices and components of a type, and wherein, each test department in every group of test department all has:
For settling the groove (105) of electronic devices and components to be measured;
Two electrodes (110 of groove both sides and electronic devices and components to be measured
1, 110
2) two relative electric contact pieces (115 of difference
1, 115
2); With
Be connected to two regulating devices (120) on this test plate surface, a regulating device is connected with an electric contact piece, for make this electric contact piece under normal conditions in working position and when placing or taking out electronic devices and components to be measured in retracted position, wherein working position makes the electronic devices and components to be measured in this electric contact piece and corresponding test department electrically contact, and retracted position makes this electric contact piece leave this electronic devices and components to be measured;
Contact site (125), draw multipair electric connection line from contact site to these many group test departments, and wherein a pair of electric connection line is corresponding with the electric contact piece of a test department, for the electronic devices and components to be measured to this slot, powers up.
2. test board as claimed in claim 1 (10), is characterized in that these many group test departments at least comprise two groups, are respectively used at least two kinds in test patch resistor, chip capacitor and SMT Inductor.
3. test board as claimed in claim 2 (10), is characterized in that every group of test department comprises a plurality of test departments, and wherein the groove size in each test department differs from one another, for placing the electronic devices and components to be measured of different size.
4. test board as claimed in claim 1 (10), is characterized in that this each test department has a plurality of grooves, is provided with baffle plate (130) between each groove.
5. test board as claimed in claim 1 (10), the electric contact piece that it is characterized in that this each test department comprise connecting portion (135) and from connecting portion, stretch out there is flexible sheet metal (136), when test, this sheet metal utilizes elastic compression on the respective electrode of correspondence electronic devices and components to be measured.
6. test board as described as one of claim 1-5 (10), it is characterized in that this regulating device (120) is fixed on test plate surface upper end (1210) flexure strip freely for lower end (1205), and there is teat (1215) on it, this jut, against corresponding electric contact piece, makes it in working position under normal conditions; When needs are placed or taken out electronic devices and components to be measured, upper end is pulled by the direction to away from electronic devices and components to be measured, thereby teat drives the electric contact piece connected, moves, and makes it in retracted position.
7. test board as described as one of claim 1-5 (10), it is characterized in that this regulating device (120) comprises the first elastomeric element (1220) be fixed on test plate surface, be supported on pressing component (1225) and the second elastomeric element (1230) on the first elastomeric element, wherein, pressing component has successively bottom (1235) on the direction away from test plate surface, transition part (1240) and top (1245), this bottom and upper side are plane to the surface of electronic devices and components to be measured, and transition part is faced the surface of electronic devices and components to be measured for smoothly domatic, and wherein, pressing component this in the face of electronic devices and components to be measured surface on be provided with draw-in groove, the second elastomeric element one end slides and is connected in this draw-in groove, the other end is connected with corresponding electric contact piece, between the bottom that this second elastomeric element is connected to pressing component compressedly under normal conditions and corresponding electric contact piece, make this electric contact piece in working position, when needs are placed or are taken out electronic devices and components to be measured, pressing component is pressed by the direction towards test plate surface, the first elastomeric element is compressed, thereby the second elastomeric element moves to top from bottom through transition part along draw-in groove and is released, drive thus the electric contact piece connected and move, make it in retracted position.
8. test board as claimed in claim 7 (10), is characterized in that described first, second elastomeric element is spring.
9. test board as claimed in claim 1 (10), test board shown in it is characterized in that is pcb board, described multipair electric connection line all is routed in pcb board inside.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220611742 CN203012063U (en) | 2012-11-19 | 2012-11-19 | Test board for batched electronic component testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220611742 CN203012063U (en) | 2012-11-19 | 2012-11-19 | Test board for batched electronic component testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203012063U true CN203012063U (en) | 2013-06-19 |
Family
ID=48603645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220611742 Expired - Fee Related CN203012063U (en) | 2012-11-19 | 2012-11-19 | Test board for batched electronic component testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203012063U (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103454565A (en) * | 2013-08-31 | 2013-12-18 | 苏州赛斯德工程设备有限公司 | High-voltage groove internal voltage testing device |
| CN104267219A (en) * | 2014-10-13 | 2015-01-07 | 华东光电集成器件研究所 | Chip capacitor voltage withstanding performance test fixture |
| CN105301415A (en) * | 2015-11-27 | 2016-02-03 | 廊坊中电熊猫晶体科技有限公司 | Method for improving test of SMD quartz crystal resonator by employing network analyzer |
| CN105759083A (en) * | 2016-04-06 | 2016-07-13 | 江苏雷特电机股份有限公司 | Multi-reactor test device |
| CN108169618A (en) * | 2018-01-08 | 2018-06-15 | 四川九洲电器集团有限责任公司 | A kind of test device and test method |
| CN109425796A (en) * | 2017-08-30 | 2019-03-05 | 中兴通讯股份有限公司 | A kind of backboard tooling test macro |
| WO2019148743A1 (en) * | 2018-02-02 | 2019-08-08 | 宁波舜宇光电信息有限公司 | Media module for testing camera module and test board |
| CN110389297A (en) * | 2019-08-22 | 2019-10-29 | 上海泽丰半导体科技有限公司 | A kind of novel measuring test plate (panel) and test device |
| CN112710900A (en) * | 2019-10-25 | 2021-04-27 | 神讯电脑(昆山)有限公司 | Chip resistor detection device |
-
2012
- 2012-11-19 CN CN 201220611742 patent/CN203012063U/en not_active Expired - Fee Related
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103454565A (en) * | 2013-08-31 | 2013-12-18 | 苏州赛斯德工程设备有限公司 | High-voltage groove internal voltage testing device |
| CN104267219A (en) * | 2014-10-13 | 2015-01-07 | 华东光电集成器件研究所 | Chip capacitor voltage withstanding performance test fixture |
| CN104267219B (en) * | 2014-10-13 | 2017-06-16 | 华东光电集成器件研究所 | A kind of sheet capacitor voltage withstanding test fixture |
| CN105301415A (en) * | 2015-11-27 | 2016-02-03 | 廊坊中电熊猫晶体科技有限公司 | Method for improving test of SMD quartz crystal resonator by employing network analyzer |
| CN105301415B (en) * | 2015-11-27 | 2018-06-22 | 廊坊中电熊猫晶体科技有限公司 | Improve the method using Network Analyzer test patch quartz-crystal resonator |
| CN105759083A (en) * | 2016-04-06 | 2016-07-13 | 江苏雷特电机股份有限公司 | Multi-reactor test device |
| CN109425796A (en) * | 2017-08-30 | 2019-03-05 | 中兴通讯股份有限公司 | A kind of backboard tooling test macro |
| CN108169618A (en) * | 2018-01-08 | 2018-06-15 | 四川九洲电器集团有限责任公司 | A kind of test device and test method |
| CN108169618B (en) * | 2018-01-08 | 2021-02-09 | 四川九洲电器集团有限责任公司 | Testing device and testing method |
| WO2019148743A1 (en) * | 2018-02-02 | 2019-08-08 | 宁波舜宇光电信息有限公司 | Media module for testing camera module and test board |
| CN110389297A (en) * | 2019-08-22 | 2019-10-29 | 上海泽丰半导体科技有限公司 | A kind of novel measuring test plate (panel) and test device |
| CN112710900A (en) * | 2019-10-25 | 2021-04-27 | 神讯电脑(昆山)有限公司 | Chip resistor detection device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130619 Termination date: 20141119 |
|
| EXPY | Termination of patent right or utility model |